testing of oscillators or resonators

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CPC
G01R31/2824

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2824testing of oscillators or resonators

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for conducting vehicle oscillator testing
- Patent number 12,099,082
- Issue date Sep 24, 2024
- Toyota Motor Engineering & Manufacturing North America, Inc.
- Ming M. Meng
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Silicon test structures for separate measurement of NMOS and PMOS t...
- Patent number 12,044,732
- Issue date Jul 23, 2024
- NVIDIA Corporation
- Prashant Singh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Broadband radiation sensor based on a resonantly-coupled graphene S...
- Patent number 11,921,141
- Issue date Mar 5, 2024
- California Institute of Technology
- Raj M. Katti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Decoupling BTI and HCI mechanism in ring oscillator
- Patent number 11,789,064
- Issue date Oct 17, 2023
- International Business Machines Corporation
- Huimei Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for testing coupled AC circuit
- Patent number 11,656,268
- Issue date May 23, 2023
- GM CRUISE HOLDINGS LLC
- Vladimir Ilchenko
- G01 - MEASURING TESTING
Information Patent Grant
Runtime measurement of process variations and supply voltage charac...
- Patent number 11,585,854
- Issue date Feb 21, 2023
- Xilinx, Inc.
- Da Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test system and method for signal processing
- Patent number 11,536,764
- Issue date Dec 27, 2022
- Rohde & Schwarz GmbH & Co. KG
- Kevin Guo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor device and test method thereof
- Patent number 11,495,498
- Issue date Nov 8, 2022
- SK Hynix Inc.
- Jihwan Kim
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for frequency compensation of real-time-clock s...
- Patent number 11,012,032
- Issue date May 18, 2021
- Guangzhou On-Bright Electronics Co., Ltd.
- Rusheng Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope and method for testing a device under test
- Patent number 11,009,552
- Issue date May 18, 2021
- Rohde & Schwarz GmbH & Co. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Grant
Measurement method and device with compensation for a shifting freq...
- Patent number 10,996,264
- Issue date May 4, 2021
- Rohde & Schwarz GmbH & Co. KG
- Walter Weiss
- G01 - MEASURING TESTING
Information Patent Grant
Oscillator failure detection circuit
- Patent number 10,897,225
- Issue date Jan 19, 2021
- International Business Machines Corporation
- James Strom
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe heater remaining useful life determination
- Patent number 10,895,592
- Issue date Jan 19, 2021
- Rosemount Aerospace Inc.
- Magdi A. Essawy
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Systems and methods for frequency compensation of real-time-clock s...
- Patent number 10,734,947
- Issue date Aug 4, 2020
- Guangzhou On-Bright Electronics Co., Ltd.
- Rusheng Zhou
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Compact millimeter-wave tuner
- Patent number 10,700,402
- Issue date Jun 30, 2020
- Christos Tsironis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Vector network analyzer and measuring method for frequency-converti...
- Patent number 10,684,317
- Issue date Jun 16, 2020
- Rohde & Schwarz GmbH & Co. KG
- Martin Leibfritz
- G02 - OPTICS
Information Patent Grant
Built-in self-test method and apparatus for single-pin crystal osci...
- Patent number 10,620,261
- Issue date Apr 14, 2020
- Arm Limited Cambridge
- Alexandru Aurelian Ciubotaru
- G01 - MEASURING TESTING
Information Patent Grant
Probe heater remaining useful life determination
- Patent number 10,605,848
- Issue date Mar 31, 2020
- Rosemount Aerospace Inc.
- Magdi A. Essawy
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Ring oscillator structures to determine local voltage value
- Patent number 10,574,240
- Issue date Feb 25, 2020
- International Business Machines Corporation
- Keith A. Jenkins
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Built-in self-test method and apparatus for single-pin crystal osci...
- Patent number 10,564,217
- Issue date Feb 18, 2020
- ARM Limited
- Alexandru Aurelian Ciubotaru
