the body of the probe being at an angle other than perpendicular to test object

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CPC
G01R1/07342

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/07342the body of the probe being at an angle other than perpendicular to test object

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Clustered rigid wafer test probe
- Patent number 12,248,003
- Issue date Mar 11, 2025
- International Business Machines Corporation
- David Michael Audette
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a probe used for testing integrated electronic...
- Patent number 12,248,012
- Issue date Mar 11, 2025
- STMicroelectronics S.r.l.
- Alberto Pagani
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probe card and its probe head
- Patent number 12,248,004
- Issue date Mar 11, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Liangyu Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting apparatus
- Patent number 12,244,083
- Issue date Mar 4, 2025
- Kabushiki Kaisha Nihon Micronics
- Shou Harako
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus
- Patent number 12,241,926
- Issue date Mar 4, 2025
- Advantest Corporation
- Naoyoshi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Wafer test system and operating method thereof
- Patent number 12,241,930
- Issue date Mar 4, 2025
- SK hynix Inc.
- Dong Kil Kim
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and circuit protection assembly thereof
- Patent number 12,243,703
- Issue date Mar 4, 2025
- Global Unichip Corporation
- Chih-Chieh Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer probe device
- Patent number 12,228,590
- Issue date Feb 18, 2025
- Winbond Electronics Corp.
- Ting-Ming Fu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MEMS probe card
- Patent number 12,222,369
- Issue date Feb 11, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Liangyu Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and probe card having same
- Patent number 12,222,370
- Issue date Feb 11, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a probe tip and a probe tip manufactured by...
- Patent number 12,210,038
- Issue date Jan 28, 2025
- TSE CO., LTD.
- Young Min Lee
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Vertical probe card device and fence-like probe thereof
- Patent number 12,203,961
- Issue date Jan 21, 2025
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Amplitude-modulating probe card and its probe and amplitude-modulat...
- Patent number 12,188,962
- Issue date Jan 7, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Ailin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Probe structure for micro device inspection
- Patent number 12,188,978
- Issue date Jan 7, 2025
- VueReal Inc.
- Gholamreza Chaji
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card and probe module thereof
- Patent number 12,181,496
- Issue date Dec 31, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Probe sheet with contact tip on stacked multi-layer and method of m...
- Patent number 12,181,494
- Issue date Dec 31, 2024
- PROTEC MEMS TECHNOLOGY INC
- Yong Ho Cho
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Heater substrate, probe card substrate, and probe card
- Patent number 12,174,220
- Issue date Dec 24, 2024
- Kyocera Corporation
- Hitoshi Tega
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe head and probe card comprising same
- Patent number 12,169,212
- Issue date Dec 17, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Microbump cluster probing architecture for 2.5D and 3D dies
- Patent number 12,163,982
- Issue date Dec 10, 2024
- Intel Corporation
- Jagat Shakya
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly
- Patent number 12,158,482
- Issue date Dec 3, 2024
- Mediatek Inc.
- Tung-Hsien Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing all test circuits on a wafer from...
- Patent number 12,153,087
- Issue date Nov 26, 2024
- IC ANALYTICA, LLC
- Patrick G. Drennan
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and probe card comprising same
- Patent number 12,135,338
- Issue date Nov 5, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Semi-automatic prober
- Patent number 12,135,335
- Issue date Nov 5, 2024
- QualiTau, Inc.
- Edward McCloud
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor substrate yield prediction based on spectra data from...
- Patent number 12,111,355
- Issue date Oct 8, 2024
- Onto Innovation Inc.
- Xin Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Modular vertical probe card
- Patent number 12,111,336
- Issue date Oct 8, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial probe
- Patent number 12,111,343
- Issue date Oct 8, 2024
- Xcerra Corporation
- Yukang Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit board and probe card
- Patent number 12,114,423
- Issue date Oct 8, 2024
- Kyocera Corporation
- Youichiro Honda
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and wafer testing assembly thereof
- Patent number 12,099,078
- Issue date Sep 24, 2024
- MPI Corporation
- Yi-Chien Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 12,092,660
- Issue date Sep 17, 2024
- NHK Spring Co., Ltd.
