Testing timing characteristics

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CPC
G01R31/2882

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/2882Testing timing characteristics

Industries

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Patents Grantslast 30 patents

Information Patent Grant
On-die aging measurements for dynamic timing modeling
- Patent number 12,216,150
- Issue date Feb 4, 2025
- Altera Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for testing inaccessible interface circuits i...
- Patent number 12,196,805
- Issue date Jan 14, 2025
- RAMBUS INC.
- Frederick A. Ware
- G01 - MEASURING TESTING
Information Patent Grant
System for scan mode exit and methods for scan mode exit
- Patent number 12,196,804
- Issue date Jan 14, 2025
- NXP B.V.
- Tarun Kumar Goyal
- G01 - MEASURING TESTING
Information Patent Grant
System and method to fix min-delay violation post fabrication
- Patent number 12,153,086
- Issue date Nov 26, 2024
- Microchip Technology Incorporated
- David Roberts
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for predicting fluctuation of circuit path delay on basis of...
- Patent number 12,112,243
- Issue date Oct 8, 2024
- Southeast University
- Peng Cao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for RF built-in test system for a beamforming...
- Patent number 12,111,350
- Issue date Oct 8, 2024
- Andrew John Bonthron
- G01 - MEASURING TESTING
Information Patent Grant
Addressable test chip test system
- Patent number 11,959,964
- Issue date Apr 16, 2024
- SEMITRONIX CORPORATION
- Jiabai Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Diagnosing multicycle transition faults and/or defects with AT-spee...
- Patent number 11,892,501
- Issue date Feb 6, 2024
- Cadence Design Systems, Inc.
- Arvind Chokhani
- G01 - MEASURING TESTING
Information Patent Grant
Fixture
- Patent number 11,885,831
- Issue date Jan 30, 2024
- Beijing BOE Chatani Electro Co., Ltd.
- Yingqiu Yang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for testing clocking systems in integrated circuits
- Patent number 11,879,939
- Issue date Jan 23, 2024
- NXP B.V.
- Nikila Krishnamoorthy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Die-to-die connectivity monitoring using a clocked receiver
- Patent number 11,815,551
- Issue date Nov 14, 2023
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit, method of testing the semiconduct...
- Patent number 11,774,493
- Issue date Oct 3, 2023
- Canon Kabushiki Kaisha
- Koichi Iwao
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining jitter, storage medium and ele...
- Patent number 11,733,293
- Issue date Aug 22, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Tianchen Lu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection device
- Patent number 11,719,746
- Issue date Aug 8, 2023
- HITACHI HIGH-TECH CORPORATION
- Masaaki Komori
- G01 - MEASURING TESTING
Information Patent Grant
Addressable test chip
- Patent number 11,668,748
- Issue date Jun 6, 2023
- SEMITRONIX CORPORATION
- Fan Lan
- G01 - MEASURING TESTING
Information Patent Grant
Slew-load characterization
- Patent number 11,624,777
- Issue date Apr 11, 2023
- ARM Limited
- Sriram Thyagarajan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Through-silicon via detecting circuit, detecting methods and integr...
- Patent number 11,614,481
- Issue date Mar 28, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- You-Hsien Lin
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for testing time parameters of adaptor
- Patent number 11,614,484
- Issue date Mar 28, 2023
- Guangdong Oppo Mobile Telecommunications Corp., Ltd.
- Chen Tian
- G01 - MEASURING TESTING
Information Patent Grant
On-die aging measurements for dynamic timing modeling
- Patent number 11,609,262
- Issue date Mar 21, 2023
- Intel Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Grant
Current generator circuit and diagnostic circuit
- Patent number 11,604,483
- Issue date Mar 14, 2023
- Hitachi Astemo, Ltd.
- Keishi Komoriyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process corner detection circuit and process corner detection method
- Patent number 11,573,263
- Issue date Feb 7, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shengcheng Deng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Memory controller with integrated test circuitry
- Patent number 11,567,120
- Issue date Jan 31, 2023
- RAMBUS INC.
- Frederick A. Ware
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for detecting faults in an analog input/output...
- Patent number 11,561,255
- Issue date Jan 24, 2023
- NXP USA, INC.
- Kumar Abhishek
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and system for predictive maintenance of integrated circuits
- Patent number 11,525,858
- Issue date Dec 13, 2022
- Siemens Aktiengesellschaft
- Friedrich Eppensteiner
- G01 - MEASURING TESTING
Information Patent Grant
Timing-aware testing
- Patent number 11,328,112
- Issue date May 10, 2022
- NVIDIA Corporation
- Shang-Ju Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory controller with integrated test circuitry
- Patent number 11,307,243
- Issue date Apr 19, 2022
- RAMBUS INC.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Grant
Addressable test system with address register
- Patent number 11,243,251
- Issue date Feb 8, 2022
- SEMITRONIX CORPORATION
- Fan Lan
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus
- Patent number 11,169,205
- Issue date Nov 9, 2021
- Advantest Corporation
- Naoya Toyota
- G01 - MEASURING TESTING
Information Patent Grant
Logic and flip-flop circuit timing margins controlled based on scan...
- Patent number 11,146,252
- Issue date Oct 12, 2021
- NXP B.V.
- Jan-Peter Schat
- G01 - MEASURING TESTING
Information Patent Grant
Degradation monitoring of semiconductor chips
- Patent number 11,131,706
- Issue date Sep 28, 2021