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems and methods for storing frequency information for system ca...
- Patent number 10,551,428
- Issue date Feb 4, 2020
- Microchip Technology Incorporated
- Ajay Kumar
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting crystal unit by analyzing frequency character...
- Patent number 10,267,755
- Issue date Apr 23, 2019
- Fujitsu Limited
- Masakazu Kishi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Area-efficient performance monitors for adaptive voltage scaling
- Patent number 9,915,696
- Issue date Mar 13, 2018
- Xilinx, Inc.
- Nagaraj Savithri
- G01 - MEASURING TESTING
Information Patent Grant
Loop parameter sensor using repetitive phase errors
- Patent number 9,800,251
- Issue date Oct 24, 2017
- International Business Machines Corporation
- Mark Ferriss
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Testing resonant sensor circuits using signal sources and controlla...
- Patent number 9,618,565
- Issue date Apr 11, 2017
- Texas Instruments Incorporated
- Frederick Paclibon
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test equipment for testing an oscillating crystal and met...
- Patent number 9,523,733
- Issue date Dec 20, 2016
- Texas Instruments Incorporated
- Ralf Sonnhueter
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for monitoring sensors
- Patent number 9,389,260
- Issue date Jul 12, 2016
- General Electric Company
- Radislav Alexandrovich Potyrailo
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self-test circuit for voltage controlled oscillator
- Patent number 9,255,963
- Issue date Feb 9, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsieh-Hung Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of oscillator, manufacturing method of circuit...
- Patent number 9,246,469
- Issue date Jan 26, 2016
- Seiko Epson Corporation
- Masayuki Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Measuring phase noise in radio frequency, microwave or millimeter s...
- Patent number 9,234,937
- Issue date Jan 12, 2016
- OEwaves, Inc.
- Danny Eliyahu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
TRANSMIT MODULATION TESTING
- Publication number 20240110972
- Publication date Apr 4, 2024
- Silicon Laboratories Inc.
- Anant Verma
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPLICATION DEVICE CALIBRATION UNIT, MEASUREMENT SYSTEM...
- Publication number 20240039644
- Publication date Feb 1, 2024
- Rohde& Schwarz GmbH & Co. KG
- Florian RAMIAN
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SILICON TEST STRUCTURES FOR SEPARATE MEASUREMENT OF NMOS AND PMOS T...
- Publication number 20230104105
- Publication date Apr 6, 2023
- NVIDIA Corporation
- Prashant Singh
- G01 - MEASURING TESTING
Information Patent Application
Techniques For Reduction Of Degradation In Channels Caused By Bias...
- Publication number 20220268837
- Publication date Aug 25, 2022
- Intel Corporation
- Han Hua Leong
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND METHOD FOR SIGNAL PROCESSING
- Publication number 20220018893
- Publication date Jan 20, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Kevin GUO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
BROADBAND RADIATION SENSOR BASED ON A RESONANTLY-COUPLED GRAPHENE S...
- Publication number 20210311101
- Publication date Oct 7, 2021
- California Institute of Technology
- Raj M. Katti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR FREQUENCY COMPENSATION OF REAL-TIME-CLOCK S...
- Publication number 20200328718
- Publication date Oct 15, 2020
- GUANGZHOU ON-BRIGHT ELECTRONICS CO., LTD.
- RUSHENG ZHOU
- G01 - MEASURING TESTING
Information Patent Application
OSCILLOSCOPE AND METHOD FOR TESTING A DEVICE UNDER TEST
- Publication number 20200200821
- Publication date Jun 25, 2020
- Rohde& Schwarz GmbH & Co. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD AND DEVICE WITH COMPENSATION FOR A SHIFTING FREQ...
- Publication number 20200174061
- Publication date Jun 4, 2020
- ROHDE & SCHWARZ GMBH & CO. KG
- Walter WEISS
- G01 - MEASURING TESTING
Information Patent Application
VECTOR NETWORK ANALYZER AND MEASURING METHOD FOR FREQUENCY-CONVERTI...
- Publication number 20190072598
- Publication date Mar 7, 2019
- ROHDE & SCHWARZ GMBH & CO. KG
- Martin Leibfritz
- G02 - OPTICS
