the measurements made in two or more directions, angles, positions

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CPC
G01N2021/887

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/887the measurements made in two or more directions, angles, positions

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Patents Grantslast 30 patents

Information Patent Grant
Processing method and processing device
- Patent number 12,085,512
- Issue date Sep 10, 2024
- Lenovo (Beijing) Limited
- Wei Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimized printing defect compensation using automatic job image re...
- Patent number 12,076,976
- Issue date Sep 3, 2024
- Xerox Corporation
- Dara N. Lubin
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Information processing apparatus, information processing method, an...
- Patent number 12,072,297
- Issue date Aug 27, 2024
- Canon Kabushiki Kaisha
- Shoichi Hoshino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data processing method and system for detection of deterioration of...
- Patent number 12,055,498
- Issue date Aug 6, 2024
- Top Technology Platform Co., Ltd.
- Chyuan-Ruey Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for assessing wear on the tread of a shoe for lim...
- Patent number 12,050,182
- Issue date Jul 30, 2024
- University of Pittsburgh of the Commonwealth System of Higher Education
- Sarah L. Hemler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non invasive process for the evaluation of the quality of internal...
- Patent number 12,019,079
- Issue date Jun 25, 2024
- Ecole Centrale de Lyon
- Thierry Hoc
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing apparatus, information processing method, an...
- Patent number 11,898,966
- Issue date Feb 13, 2024
- Canon Kabushiki Kaisha
- Shoichi Hoshino
- G01 - MEASURING TESTING
Information Patent Grant
Grading cosmetic appearance of a test object based on multi-region...
- Patent number 11,836,912
- Issue date Dec 5, 2023
- Future Dial, Inc.
- Yan Zhou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for inspecting containers which are at least p...
- Patent number 11,815,469
- Issue date Nov 14, 2023
- Stevanato Group S.P.A.
- Luca Vallati
- G01 - MEASURING TESTING
Information Patent Grant
Identification of defect types in liquid pipelines for classificati...
- Patent number 11,790,518
- Issue date Oct 17, 2023
- TATA Consultancy Services Limited
- Jayavardhana Rama Gubbi Lakshminarasimha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart coordinate conversion and calibration system in semiconductor...
- Patent number 11,774,372
- Issue date Oct 3, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart coordinate conversion and calibration system in semiconductor...
- Patent number 11,774,373
- Issue date Oct 3, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart defect calibration system in semiconductor wafer manufacturing
- Patent number 11,761,904
- Issue date Sep 19, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for performing smart semiconductor wafer defect calibration
- Patent number 11,719,650
- Issue date Aug 8, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for smart conversion and calibration of coordinate
- Patent number 11,719,649
- Issue date Aug 8, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for smart conversion and calibration of coordinate
- Patent number 11,719,648
- Issue date Aug 8, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical scanning for industrial metrology
- Patent number 11,712,837
- Issue date Aug 1, 2023
- Inkbit, LLC
- Wojciech Matusik
- G01 - MEASURING TESTING
Information Patent Grant
Method and devices to construct artificial inline defects to calibr...
- Patent number 11,685,129
- Issue date Jun 27, 2023
- United States of America as Represented by the Adminstrator of NASA
- Peter D. Juarez
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Multimode defect classification in semiconductor inspection
- Patent number 11,668,655
- Issue date Jun 6, 2023
- KLA Corporation
- Vaibhav Gaind
- G01 - MEASURING TESTING
Information Patent Grant
