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the devices involving a micro-mechanical structure
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G01C19/5656
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PHYSICS
G01
Measuring instruments
G01C
MEASURING DISTANCES, LEVELS OR BEARINGS SURVEYING NAVIGATION GYROSCOPIC INSTRUMENTS PHOTOGRAMMETRY OR VIDEOGRAMMETRY
G01C19/00
Gyroscopes Turn-sensitive devices using vibrating masses Turn-sensitive devices without moving masses Measuring angular rate using gyroscopic effects
Current Industry
G01C19/5656
the devices involving a micro-mechanical structure
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Patents Grants
last 30 patents
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Patent Grant
Micromechanical system, method for operating a micromechanical system
Patent number
12,031,820
Issue date
Jul 9, 2024
Robert Bosch GmbH
Lars Tebje
G01 - MEASURING TESTING
Information
Patent Grant
Vibrator device, electronic apparatus, and vehicle
Patent number
11,940,275
Issue date
Mar 26, 2024
Seiko Epson Corporation
Seiichiro Ogura
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Micromachined multi-axis gyroscopes with reduced stress sensitivity
Patent number
11,898,845
Issue date
Feb 13, 2024
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Cenk Acar
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Vibration element, physical quantity sensor, inertial measurement u...
Patent number
11,888,464
Issue date
Jan 30, 2024
Seiko Epson Corporation
Seiichiro Ogura
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Piezoelectric frequency-modulated gyroscope
Patent number
11,781,867
Issue date
Oct 10, 2023
Murata Manufacturing Co., Ltd.
Ville Kaajakari
G01 - MEASURING TESTING
Information
Patent Grant
Vibration element, method of manufacturing vibration element, physi...
Patent number
11,402,208
Issue date
Aug 2, 2022
Seiko Epson Corporation
Shogo Sasaki
G01 - MEASURING TESTING
Information
Patent Grant
Vibrator device, electronic apparatus, and vehicle
Patent number
11,326,882
Issue date
May 10, 2022
Seiko Epson Corporation
Seiichiro Ogura
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Vibrator device
Patent number
11,287,260
Issue date
Mar 29, 2022
Seiko Epson Corporation
Masahiro Oshio
G01 - MEASURING TESTING
Information
Patent Grant
Low power inertial sensor architecture and methods
Patent number
11,236,999
Issue date
Feb 1, 2022
MCube, Inc.
Sanjay Bhandari
G01 - MEASURING TESTING
Information
Patent Grant
MEMS device
Patent number
11,220,422
Issue date
Jan 11, 2022
Taiwan Semiconductor Manufacturing Company Ltd.
Fan Hu
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
MEMS gyroscope and electronic device including the same
Patent number
11,156,458
Issue date
Oct 26, 2021
AAC Acoustic Technologies (Shenzhen) Co., Ltd.
Zhenkui Meng
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for self-testing MEMS inertial sensors
Patent number
11,112,269
Issue date
Sep 7, 2021
Analog Devices, Inc.
William A. Clark
G01 - MEASURING TESTING
Information
Patent Grant
Frequency adjustment method of vibration element, manufacturing met...
Patent number
11,085,765
Issue date
Aug 10, 2021
Seiko Epson Corporation
Shogo Sasaki
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Micromachined multi-axis gyroscopes with reduced stress sensitivity
Patent number
11,085,766
Issue date
Aug 10, 2021
Semiconductor Components Industries, LLC
Cenk Acar
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Microelectromechanical system resonator devices and oscillator cont...
Patent number
10,879,869
Issue date
Dec 29, 2020
Socovar, Société En Commandite
Mohannad Elsayad
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Positioning apparatus comprising an inertial sensor and inertial se...
Patent number
10,877,059
Issue date
Dec 29, 2020
STMicroelectronics S.r.l.
Nicola Matteo Palella
G01 - MEASURING TESTING
Information
Patent Grant
Electro-opto-mechanical micro gyroscope
Patent number
10,866,099
Issue date
Dec 15, 2020
United States of America as represented by the Secretary of the Navy
Michael Mazilu
G01 - MEASURING TESTING
Information
Patent Grant
Method for operating a rotation rate sensor using different frequen...
Patent number
10,837,776
Issue date
Nov 17, 2020
Robert Bosch GmbH
Michael Curcic
G01 - MEASURING TESTING
Information
Patent Grant
Multiple axis sensing device based on frequency modulation and meth...
Patent number
10,823,569
Issue date
Nov 3, 2020
NXP USA, INC.
Peng Shao
G01 - MEASURING TESTING
Information
Patent Grant
Single axis inertial sensor with suppressed parasitic modes
Patent number
10,809,277
Issue date
Oct 20, 2020
NXP USA, INC.
Jun Tang
G01 - MEASURING TESTING
Information
Patent Grant
Sensor device, gyro sensor, and electronic apparatus
Patent number
10,775,168
Issue date
Sep 15, 2020
Sony Corporation
Satoshi Mitani
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Vibration device, angular velocity sensor, electronic device, and v...
Patent number
10,760,908
Issue date
Sep 1, 2020
Seiko Epson Corporation
Ryuta Nishizawa
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Silicon carbide microelectromechanical structure, device, and method
Patent number
10,717,642
Issue date
Jul 21, 2020
The Government of the United States of America, as represented by the Secreta...
Francis J. Kub
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Physical quantity sensor, electronic device, and vehicle
Patent number
10,712,157
Issue date
Jul 14, 2020
Seiko Epson Corporation
Ryuji Kihara
G01 - MEASURING TESTING
Information
Patent Grant
Liquid discharge apparatus and liquid discharge method
Patent number
10,596,813
Issue date
Mar 24, 2020
Ricoh Company, Ltd.
Hiroki Tanaka
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Grant
Silicon carbide microelectromechanical structure, device, and method
Patent number
10,589,983
Issue date
Mar 17, 2020
The Government of the United States of America, as represented by the Secreta...
Francis J. Kub
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method for determining the quality factor of an oscillator
Patent number
10,578,661
Issue date
Mar 3, 2020
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Antoine Nowodzinski
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Drive mode and sense mode resonance frequency matching
Patent number
10,538,427
Issue date
Jan 21, 2020
Invensense, Inc.
Alireza Shirvani
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Functional element, electronic apparatus and mobile entity
Patent number
10,421,661
Issue date
Sep 24, 2019
Seiko Epson Corporation
Satoru Tanaka
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Integrated sensor and homologous calibration structure for resonant...
Patent number
10,386,204
Issue date
Aug 20, 2019
Intel Corporation
Sasha Oster
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Vibrator Device
Publication number
20240361125
Publication date
Oct 31, 2024
SEIKO EPSON CORPORATION
Kota KOMATSUBARA
G01 - MEASURING TESTING
Information
Patent Application
SENSOR AND ELECTRONIC DEVICE
Publication number
20240085181
Publication date
Mar 14, 2024
Kabushiki Kaisha Toshiba
Kei MASUNISHI
G01 - MEASURING TESTING
Information
Patent Application
4-POINTS PHASE AND SENSITIVITY ESTIMATION ALGORITHM AND RELATED ARC...
Publication number
20230160696
Publication date
May 25, 2023
InvenSense, Inc.
Vito Avantaggiati
G01 - MEASURING TESTING
Information
Patent Application
VIBROMETER AND METHOD FOR DETECTING VIBRATION
Publication number
20220268582
Publication date
Aug 25, 2022
KYOCERA CORPORATION
Munetaka SOEJIMA
G01 - MEASURING TESTING
Information
Patent Application
Vibrator Device, Electronic Apparatus, And Vehicle
Publication number
20220236057
Publication date
Jul 28, 2022
SEIKO EPSON CORPORATION
Seiichiro OGURA
B60 - VEHICLES IN GENERAL
Information
Patent Application
PIEZOELECTRIC FREQUENCY-MODULATED GYROSCOPE
Publication number
20220178696
Publication date
Jun 9, 2022
Murata Manufacturing Co., Ltd.
Ville KAAJAKARI
G01 - MEASURING TESTING
Information
Patent Application
MICROMECHANICAL SYSTEM, METHOD FOR OPERATING A MICROMECHANICAL SYSTEM
Publication number
20220049958
Publication date
Feb 17, 2022
ROBERT BOSCH GmbH
Lars Tebje
G01 - MEASURING TESTING
Information
Patent Application
MICROMACHINED MULTI-AXIS GYROSCOPES WITH REDUCED STRESS SENSITIVITY
Publication number
20210372795
Publication date
Dec 2, 2021
Semiconductor Components Industries, LLC
Cenk ACAR
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
INERTIAL DEVICES WITH WAFER-LEVEL INTEGRATION OF HIGHER DENSITY PRO...
Publication number
20210140767
Publication date
May 13, 2021
Societe de commercialisation des produits de la recherche appliquee SOCPRA Sc...
Andre DOMPIERRE
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Vibrator Device
Publication number
20210063156
Publication date
Mar 4, 2021
SEIKO EPSON CORPORATION
Masahiro OSHIO
G01 - MEASURING TESTING
Information
Patent Application
Electro-Opto-Mechanical Micro Gyroscope
Publication number
20200378762
Publication date
Dec 3, 2020
United States of America, as Represented by teh Secretary of the Navy
Michael Mazilu
G01 - MEASURING TESTING
Information
Patent Application
POSITIONING APPARATUS COMPRISING AN INERTIAL SENSOR AND INERTIAL SE...