Information Patent Application
ULTRA-LOW NOISE PHOTONIC PHASE NOISE MEASUREMENT SYSTEM FOR MICROWA...
- Publication number 20180180655
- Publication date Jun 28, 2018
- IMRA America, Inc.
- Naoya Kuse
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEMS AND METHODS FOR STORING FREQUENCY INFORMATION FOR SYSTEM CA...
- Publication number 20180059171
- Publication date Mar 1, 2018
- MICROCHIP TECHNOLOGY INCORPORATED
- Ajay Kumar
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD AND MEASUREMENT SYSTEM
- Publication number 20160109496
- Publication date Apr 21, 2016
- Fujitsu Limited
- Masakazu Kishi
- G01 - MEASURING TESTING
Information Patent Application
ERROR DETECTOR AND METHOD FOR DETECTING ERROR OF AN OSCILLATOR
- Publication number 20160094371
- Publication date Mar 31, 2016
- Samsung Electronics Co., Ltd.
- Sang-min HONG
- G01 - MEASURING TESTING
Information Patent Application
LOOP PARAMETER SENSOR USING REPETITIVE PHASE ERRORS
- Publication number 20160036452
- Publication date Feb 4, 2016
- International Business Machines Corporation
- Mark Ferriss
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT FOR TESTING AN OSCILLATING CRYSTAL AND MET...
- Publication number 20150042368
- Publication date Feb 12, 2015
- Texas Instruments Deutschland GmbH
- Ralf Sonnhueter
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS, MEASURING METHOD, AND MEASURING PROGRAM
- Publication number 20140320110
- Publication date Oct 30, 2014
- NIHON DEMPA KOGYO CO., LTD.
- HIROKI MATSUI
- G01 - MEASURING TESTING
Information Patent Application
Built-in Self-test Circuit for Voltage Controlled Oscillator
- Publication number 20140225676
- Publication date Aug 14, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsieh-Hung Hsieh
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TESTING OSCILLATOR CIRCUIT
- Publication number 20140125419
- Publication date May 8, 2014
- Jun Zhang
- G01 - MEASURING TESTING
Information Patent Application
RING OSCILLATOR TESTING WITH POWER SENSING RESISTOR
- Publication number 20140097858
- Publication date Apr 10, 2014
- International Business Machines Corporation
- Hanyi Ding
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MONITORING SENSORS
- Publication number 20140095102
- Publication date Apr 3, 2014
- GENERAL ELECTRIC COMPANY
- Radislav Alexandrovich Potyrailo
- G01 - MEASURING TESTING
Information Patent Application
ERROR DETECTION AT AN OSCILLATOR
- Publication number 20140022022
- Publication date Jan 23, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Jon S. Choy
- G01 - MEASURING TESTING
Information Patent Application
MEASURING BIAS TEMPERATURE INSTABILITY INDUCED RING OSCILLATOR FREQ...
- Publication number 20130147562
- Publication date Jun 13, 2013
- Internatinal Business Machines Corporation
- David G. Brochu
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM WITH ADJUSTABLE RADIO-FREQUENCY PROBE ARRAY
- Publication number 20130044033
- Publication date Feb 21, 2013
- Joshua G. Nickel
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TESTING OSCILLATOR CIRCUIT
- Publication number 20120293270
- Publication date Nov 22, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Jun ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Built-in Self-test Circuit for Voltage Controlled Oscillators
- Publication number 20120286836
- Publication date Nov 15, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsieh-Hung Hsieh
- G01 - MEASURING TESTING
Information Patent Application
LOOP PARAMETER SENSOR USING REPETITIVE PHASE ERRORS
- Publication number 20120262149
- Publication date Oct 18, 2012
- International Business Machines Corporation
- Mark Ferriss
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD FOR DETERMINING LOAD CAPACITANCE OF AN OSCILLATOR CIRCUIT, O...
- Publication number 20120229149
- Publication date Sep 13, 2012
- Hiroyuki Souma
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD OF DETERMINING LOAD CAPACITANCE OF CRYSTAL OSCILLATION CIRCU...
- Publication number 20120197568
- Publication date Aug 2, 2012
- Hiroyuki Souma
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PHASE NOISE IN RADIO FREQUENCY, MICROWAVE OR MILLIMETER S...
- Publication number 20120195590
- Publication date Aug 2, 2012
- OEWAVES, INC.
- Danny Eliyahu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