Processing condition determination system and processing condition...
- Patent number 11,609,188
- Issue date Mar 21, 2023
- Hitachi, Ltd.
- Hyakka Nakada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-sensor pipe inspection system and method
- Patent number 11,598,728
- Issue date Mar 7, 2023
- HYDROMAX USA, LLC
- Guy Schiavone
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Baffles for three-dimensional sensors having spherical fields of view
- Patent number 11,475,584
- Issue date Oct 18, 2022
- MAGIK EYE INC.
- Akiteru Kimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Intelligent defect identification system
- Patent number 11,320,385
- Issue date May 3, 2022
- Seagate Technology LLC
- Kurtis Dean Loken
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for detecting wafer backside defect
- Patent number 11,307,151
- Issue date Apr 19, 2022
- Shanghai Huali Integrated Circuit Corporation
- Zengyi Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device for optically checking appearance of product for...
- Patent number 11,249,029
- Issue date Feb 15, 2022
- Fu Tai Hua Industry (Shenzhen) Co., Ltd.
- Liu-Bin Hu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Appearance inspection system, setting device, and inspection method
- Patent number 11,218,642
- Issue date Jan 4, 2022
- Omron Corporation
- Yutaka Kato
- G01 - MEASURING TESTING
Information Patent Grant
Strain measurement method and strain measurement apparatus
- Patent number 11,204,240
- Issue date Dec 21, 2021
- Industrial Technology Research Institute
- I-Hung Chiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-sensor pipe inspection utilizing pipe templates to determine...
- Patent number 11,193,896
- Issue date Dec 7, 2021
- HYDROMAX USA, LLC
- Adam Fredrick Stewart
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic device for optically checking appearance of product for...
- Patent number 11,156,563
- Issue date Oct 26, 2021
- Fu Tai Hua Industry (Shenzhen) Co., Ltd.
- Liu-Bin Hu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection device
- Patent number 11,143,600
- Issue date Oct 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR GRADING, PROCESSING, AND LOADING LOGS
- Publication number 20240420309
- Publication date Dec 19, 2024
- Hendtech LLC
- Andrew Henderson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPUTTER MEASUREMENT SYSTEM
- Publication number 20240383077
- Publication date Nov 21, 2024
- Prime Planet Energy & Solutions, Inc.
- Takashi YOSHIDA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
VISUAL INSPECTION APPARATUS AND VISUAL INSPECTION METHOD
- Publication number 20240353347
- Publication date Oct 24, 2024
- Hitachi Astemo, Ltd.
- Shinichi INOUE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR FINDING BLACK SPOTS IN SEPARATOR
- Publication number 20240337602
- Publication date Oct 10, 2024
- Samsung SDI Co., Ltd.
- Jungyi YU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD FOR FILTER
- Publication number 20240302288
- Publication date Sep 12, 2024
- Japan Tobacco Inc.
- Shota KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ELECTROMAGNETIC MONITORING OF ACTIVE CRACKS I...
- Publication number 20240219311
- Publication date Jul 4, 2024
- TSINGHUA UNIVERSITY
- Songling Huang
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS, RECORDING MEDIUM, AND INSPECTION SYSTEM
- Publication number 20240192143
- Publication date Jun 13, 2024
- Konica Minolta, Inc.
- Masaru OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTS IN THE SURFACE OF CURVED...
- Publication number 20240183791
- Publication date Jun 6, 2024
- NORDISCHER MASCHINENBAU RUD. BAADER GMBH + CO. KG
- Ulf Jacobsen
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE, INSPECTION METHOD, AND PROGRAM
- Publication number 20240183793
- Publication date Jun 6, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Jeffry NAINGGOLAN
- G01 - MEASURING TESTING
Information Patent Application
Method for Inspecting Surface Deformation of Structure, System for...
- Publication number 20240175823
- Publication date May 30, 2024
