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G01N2223/606

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/606texture

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
- Patent number 11,933,747
- Issue date Mar 19, 2024
- University of Maryland, College Park
- Peter Zavalij
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Controlling process parameters by means of radiographic online dete...
- Patent number 11,898,971
- Issue date Feb 13, 2024
- SMS group GMBH
- Christian Klinkenberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for determining the microstructure of a metal pro...
- Patent number 11,249,037
- Issue date Feb 15, 2022
- SMS group GMBH
- Mostafa Biglari
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Grant
X-ray diffraction and X-ray spectroscopy method and related apparatus
- Patent number 11,105,756
- Issue date Aug 31, 2021
- NINGBO GALAXY MATERIALS TECHNOLOGY CO. LTD.
- Xiao-dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Macrotexture map visualizing texture heterogeneity in polycrystalli...
- Patent number 11,047,812
- Issue date Jun 29, 2021
- Advanced Manufacturing LLC
- Dongsheng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for calculating a recording trajectory
- Patent number 11,016,041
- Issue date May 25, 2021
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Richard Schielein
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for materials analysis
- Patent number 10,458,929
- Issue date Oct 29, 2019
- United Technologies Corporation
- Iuliana Cernatescu
- G01 - MEASURING TESTING
Information Patent Grant
Macrotexture map visualizing texture heterogeneity in polycrystalli...
- Patent number 10,371,650
- Issue date Aug 6, 2019
- Advanced Manufacturing LLC
- Dongsheng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterization of trace crystallinity by second harmonic generati...
- Patent number 10,309,902
- Issue date Jun 4, 2019
- Purdue Research Foundation
- Garth Jason Simpson
- G01 - MEASURING TESTING
Information Patent Grant
X-ray multigrain crystallography
- Patent number 10,288,570
- Issue date May 14, 2019
- Xnovo Technology ApS
- Christian Wejdemann
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for materials analysis
- Patent number 10,161,887
- Issue date Dec 25, 2018
- United Technologies Corporation
- Iuliana Cernatescu
- G01 - MEASURING TESTING
Information Patent Grant
Crystalline phase identification method, crystalline phase identifi...
- Patent number 10,161,888
- Issue date Dec 25, 2018
- Rigaku Corporation
- Yukiko Ikeda
- G01 - MEASURING TESTING
Information Patent Grant
X-ray multigrain crystallography
- Patent number 10,139,357
- Issue date Nov 27, 2018
- Xnovo Technology ApS
- Christian Wejdemann
- G01 - MEASURING TESTING
Information Patent Grant
Method for mapping crystal orientations in a sample made of a polyc...
- Patent number 10,062,145
- Issue date Aug 28, 2018
- Institut National des Sciences Appliquees de Lyon
- Cyril Langlois
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Laboratory X-ray micro-tomography system with crystallographic grai...
- Patent number 9,383,324
- Issue date Jul 5, 2016
- Carl Zeiss X-ray Microscopy, Inc.
- Michael Feser
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating degree of crystalline orientation of polycrys...
- Patent number 9,274,069
- Issue date Mar 1, 2016
- Shin-Etsu Chemical Co., Ltd.
- Shuichi Miyao
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
- Patent number 9,222,900
- Issue date Dec 29, 2015
- Danmarks Tekniske Universitet of Anker Engelundsvej
- Erik Mejdal Lauridsen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
- Patent number 9,222,901
- Issue date Dec 29, 2015
- Danmarks Tekniske Universitet Anker Engelundsvej
- Erik Mejdal Lauridsen
- G01 - MEASURING TESTING
Information Patent Grant
Laboratory x-ray micro-tomography system with crystallographic grai...
- Patent number 9,110,004
- Issue date Aug 18, 2015
- Carl Zeiss X-ray Microscopy, Inc.
- Michael Feser
- G01 - MEASURING TESTING
Information Patent Grant
Methods for determining a recovery state of a metal alloy
- Patent number 9,002,499
- Issue date Apr 7, 2015
- GM Global Technology Operations LLC
- Rajesh Raghavan
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for evaluation of a superabrasive material
- Patent number 8,995,742
- Issue date Mar 31, 2015
- U.S. Synthetic Corporation
- Craig H. Cooley
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus
- Patent number 4,726,047
- Issue date Feb 16, 1988
- U.S. Philips Corporation
- Geert Brouwer
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for material analysis
- Patent number 4,476,386
- Issue date Oct 9, 1984
- Commonwealth Scientific and Industrial Research Organization
- Alan F. Reid
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Laboratory crystallographic x-ray diffraction analysis system
- Publication number 20240219328
- Publication date Jul 4, 2024
- Carl Zeiss X-ray Microscopy, Inc.
- Christian HOLZNER
- G01 - MEASURING TESTING
Information Patent Application
Macrotexture Map Visualizing Texture Heterogeneity in Polycrystalli...
- Publication number 20190353602
- Publication date Nov 21, 2019
- Advanced Manufacturing LLC
- Dongsheng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR MATERIALS ANALYSIS
- Publication number 20190086343
- Publication date Mar 21, 2019
- United Technologies Corporation
- luliana Cernatescu
- G01 - MEASURING TESTING
Information Patent Application
X-RAY MULTIGRAIN CRYSTALLOGRAPHY
- Publication number 20190079032
- Publication date Mar 14, 2019
- Xnovo Technology ApS
- Christian Wejdemann
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...
- Publication number 20140307854
- Publication date Oct 16, 2014
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Erik Mejdal LAURIDSEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...
- Publication number 20140254763
- Publication date Sep 11, 2014
- DANMARKS TEKNISKE UNIVERSITET
- Erik Mejdal LAURIDSEN
- G01 - MEASURING TESTING
Information Patent Application
LABORATORY X-RAY MICRO-TOMOGRAPHY SYSTEM WITH CRYSTALLOGRAPHIC GRAI...
- Publication number 20140112433
- Publication date Apr 24, 2014
- Michael Feser
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR DETERMINING A RECOVERY STATE OF A METAL ALLOY
- Publication number 20130253691
- Publication date Sep 26, 2013
- GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Rajesh Raghavan
- G01 - MEASURING TESTING
Information Patent Application
Method for Measuring the Orientation and the Elastic Strain of Grai...
- Publication number 20120089349
- Publication date Apr 12, 2012
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Pierre BLEUET
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device and method for measuring short-wavelength characteristic X-r...