testing of oscillators or resonators

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for conducting vehicle oscillator testing

Silicon test structures for separate measurement of NMOS and PMOS t...

Broadband radiation sensor based on a resonantly-coupled graphene S...

Decoupling BTI and HCI mechanism in ring oscillator

Apparatus and method for testing coupled AC circuit

Runtime measurement of process variations and supply voltage charac...

Test system and method for signal processing

Semiconductor device and test method thereof

Systems and methods for frequency compensation of real-time-clock s...

Oscilloscope and method for testing a device under test

Measurement method and device with compensation for a shifting freq...

Oscillator failure detection circuit

Probe heater remaining useful life determination

Systems and methods for frequency compensation of real-time-clock s...

Compact millimeter-wave tuner

Vector network analyzer and measuring method for frequency-converti...

Built-in self-test method and apparatus for single-pin crystal osci...

Probe heater remaining useful life determination

Ring oscillator structures to determine local voltage value

Built-in self-test method and apparatus for single-pin crystal osci...

Systems and methods for storing frequency information for system ca...

Method for inspecting crystal unit by analyzing frequency character...

Area-efficient performance monitors for adaptive voltage scaling

Loop parameter sensor using repetitive phase errors

Testing resonant sensor circuits using signal sources and controlla...

Automatic test equipment for testing an oscillating crystal and met...

Systems and methods for monitoring sensors

Built-in self-test circuit for voltage controlled oscillator

Manufacturing method of oscillator, manufacturing method of circuit...

Measuring phase noise in radio frequency, microwave or millimeter s...

Patents Applicationslast 30 patents

TRANSMIT MODULATION TESTING

MEASUREMENT APPLICATION DEVICE CALIBRATION UNIT, MEASUREMENT SYSTEM...

SILICON TEST STRUCTURES FOR SEPARATE MEASUREMENT OF NMOS AND PMOS T...

Techniques For Reduction Of Degradation In Channels Caused By Bias...

TEST SYSTEM AND METHOD FOR SIGNAL PROCESSING

BROADBAND RADIATION SENSOR BASED ON A RESONANTLY-COUPLED GRAPHENE S...

SYSTEMS AND METHODS FOR FREQUENCY COMPENSATION OF REAL-TIME-CLOCK S...

OSCILLOSCOPE AND METHOD FOR TESTING A DEVICE UNDER TEST

MEASUREMENT METHOD AND DEVICE WITH COMPENSATION FOR A SHIFTING FREQ...

VECTOR NETWORK ANALYZER AND MEASURING METHOD FOR FREQUENCY-CONVERTI...

ULTRA-LOW NOISE PHOTONIC PHASE NOISE MEASUREMENT SYSTEM FOR MICROWA...

SYSTEMS AND METHODS FOR STORING FREQUENCY INFORMATION FOR SYSTEM CA...

MEASUREMENT METHOD AND MEASUREMENT SYSTEM

ERROR DETECTOR AND METHOD FOR DETECTING ERROR OF AN OSCILLATOR

LOOP PARAMETER SENSOR USING REPETITIVE PHASE ERRORS

AUTOMATIC TEST EQUIPMENT FOR TESTING AN OSCILLATING CRYSTAL AND MET...

MEASURING APPARATUS, MEASURING METHOD, AND MEASURING PROGRAM

Built-in Self-test Circuit for Voltage Controlled Oscillator

METHOD AND SYSTEM FOR TESTING OSCILLATOR CIRCUIT

RING OSCILLATOR TESTING WITH POWER SENSING RESISTOR

SYSTEMS AND METHODS FOR MONITORING SENSORS

ERROR DETECTION AT AN OSCILLATOR

MEASURING BIAS TEMPERATURE INSTABILITY INDUCED RING OSCILLATOR FREQ...

TEST SYSTEM WITH ADJUSTABLE RADIO-FREQUENCY PROBE ARRAY

METHOD AND SYSTEM FOR TESTING OSCILLATOR CIRCUIT

Built-in Self-test Circuit for Voltage Controlled Oscillators

LOOP PARAMETER SENSOR USING REPETITIVE PHASE ERRORS

METHOD FOR DETERMINING LOAD CAPACITANCE OF AN OSCILLATOR CIRCUIT, O...

METHOD OF DETERMINING LOAD CAPACITANCE OF CRYSTAL OSCILLATION CIRCU...

MEASURING PHASE NOISE IN RADIO FREQUENCY, MICROWAVE OR MILLIMETER S...