the body of the probe being at an angle other than perpendicular to test object

Industry

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G01R1/07342

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/07342the body of the probe being at an angle other than perpendicular to test object

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing a probe tip and a probe tip manufactured by...
- Patent number 12,210,038
- Issue date Jan 28, 2025
- TSE CO., LTD.
- Young Min Lee
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Vertical probe card device and fence-like probe thereof
- Patent number 12,203,961
- Issue date Jan 21, 2025
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Amplitude-modulating probe card and its probe and amplitude-modulat...
- Patent number 12,188,962
- Issue date Jan 7, 2025
- MAXONE SEMICONDUCTOR CO., LTD.
- Ailin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Probe structure for micro device inspection
- Patent number 12,188,978
- Issue date Jan 7, 2025
- VueReal Inc.
- Gholamreza Chaji
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card and probe module thereof
- Patent number 12,181,496
- Issue date Dec 31, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Probe sheet with contact tip on stacked multi-layer and method of m...
- Patent number 12,181,494
- Issue date Dec 31, 2024
- PROTEC MEMS TECHNOLOGY INC
- Yong Ho Cho
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Heater substrate, probe card substrate, and probe card
- Patent number 12,174,220
- Issue date Dec 24, 2024
- Kyocera Corporation
- Hitoshi Tega
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe head and probe card comprising same
- Patent number 12,169,212
- Issue date Dec 17, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Microbump cluster probing architecture for 2.5D and 3D dies
- Patent number 12,163,982
- Issue date Dec 10, 2024
- Intel Corporation
- Jagat Shakya
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly
- Patent number 12,158,482
- Issue date Dec 3, 2024
- Mediatek Inc.
- Tung-Hsien Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing all test circuits on a wafer from...
- Patent number 12,153,087
- Issue date Nov 26, 2024
- IC ANALYTICA, LLC
- Patrick G. Drennan
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and probe card comprising same
- Patent number 12,135,338
- Issue date Nov 5, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Semi-automatic prober
- Patent number 12,135,335
- Issue date Nov 5, 2024
- QualiTau, Inc.
- Edward McCloud
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor substrate yield prediction based on spectra data from...
- Patent number 12,111,355
- Issue date Oct 8, 2024
- Onto Innovation Inc.
- Xin Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Modular vertical probe card
- Patent number 12,111,336
- Issue date Oct 8, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Circuit board and probe card
- Patent number 12,114,423
- Issue date Oct 8, 2024
- Kyocera Corporation
- Youichiro Honda
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial probe
- Patent number 12,111,343
- Issue date Oct 8, 2024
- Xcerra Corporation
- Yukang Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card and wafer testing assembly thereof
- Patent number 12,099,078
- Issue date Sep 24, 2024
- MPI Corporation
- Yi-Chien Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 12,092,660
- Issue date Sep 17, 2024
- NHK Spring Co., Ltd.
- Naruhiko Nishiwaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cantilever probe card device and elastic probe thereof
- Patent number 12,092,661
- Issue date Sep 17, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Fine pitch probe card
- Patent number 12,085,589
- Issue date Sep 10, 2024
- Xallent Inc.
- Kwame Amponsah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vertical probe head with improved contact properties towards a devi...
- Patent number 12,085,588
- Issue date Sep 10, 2024
- Technoprobe S.p.A.
- Stefano Felici
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor probe
- Patent number 12,078,658
- Issue date Sep 3, 2024
- Chien Cheng Tien
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting semiconductor device, semiconductor device, an...
- Patent number 12,078,659
- Issue date Sep 3, 2024
- Renesas Electronics Corporation
- Masaaki Tanimura
- G01 - MEASURING TESTING
Information Patent Grant
Probe card, apparatus and method for detecting contact force of pro...
- Patent number 12,055,563
- Issue date Aug 6, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ming-Cheng Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Heat dissipatable die unit and probe seat using the same
- Patent number 12,050,235
- Issue date Jul 30, 2024
- MPI Corporation
- Chin-Yi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Method of centering probe head in mounting frame
- Patent number 12,044,704
- Issue date Jul 23, 2024
- FormFactor, Inc.
- Kalyanjit Ghosh
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for device under test
- Patent number 12,044,719
- Issue date Jul 23, 2024
- Texas Instruments Incorporated
- Trevor Hubbard
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing a semiconductor device and a probe card including...
- Patent number 12,038,458
- Issue date Jul 16, 2024
- Samsung Electronics Co., Ltd.
- Sung Hoon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 12,025,637
