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Testing of vacuum tubes
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G01R31/25
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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G01R31/25
Testing of vacuum tubes
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Patents Grants
last 30 patents
Information
Patent Grant
Evaluating performance of X-ray tube
Patent number
12,228,602
Issue date
Feb 18, 2025
SIEMENS HEALTHINEERS AG
Xin Yuan Yang
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for predicting failures in X-ray tubes
Patent number
10,753,969
Issue date
Aug 25, 2020
General Electric Company
Rui Xu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Robust fault diagnosis for electronic devices
Patent number
10,295,561
Issue date
May 21, 2019
International Business Machines Corporation
Daniel S. Critchley
G01 - MEASURING TESTING
Information
Patent Grant
Device for monitoring the vacuum quality of a vacuum circuit breaker
Patent number
10,153,112
Issue date
Dec 11, 2018
Schneider Electric Industries SAS
Hans Schellekens
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for inspecting magnetron
Patent number
9,977,070
Issue date
May 22, 2018
Tokyo Electron Limited
Kazushi Kaneko
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Thermionic valve tester
Patent number
9,810,733
Issue date
Nov 7, 2017
Orange Music Electronics Company Limited
Cliff Cooper
G01 - MEASURING TESTING
Information
Patent Grant
Predicting the end of service life for a vacuum electron device
Patent number
9,625,515
Issue date
Apr 18, 2017
Communications & Power Industries LLC
John B. Overstreet
G01 - MEASURING TESTING
Information
Patent Grant
Electrical arc trigger systems, methods, and apparatuses
Patent number
9,341,610
Issue date
May 17, 2016
The Boeing Company
Carl Roy McIver
G01 - MEASURING TESTING
Information
Patent Grant
Electric current measurement apparatus, voltage measurement apparat...
Patent number
8,027,182
Issue date
Sep 27, 2011
NEC Microwave Tube, Ltd.
Shuji Abiko
G01 - MEASURING TESTING
Information
Patent Grant
Sensor-based feedback method for improved assembly of vacuum electr...
Patent number
7,891,078
Issue date
Feb 22, 2011
The United States of America as represented by the Secretary of the Navy
Ayax D. Ramirez
G01 - MEASURING TESTING
Information
Patent Grant
Method for estimating the remaining life span of an X-ray radiator
Patent number
7,302,041
Issue date
Nov 27, 2007
Siemens Aktiengesellschaft
Josef Deuringer
G01 - MEASURING TESTING
Information
Patent Grant
Method of testing addressable emissive cathodes
Patent number
6,559,818
Issue date
May 6, 2003
Micron Technology, Inc.
Jim Browning
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for testing emissive cathodes in matrix addressable displays
Patent number
6,441,634
Issue date
Aug 27, 2002
Micron Technology, Inc.
Jim Browning
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing emissive cathodes
Patent number
6,429,835
Issue date
Aug 6, 2002
Micron Technologies, Inc.
Jim Browning
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for landing adjustment jig calibration check
Patent number
6,356,301
Issue date
Mar 12, 2002
Sony Corporation
David Christian Steele
G01 - MEASURING TESTING
Information
Patent Grant
Method of detecting secondary electron charge in a cathode ray tube
Patent number
6,104,194
Issue date
Aug 15, 2000
Sony Corporation
Hideo Kato
G01 - MEASURING TESTING
Information
Patent Grant
Method of detecting arcing in cathode ray tubes
Patent number
5,789,926
Issue date
Aug 4, 1998
Sony Corporation
Mahmoud Badenlou
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing emissive cathodes
Patent number
5,751,262
Issue date
May 12, 1998
Micron Display Technology, Inc.
Jim Browning
G01 - MEASURING TESTING
Information
Patent Grant
Inspection method and inspection apparatus for field-emission cold...
Patent number
5,730,634
Issue date
Mar 24, 1998
NEC Corporation
Nobuya Seko
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for detecting arcing in a CRT
Patent number
5,659,252
Issue date
Aug 19, 1997
Sony Corporation
Mahmoud Badenlou
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for calibrating an arc counter
Patent number
5,625,283
Issue date
Apr 29, 1997
Sony Corporation
Mahmoud Badenlou
G01 - MEASURING TESTING
Information
Patent Grant
Method and a system for testing a cathode ray tube or like products
Patent number
5,442,391
Issue date
Aug 15, 1995
Eerise Corporation
Yi-ping Hung
G01 - MEASURING TESTING
Information
Patent Grant
Vacuum tube characterization apparatus
Patent number
5,144,246
Issue date
Sep 1, 1992
General Electric Company
Frank A. Stelloh
G01 - MEASURING TESTING
Information
Patent Grant
Method testing electron discharge tubes
Patent number
5,012,194
Issue date
Apr 30, 1991
Raytheon Company
Philip L. Licter
G01 - MEASURING TESTING
Information
Patent Grant
Picture quality testing method and apparatus for color cathode-ray...