- Keiwa Incorporated
- Satoru Tani
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
- Publication number 20240151650
- Publication date May 9, 2024
- Canon Kabushiki Kaisha
- Shoichi Hoshino
- G01 - MEASURING TESTING
Information Patent Application
MACRO PLASTIC AND MICRO PLASTIC DETECTION METHOD BASED ON RGB AND H...
- Publication number 20240125712
- Publication date Apr 18, 2024
- Tongji University
- Pinjing He
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED FLUID LEAK DETECTION USING MULTIPLE SENSORS
- Publication number 20240110878
- Publication date Apr 4, 2024
- Chevron U.S.A. Inc.
- Nikolaos Ioannis Salmatanis
- G01 - MEASURING TESTING
Information Patent Application
GRADING COSMETIC APPEARANCE OF A TEST OBJECT
- Publication number 20240062363
- Publication date Feb 22, 2024
- FUTURE DIAL, INC.
- Yan Zhou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION DEVICE AND METHOD FOR INSPECTING DEFECT
- Publication number 20240060904
- Publication date Feb 22, 2024
- SAMSUNG DISPLAY CO., LTD.
- Jeong Moon LEE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETECTING A FALSE ERROR ON A COMPONENT OF A B...
- Publication number 20240053278
- Publication date Feb 15, 2024
- Siemens Industry Software Inc.
- Tova Yadin
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING DEFECTS
- Publication number 20240035983
- Publication date Feb 1, 2024
- WITRINS S.R.O.
- Pavel Linhart
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING DEFECTS OF THE HORIZONTAL MOLD SEAL FOR GLASS...
- Publication number 20240003823
- Publication date Jan 4, 2024
- TIAMA
- Lubin FAYOLLE
- G01 - MEASURING TESTING
Information Patent Application
Foreign Substance Detection Device and Detection Method
- Publication number 20230358688
- Publication date Nov 9, 2023
- LG ENERGY SOLUTION, LTD.
- Jeong Ho Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR ASSESSING WEAR ON THE TREAD OF A SHOE FOR LIM...
- Publication number 20230228689
- Publication date Jul 20, 2023
- University of Pittsburgh of the Commonwealth System of Higher Education
- SARAH L. HEMLER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEATHER DEFECT DETECTION SYSTEM
- Publication number 20230213456
- Publication date Jul 6, 2023
- Feng Chia University
- Sze Teng LIONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT CLASSIFICATION EQUIPMENT FOR SILICON CARBIDE SUBSTRATE USING...
- Publication number 20230113093
- Publication date Apr 13, 2023
- ETAMAX CO., LTD
- Huyndon JUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSING METHOD AND PROCESSING DEVICE
- Publication number 20230093531
- Publication date Mar 23, 2023
- Lenovo (Beijing) Limited
- Wei LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERIORATION DIAGNOSIS DEVICE, DETERIORATION DIAGNOSIS METHOD, AND...
- Publication number 20230081098
- Publication date Mar 16, 2023
- NEC Corporation
- Chisato SUGAWARA
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SENSOR PIPE INSPECTION SYSTEM AND METHOD
- Publication number 20230077875
- Publication date Mar 16, 2023
- Hydromax USA, LLC
- Guy Schiavone
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZED PRINTING DEFECT COMPENSATION USING AUTOMATIC JOB IMAGE RE...
- Publication number 20230068167
- Publication date Mar 2, 2023
- Xerox Corporation
- Dara N. Lubin
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
SURFACE DEFECT MONITORING SYSTEM
- Publication number 20220373473
- Publication date Nov 24, 2022
- NOVI LLC
- Scott Steffan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
- Publication number 20220373475
- Publication date Nov 24, 2022
- Canon Kabushiki Kaisha
- Shoichi Hoshino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING CONTAINERS WHICH ARE AT LEAST P...
- Publication number 20220349831
- Publication date Nov 3, 2022
- Stevanato Group S.P.A.
- Luca Vallati
- G01 - MEASURING TESTING
Information Patent Application
DATA PROCESSING METHOD AND SYSTEM FOR DETECTION OF DETERIORATION OF...
- Publication number 20220283099
- Publication date Sep 8, 2022
- TOP TECHNOLOGY PLATFORM CO., LTD.
- Chyuan-Ruey LIN
- G01 - MEASURING TESTING