- Issue date Jul 2, 2024
- MPI Corporation
- Chin-Yi Tsai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD
- Publication number 20250027973
- Publication date Jan 23, 2025
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Chikaomi MORI
- G01 - MEASURING TESTING
Information Patent Application
ADHERED MULTILAYER DIE UNIT AND PROBE HEAD, PROBE SEAT, PROBE CARD...
- Publication number 20250020692
- Publication date Jan 16, 2025
- MPI Corporation
- SHENG-YU LIN
- G01 - MEASURING TESTING
Information Patent Application
ANODIC OXIDATION FILM STRUCTURE
- Publication number 20250011939
- Publication date Jan 9, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SEMICONDUCTOR WAFER
- Publication number 20240410934
- Publication date Dec 12, 2024
- NANYA TECHNOLOGY CORPORATION
- Wei Zhong LI
- G01 - MEASURING TESTING
Information Patent Application
SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...
- Publication number 20240410936
- Publication date Dec 12, 2024
- FormFactor, Inc.
- Ernest Gammon McReynolds
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR TESTING DEVICE UNDER TEST INTEGRATED IN SEMICONDUC...
- Publication number 20240402218
- Publication date Dec 5, 2024
- MPI CORPORATION
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...
- Publication number 20240393368
- Publication date Nov 28, 2024
- MPI CORPORATION
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...
- Publication number 20240393367
- Publication date Nov 28, 2024
- MPI CORPORATION
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND SOLDER RECEIVING PROBE
- Publication number 20240385223
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND CLIMB-RESTRICTING PROBE
- Publication number 20240385217
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND MICRO ELECTRO MECHANICAL SYSTEM (M...
- Publication number 20240385218
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND LIGHT SCATTERING PROBE
- Publication number 20240385219
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND LIGHT ABSORPTION PROBE
- Publication number 20240385221
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND CANTILEVER PROBE MODULE
- Publication number 20240385222
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE CARD AND OPEN-TYPE PROBE THEREOF
- Publication number 20240377437
- Publication date Nov 14, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- YU-JU LU
- G01 - MEASURING TESTING
Information Patent Application
SUPPORTING DEVICE AND PROTECTIVE CASE FOR PROBE CARD
- Publication number 20240369596
- Publication date Nov 7, 2024
- GUDENG PRECISION INDUSTRIAL CO., LTD.
- MING-CHIEN CHIU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD FOR DEVICE UNDER TEST
- Publication number 20240369614
- Publication date Nov 7, 2024
- TEXAS INSTRUMENTS INCORPORATED
- TREVOR HUBBARD
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING CONTACT FORCE OF PROBE CARD
- Publication number 20240361354
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Cheng HSU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20240353445
- Publication date Oct 24, 2024
- NHK Spring Co., Ltd.
- Naruhiko Nishiwaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD MONITORING SYSTEM AND MONITORING METHOD THEREOF
- Publication number 20240345134
- Publication date Oct 17, 2024
- HERMES TESTING SOLUTIONS INC.
- Wei-Ting Chen
- G01 - MEASURING TESTING
Information Patent Application
PROBER AND TEMPERATURE MEASUREMENT METHOD
- Publication number 20240329118
- Publication date Oct 3, 2024
- TOKYO SEIMITSU CO., LTD.
- Hiroo Tamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR TESTING AND/OR OPERATING ELECTRONIC DEVICES
- Publication number 20240329121
- Publication date Oct 3, 2024
- KIUTRA GMBH
- Jan Spallek
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD, AND SUPPORTING STRUCTURE AND PROBE STRUCTURE THEREOF
- Publication number 20240319230
- Publication date Sep 26, 2024
- STAR TECHNOLOGIES, INC.
- HUNG-CHAN HUANG
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING APPARATUS AND CONTROL METHOD THEREOF
- Publication number 20240319229
- Publication date Sep 26, 2024
- Samsung Electronics Co., LTD
- Chunghyun KIM
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE AND TEST METHOD IMPLEMENTING THE SAME
- Publication number 20240310439
- Publication date Sep 19, 2024
- Samsung Electronics Co., Ltd.
- Gyuyeol KIM
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER TESTING APPARATUS, SEMICONDUCTOR WAFER TESTING...
- Publication number 20240302411
- Publication date Sep 12, 2024
- Advantest Corporation
- Yuto Mori
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20240280610
- Publication date Aug 22, 2024
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Tatsunori SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD FOR FINE PITCH CIRCUIT PROBE TESTING OF SEMICONDUCTOR IN...
- Publication number 20240272200
- Publication date Aug 15, 2024
- Taiwan Semiconductor Manufacturing Company Limited
- Yuan-Li LIN
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND TEST APPARATUS INCLUDING PROBE CARD
- Publication number 20240255545
- Publication date Aug 1, 2024
- LX Semicon Co., Ltd.
- Min Suk KIM
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARDS, DUT SIDE MODULES OF THE PROBE CARDS, TESTING METHODS A...
- Publication number 20240241155
- Publication date Jul 18, 2024
- MPI Corporation
- CHIN-YI LIN
- G01 - MEASURING TESTING

