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G01N2021/887
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N2021/887
the measurements made in two or more directions, angles, positions
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last 30 patents
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Patent Grant
Information processing apparatus, information processing method, an...
Patent number
11,898,966
Issue date
Feb 13, 2024
Canon Kabushiki Kaisha
Shoichi Hoshino
G01 - MEASURING TESTING
Information
Patent Grant
Grading cosmetic appearance of a test object based on multi-region...
Patent number
11,836,912
Issue date
Dec 5, 2023
Future Dial, Inc.
Yan Zhou
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Apparatus and method for inspecting containers which are at least p...
Patent number
11,815,469
Issue date
Nov 14, 2023
Stevanato Group S.P.A.
Luca Vallati
G01 - MEASURING TESTING
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Patent Grant
Identification of defect types in liquid pipelines for classificati...
Patent number
11,790,518
Issue date
Oct 17, 2023
TATA Consultancy Services Limited
Jayavardhana Rama Gubbi Lakshminarasimha
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Smart coordinate conversion and calibration system in semiconductor...
Patent number
11,774,372
Issue date
Oct 3, 2023
Elite Semiconductor Inc.
Iyun Leu
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Smart coordinate conversion and calibration system in semiconductor...
Patent number
11,774,373
Issue date
Oct 3, 2023
Elite Semiconductor Inc.
Iyun Leu
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Smart defect calibration system in semiconductor wafer manufacturing
Patent number
11,761,904
Issue date
Sep 19, 2023
Elite Semiconductor Inc.
Iyun Leu
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Method for performing smart semiconductor wafer defect calibration
Patent number
11,719,650
Issue date
Aug 8, 2023
Elite Semiconductor Inc.
Iyun Leu
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Method for smart conversion and calibration of coordinate
Patent number
11,719,649
Issue date
Aug 8, 2023
Elite Semiconductor Inc.
Iyun Leu
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Method for smart conversion and calibration of coordinate
Patent number
11,719,648
Issue date
Aug 8, 2023
Elite Semiconductor Inc.
Iyun Leu
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Optical scanning for industrial metrology
Patent number
11,712,837
Issue date
Aug 1, 2023
Inkbit, LLC
Wojciech Matusik
G01 - MEASURING TESTING
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Patent Grant
Method and devices to construct artificial inline defects to calibr...
Patent number
11,685,129
Issue date
Jun 27, 2023
United States of America as Represented by the Adminstrator of NASA
Peter D. Juarez
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
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Patent Grant
Multimode defect classification in semiconductor inspection
Patent number
11,668,655
Issue date
Jun 6, 2023
KLA Corporation
Vaibhav Gaind
G01 - MEASURING TESTING
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Patent Grant
Processing condition determination system and processing condition...
Patent number
11,609,188
Issue date
Mar 21, 2023
Hitachi, Ltd.
Hyakka Nakada
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Multi-sensor pipe inspection system and method
Patent number
11,598,728
Issue date
Mar 7, 2023
HYDROMAX USA, LLC
Guy Schiavone
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Baffles for three-dimensional sensors having spherical fields of view
Patent number
11,475,584
Issue date
Oct 18, 2022
MAGIK EYE INC.
Akiteru Kimura
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Intelligent defect identification system
Patent number
11,320,385
Issue date
May 3, 2022
Seagate Technology LLC
Kurtis Dean Loken
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Method for detecting wafer backside defect
Patent number
11,307,151
Issue date
Apr 19, 2022
Shanghai Huali Integrated Circuit Corporation
Zengyi Yuan
G01 - MEASURING TESTING
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Patent Grant
Electronic device for optically checking appearance of product for...
Patent number
11,249,029
Issue date
Feb 15, 2022
Fu Tai Hua Industry (Shenzhen) Co., Ltd.
Liu-Bin Hu
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Appearance inspection system, setting device, and inspection method
Patent number
11,218,642
Issue date
Jan 4, 2022
Omron Corporation
Yutaka Kato
G01 - MEASURING TESTING
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Patent Grant
Strain measurement method and strain measurement apparatus
Patent number
11,204,240
Issue date
Dec 21, 2021
Industrial Technology Research Institute
I-Hung Chiang
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Multi-sensor pipe inspection utilizing pipe templates to determine...
