TREA

Testing of transit-time tubes

Follow

Industry

  • CPC
  • G01R31/255
This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/255Testing of transit-time tubes
Industries

Patents Grantslast 30 patents

  • Information Patent Grant

    Method for inspecting magnetron
    • Patent number 9,977,070
    • Issue date May 22, 2018
    • Tokyo Electron Limited
    • Kazushi Kaneko
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Sensor-based feedback method for improved assembly of vacuum electr...
    • Patent number 7,891,078
    • Issue date Feb 22, 2011
    • The United States of America as represented by the Secretary of the Navy
    • Ayax D. Ramirez
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method and apparatus for detecting magnetron power supply failure
    • Patent number 4,868,509
    • Issue date Sep 19, 1989
    • Fusion Systems Corporation
    • Michael G. Ury
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Apparatus for counteracting the cathode current increase occurring...
    • Patent number 4,471,265
    • Issue date Sep 11, 1984
    • Telefonaktiebolaget L M Ericsson
    • Rolf W. Rasmusson
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Traveling wave tube body current sensor
    • Patent number 3,936,732
    • Issue date Feb 3, 1976
    • The United States of America as represented by the Secretary of the Air Force
    • Victor J. Modiano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3711771
    • Patent number 3,711,771
    • Issue date Jan 16, 1973
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3641428
    • Patent number 3,641,428
    • Issue date Feb 8, 1972
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3398361
    • Patent number 3,398,361
    • Issue date Aug 20, 1968
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2985820
    • Patent number 2,985,820
    • Issue date May 23, 1961
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2967996
    • Patent number 2,967,996
    • Issue date Jan 10, 1961
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2923878
    • Patent number 2,923,878
    • Issue date Feb 2, 1960
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2899645
    • Patent number 2,899,645
    • Issue date Aug 11, 1959
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2882485
    • Patent number 2,882,485
    • Issue date Apr 14, 1959
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2847570
    • Patent number 2,847,570
    • Issue date Aug 12, 1958
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2796582
    • Patent number 2,796,582
    • Issue date Jun 18, 1957
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2790142
    • Patent number 2,790,142
    • Issue date Apr 23, 1957
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    METHOD FOR INSPECTING MAGNETRON
    • Publication number 20160109502
    • Publication date Apr 21, 2016
    • TOKYO ELECTRON LIMITED
    • Kazushi Kaneko
    • G01 - MEASURING TESTING