the body of the probe being at an angle other than perpendicular to test object

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of manufacturing a probe tip and a probe tip manufactured by...

Vertical probe card device and fence-like probe thereof

Amplitude-modulating probe card and its probe and amplitude-modulat...

Probe structure for micro device inspection

Cantilever probe card and probe module thereof

Probe sheet with contact tip on stacked multi-layer and method of m...

Heater substrate, probe card substrate, and probe card

Probe head and probe card comprising same

Microbump cluster probing architecture for 2.5D and 3D dies

Probe card assembly

Apparatus and method for testing all test circuits on a wafer from...

Probe head and probe card comprising same

Semi-automatic prober

Semiconductor substrate yield prediction based on spectra data from...

Modular vertical probe card

Circuit board and probe card

Coaxial probe

Probe card and wafer testing assembly thereof

Probe card

Cantilever probe card device and elastic probe thereof

Fine pitch probe card

Vertical probe head with improved contact properties towards a devi...

Semiconductor probe

Method of inspecting semiconductor device, semiconductor device, an...

Probe card, apparatus and method for detecting contact force of pro...

Heat dissipatable die unit and probe seat using the same

Method of centering probe head in mounting frame

Probe card for device under test

Probe for testing a semiconductor device and a probe card including...

Probe card

Patents Applicationslast 30 patents

PROBE CARD

ADHERED MULTILAYER DIE UNIT AND PROBE HEAD, PROBE SEAT, PROBE CARD...

ANODIC OXIDATION FILM STRUCTURE

SEMICONDUCTOR WAFER

SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...

PROBE SYSTEM FOR TESTING DEVICE UNDER TEST INTEGRATED IN SEMICONDUC...

PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...

PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...

CANTILEVER PROBE CARD DEVICE AND SOLDER RECEIVING PROBE

CANTILEVER PROBE CARD DEVICE AND CLIMB-RESTRICTING PROBE

CANTILEVER PROBE CARD DEVICE AND MICRO ELECTRO MECHANICAL SYSTEM (M...

CANTILEVER PROBE CARD DEVICE AND LIGHT SCATTERING PROBE

CANTILEVER PROBE CARD DEVICE AND LIGHT ABSORPTION PROBE

CANTILEVER PROBE CARD DEVICE AND CANTILEVER PROBE MODULE

VERTICAL PROBE CARD AND OPEN-TYPE PROBE THEREOF

SUPPORTING DEVICE AND PROTECTIVE CASE FOR PROBE CARD

PROBE CARD FOR DEVICE UNDER TEST

METHOD FOR DETECTING CONTACT FORCE OF PROBE CARD

PROBE CARD

PROBE CARD MONITORING SYSTEM AND MONITORING METHOD THEREOF

PROBER AND TEMPERATURE MEASUREMENT METHOD

APPARATUS FOR TESTING AND/OR OPERATING ELECTRONIC DEVICES

PROBE CARD, AND SUPPORTING STRUCTURE AND PROBE STRUCTURE THEREOF

WAFER TESTING APPARATUS AND CONTROL METHOD THEREOF

TEST DEVICE AND TEST METHOD IMPLEMENTING THE SAME

SEMICONDUCTOR WAFER TESTING APPARATUS, SEMICONDUCTOR WAFER TESTING...

PROBE CARD

PROBE CARD FOR FINE PITCH CIRCUIT PROBE TESTING OF SEMICONDUCTOR IN...

PROBE CARD AND TEST APPARATUS INCLUDING PROBE CARD

PROBE CARDS, DUT SIDE MODULES OF THE PROBE CARDS, TESTING METHODS A...