Patent number
4,963,828
Issue date
Oct 16, 1990
Hitachi, Ltd.
Keisuke Kawame
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting magnetron power supply failure
Patent number
4,868,509
Issue date
Sep 19, 1989
Fusion Systems Corporation
Michael G. Ury
G01 - MEASURING TESTING
Information
Patent Grant
Method of convergence measurement for a color picture tube and an a...
Patent number
4,593,309
Issue date
Jun 3, 1986
Tokyo Shibaura Denki Kabushiki Kaisha
Shinichi Uno
G01 - MEASURING TESTING
Information
Patent Grant
Cathode ray tube tracking tester and method of testing
Patent number
4,563,649
Issue date
Jan 7, 1986
Sencore, Inc.
Barry A. Arenson
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for counteracting the cathode current increase occurring...
Patent number
4,471,265
Issue date
Sep 11, 1984
Telefonaktiebolaget L M Ericsson
Rolf W. Rasmusson
G01 - MEASURING TESTING
Information
Patent Grant
Television receiver and test set voltage analyzer
Patent number
4,459,551
Issue date
Jul 10, 1984
RCA Corporation
Kenneth J. Yakmovitz
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PREDICTING TUBE DEGRADATION VIA FILAMENT OR EXPOSURE FINGERPRINTS U...
Publication number
20230389167
Publication date
Nov 30, 2023
Koninklijke Philips N.V.
ANDRÉ GOOSSEN
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Evaluating Performance of X-Ray Tube
Publication number
20230079022
Publication date
Mar 16, 2023
Siemens Healthcare GmbH
Xin Yuan Yang
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR PREDICTING FAILURES IN X-RAY TUBES
Publication number
20190317144
Publication date
Oct 17, 2019
GENERAL ELECTRIC COMPANY
Rui Xu
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR MONITORING THE VACUUM QUALITY OF A VACUUM CIRCUIT BREAKER
Publication number
20170221659
Publication date
Aug 3, 2017
Schneider Electric Industries SAS
Hans SCHELLEKENS
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR INSPECTING MAGNETRON
Publication number
20160109502
Publication date
Apr 21, 2016
TOKYO ELECTRON LIMITED
Kazushi Kaneko
G01 - MEASURING TESTING
Information
Patent Application
Predicting the End of Service Life for a Vacuum Electron Device
Publication number
20150355264
Publication date
Dec 10, 2015
Communications & Power Industries LLC
John B. Overstreet
G01 - MEASURING TESTING
Information
Patent Application
Thermionic Valve Tester
Publication number
20150042345
Publication date
Feb 12, 2015
ORANGE MUSIC ELECTRONIC COMPANY LIMITED
Cliff Cooper
G01 - MEASURING TESTING
Information
Patent Application
ROBUST FAULT DIAGNOSIS FOR ELECTRONIC DEVICES
Publication number
20140131436
Publication date
May 15, 2014
International Business Machines Corporation
Daniel S. Critchley
G01 - MEASURING TESTING
Information
Patent Application
ELECTRIC CURRENT MEASUREMENT APPARATUS, VOLTAGE MEASUREMENT APPARAT...
Publication number
20090237041
Publication date
Sep 24, 2009
SHUJI ABIKO
G01 - MEASURING TESTING
Information
Patent Application
Method for estimating the remaining life span of an X-ray radiator
Publication number
20070189463
Publication date
Aug 16, 2007
Josef Deuringer
G01 - MEASURING TESTING
Information
Patent Application
CRT aging line load voltage socket
Publication number
20030022546
Publication date
Jan 30, 2003
Brian Solomich
G01 - MEASURING TESTING
Information
Patent Application
Device and method for testing and calibrating multi-meters in a cat...
Publication number
20020153903
Publication date
Oct 24, 2002
Sony Corporation and Sony Electronics Inc.
David Allen Murtishaw
G01 - MEASURING TESTING