Testing of vacuum tubes

Industry

CPC
G01R31/25

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/25Testing of vacuum tubes

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for predicting failures in X-ray tubes
- Patent number 10,753,969
- Issue date Aug 25, 2020
- General Electric Company
- Rui Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Robust fault diagnosis for electronic devices
- Patent number 10,295,561
- Issue date May 21, 2019
- International Business Machines Corporation
- Daniel S. Critchley
- G01 - MEASURING TESTING
Information Patent Grant
Device for monitoring the vacuum quality of a vacuum circuit breaker
- Patent number 10,153,112
- Issue date Dec 11, 2018
- Schneider Electric Industries SAS
- Hans Schellekens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for inspecting magnetron
- Patent number 9,977,070
- Issue date May 22, 2018
- Tokyo Electron Limited
- Kazushi Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermionic valve tester
- Patent number 9,810,733
- Issue date Nov 7, 2017
- Orange Music Electronics Company Limited
- Cliff Cooper
- G01 - MEASURING TESTING
Information Patent Grant
Predicting the end of service life for a vacuum electron device
- Patent number 9,625,515
- Issue date Apr 18, 2017
- Communications & Power Industries LLC
- John B. Overstreet
- G01 - MEASURING TESTING
Information Patent Grant
Electrical arc trigger systems, methods, and apparatuses
- Patent number 9,341,610
- Issue date May 17, 2016
- The Boeing Company
- Carl Roy McIver
- G01 - MEASURING TESTING
Information Patent Grant
Electric current measurement apparatus, voltage measurement apparat...
- Patent number 8,027,182
- Issue date Sep 27, 2011
- NEC Microwave Tube, Ltd.
- Shuji Abiko
- G01 - MEASURING TESTING
Information Patent Grant
Sensor-based feedback method for improved assembly of vacuum electr...
- Patent number 7,891,078
- Issue date Feb 22, 2011
- The United States of America as represented by the Secretary of the Navy
- Ayax D. Ramirez
- G01 - MEASURING TESTING
Information Patent Grant
Method for estimating the remaining life span of an X-ray radiator
- Patent number 7,302,041
- Issue date Nov 27, 2007
- Siemens Aktiengesellschaft
- Josef Deuringer
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing addressable emissive cathodes
- Patent number 6,559,818
- Issue date May 6, 2003
- Micron Technology, Inc.
- Jim Browning
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing emissive cathodes in matrix addressable displays
- Patent number 6,441,634
- Issue date Aug 27, 2002
- Micron Technology, Inc.
- Jim Browning
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing emissive cathodes
- Patent number 6,429,835
- Issue date Aug 6, 2002
- Micron Technologies, Inc.
- Jim Browning
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for landing adjustment jig calibration check
- Patent number 6,356,301
- Issue date Mar 12, 2002
- Sony Corporation
- David Christian Steele
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting secondary electron charge in a cathode ray tube
- Patent number 6,104,194
- Issue date Aug 15, 2000
- Sony Corporation
- Hideo Kato
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting arcing in cathode ray tubes
- Patent number 5,789,926
- Issue date Aug 4, 1998
- Sony Corporation
- Mahmoud Badenlou
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing emissive cathodes
- Patent number 5,751,262
- Issue date May 12, 1998
- Micron Display Technology, Inc.
- Jim Browning
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and inspection apparatus for field-emission cold...
- Patent number 5,730,634
- Issue date Mar 24, 1998
- NEC Corporation
- Nobuya Seko
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting arcing in a CRT
- Patent number 5,659,252
- Issue date Aug 19, 1997
- Sony Corporation
- Mahmoud Badenlou
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for calibrating an arc counter
- Patent number 5,625,283
- Issue date Apr 29, 1997
- Sony Corporation
- Mahmoud Badenlou
- G01 - MEASURING TESTING
Information Patent Grant
Method and a system for testing a cathode ray tube or like products
- Patent number 5,442,391
- Issue date Aug 15, 1995
- Eerise Corporation
- Yi-ping Hung
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum tube characterization apparatus
- Patent number 5,144,246
- Issue date Sep 1, 1992
- General Electric Company
- Frank A. Stelloh
- G01 - MEASURING TESTING
Information Patent Grant
Method testing electron discharge tubes
- Patent number 5,012,194
- Issue date Apr 30, 1991
- Raytheon Company
- Philip L. Licter
- G01 - MEASURING TESTING
Information Patent Grant
Picture quality testing method and apparatus for color cathode-ray...
- Patent number 4,963,828
- Issue date Oct 16, 1990
- Hitachi, Ltd.
- Keisuke Kawame
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting magnetron power supply failure
- Patent number 4,868,509
- Issue date Sep 19, 1989
- Fusion Systems Corporation
- Michael G. Ury
- G01 - MEASURING TESTING
Information Patent Grant
Method of convergence measurement for a color picture tube and an a...
- Patent number 4,593,309
- Issue date Jun 3, 1986
- Tokyo Shibaura Denki Kabushiki Kaisha
- Shinichi Uno
- G01 - MEASURING TESTING
Information Patent Grant
Cathode ray tube tracking tester and method of testing
- Patent number 4,563,649
- Issue date Jan 7, 1986
- Sencore, Inc.
- Barry A. Arenson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for counteracting the cathode current increase occurring...
- Patent number 4,471,265
- Issue date Sep 11, 1984
- Telefonaktiebolaget L M Ericsson
- Rolf W. Rasmusson
- G01 - MEASURING TESTING
Information Patent Grant
Television receiver and test set voltage analyzer
- Patent number 4,459,551
- Issue date Jul 10, 1984
- RCA Corporation
- Kenneth J. Yakmovitz
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing line screen CRT registration
- Patent number 4,439,735
- Issue date Mar 27, 1984
- Zenith Radio Corporation
- Armando Alvite
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PREDICTING TUBE DEGRADATION VIA FILAMENT OR EXPOSURE FINGERPRINTS U...
- Publication number 20230389167
- Publication date Nov 30, 2023
- Koninklijke Philips N.V.
- ANDRÉ GOOSSEN
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Evaluating Performance of X-Ray Tube
- Publication number 20230079022
- Publication date Mar 16, 2023
- Siemens Healthcare GmbH
- Xin Yuan Yang
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR PREDICTING FAILURES IN X-RAY TUBES
- Publication number 20190317144
- Publication date Oct 17, 2019
- GENERAL ELECTRIC COMPANY
- Rui Xu
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MONITORING THE VACUUM QUALITY OF A VACUUM CIRCUIT BREAKER
- Publication number 20170221659
- Publication date Aug 3, 2017
- Schneider Electric Industries SAS
- Hans SCHELLEKENS
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING MAGNETRON
- Publication number 20160109502
- Publication date Apr 21, 2016
- TOKYO ELECTRON LIMITED
- Kazushi Kaneko
- G01 - MEASURING TESTING
Information Patent Application
Predicting the End of Service Life for a Vacuum Electron Device
- Publication number 20150355264
- Publication date Dec 10, 2015
- Communications & Power Industries LLC
- John B. Overstreet
- G01 - MEASURING TESTING
Information Patent Application
Thermionic Valve Tester
- Publication number 20150042345
- Publication date Feb 12, 2015
- ORANGE MUSIC ELECTRONIC COMPANY LIMITED
- Cliff Cooper
- G01 - MEASURING TESTING
Information Patent Application
ROBUST FAULT DIAGNOSIS FOR ELECTRONIC DEVICES
- Publication number 20140131436
- Publication date May 15, 2014
- International Business Machines Corporation
- Daniel S. Critchley
- G01 - MEASURING TESTING
Information Patent Application
ELECTRIC CURRENT MEASUREMENT APPARATUS, VOLTAGE MEASUREMENT APPARAT...
- Publication number 20090237041
- Publication date Sep 24, 2009
- SHUJI ABIKO
- G01 - MEASURING TESTING
Information Patent Application
Method for estimating the remaining life span of an X-ray radiator
- Publication number 20070189463
- Publication date Aug 16, 2007
- Josef Deuringer
- G01 - MEASURING TESTING
Information Patent Application
CRT aging line load voltage socket
- Publication number 20030022546
- Publication date Jan 30, 2003
- Brian Solomich
- G01 - MEASURING TESTING
Information Patent Application
Device and method for testing and calibrating multi-meters in a cat...
- Publication number 20020153903
- Publication date Oct 24, 2002
- Sony Corporation and Sony Electronics Inc.
- David Allen Murtishaw
- G01 - MEASURING TESTING