- Naruhiko Nishiwaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cantilever probe card device and elastic probe thereof
- Patent number 12,092,661
- Issue date Sep 17, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...
- Publication number 20250076366
- Publication date Mar 6, 2025
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20250076372
- Publication date Mar 6, 2025
- TOKYO ELECTRON LIMITED
- Sooraj RAJENDRAN
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE CIRCUIT BOARD
- Publication number 20250071889
- Publication date Feb 27, 2025
- Chipbond Technology Corporation
- Kung-Tzu Tu
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICES AND PROBE CONTROL APPARATUS
- Publication number 20250067776
- Publication date Feb 27, 2025
- Parcan Nanotech Co., Ltd.
- Xiangqian ZHOU
- G01 - MEASURING TESTING
Information Patent Application
TESTING MODULE
- Publication number 20250060405
- Publication date Feb 20, 2025
- NANYA TECHNOLOGY CORPORATION
- Wei-Zhong LI
- G01 - MEASURING TESTING
Information Patent Application
PROBE PIN AND PROBE CARD
- Publication number 20250052784
- Publication date Feb 13, 2025
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Koki OKUMA
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD STRUCTURE
- Publication number 20250052785
- Publication date Feb 13, 2025
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20250027973
- Publication date Jan 23, 2025
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Chikaomi MORI
- G01 - MEASURING TESTING
Information Patent Application
ADHERED MULTILAYER DIE UNIT AND PROBE HEAD, PROBE SEAT, PROBE CARD...
- Publication number 20250020692
- Publication date Jan 16, 2025
- MPI Corporation
- SHENG-YU LIN
- G01 - MEASURING TESTING
Information Patent Application
ANODIC OXIDATION FILM STRUCTURE
- Publication number 20250011939
- Publication date Jan 9, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SEMICONDUCTOR WAFER
- Publication number 20240410934
- Publication date Dec 12, 2024
- NANYA TECHNOLOGY CORPORATION
- Wei Zhong LI
- G01 - MEASURING TESTING
Information Patent Application
SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...
- Publication number 20240410936
- Publication date Dec 12, 2024
- FormFactor, Inc.
- Ernest Gammon McReynolds
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR TESTING DEVICE UNDER TEST INTEGRATED IN SEMICONDUC...
- Publication number 20240402218
- Publication date Dec 5, 2024
- MPI CORPORATION
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...
- Publication number 20240393368
- Publication date Nov 28, 2024
- MPI CORPORATION
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...
- Publication number 20240393367
- Publication date Nov 28, 2024
- MPI CORPORATION
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND SOLDER RECEIVING PROBE
- Publication number 20240385223
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND CLIMB-RESTRICTING PROBE
- Publication number 20240385217
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND MICRO ELECTRO MECHANICAL SYSTEM (M...
- Publication number 20240385218
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND LIGHT SCATTERING PROBE
- Publication number 20240385219
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND LIGHT ABSORPTION PROBE
- Publication number 20240385221
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND CANTILEVER PROBE MODULE
- Publication number 20240385222
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE CARD AND OPEN-TYPE PROBE THEREOF
- Publication number 20240377437
- Publication date Nov 14, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- YU-JU LU
- G01 - MEASURING TESTING
Information Patent Application
SUPPORTING DEVICE AND PROTECTIVE CASE FOR PROBE CARD
- Publication number 20240369596
- Publication date Nov 7, 2024
- GUDENG PRECISION INDUSTRIAL CO., LTD.
- MING-CHIEN CHIU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD FOR DEVICE UNDER TEST
- Publication number 20240369614
- Publication date Nov 7, 2024
- TEXAS INSTRUMENTS INCORPORATED
- TREVOR HUBBARD
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING CONTACT FORCE OF PROBE CARD
- Publication number 20240361354
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Cheng HSU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20240353445
- Publication date Oct 24, 2024
- NHK Spring Co., Ltd.
- Naruhiko Nishiwaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD MONITORING SYSTEM AND MONITORING METHOD THEREOF
- Publication number 20240345134
- Publication date Oct 17, 2024
- HERMES TESTING SOLUTIONS INC.
- Wei-Ting Chen
- G01 - MEASURING TESTING
Information Patent Application
PROBER AND TEMPERATURE MEASUREMENT METHOD
- Publication number 20240329118
- Publication date Oct 3, 2024
- TOKYO SEIMITSU CO., LTD.
- Hiroo Tamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR TESTING AND/OR OPERATING ELECTRONIC DEVICES
- Publication number 20240329121
- Publication date Oct 3, 2024
- KIUTRA GMBH
- Jan Spallek
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD, AND SUPPORTING STRUCTURE AND PROBE STRUCTURE THEREOF
- Publication number 20240319230
- Publication date Sep 26, 2024
- STAR TECHNOLOGIES, INC.
- HUNG-CHAN HUANG
- G01 - MEASURING TESTING