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR TESTING CIRCUIT
- Publication number 20250004041
- Publication date Jan 2, 2025
- STMicroelectronics International N.V.
- Marco Casarsa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MONITORING CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, AND VE...
- Publication number 20240418772
- Publication date Dec 19, 2024
- ROHM CO., LTD.
- Takashi FUJIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRIC POWER MEASUREMENT CIRCUIT
- Publication number 20240255568
- Publication date Aug 1, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Kazuhito TANAKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING CHIP CHARACTERISTICS, TEST DEVICE AND NON-TRANS...
- Publication number 20240159822
- Publication date May 16, 2024
- Global Unichip Corporation
- Ting-Hao WANG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR SCAN MODE EXIT AND METHODS FOR SCAN MODE EXIT
- Publication number 20240094284
- Publication date Mar 21, 2024
- NXP B.V.
- Tarun Kumar Goyal
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS AND DEGRADATION ESTIMATION METHOD
- Publication number 20230400507
- Publication date Dec 14, 2023
- Fujitsu Limited
- Keigo TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING USING A CLOCKED RECEIVER
- Publication number 20230393196
- Publication date Dec 7, 2023
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
ADDRESSABLE TEST CHIP TEST SYSTEM
- Publication number 20230324458
- Publication date Oct 12, 2023
- Semitronix Corporation
- Jiabai CHENG
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR TESTING INACCESSIBLE INTERFACE CIRCUITS I...
- Publication number 20230266385
- Publication date Aug 24, 2023
- Rambus Inc.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Application
System and Method to Fix Min-Delay Violation Post Fabrication
- Publication number 20230251307
- Publication date Aug 10, 2023
- MICROCHIP TECHNOLOGY INCORPORATED
- David Roberts
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEM AND METHOD FOR TESTING CLOCKING SYSTEMS IN INTEGRATED CIRCUITS
- Publication number 20230251310
- Publication date Aug 10, 2023
- NXP B.V.
- Nikila Krishnamoorthy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHIP TESTING METHOD AND APPARATUS
- Publication number 20230176113
- Publication date Jun 8, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Liang CHEN
- G01 - MEASURING TESTING
Information Patent Application
On-Die Aging Measurements for Dynamic Timing Modeling
- Publication number 20230129176
- Publication date Apr 27, 2023
- Intel Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR RF BUILT-IN TEST SYSTEM
- Publication number 20220365133
- Publication date Nov 17, 2022
- Metawave Corporation
- Andrew John BONTHRON
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING FAULTS IN AN ANALOG INPUT/OUTPUT...
- Publication number 20220334176
- Publication date Oct 20, 2022
- Kumar Abhishek
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT, METHOD OF TESTING THE SEMICONDUCT...
- Publication number 20220317180
- Publication date Oct 6, 2022
- Canon Kabushiki Kaisha
- Koichi Iwao
- G01 - MEASURING TESTING
Information Patent Application
MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY
- Publication number 20220283219
- Publication date Sep 8, 2022
- Rambus Inc.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Application
PROCESS CORNER DETECTION CIRCUIT AND PROCESS CORNER DETECTION METHOD
- Publication number 20220276300
- Publication date Sep 1, 2022
- Shengcheng DENG
- G01 - MEASURING TESTING
Information Patent Application
ADDRESSABLE TEST CHIP
- Publication number 20220146573
- Publication date May 12, 2022
- Semitronix Corporation
- Fan LAN
- G01 - MEASURING TESTING
Information Patent Application
FIXTURE
- Publication number 20220137096
- Publication date May 5, 2022
- BEIJING BOE CHATANI ELECTRONICS CO., LTD.
- Yingqiu YANG
- G01 - MEASURING TESTING
Information Patent Application
Slew-Load Characterization
- Publication number 20210333320
- Publication date Oct 28, 2021
- ARM Limited
- Sriram Thyagarajan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING JITTER, STORAGE MEDIUM AND ELE...
- Publication number 20210293878
- Publication date Sep 23, 2021
- Changxin Memory Technologies, Inc.
- Tianchen LU
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Inspection Device
- Publication number 20210270891
- Publication date Sep 2, 2021
- Hitachi High-Tech Corporation
- Masaaki KOMORI
- G01 - MEASURING TESTING
Information Patent Application
THROUGH-SILICON VIA DETECTING CIRCUIT, DETECTING METHODS AND INTEGR...
- Publication number 20210239751
- Publication date Aug 5, 2021
- Changxin Memory Technologies, Inc.
- You-Hsien LIN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR PREDICTING OPERATION PARAMETER OF INTEGRATED...
- Publication number 20210096171
- Publication date Apr 1, 2021
- Shanghai Zhaoxin Semiconductor Co., Ltd.
- YI LI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PREDICTING FLUCTUATION OF CIRCUIT PATH DELAY ON BASIS OF...
- Publication number 20210056468
- Publication date Feb 25, 2021
- SOUTHEAST UNIVERSITY
- Peng CAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY
- Publication number 20210033665
- Publication date Feb 4, 2021
- Rambus Inc.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Application
TEST APPARATUS
- Publication number 20200379036
- Publication date Dec 3, 2020
- Advantest Corporation
- Naoya TOYOTA
- G01 - MEASURING TESTING
Information Patent Application
ADDRESSABLE TEST SYSTEM WITH ADDRESS REGISTER
- Publication number 20200355742
- Publication date Nov 12, 2020
- Semitronix Corporation
- Fan LAN
- G01 - MEASURING TESTING
Information Patent Application
LOW POWER MODE TESTING IN AN INTEGRATED CIRCUIT
- Publication number 20200284830
- Publication date Sep 10, 2020
- NXP USA, Inc.
- Kumar ABHISHEK
- G01 - MEASURING TESTING