Patent number
11,193,896
Issue date
Dec 7, 2021
HYDROMAX USA, LLC
Adam Fredrick Stewart
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Electronic device for optically checking appearance of product for...
Patent number
11,156,563
Issue date
Oct 26, 2021
Fu Tai Hua Industry (Shenzhen) Co., Ltd.
Liu-Bin Hu
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Defect inspection device
Patent number
11,143,600
Issue date
Oct 12, 2021
HITACHI HIGH-TECH CORPORATION
Toshifumi Honda
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Smart defect calibration system and the method thereof
Patent number
11,016,035
Issue date
May 25, 2021
Elite Semiconductor Inc.
Iyun Leu
G01 - MEASURING TESTING
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Patent Grant
Method for producing an OSB
Patent number
10,955,357
Issue date
Mar 23, 2021
SWISS KRONO TEC AG
Norbert Kalwa
G01 - MEASURING TESTING
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Patent Grant
Interactive semi-automated borescope video analysis and damage asse...
Patent number
10,878,556
Issue date
Dec 29, 2020
United Technologies Corporation
Paul D. Hestand
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Remote visual inspection method and system
Patent number
10,853,645
Issue date
Dec 1, 2020
COLLINEO INC.
Guillaume Lambert
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Inspection and cosmetic grading through image processing system and...
Patent number
10,753,882
Issue date
Aug 25, 2020
Amit Anil Mahajan
G06 - COMPUTING CALCULATING COUNTING
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Item inspecting device
Patent number
10,713,775
Issue date
Jul 14, 2020
Koh Young Technology Inc.
Young Heon Bae
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
INSPECTION APPARATUS, RECORDING MEDIUM, AND INSPECTION SYSTEM
Publication number
20240192143
Publication date
Jun 13, 2024
Konica Minolta, Inc.
Masaru OHTSUKA
G01 - MEASURING TESTING
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Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTS IN THE SURFACE OF CURVED...
Publication number
20240183791
Publication date
Jun 6, 2024
NORDISCHER MASCHINENBAU RUD. BAADER GMBH + CO. KG
Ulf Jacobsen
G01 - MEASURING TESTING
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Patent Application
INSPECTION DEVICE, INSPECTION METHOD, AND PROGRAM
Publication number
20240183793
Publication date
Jun 6, 2024
Panasonic Intellectual Property Management Co., Ltd.
Jeffry NAINGGOLAN
G01 - MEASURING TESTING
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Patent Application
Method for Inspecting Surface Deformation of Structure, System for...
Publication number
20240175823
Publication date
May 30, 2024
Keiwa Incorporated
Satoru Tani
E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
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Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
Publication number
20240151650
Publication date
May 9, 2024
Canon Kabushiki Kaisha
Shoichi Hoshino
G01 - MEASURING TESTING
Information
Patent Application
MACRO PLASTIC AND MICRO PLASTIC DETECTION METHOD BASED ON RGB AND H...
Publication number
20240125712
Publication date
Apr 18, 2024
Tongji University
Pinjing He
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED FLUID LEAK DETECTION USING MULTIPLE SENSORS
Publication number
20240110878
Publication date
Apr 4, 2024
Chevron U.S.A. Inc.
Nikolaos Ioannis Salmatanis
G01 - MEASURING TESTING
Information
Patent Application
GRADING COSMETIC APPEARANCE OF A TEST OBJECT
Publication number
20240062363
Publication date
Feb 22, 2024
FUTURE DIAL, INC.
Yan Zhou
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT INSPECTION DEVICE AND METHOD FOR INSPECTING DEFECT
Publication number
20240060904
Publication date
Feb 22, 2024
SAMSUNG DISPLAY CO., LTD.
Jeong Moon LEE
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR DETECTING A FALSE ERROR ON A COMPONENT OF A B...
Publication number
20240053278
Publication date
Feb 15, 2024
Siemens Industry Software Inc.
Tova Yadin
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING DEFECTS
Publication number
20240035983
Publication date
Feb 1, 2024
WITRINS S.R.O.