Testing of vacuum tubes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods and systems for predicting failures in X-ray tubes

Robust fault diagnosis for electronic devices

Device for monitoring the vacuum quality of a vacuum circuit breaker

Method for inspecting magnetron

Thermionic valve tester

Predicting the end of service life for a vacuum electron device

Electrical arc trigger systems, methods, and apparatuses

Electric current measurement apparatus, voltage measurement apparat...

Sensor-based feedback method for improved assembly of vacuum electr...

Method for estimating the remaining life span of an X-ray radiator

Method of testing addressable emissive cathodes

Apparatus for testing emissive cathodes in matrix addressable displays

Method and apparatus for testing emissive cathodes

Method and apparatus for landing adjustment jig calibration check

Method of detecting secondary electron charge in a cathode ray tube

Method of detecting arcing in cathode ray tubes

Method and apparatus for testing emissive cathodes

Inspection method and inspection apparatus for field-emission cold...

Apparatus and method for detecting arcing in a CRT

Method and apparatus for calibrating an arc counter

Method and a system for testing a cathode ray tube or like products

Vacuum tube characterization apparatus

Method testing electron discharge tubes

Picture quality testing method and apparatus for color cathode-ray...

Method and apparatus for detecting magnetron power supply failure

Method of convergence measurement for a color picture tube and an a...

Cathode ray tube tracking tester and method of testing

Apparatus for counteracting the cathode current increase occurring...

Television receiver and test set voltage analyzer

Method and apparatus for testing line screen CRT registration

Patents Applicationslast 30 patents

PREDICTING TUBE DEGRADATION VIA FILAMENT OR EXPOSURE FINGERPRINTS U...

Evaluating Performance of X-Ray Tube

METHODS AND SYSTEMS FOR PREDICTING FAILURES IN X-RAY TUBES

DEVICE FOR MONITORING THE VACUUM QUALITY OF A VACUUM CIRCUIT BREAKER

METHOD FOR INSPECTING MAGNETRON

Predicting the End of Service Life for a Vacuum Electron Device

Thermionic Valve Tester

ROBUST FAULT DIAGNOSIS FOR ELECTRONIC DEVICES

ELECTRIC CURRENT MEASUREMENT APPARATUS, VOLTAGE MEASUREMENT APPARAT...

Method for estimating the remaining life span of an X-ray radiator

CRT aging line load voltage socket

Device and method for testing and calibrating multi-meters in a cat...