Testing timing characteristics

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

On-die aging measurements for dynamic timing modeling

Methods and apparatus for testing inaccessible interface circuits i...

System for scan mode exit and methods for scan mode exit

System and method to fix min-delay violation post fabrication

Method for predicting fluctuation of circuit path delay on basis of...

Method and apparatus for RF built-in test system for a beamforming...

Addressable test chip test system

Diagnosing multicycle transition faults and/or defects with AT-spee...

Fixture

System and method for testing clocking systems in integrated circuits

Die-to-die connectivity monitoring using a clocked receiver

Semiconductor integrated circuit, method of testing the semiconduct...

Method and apparatus for determining jitter, storage medium and ele...

Semiconductor inspection device

Addressable test chip

Slew-load characterization

Through-silicon via detecting circuit, detecting methods and integr...

Method and system for testing time parameters of adaptor

On-die aging measurements for dynamic timing modeling

Current generator circuit and diagnostic circuit

Process corner detection circuit and process corner detection method

Memory controller with integrated test circuitry

Systems and methods for detecting faults in an analog input/output...

Method and system for predictive maintenance of integrated circuits

Timing-aware testing

Memory controller with integrated test circuitry

Addressable test system with address register

Test apparatus

Logic and flip-flop circuit timing margins controlled based on scan...

Degradation monitoring of semiconductor chips

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR TESTING CIRCUIT

MONITORING CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, AND VE...

ELECTRIC POWER MEASUREMENT CIRCUIT

METHOD OF MEASURING CHIP CHARACTERISTICS, TEST DEVICE AND NON-TRANS...

SYSTEM FOR SCAN MODE EXIT AND METHODS FOR SCAN MODE EXIT

INFORMATION PROCESSING APPARATUS AND DEGRADATION ESTIMATION METHOD

DIE-TO-DIE CONNECTIVITY MONITORING USING A CLOCKED RECEIVER

ADDRESSABLE TEST CHIP TEST SYSTEM

METHODS AND APPARATUS FOR TESTING INACCESSIBLE INTERFACE CIRCUITS I...

System and Method to Fix Min-Delay Violation Post Fabrication

SYSTEM AND METHOD FOR TESTING CLOCKING SYSTEMS IN INTEGRATED CIRCUITS

CHIP TESTING METHOD AND APPARATUS

On-Die Aging Measurements for Dynamic Timing Modeling

METHOD AND APPARATUS FOR RF BUILT-IN TEST SYSTEM

SYSTEMS AND METHODS FOR DETECTING FAULTS IN AN ANALOG INPUT/OUTPUT...

SEMICONDUCTOR INTEGRATED CIRCUIT, METHOD OF TESTING THE SEMICONDUCT...

MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY

PROCESS CORNER DETECTION CIRCUIT AND PROCESS CORNER DETECTION METHOD

ADDRESSABLE TEST CHIP

FIXTURE

Slew-Load Characterization

METHOD AND APPARATUS FOR DETERMINING JITTER, STORAGE MEDIUM AND ELE...

Semiconductor Inspection Device

THROUGH-SILICON VIA DETECTING CIRCUIT, DETECTING METHODS AND INTEGR...

METHOD AND DEVICE FOR PREDICTING OPERATION PARAMETER OF INTEGRATED...

METHOD FOR PREDICTING FLUCTUATION OF CIRCUIT PATH DELAY ON BASIS OF...

MEMORY CONTROLLER WITH INTEGRATED TEST CIRCUITRY

TEST APPARATUS

ADDRESSABLE TEST SYSTEM WITH ADDRESS REGISTER

LOW POWER MODE TESTING IN AN INTEGRATED CIRCUIT