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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q30/00Auxiliary means serving to assist or improve the scanning probe techniques or apparatus

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G01Q30/10Thermal environment

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Initiating and monitoring the evolution of single electrons within...
- Patent number 11,635,450
- Issue date Apr 25, 2023
- QUANTUM SILICON INC.
- Robert Wolkow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning probe microscope, scan head and method
- Patent number 11,592,460
- Issue date Feb 28, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Roelof Willem Herfst
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe nanotomograph comprising an optical analysis module
- Patent number 11,150,266
- Issue date Oct 19, 2021
- NAZARBAYEV UNIVERSITY RESEARCH AND INNOVATION SYSTEM
- Alexander Mihaylovich Alekseev
- G01 - MEASURING TESTING
Information Patent Grant
Initiating and monitoring the evolution of single electrons within...
- Patent number 11,047,877
- Issue date Jun 29, 2021
- QUANTUM SILICON INC.
- Robert Wolkow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low drift system for a metrology instrument
- Patent number 10,900,997
- Issue date Jan 26, 2021
- Bruker Nano, Inc.
- Andrew Neushul
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for generating three-dimensional image of poly...
- Patent number 10,740,948
- Issue date Aug 11, 2020
- Hanbat National University Industry-Academic Cooperation Foundation
- Sang Mo Shin
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope combined with a device for acting on a pr...
- Patent number 10,690,698
- Issue date Jun 23, 2020
- Chastnoe Uchrezhdenie “Nazarbayev University Research and Innovation System”
- Alexander Mihaylovich Alekseev
- G01 - MEASURING TESTING
Information Patent Grant
Cryogenic cooling system
- Patent number 10,627,424
- Issue date Apr 21, 2020
- Oxford Instruments Nanotechnology Tools Limited
- Mark Patton
- G01 - MEASURING TESTING
Information Patent Grant
Surface measurement probe
- Patent number 10,436,562
- Issue date Oct 8, 2019
- ANTON PAAR TRITEC SA
- Bertrand Bellaton
- G01 - MEASURING TESTING
Information Patent Grant
Modular atomic force microscope with environmental controls
- Patent number 10,416,190
- Issue date Sep 17, 2019
- Oxford Instruments Asylum Research Inc
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Grant
Structure for achieving dimensional stability during temperature ch...
- Patent number 10,168,261
- Issue date Jan 1, 2019
- KLA-Tencor Corporation
- Warren Oliver
- G01 - MEASURING TESTING
Information Patent Grant
Modular atomic force microscope with environmental controls
- Patent number 9,581,616
- Issue date Feb 28, 2017
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip heating assembly
- Patent number 9,476,816
- Issue date Oct 25, 2016
- Hysitron, Inc.
- Roger William Schmitz
- G01 - MEASURING TESTING
Information Patent Grant
Low drift scanning probe microscope
- Patent number 9,116,168
- Issue date Aug 25, 2015
- Bruker Nano, Inc.
- Anthonius G. Ruiter
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Device for the light stimulation and cryopreservation of biological...
- Patent number 9,097,632
- Issue date Aug 4, 2015
- Leica Mikrosysteme GmbH
- Reinhard Lihl
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Apparatus for mechanically robust thermal isolation of components
- Patent number 9,081,029
- Issue date Jul 14, 2015
- The United States of America as represented by the Secretary of the Army
- Doran Smith
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Low temperature device with low-vibration sample holding device
- Patent number 9,062,905
- Issue date Jun 23, 2015
- HB Patent Unternehmergesellschaft
- Jens Hoehne
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Methods of manufacturing diamond capsules
- Patent number 8,778,196
- Issue date Jul 15, 2014
- Sunshell LLC
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Zero thermal expansion, low heat transfer, variable temperature sam...
- Patent number 8,763,161
- Issue date Jun 24, 2014
- The United States of America, as represented by the Secretary of Commerce, th...
- Rachel Cannara
