the pulse characteristic being rise time

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CPC
G01R29/0276

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00

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G01R29/0276the pulse characteristic being rise time

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Patents Grantslast 30 patents

Information Patent Grant
Jitter noise detector
- Patent number 12,072,365
- Issue date Aug 27, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tien-Chien Huang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Jitter noise detector
- Patent number 11,808,798
- Issue date Nov 7, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tien-Chien Huang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Jitter noise detector
- Patent number 11,513,147
- Issue date Nov 29, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tien-Chien Huang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method to estimate the rise-time of a pulse for single and multi-ch...
- Patent number 11,156,647
- Issue date Oct 26, 2021
- BAE Systems Information and Electronic Systems Integration Inc.
- Masoud Farshchian
- G01 - MEASURING TESTING
Information Patent Grant
Jitter noise detector
- Patent number 10,845,404
- Issue date Nov 24, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tien-Chien Huang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Power supply glitch detector
- Patent number 10,156,595
- Issue date Dec 18, 2018
- MICROSEMI SOC CORP.
- Bhawana Singh Nirwan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and circuit for assessing pulse-width-modulated signals
- Patent number 9,638,732
- Issue date May 2, 2017
- ZF Friedrichshafen AG
- Florian Weinl
- G01 - MEASURING TESTING
Information Patent Grant
Increased reliability in the processing of digital signals
- Patent number 8,738,331
- Issue date May 27, 2014
- ABB Technology AG
- Hans Björklund
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit for evaluating characteristic of analog signal of device
- Patent number 7,079,060
- Issue date Jul 18, 2006
- Renesas Technology Corp.
- Toshiaki Tarui
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive fixed-threshold pulse time-of-arrival detection apparatus...
- Patent number 5,266,953
- Issue date Nov 30, 1993
- Allied-Signal Inc.
- Robert J. Kelly
- G01 - MEASURING TESTING
Information Patent Grant
Risetime and falltime test system and method
- Patent number 5,194,818
- Issue date Mar 16, 1993
- National Semiconductor Corporation
- Harry J. Scheibner
- G01 - MEASURING TESTING
Information Patent Grant
Pulse position measurement type meter-driving circuit capable of im...
- Patent number 5,138,639
- Issue date Aug 11, 1992
- Kabushiki Kaisha Toshiba
- Yoshihito Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Time domain reflectometer
- Patent number 4,866,302
- Issue date Sep 12, 1989
- Hypres, Incorporated
- Stephen R. Whiteley
- G01 - MEASURING TESTING
Information Patent Grant
Timing signal generator
- Patent number 4,864,160
- Issue date Sep 5, 1989
- Schlumberger Systems and Services, Inc.
- David G. Abdoo
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring settling characteristics of a de...
- Patent number 4,833,403
- Issue date May 23, 1989
- Hewlett-Packard Company
- Toshio Tamamura
- G01 - MEASURING TESTING
Information Patent Grant
Test method of A/D converter
- Patent number 4,795,963
- Issue date Jan 3, 1989
- Hitachi, Ltd.
- Toshiaki Ueno
- G01 - MEASURING TESTING
Information Patent Grant
Time domain reflectometer
- Patent number 4,789,794
- Issue date Dec 6, 1988
- Hypres Incorporated
- Stephen R. Whiteley
- G01 - MEASURING TESTING
Information Patent Grant
Ultra high resolution Josephson sampling technique
- Patent number 4,631,423
- Issue date Dec 23, 1986
- International Business Machines Corporation
- Sadeg M. Faris
- G01 - MEASURING TESTING
Information Patent Grant
Pulse arrival time determining device, use thereof in distance-meas...
- Patent number 4,518,964
- Issue date May 21, 1985
- Thomson-CSF
- Joseph Hetyei
- G01 - MEASURING TESTING
Information Patent Grant
Ultra high resolution Josephson sampling technique
- Patent number 4,401,900
- Issue date Aug 30, 1983
- International Business Machines Corporation
- Sadeg M. Faris
- G01 - MEASURING TESTING
Information Patent Grant
Overvoltage-pulse analyzer
- Patent number 4,365,193
- Issue date Dec 21, 1982
- CSELT - Centro Studi e Laboratori Telecomunicazioni S.p.A.
- Adriano Bollero
- G01 - MEASURING TESTING
Information Patent Grant
3543159
- Patent number 3,543,159
- Issue date Nov 24, 1970
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NOVEL JITTER NOISE DETECTOR
- Publication number 20230400494
- Publication date Dec 14, 2023
- Taiwan Semiconductor Manufacturing Co., LTD
- Tien-Chien HUANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
NOVEL JITTER NOISE DETECTOR
- Publication number 20230040034
- Publication date Feb 9, 2023
- Taiwan Semiconductor Manufacturing Co., LTD
- Tien-Chien HUANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
JITTER NOISE DETECTOR
- Publication number 20210072300
- Publication date Mar 11, 2021
- Taiwan Semiconductor Manufacturing Co., LTD
- Tien-Chien HUANG
- G01 - MEASURING TESTING
Information Patent Application
Power Supply Glitch Detector
- Publication number 20180164351
- Publication date Jun 14, 2018
- Microsemi SoC Corp.
- Bhawana Singh Nirwan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method For Arc Detection And Devices Thereof
- Publication number 20120280717
- Publication date Nov 8, 2012
- Junhua Fu
- G01 - MEASURING TESTING
Information Patent Application
INCREASED RELIABILITY IN THE PROCESSING OF DIGITAL SIGNALS
- Publication number 20100289551
- Publication date Nov 18, 2010
- ABB TECHNOLOGY AG
- Hans Björklund
- G01 - MEASURING TESTING
Information Patent Application
Test circuit for evaluating characteristic of analog signal of device
- Publication number 20050179576
- Publication date Aug 18, 2005
- RENESAS TECHNOLOGY CORP.
- Toshiaki Tarui
- G01 - MEASURING TESTING
Information Patent Application
Circuit for measuring rising or falling time of high-speed data and...
- Publication number 20030187599
- Publication date Oct 2, 2003
- Du-sik Yoo
- G01 - MEASURING TESTING

the pulse characteristic being rise time

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Jitter noise detector

Jitter noise detector

Jitter noise detector

Method to estimate the rise-time of a pulse for single and multi-ch...

Jitter noise detector

Power supply glitch detector

Method and circuit for assessing pulse-width-modulated signals

Increased reliability in the processing of digital signals

Test circuit for evaluating characteristic of analog signal of device

Adaptive fixed-threshold pulse time-of-arrival detection apparatus...

Risetime and falltime test system and method

Pulse position measurement type meter-driving circuit capable of im...

Time domain reflectometer

Timing signal generator

Method and apparatus for measuring settling characteristics of a de...

Test method of A/D converter

Time domain reflectometer

Ultra high resolution Josephson sampling technique

Pulse arrival time determining device, use thereof in distance-meas...

Ultra high resolution Josephson sampling technique

Overvoltage-pulse analyzer

3543159

Patents Applicationslast 30 patents

NOVEL JITTER NOISE DETECTOR

NOVEL JITTER NOISE DETECTOR

JITTER NOISE DETECTOR

Power Supply Glitch Detector

Method For Arc Detection And Devices Thereof

INCREASED RELIABILITY IN THE PROCESSING OF DIGITAL SIGNALS

Test circuit for evaluating characteristic of analog signal of device

Circuit for measuring rising or falling time of high-speed data and...