the measurements made in two or more directions, angles, positions

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Processing method and processing device

Optimized printing defect compensation using automatic job image re...

Information processing apparatus, information processing method, an...

Data processing method and system for detection of deterioration of...

System and method for assessing wear on the tread of a shoe for lim...

Non invasive process for the evaluation of the quality of internal...

Information processing apparatus, information processing method, an...

Grading cosmetic appearance of a test object based on multi-region...

Apparatus and method for inspecting containers which are at least p...

Identification of defect types in liquid pipelines for classificati...

Smart coordinate conversion and calibration system in semiconductor...

Smart coordinate conversion and calibration system in semiconductor...

Smart defect calibration system in semiconductor wafer manufacturing

Method for performing smart semiconductor wafer defect calibration

Method for smart conversion and calibration of coordinate

Method for smart conversion and calibration of coordinate

Optical scanning for industrial metrology

Method and devices to construct artificial inline defects to calibr...

Multimode defect classification in semiconductor inspection

Processing condition determination system and processing condition...

Multi-sensor pipe inspection system and method

Baffles for three-dimensional sensors having spherical fields of view

Intelligent defect identification system

Method for detecting wafer backside defect

Electronic device for optically checking appearance of product for...

Appearance inspection system, setting device, and inspection method

Strain measurement method and strain measurement apparatus

Multi-sensor pipe inspection utilizing pipe templates to determine...

Electronic device for optically checking appearance of product for...

Defect inspection device

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR GRADING, PROCESSING, AND LOADING LOGS

SPUTTER MEASUREMENT SYSTEM

VISUAL INSPECTION APPARATUS AND VISUAL INSPECTION METHOD

METHOD FOR FINDING BLACK SPOTS IN SEPARATOR

INSPECTION DEVICE AND INSPECTION METHOD FOR FILTER

SYSTEM AND METHOD FOR ELECTROMAGNETIC MONITORING OF ACTIVE CRACKS I...

INSPECTION APPARATUS, RECORDING MEDIUM, AND INSPECTION SYSTEM

METHOD AND APPARATUS FOR DETECTING DEFECTS IN THE SURFACE OF CURVED...

INSPECTION DEVICE, INSPECTION METHOD, AND PROGRAM

Method for Inspecting Surface Deformation of Structure, System for...

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...

MACRO PLASTIC AND MICRO PLASTIC DETECTION METHOD BASED ON RGB AND H...

INTEGRATED FLUID LEAK DETECTION USING MULTIPLE SENSORS

GRADING COSMETIC APPEARANCE OF A TEST OBJECT

DEFECT INSPECTION DEVICE AND METHOD FOR INSPECTING DEFECT

METHOD AND SYSTEM FOR DETECTING A FALSE ERROR ON A COMPONENT OF A B...

INSPECTION SYSTEM AND METHOD FOR ANALYZING DEFECTS

METHOD FOR DETECTING DEFECTS OF THE HORIZONTAL MOLD SEAL FOR GLASS...

Foreign Substance Detection Device and Detection Method

SYSTEM AND METHOD FOR ASSESSING WEAR ON THE TREAD OF A SHOE FOR LIM...

LEATHER DEFECT DETECTION SYSTEM

DEFECT CLASSIFICATION EQUIPMENT FOR SILICON CARBIDE SUBSTRATE USING...

PROCESSING METHOD AND PROCESSING DEVICE

DETERIORATION DIAGNOSIS DEVICE, DETERIORATION DIAGNOSIS METHOD, AND...

MULTI-SENSOR PIPE INSPECTION SYSTEM AND METHOD

OPTIMIZED PRINTING DEFECT COMPENSATION USING AUTOMATIC JOB IMAGE RE...

SURFACE DEFECT MONITORING SYSTEM

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...

APPARATUS AND METHOD FOR INSPECTING CONTAINERS WHICH ARE AT LEAST P...

DATA PROCESSING METHOD AND SYSTEM FOR DETECTION OF DETERIORATION OF...