Testing passive components

Industry

CPC
G01R31/013

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/013Testing passive components

Industries

Patents Grantslast 30 patents

Information Patent Grant
Fully differential current sensing
- Patent number 10,996,256
- Issue date May 4, 2021
- Texas Instruments Incorporated
- Sudeep Banerji
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Calibration system and calibrating method
- Patent number 10,957,471
- Issue date Mar 23, 2021
- Tyco Electronics (Shanghai) Co. Ltd.
- Fengchun Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fully differential current sensing
- Patent number 10,746,778
- Issue date Aug 18, 2020
- Texas Instruments Incorporated
- Sudeep Banerji
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for checking inductor
- Patent number 10,718,824
- Issue date Jul 21, 2020
- Samsung Electro-Mechanics Co., Ltd.
- Gun Woo Koo
- G01 - MEASURING TESTING
Information Patent Grant
Fully differential current sensing
- Patent number 10,345,353
- Issue date Jul 9, 2019
- Texas Instruments Incorporated
- Sudeep Banerji
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Jumpers and methods of making and using same
- Patent number 9,652,966
- Issue date May 16, 2017
- Thyssenkrupp Elevator AG
- Mike Palazzola
- G08 - SIGNALLING
Information Patent Grant
Chip component carrying method and system, and visual inspection me...
- Patent number 8,499,924
- Issue date Aug 6, 2013
- TDK Corporation
- Masayoshi Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring slider resistance of different types of row bar...
- Patent number 8,471,579
- Issue date Jun 25, 2013
- Sae Magnetics (H.K.) Ltd.
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Chip component carrying method and system, and visual inspection me...
- Patent number 7,987,968
- Issue date Aug 2, 2011
- TDK Corporation
- Masayoshi Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Method for contact-free testing of antennas applied to a material web
- Patent number 7,701,223
- Issue date Apr 20, 2010
- Nordenia Deutschland Gronau GmbH
- Michael Kohla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wire disconnection inspecting device and method
- Patent number 7,537,378
- Issue date May 26, 2009
- Honda Motor Co., Ltd.
- Keita Sekine
- G01 - MEASURING TESTING
Information Patent Grant
Compositions and methods for helper-free production of recombinant...
- Patent number 7,022,519
- Issue date Apr 4, 2006
- The Trustees of the University of Pennsylvania
- Guangping Gao
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Component testing system vacuum ring and test plate construction
- Patent number 6,906,508
- Issue date Jun 14, 2005
- Ceramic Component Technologies, Inc.
- Christian R. Saulnier
- G01 - MEASURING TESTING
Information Patent Grant
Inspection terminal for inspecting electronic chip component, and i...
- Patent number 6,812,692
- Issue date Nov 2, 2004
- Murata Manufacturing Co., Ltd.
- Satoki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Instrument for measuring and sorting resistors and method therefor
- Patent number 6,750,416
- Issue date Jun 15, 2004
- M&R Automatisierung von Industrieanlagen
- Anton Maierhofer
- G01 - MEASURING TESTING
Information Patent Grant
Electrode and fixture for measuring electronic components
- Patent number 6,717,424
- Issue date Apr 6, 2004
- Agilent Technologies, Inc.
- Masaji Furuta
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic components
- Patent number 6,593,762
- Issue date Jul 15, 2003
- Agilent Technologies, Inc.
- Masaji Furuta
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive testing of passive components
- Patent number 6,528,985
- Issue date Mar 4, 2003
- Koninklijke Philips Electronics N.V.
- Georg Greuel
- G01 - MEASURING TESTING
Information Patent Grant
Compositions and methods for helper-free production of recombinant...
- Patent number 6,485,966
- Issue date Nov 26, 2002
- The Trustees of the University of Pennsylvania
- Guangping Gao
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Method and arrangement for dielectric integrity testing using PLL l...
- Patent number 6,420,880
- Issue date Jul 16, 2002
- Koninklijke Philips Electronics N.V.
- Edward E. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Compositions and methods for helper-free production of recombinant...
- Patent number 6,258,595
- Issue date Jul 10, 2001
- The Trustees of the University of Pennsylvania
- Guang-Ping Gao
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Method of screening varistors
- Patent number 6,246,242
- Issue date Jun 12, 2001
- Murata Manufacturing Co., Ltd.
- Seiji Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Four electrical contact testing machine for miniature inductors and...
- Patent number 6,194,679
- Issue date Feb 27, 2001
- Douglas J. Garcia
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Method and apparatus for loading electronic components
- Patent number 5,984,079
- Issue date Nov 16, 1999
- Electro Scientific Industries, Inc.
- Douglas J. Garcia
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for local temperature sensing for use in perfo...