- G01 - MEASURING TESTING
Information Patent Grant
Method for examining a sample
- Patent number 8,347,410
- Issue date Jan 1, 2013
- Forschungszentrum Juelich GmbH
- Ruslan Temirov
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods of manufacturing diamond capsules
- Patent number 8,318,029
- Issue date Nov 27, 2012
- Terraspan LLC
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Device and method for scanning probe microscopy
- Patent number 7,810,166
- Issue date Oct 5, 2010
- Nambition GmbH
- Jens Struckmeier
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus for modifying and measuring diamond and other workpiece s...
- Patent number 7,514,680
- Issue date Apr 7, 2009
- Metadigm LLC
- Victor B. Kley
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Integrated electron beam tip and sample heating device for a scanni...
- Patent number 7,427,755
- Issue date Sep 23, 2008
- UChicago Argonne, LLC
- Haifeng Ding
- G01 - MEASURING TESTING
Information Patent Grant
Cryogenic variable temperature vacuum scanning tunneling microscope
- Patent number 7,414,250
- Issue date Aug 19, 2008
- Northwestern University
- Mark C. Hersam
- G01 - MEASURING TESTING
Information Patent Grant
Methods of manufacturing diamond capsules
- Patent number 7,309,446
- Issue date Dec 18, 2007
- Metadigm LLC
- Victor B. Kley
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Apparatus for modifying and measuring diamond and other workpiece s...
- Patent number 7,183,548
- Issue date Feb 27, 2007
- Metadigm LLC
- Victor B. Kley
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multiple plate tip or sample scanning reconfigurable scanned probe...
- Patent number 7,047,796
- Issue date May 23, 2006
- Nanonics Imaging, Ltd.
- Aaron Lewis
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced scanning probe microscope and nanolithographic methods usi...
- Patent number 6,737,646
- Issue date May 18, 2004
- Northwestern University
- Peter V. Schwartz
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced scanning probe microscope
- Patent number 6,674,074
- Issue date Jan 6, 2004
- Northwestern University
- Peter V. Schwartz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA...
- Publication number 20240272196
- Publication date Aug 15, 2024
- The Research Foundation for the State University of New York
- Michael DAPOLITO
- G01 - MEASURING TESTING
Information Patent Application
DAMPING BASE FOR MODULAR SCANNING PROBE MICROSCOPE HEAD
- Publication number 20230176088
- Publication date Jun 8, 2023
- Rutgers, The State University of New Jersey
- Angela M. COE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE, SCAN HEAD AND METHOD
- Publication number 20220057430
- Publication date Feb 24, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Roelof Willem HERFST
- G01 - MEASURING TESTING
Information Patent Application
INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN...
- Publication number 20210325429
- Publication date Oct 21, 2021
- Quantum Silicon Inc.
- Robert Wolkow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN...
- Publication number 20200249256
- Publication date Aug 6, 2020
- Quantum Silicon Inc.
- Robert Wolkow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Low Drift System for a Metrology Instrument
- Publication number 20200166540
- Publication date May 28, 2020
- Bruker Nano, Inc.
- Andrew Neushul
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPY SAMPLE STAGE FOR GAS HYDRATE TESTS AND TEMPERATURE AND P...
- Publication number 20190317125
- Publication date Oct 17, 2019
- CHINA UNIVERSITY OF GEOSCIENCES (WUHAN)
- Fulong Ning
- G01 - MEASURING TESTING
Information Patent Application
Cryogenic Cooling System
- Publication number 20190310283
- Publication date Oct 10, 2019
- Oxford Instruments Nanotechnology Tools Limited
- Mark Patton
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SCANNING PROBE NANOTOMOGRAPH COMPRISING AN OPTICAL ANALYSIS MODULE
- Publication number 20190219608
- Publication date Jul 18, 2019
- CHASTNOE UCHREZHDENIE "NAZARBAYEV UNIVERSITY RESEARCH AND INNOVATION SYSTEM"
- Alexander Mihaylovich ALEKSEEV
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE COMBINED WITH A DEVICE FOR ACTING ON A PR...
- Publication number 20190219609
- Publication date Jul 18, 2019