Pavel Linhart
G01 - MEASURING TESTING
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Patent Application
METHOD FOR DETECTING DEFECTS OF THE HORIZONTAL MOLD SEAL FOR GLASS...
Publication number
20240003823
Publication date
Jan 4, 2024
TIAMA
Lubin FAYOLLE
G01 - MEASURING TESTING
Information
Patent Application
Foreign Substance Detection Device and Detection Method
Publication number
20230358688
Publication date
Nov 9, 2023
LG ENERGY SOLUTION, LTD.
Jeong Ho Park
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR ASSESSING WEAR ON THE TREAD OF A SHOE FOR LIM...
Publication number
20230228689
Publication date
Jul 20, 2023
University of Pittsburgh of the Commonwealth System of Higher Education
SARAH L. HEMLER
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LEATHER DEFECT DETECTION SYSTEM
Publication number
20230213456
Publication date
Jul 6, 2023
Feng Chia University
Sze Teng LIONG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT CLASSIFICATION EQUIPMENT FOR SILICON CARBIDE SUBSTRATE USING...
Publication number
20230113093
Publication date
Apr 13, 2023
ETAMAX CO., LTD
Huyndon JUNG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PROCESSING METHOD AND PROCESSING DEVICE
Publication number
20230093531
Publication date
Mar 23, 2023
Lenovo (Beijing) Limited
Wei LIU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DETERIORATION DIAGNOSIS DEVICE, DETERIORATION DIAGNOSIS METHOD, AND...
Publication number
20230081098
Publication date
Mar 16, 2023
NEC Corporation
Chisato SUGAWARA
G01 - MEASURING TESTING
Information
Patent Application
MULTI-SENSOR PIPE INSPECTION SYSTEM AND METHOD
Publication number
20230077875
Publication date
Mar 16, 2023
Hydromax USA, LLC
Guy Schiavone
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTIMIZED PRINTING DEFECT COMPENSATION USING AUTOMATIC JOB IMAGE RE...
Publication number
20230068167
Publication date
Mar 2, 2023
Xerox Corporation
Dara N. Lubin
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
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Patent Application
SURFACE DEFECT MONITORING SYSTEM
Publication number
20220373473
Publication date
Nov 24, 2022
NOVI LLC
Scott Steffan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
Publication number
20220373475
Publication date
Nov 24, 2022
Canon Kabushiki Kaisha
Shoichi Hoshino
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS AND METHOD FOR INSPECTING CONTAINERS WHICH ARE AT LEAST P...
Publication number
20220349831
Publication date
Nov 3, 2022
Stevanato Group S.P.A.
Luca Vallati
G01 - MEASURING TESTING
Information
Patent Application
DATA PROCESSING METHOD AND SYSTEM FOR DETECTION OF DETERIORATION OF...
Publication number
20220283099
Publication date
Sep 8, 2022
TOP TECHNOLOGY PLATFORM CO., LTD.
Chyuan-Ruey LIN
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
Publication number
20220099588
Publication date
Mar 31, 2022
Canon Kabushiki Kaisha
Shoichi Hoshino
G01 - MEASURING TESTING
Information
Patent Application
GRADING COSMETIC APPEARANCE OF A TEST OBJECT
Publication number
20220092757
Publication date
Mar 24, 2022
FUTURE DIAL, INC.
Yan Zhou
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IDENTIFICATION OF DEFECT TYPES IN LIQUID PIPELINES FOR CLASSIFICATI...
Publication number
20220036541
Publication date
Feb 3, 2022
TATA CONSULTANCY SERVICES LIMITED
Jayavardhana Rama Gubbi Lakshminarasimha
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PROCESSING CONDITION DETERMINATION SYSTEM AND PROCESSING CONDITION...
Publication number
20210372943
Publication date
Dec 2, 2021
Hitachi, Ltd
Hyakka Nakada
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
STRAIN MEASUREMENT METHOD AND STRAIN MEASUREMENT APPARATUS
Publication number
20210356403
Publication date
Nov 18, 2021
Industrial Technology Research Institute
I-Hung Chiang
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SCANNING FOR INDUSTRIAL METROLOGY
Publication number
20210252775
Publication date
Aug 19, 2021
Inkbit, LLC
Wojciech Matusik
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL