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G01N23/10
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00
Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00
Current Industry
G01N23/10
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Patents Grants
last 30 patents
Information
Patent Grant
Two-stage screening technique for prohibited objects at security ch...
Patent number
12,205,359
Issue date
Jan 21, 2025
International Business Machines Corporation
Mohamed Nooman Ahmed
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pulse frequency adjustment
Patent number
12,203,879
Issue date
Jan 21, 2025
SMITHS DETECTION FRANCE S.A.S.
Joseph Bendahan
G01 - MEASURING TESTING
Information
Patent Grant
Scanners to characterize and distinguish anomalies based on multipl...
Patent number
12,183,081
Issue date
Dec 31, 2024
John Fortune
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Disinfection apparatus for transport containers of an inspection ar...
Patent number
12,178,932
Issue date
Dec 31, 2024
Smiths Detection Germany GmbH
Gregor Hess
G01 - MEASURING TESTING
Information
Patent Grant
Transmission imaging detection device and its computerized tomograp...
Patent number
12,169,181
Issue date
Dec 17, 2024
Xiamen University
Zheng Fang
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system
Patent number
12,140,554
Issue date
Nov 12, 2024
THE NIPPON SIGNAL CO., LTD.
Kazuaki Takayama
G01 - MEASURING TESTING
Information
Patent Grant
Rotational X-ray inspection system and method
Patent number
12,061,156
Issue date
Aug 13, 2024
VIKEN DETECTION CORPORATION
Peter J. Rothschild
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for generating three-dimensional images that en...
Patent number
12,056,840
Issue date
Aug 6, 2024
Rapiscan Systems, Inc.
Mala Sivakumar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection system
Patent number
12,044,633
Issue date
Jul 23, 2024
THE NIPPON SIGNAL CO., LTD.
Kazuaki Takayama
G01 - MEASURING TESTING
Information
Patent Grant
Material detection in x-ray security screening
Patent number
12,019,035
Issue date
Jun 25, 2024
Rapiscan Holdings, Inc.
Simon Archambault
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray baggage and parcel inspection system with efficient third-par...
Patent number
12,007,341
Issue date
Jun 11, 2024
Battelle Memorial Institute
Rodney Arthur Hallgren
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Correction of images
Patent number
11,983,859
Issue date
May 14, 2024
Smiths Detection France S.A.S.
Serge Maitrejean
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for three-dimensional localization of an object
Patent number
11,978,229
Issue date
May 7, 2024
Vidisco Ltd.
Alon Fleider
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Insert for screening tray
Patent number
11,977,037
Issue date
May 7, 2024
Rapiscan Holdings, Inc.
Philippe Desjeans-Gauthier
G01 - MEASURING TESTING
Information
Patent Grant
System and methods for determining air content of fresh concrete, a...
Patent number
11,965,837
Issue date
Apr 23, 2024
COMMAND ALKON INCORPORATED
Denis Beaupre
G08 - SIGNALLING
Information
Patent Grant
X-ray detector component, X-ray detection module, imaging device an...
Patent number
11,953,632
Issue date
Apr 9, 2024
ams International AG
Jens Hofrichter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-modal transportation baggage screening and image sharing system
Patent number
11,935,072
Issue date
Mar 19, 2024
Craig Mateer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Security inspection device and transfer method therefor
Patent number
11,933,934
Issue date
Mar 19, 2024
Nuctech Company Limited
Xuping Fan
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and non-transitory recording medium storing in...
Patent number
11,933,745
Issue date
Mar 19, 2024
Kabushiki Kaisha Toshiba
Yuka Watanabe
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Grant
Radiation detector
Patent number
11,918,394
Issue date
Mar 5, 2024
SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
Peiyan Cao
G01 - MEASURING TESTING
Information
Patent Grant
Screening system
Patent number
11,913,890
Issue date
Feb 27, 2024
Halo X Ray Technologies Limited
Anthony Dicken
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system for inspecting contents of a target person, and i...
Patent number
11,914,035
Issue date
Feb 27, 2024
NEC Corporation
Tatsuya Sumiya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multi-channel static CT device
Patent number
11,906,447
Issue date
Feb 20, 2024
Nuctech Company Limited
Zhiqiang Chen
G01 - MEASURING TESTING
Information
Patent Grant
Calibration method and device therefor
Patent number
11,885,752
Issue date
Jan 30, 2024
Rapiscan Holdings, Inc.
Emmanuel St-Aubin
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system and inspection method
Patent number
11,860,112
Issue date
Jan 2, 2024
NEC Corporation
Naoya Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Adjustable collimators and x-ray imaging systems including adjustab...
Patent number
11,862,357
Issue date
Jan 2, 2024
Illinois Tool Works Inc.
Svetlana Zigelman
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Hazardous material canister systems and methods
Patent number
11,842,822
Issue date
Dec 12, 2023
Deep Isolation, Inc.
Richard A. Muller
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Radiation inspection apparatus comprising a radiation inspection de...
Patent number
11,822,043
Issue date
Nov 21, 2023
Zhiqiang Chen
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for determining contents of a belongings inspec...
Patent number
11,815,597
Issue date
Nov 14, 2023
NEC Corporation
Shingo Yamanouchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Fluid level and composition sensor
Patent number
11,796,376
Issue date
Oct 24, 2023
Tigmill Technologies, LLC
Bobby David Strong
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MANAGEMENT SYSTEM AND MANAGEMENT METHOD
Publication number
20250020825
Publication date
Jan 16, 2025
SINTOKOGIO, LTD.
Yoshiyasu MAKINO
G01 - MEASURING TESTING
Information
Patent Application
ENTRANCE MANAGEMENT SYSTEM AND ENTRANCE MANAGEMENT CONTROL DEVICE
Publication number
20250012741
Publication date
Jan 9, 2025
Kabushiki Kaisha Toshiba
Kentaro WADA
G01 - MEASURING TESTING
Information
Patent Application
Methods and Systems for Generating Three-Dimensional Images that En...
Publication number
20240412476
Publication date
Dec 12, 2024
Rapiscan Systems, Inc.
Mala Sivakumar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Baggage Imagery Reanalysis for Multi-Modal Travel
Publication number
20240386441
Publication date
Nov 21, 2024
Craig Mateer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD
Publication number
20240377340
Publication date
Nov 14, 2024
Greyscale AI
Brian Green
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
Publication number
20240361257
Publication date
Oct 31, 2024
Nuctech Company Limited
Li ZHANG
G01 - MEASURING TESTING
Information
Patent Application
Tray Insert for Screening Tray
Publication number
20240353354
Publication date
Oct 24, 2024
Rapiscan Holdings, Inc.
Philippe Desjeans-Gauthier
G01 - MEASURING TESTING
Information
Patent Application
3D MASKING IN A COMPUTED TOMOGRAPHY IMAGE
Publication number
20240345003
Publication date
Oct 17, 2024
Faxitron Bioptics, LLC
Ciaran PURDY
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM AND METHOD
Publication number
20240345005
Publication date
Oct 17, 2024
Nuctech Company Limited
Li ZHANG
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM AND METHOD
Publication number
20240319114
Publication date
Sep 26, 2024
Nuctech Company Limited
Weizhen WANG
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM AND METHOD
Publication number
20240310305
Publication date
Sep 19, 2024
Nuctech Company Limited
Zhiqiang CHEN
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION SYSTEM AND CONTROL ARCHITECTURE FOR AN X-RAY INSPE...
Publication number
20240302296
Publication date
Sep 12, 2024
Smiths Detection France S.A.S.
Jean-Michel FAUGIER
G01 - MEASURING TESTING
Information
Patent Application
Material Detection in X-Ray Security Screening
Publication number
20240302300
Publication date
Sep 12, 2024
Rapiscan Holdings, Inc.
Simon Archambault
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION OF CARGO IN OPEN-TOPPED VEHICLE
Publication number
20240288605
Publication date
Aug 29, 2024
Smiths Detection France S.A.S.
Serge MAITREJEAN
G01 - MEASURING TESTING
Information
Patent Application
X-RAY BAGGAGE AND PARCEL INSPECTION SYSTEM WITH EFFICIENT THIRD-PAR...
Publication number
20240280514
Publication date
Aug 22, 2024
Battelle Memorial Institute
Rodney Arthur Hallgren
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY DETECTOR COMPONENT, X-RAY DETECTION MODULE, IMAGING DEVICE AN...
Publication number
20240248218
Publication date
Jul 25, 2024
ams International AG
Jens HOFRICHTER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
Publication number
20240219325
Publication date
Jul 4, 2024
Nuctech Company Limited
Li ZHANG
G01 - MEASURING TESTING
Information
Patent Application
RADIOGRAPHIC INSPECTION APPARATUS AND VEHICLE-MOUNTED SECURITY INSP...
Publication number
20240192151
Publication date
Jun 13, 2024
Nuctech Company Limited
Li ZHANG
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR DETECTING DANGEROUS SUBSTANCE BY USING ARTIFI...
Publication number
20240151658
Publication date
May 9, 2024
Republic of Korea (Chief of Presidential Security Service)
Hyun Woo LEE
G01 - MEASURING TESTING
Information
Patent Application
RADIOGRAPHIC INSPECTION APPARATUS AND VEHICLE-MOUNTED SECURITY INSP...
Publication number
20240151661
Publication date
May 9, 2024
Nuctech Company Limited
Li ZHANG
G01 - MEASURING TESTING
Information
Patent Application
Calibration Method and Device Therefor
Publication number
20240134083
Publication date
Apr 25, 2024
Rapiscan Holdings, Inc.
Emmanuel St-Aubin
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Generating High-Energy Three-Dimensional Co...
Publication number
20240094147
Publication date
Mar 21, 2024
Rapiscan Holdings, Inc.
Mark Procter
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RADIATION INSPECTION SYSTEM
Publication number
20240085349
Publication date
Mar 14, 2024
Nuctech Company Limited
Zhiqiang CHEN
G01 - MEASURING TESTING
Information
Patent Application
RADIATION INSPECTION DEVICE
Publication number
20240069240
Publication date
Feb 29, 2024
Nuctech Company Limited
Lei LIU
G01 - MEASURING TESTING
Information
Patent Application
DISINFECTION APPARATUS FOR TRANSPORT CONTAINERS OF AN INSPECTION AR...
Publication number
20240066167
Publication date
Feb 29, 2024
SMITHS DETECTION GERMANY GMBH
Gregor HESS
G01 - MEASURING TESTING
Information
Patent Application
A SCREENING SYSTEM
Publication number
20240044813
Publication date
Feb 8, 2024
Halo X Ray Technologies Limited
Anthony DICKEN
G01 - MEASURING TESTING
Information
Patent Application
SORTING SUPPORT APPARATUS, SORTING SUPPORT SYSTEM, SORTING SUPPORT...
Publication number
20240044815
Publication date
Feb 8, 2024
NEC Corporation
Masahiro KAJI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SORTING SUPPORT APPARATUS, SORTING SUPPORT SYSTEM, SORTING SUPPORT...
Publication number
20240044816
Publication date
Feb 8, 2024
NEC Corporation
Masahiro KAJI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SORTING SUPPORT APPARATUS, SORTING SUPPORT SYSTEM, SORTING SUPPORT...
Publication number
20240044814
Publication date
Feb 8, 2024
NEC Corporation
Masahiro KAJI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Rotational X-ray Inspection System and Method
Publication number
20240044812
Publication date
Feb 8, 2024
Viken Detection Corporation
Peter J. Rothschild
G01 - MEASURING TESTING