- CHASTNOE UCHREZHDENIE "NAZARBAYEV UNIVERSITY RESEARCH AND INNOVATION SYSTEM"
- Alexander Mihaylovich ALEKSEEV
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR GENERATING THREE-DIMENSIONAL IMAGE OF POLY...
- Publication number 20190035136
- Publication date Jan 31, 2019
- Hanbat National University Industry-Academic Cooperation Foundation
- Sang Mo Shin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Modular Atomic Force Microscope with Environmental Controls
- Publication number 20170168089
- Publication date Jun 15, 2017
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Application
Low Drift Scanning Probe Microscope
- Publication number 20150074859
- Publication date Mar 12, 2015
- Bruker Nano, Inc.
- Anthonius G. Ruiter
- G01 - MEASURING TESTING
Information Patent Application
PROBE TIP HEATING ASSEMBLY
- Publication number 20140326707
- Publication date Nov 6, 2014
- Roger William Schmitz
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR THE LIGHT STIMULATION AND CRYOPRESERVATION OF BIOLOGICAL...
- Publication number 20130227970
- Publication date Sep 5, 2013
- Leica Mikrosysteme GmbH
- Reinhard LIHL
- G02 - OPTICS
Information Patent Application
ZERO THERMAL EXPANSION, LOW HEAT TRANSFER, VARIABLE TEMPERATURE SAM...
- Publication number 20130212750
- Publication date Aug 15, 2013
- THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
- Rachel Cannara
- B82 - NANO-TECHNOLOGY
Information Patent Application
APPARATUS FOR MECHANICALLY ROBUST THERMAL ISOLATION OF COMPONENTS
- Publication number 20130198913
- Publication date Aug 1, 2013
- U.S. Army Research Laboratory
- Doran Smith
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHODS OF MANUFACTURING DIAMOND CAPSULES
- Publication number 20130037978
- Publication date Feb 14, 2013
- Terraspan LLC
- Victor B. KLEY
- B82 - NANO-TECHNOLOGY
Information Patent Application
Low Drift Scanning Probe Microscope
- Publication number 20110239336
- Publication date Sep 29, 2011
- BRUCKER NANO, INC.
- Anthonius Ruiter
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER HEATING MECHANISM, AND A CANTILEVER HOLDER AND CANTILEVE...
- Publication number 20110174797
- Publication date Jul 21, 2011
- Japan Advanced Institute Of Science And Technology
- Masahiko Tomitori
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EXAMINING A SAMPLE
- Publication number 20100263097
- Publication date Oct 14, 2010
- Ruslan Temirov
- G01 - MEASURING TESTING
Information Patent Application
Low temperature device
- Publication number 20100089069
- Publication date Apr 15, 2010
- Jens Hoehne
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Application
Heat Coupling Device
- Publication number 20100031403
- Publication date Feb 4, 2010
- NAMBITION GMBH
- Mirko Leuschner
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
Apparatus and method using a disk drive slider and/or a peltier pla...
- Publication number 20090151434
- Publication date Jun 18, 2009
- SAMSUNG ELECTRONICS CO., LTD.
- Dongman Kim
- G01 - MEASURING TESTING
Information Patent Application
Diamond structures as fuel capsules for nuclear fusion
- Publication number 20080256850
- Publication date Oct 23, 2008
- General Nanotechnology LLC
- Victor B. Kley
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Device and Method for Scanning Probe Microscopy
- Publication number 20080072665
- Publication date Mar 27, 2008
- NAMBITION GMBH
- Jens Struckmeier
- G01 - MEASURING TESTING
Information Patent Application
Coherent electron junction scanning probe interference microscope,...
- Publication number 20070194225
- Publication date Aug 23, 2007
- Miguel Delmar Zorn
- G01 - MEASURING TESTING
Information Patent Application
Integrated electron beam tip and sample heating device for a scanni...
- Publication number 20070029480
- Publication date Feb 8, 2007
- The University of Chicago
- Haifeng Ding
- G01 - MEASURING TESTING
Information Patent Application
Multiple plate tip or sample scanning reconfigurable scanned probe...
- Publication number 20040216518
- Publication date Nov 4, 2004
- Aaron Lewis
- G01 - MEASURING TESTING
Information Patent Application
Method for performing nanoscale dynamics imaging by atomic force mi...
- Publication number 20040129063
- Publication date Jul 8, 2004
- Mehdi Balooch
- G01 - MEASURING TESTING