- Patent number 5,915,838
- Issue date Jun 29, 1999
- IMEC vzw
- Lambert Stals
- G01 - MEASURING TESTING
Information Patent Grant
Method for local temperature sensing for use in performing high res...
- Patent number 5,833,365
- Issue date Nov 10, 1998
- Interuniversitair Micro-Electronika Centrum vzw
- Lambert Stals
- G01 - MEASURING TESTING
Information Patent Grant
Probe and apparatus for testing electronic components
- Patent number 5,739,696
- Issue date Apr 14, 1998
- Jakob Herrmann
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus for a passive element value using a current vector
- Patent number 5,519,325
- Issue date May 21, 1996
- Samsung Electronics Co., Ltd.
- Sang-Gon Park
- G01 - MEASURING TESTING
Information Patent Grant
Electronic test instrument for component test
- Patent number 5,508,607
- Issue date Apr 16, 1996
- Fluke Corporation
- Greg S. Gibson
- G01 - MEASURING TESTING
Information Patent Grant
Automatic transformer testing apparatus
- Patent number 5,264,799
- Issue date Nov 23, 1993
- San Horng Electric Factory Co., Ltd.
- Yincheng Huang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HEALTH MONITORING OF INPUT FILTER FOR DEGRADATION DETECTION
- Publication number 20240353826
- Publication date Oct 24, 2024
- HAMILTON SUNDSTRAND CORPORATION
- Ali Khalid AL-KARAGHOULI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONFECTIONING RESISTORS, RESISTOR, AND HEATING DEVICE
- Publication number 20230162895
- Publication date May 25, 2023
- BorgWarner Inc.
- Julio Abraham Carrera Garcia
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
FULLY DIFFERENTIAL CURRENT SENSING
- Publication number 20200333390
- Publication date Oct 22, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Sudeep BANERJI
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
FULLY DIFFERENTIAL CURRENT SENSING
- Publication number 20190277897
- Publication date Sep 12, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Sudeep BANERJI
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
APPARATUS AND METHOD FOR CHECKING INDUCTOR
- Publication number 20190195935
- Publication date Jun 27, 2019
- Samsung Electro-Mechanics Co., Ltd.
- Gun Woo KOO
- G01 - MEASURING TESTING
Information Patent Application
FULLY DIFFERENTIAL CURRENT SENSING
- Publication number 20190146020
- Publication date May 16, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Sudeep BANERJI
- G01 - MEASURING TESTING
Information Patent Application
CHIP COMPONENT CARRYING METHOD AND SYSTEM, AND VISUAL INSPECTION ME...
- Publication number 20110261185
- Publication date Oct 27, 2011
- TDK Corporation
- Masayoshi Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring slider resistance of different types of row bar...
- Publication number 20110241707
- Publication date Oct 6, 2011
- SAE MAGNETICS (H. K) LTD.
- Jian LIU
- G01 - MEASURING TESTING
Information Patent Application
Wire Disconnection Inspecting Device And Method
- Publication number 20080143338
- Publication date Jun 19, 2008
- HONDA MOTOR CO., LTD.
- Keita Sekine
- G01 - MEASURING TESTING
Information Patent Application
Method for contact-free testing of antennas applied to a material web
- Publication number 20080048670
- Publication date Feb 28, 2008
- Michael Kohla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Chip Component Carrying Method and System, and Visual Inspection Me...
- Publication number 20070205084
- Publication date Sep 6, 2007
- TDK Corporation
- Masayoshi Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
Compositions and methods for helper-free production of recombinant...
- Publication number 20070004042
- Publication date Jan 4, 2007
- The Trustees of the University of Pennsylvania
- Guangping Gao
- G01 - MEASURING TESTING
Information Patent Application
Mass-production LED test device for mass production
- Publication number 20060226848
- Publication date Oct 12, 2006
- Youngtek Electronics Corporation
- Tsan-Hsiung Lai
- G01 - MEASURING TESTING
Information Patent Application
COMPONENT TESTING SYSTEM VACUUM RING AND TEST PLATE CONSTRUCTION
- Publication number 20050127896
- Publication date Jun 16, 2005
- Ceramic Component Technologies, Inc.
- Christian R. Saulnier
- G01 - MEASURING TESTING
Information Patent Application
Electrode and fixture for measuring electronic components
- Publication number 20030184331
- Publication date Oct 2, 2003
- AGILENT TECHNOLOGIES
- Masaji Furuta
- G01 - MEASURING TESTING
Information Patent Application
Compositions and methods for helper-free production of recombinant...
- Publication number 20030119191
- Publication date Jun 26, 2003
- The Trustees of the University of Pennsylvania
- Guangping Gao
- G01 - MEASURING TESTING
Information Patent Application
Inspection terminal for inspecting electronic chip component, and i...
- Publication number 20030042924
- Publication date Mar 6, 2003
- Murata Manufacturing Co., Ltd.
- Satoki Sakai
- G01 - MEASURING TESTING
Information Patent Application
Compositions and methods for helper-free production of recombinant...
- Publication number 20020019050
- Publication date Feb 14, 2002
- Guangping Gao
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...

Testing passive components

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Fully differential current sensing

Calibration system and calibrating method

Fully differential current sensing

Apparatus and method for checking inductor

Fully differential current sensing

Jumpers and methods of making and using same

Chip component carrying method and system, and visual inspection me...

Method of measuring slider resistance of different types of row bar...

Chip component carrying method and system, and visual inspection me...

Method for contact-free testing of antennas applied to a material web

Wire disconnection inspecting device and method

Compositions and methods for helper-free production of recombinant...

Component testing system vacuum ring and test plate construction

Inspection terminal for inspecting electronic chip component, and i...

Instrument for measuring and sorting resistors and method therefor

Electrode and fixture for measuring electronic components

Apparatus for testing electronic components

Non-destructive testing of passive components

Compositions and methods for helper-free production of recombinant...

Method and arrangement for dielectric integrity testing using PLL l...

Compositions and methods for helper-free production of recombinant...

Method of screening varistors

Four electrical contact testing machine for miniature inductors and...

Method and apparatus for loading electronic components

Method and apparatus for local temperature sensing for use in perfo...

Method for local temperature sensing for use in performing high res...

Probe and apparatus for testing electronic components

Measuring apparatus for a passive element value using a current vector

Electronic test instrument for component test

Automatic transformer testing apparatus

Patents Applicationslast 30 patents

HEALTH MONITORING OF INPUT FILTER FOR DEGRADATION DETECTION

METHOD FOR CONFECTIONING RESISTORS, RESISTOR, AND HEATING DEVICE

FULLY DIFFERENTIAL CURRENT SENSING

FULLY DIFFERENTIAL CURRENT SENSING

APPARATUS AND METHOD FOR CHECKING INDUCTOR

FULLY DIFFERENTIAL CURRENT SENSING

CHIP COMPONENT CARRYING METHOD AND SYSTEM, AND VISUAL INSPECTION ME...

Method of measuring slider resistance of different types of row bar...

Wire Disconnection Inspecting Device And Method

Method for contact-free testing of antennas applied to a material web

Chip Component Carrying Method and System, and Visual Inspection Me...

Compositions and methods for helper-free production of recombinant...

Mass-production LED test device for mass production

COMPONENT TESTING SYSTEM VACUUM RING AND TEST PLATE CONSTRUCTION

Electrode and fixture for measuring electronic components

Compositions and methods for helper-free production of recombinant...

Inspection terminal for inspecting electronic chip component, and i...

Compositions and methods for helper-free production of recombinant...