Publication number
20200292570
Publication date
Sep 17, 2020
STMicroelectronics S.r.l.
Nicola Matteo Palella
G01 - MEASURING TESTING
Information
Patent Application
MEMS DEVICE
Publication number
20200290863
Publication date
Sep 17, 2020
Taiwan Semiconductor Manufacturing company Ltd.
FAN HU
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MEMS GYROSCOPE AND ELECTRONIC DEVICE INCLUDING THE SAME
Publication number
20200208973
Publication date
Jul 2, 2020
AAC ACOUSTIC TECHNOLOGIES (SHENZHEN) CO., LTD
Zhenkui Meng
G01 - MEASURING TESTING
Information
Patent Application
VIBRATION ELEMENT, METHOD OF MANUFACTURING VIBRATION ELEMENT, PHYSI...
Publication number
20200200533
Publication date
Jun 25, 2020
SEIKO EPSON CORPORATION
Shogo SASAKI
G01 - MEASURING TESTING
Information
Patent Application
Silicon Carbide Microelectromechanical Structure, Device, and Method
Publication number
20200115219
Publication date
Apr 16, 2020
The Government of the United States of America, as represented by the Secreta...
Francis J. Kub
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
METHODS AND SYSTEMS FOR SELF-TESTING MEMS INERTIAL SENSORS
Publication number
20200011702
Publication date
Jan 9, 2020
Analog Devices, Inc.
William A. Clark
G01 - MEASURING TESTING
Information
Patent Application
VIBRATORY GYROSCOPE UTILIZING THE NONLINEAR MODAL INTERACTION
Publication number
20200011666
Publication date
Jan 9, 2020
SIMON FRASER UNIVERSITY
Farid Golnaraghi
G01 - MEASURING TESTING
Information
Patent Application
GYROSENSOR, SIGNAL PROCESSING DEVICE, ELECTRONIC APPARATUS, AND MET...
Publication number
20190310086
Publication date
Oct 10, 2019
SONY CORPORATION
KAZUO TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
Frequency Adjustment Method Of Vibration Element, Manufacturing Met...
Publication number
20190301869
Publication date
Oct 3, 2019
SEIKO EPSON CORPORATION
Shogo SASAKI
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
LIQUID DISCHARGE APPARATUS AND LIQUID DISCHARGE METHOD
Publication number
20190283408
Publication date
Sep 19, 2019
RICOH COMPANY, LTD.
Hiroki TANAKA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SINGLE AXIS INERTIAL SENSOR WITH SUPPRESSED PARASITIC MODES
Publication number
20190187169
Publication date
Jun 20, 2019
NXP USA, Inc.
Jun Tang
G01 - MEASURING TESTING
Information
Patent Application
MICROMACHINED MULTI-AXIS GYROSCOPES WITH REDUCED STRESS SENSITIVITY
Publication number
20190145772
Publication date
May 16, 2019
Semiconductor Components Industries, LLC
Cenk ACAR
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DRIVE MODE AND SENSE MODE RESONANCE FREQUENCY MATCHING
Publication number
20190055116
Publication date
Feb 21, 2019
InvenSense, Inc.
Alireza SHIRVANI
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
INTEGRATED SENSOR AND HOMOLOGOUS CALIBRATION STRUCTURE FOR RESONANT...
Publication number
20190003854
Publication date
Jan 3, 2019
Sasha Oster
G01 - MEASURING TESTING
Information
Patent Application
PHYSICAL QUANTITY SENSOR, ELECTRONIC DEVICE, AND VEHICLE
Publication number
20180292210
Publication date
Oct 11, 2018
SEIKO EPSON CORPORATION
Ryuji KIHARA
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR PROCESSING OF RESIDUAL VALUES WHEN CONTROLLIN...
Publication number
20180252525
Publication date
Sep 6, 2018
NORTHROP GRUMMAN LITEF GMBH
GUENTER SPAHLINGER
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR A FOUR-MASS VIBRATING MEMS STRUCTURE
Publication number
20180231384
Publication date
Aug 16, 2018
HONEYWELL INTERNATIONAL INC.
Burgess R. Johnson
G01 - MEASURING TESTING
Information
Patent Application
VIBRATORY GYROSCOPE UTILIZING A NONLINEAR MODAL INTERACTION
Publication number
20180143021
Publication date
May 24, 2018
SIMON FRASER UNIVERSITY
Farid Golnaraghi
G01 - MEASURING TESTING
Information
Patent Application
Silicon Carbide Microelectromechanical Structure, Device, and Method
Publication number
20180086625
Publication date
Mar 29, 2018
The Government of the United States of America, as represented by the Secreta...
Francis J. KUB
B81 - MICRO-STRUCTURAL TECHNOLOGY