Thermal environment

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Initiating and monitoring the evolution of single electrons within...

Scanning probe microscope, scan head and method

Scanning probe nanotomograph comprising an optical analysis module

Initiating and monitoring the evolution of single electrons within...

Low drift system for a metrology instrument

Apparatus and method for generating three-dimensional image of poly...

Scanning probe microscope combined with a device for acting on a pr...

Cryogenic cooling system

Surface measurement probe

Modular atomic force microscope with environmental controls

Structure for achieving dimensional stability during temperature ch...

Modular atomic force microscope with environmental controls

Probe tip heating assembly

Low drift scanning probe microscope

Device for the light stimulation and cryopreservation of biological...

Apparatus for mechanically robust thermal isolation of components

Low temperature device with low-vibration sample holding device

Methods of manufacturing diamond capsules

Zero thermal expansion, low heat transfer, variable temperature sam...

Method for examining a sample

Methods of manufacturing diamond capsules

Device and method for scanning probe microscopy

Apparatus for modifying and measuring diamond and other workpiece s...

Integrated electron beam tip and sample heating device for a scanni...

Cryogenic variable temperature vacuum scanning tunneling microscope

Methods of manufacturing diamond capsules

Apparatus for modifying and measuring diamond and other workpiece s...

Multiple plate tip or sample scanning reconfigurable scanned probe...

Enhanced scanning probe microscope and nanolithographic methods usi...

Enhanced scanning probe microscope

Patents Applicationslast 30 patents

SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA...

DAMPING BASE FOR MODULAR SCANNING PROBE MICROSCOPE HEAD

SCANNING PROBE MICROSCOPE, SCAN HEAD AND METHOD

INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN...

INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN...

Low Drift System for a Metrology Instrument

MICROSCOPY SAMPLE STAGE FOR GAS HYDRATE TESTS AND TEMPERATURE AND P...

Cryogenic Cooling System

SCANNING PROBE NANOTOMOGRAPH COMPRISING AN OPTICAL ANALYSIS MODULE

SCANNING PROBE MICROSCOPE COMBINED WITH A DEVICE FOR ACTING ON A PR...

APPARATUS AND METHOD FOR GENERATING THREE-DIMENSIONAL IMAGE OF POLY...

Modular Atomic Force Microscope with Environmental Controls

Low Drift Scanning Probe Microscope

PROBE TIP HEATING ASSEMBLY

DEVICE FOR THE LIGHT STIMULATION AND CRYOPRESERVATION OF BIOLOGICAL...

ZERO THERMAL EXPANSION, LOW HEAT TRANSFER, VARIABLE TEMPERATURE SAM...

APPARATUS FOR MECHANICALLY ROBUST THERMAL ISOLATION OF COMPONENTS

METHODS OF MANUFACTURING DIAMOND CAPSULES

Low Drift Scanning Probe Microscope

CANTILEVER HEATING MECHANISM, AND A CANTILEVER HOLDER AND CANTILEVE...

METHOD FOR EXAMINING A SAMPLE

Low temperature device

Heat Coupling Device

Apparatus and method using a disk drive slider and/or a peltier pla...

Diamond structures as fuel capsules for nuclear fusion

Device and Method for Scanning Probe Microscopy

Coherent electron junction scanning probe interference microscope,...

Integrated electron beam tip and sample heating device for a scanni...

Multiple plate tip or sample scanning reconfigurable scanned probe...

Method for performing nanoscale dynamics imaging by atomic force mi...