the body of the probe being at an angle other than perpendicular to test object

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Clustered rigid wafer test probe

Method for producing a probe used for testing integrated electronic...

Membrane probe card and its probe head

Electrical connecting apparatus

Test apparatus

Wafer test system and operating method thereof

Probe card device and circuit protection assembly thereof

Wafer probe device

MEMS probe card

Probe head and probe card having same

Method of manufacturing a probe tip and a probe tip manufactured by...

Vertical probe card device and fence-like probe thereof

Amplitude-modulating probe card and its probe and amplitude-modulat...

Probe structure for micro device inspection

Cantilever probe card and probe module thereof

Probe sheet with contact tip on stacked multi-layer and method of m...

Heater substrate, probe card substrate, and probe card

Probe head and probe card comprising same

Microbump cluster probing architecture for 2.5D and 3D dies

Probe card assembly

Apparatus and method for testing all test circuits on a wafer from...

Probe head and probe card comprising same

Semi-automatic prober

Semiconductor substrate yield prediction based on spectra data from...

Modular vertical probe card

Coaxial probe

Circuit board and probe card

Probe card and wafer testing assembly thereof

Probe card

Cantilever probe card device and elastic probe thereof

Patents Applicationslast 30 patents

SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...

INSPECTION METHOD AND INSPECTION APPARATUS

FLEXIBLE CIRCUIT BOARD

PROBE DEVICES AND PROBE CONTROL APPARATUS

TESTING MODULE

PROBE PIN AND PROBE CARD

PROBE CARD STRUCTURE

PROBE CARD

ADHERED MULTILAYER DIE UNIT AND PROBE HEAD, PROBE SEAT, PROBE CARD...

ANODIC OXIDATION FILM STRUCTURE

SEMICONDUCTOR WAFER

SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...

PROBE SYSTEM FOR TESTING DEVICE UNDER TEST INTEGRATED IN SEMICONDUC...

PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...

PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...

CANTILEVER PROBE CARD DEVICE AND SOLDER RECEIVING PROBE

CANTILEVER PROBE CARD DEVICE AND CLIMB-RESTRICTING PROBE

CANTILEVER PROBE CARD DEVICE AND MICRO ELECTRO MECHANICAL SYSTEM (M...

CANTILEVER PROBE CARD DEVICE AND LIGHT SCATTERING PROBE

CANTILEVER PROBE CARD DEVICE AND LIGHT ABSORPTION PROBE

CANTILEVER PROBE CARD DEVICE AND CANTILEVER PROBE MODULE

VERTICAL PROBE CARD AND OPEN-TYPE PROBE THEREOF

SUPPORTING DEVICE AND PROTECTIVE CASE FOR PROBE CARD

PROBE CARD FOR DEVICE UNDER TEST

METHOD FOR DETECTING CONTACT FORCE OF PROBE CARD

PROBE CARD

PROBE CARD MONITORING SYSTEM AND MONITORING METHOD THEREOF

PROBER AND TEMPERATURE MEASUREMENT METHOD

APPARATUS FOR TESTING AND/OR OPERATING ELECTRONIC DEVICES

PROBE CARD, AND SUPPORTING STRUCTURE AND PROBE STRUCTURE THEREOF