X-ray beam shaping apparatus and method

System and method for in-situ X-ray diffraction-based real-time mon...

Controlling process parameters by means of radiographic online dete...

Device and method for determining the microstructure of a metal pro...

X-ray diffraction and X-ray spectroscopy method and related apparatus

Macrotexture map visualizing texture heterogeneity in polycrystalli...

Apparatus and method for calculating a recording trajectory

Systems and methods for materials analysis

Macrotexture map visualizing texture heterogeneity in polycrystalli...

Characterization of trace crystallinity by second harmonic generati...

X-ray multigrain crystallography

Systems and methods for materials analysis

Crystalline phase identification method, crystalline phase identifi...

X-ray multigrain crystallography

Method for mapping crystal orientations in a sample made of a polyc...

Laboratory X-ray micro-tomography system with crystallographic grai...

Method for evaluating degree of crystalline orientation of polycrys...

X-ray diffraction method of mapping grain structures in a crystalli...

X-ray diffraction method of mapping grain structures in a crystalli...

Laboratory x-ray micro-tomography system with crystallographic grai...

Methods for determining a recovery state of a metal alloy

Systems and methods for evaluation of a superabrasive material

X-ray analysis apparatus

Method and apparatus for material analysis

Patents Applicationslast 30 patents

Laboratory crystallographic x-ray diffraction analysis system

Macrotexture Map Visualizing Texture Heterogeneity in Polycrystalli...

SYSTEMS AND METHODS FOR MATERIALS ANALYSIS

X-RAY MULTIGRAIN CRYSTALLOGRAPHY

X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...

X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...

LABORATORY X-RAY MICRO-TOMOGRAPHY SYSTEM WITH CRYSTALLOGRAPHIC GRAI...

METHODS FOR DETERMINING A RECOVERY STATE OF A METAL ALLOY

Method for Measuring the Orientation and the Elastic Strain of Grai...