thickness, density, surface weight (unit area)

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G01N2223/633

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/633thickness, density, surface weight (unit area)

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for quantifying amine compound constituting separator active...
- Patent number 12,350,628
- Issue date Jul 8, 2025
- LG Chem, Ltd.
- Bo Ri Lee
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 12,337,215
- Issue date Jun 24, 2025
- Topgolf Callaway Brands Corp.
- Megan Ilnicky
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 12,281,893
- Issue date Apr 22, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deposition system and method
- Patent number 12,211,756
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Hao Cheng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Measurement of metal or alloy coating
- Patent number 12,092,594
- Issue date Sep 17, 2024
- Schlumberger Technology Corporation
- Jill F. Geddes
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 12,066,391
- Issue date Aug 20, 2024
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 11,988,502
- Issue date May 21, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- G01 - MEASURING TESTING
Information Patent Grant
Dry ice cleaning and recycling device and method for connecting rod
- Patent number 11,938,589
- Issue date Mar 26, 2024
- GUANGDONG UNIVERSITY OF TECHNOLOGY
- Guan Wang
- B08 - CLEANING
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 11,911,667
- Issue date Feb 27, 2024
- Topgolf Callaway Brands Corp.
- Megan Ilnicky
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 11,906,451
- Issue date Feb 20, 2024
- Nova Ltd.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray collimator and related X-ray inspection apparatus
- Patent number 11,854,712
- Issue date Dec 26, 2023
- DUE2LAB S.R.L.
- Nicola Zambelli
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Quantitative phase analysis device, quantitative phase analysis met...
- Patent number 11,841,334
- Issue date Dec 12, 2023
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Deposition system and method
- Patent number 11,823,964
- Issue date Nov 21, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Hao Cheng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Conveyor system and measuring device for determining water content...
- Patent number 11,714,053
- Issue date Aug 1, 2023
- Troxler Electronic Laboratories, Inc.
- Wewage Hiran Linus Dep
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 11,668,663
- Issue date Jun 6, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 11,656,190
- Issue date May 23, 2023
- Rigaku Corporation
- Shinya Hara
- G01 - MEASURING TESTING
Information Patent Grant
Dimension measurement method using projection image obtained by X-r...
- Patent number 11,561,091
- Issue date Jan 24, 2023
- The University of Tokyo
- Yutaka Ohtake
- G01 - MEASURING TESTING
Information Patent Grant
System and method using x-rays for depth-resolving metrology and an...
- Patent number 11,549,895
- Issue date Jan 10, 2023
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for analysing and processing granular material
- Patent number 11,519,868
- Issue date Dec 6, 2022
- Sorterra Global Pty Ltd
- Jan Verboomen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 11,513,086
- Issue date Nov 29, 2022
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Analysis of antimicrobial coatings using XRF
- Patent number 11,442,032
- Issue date Sep 13, 2022
- SRFC BIO, INC.
- Parham Asgari
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting membrane electrode structure
- Patent number 11,421,985
- Issue date Aug 23, 2022
- Honda Motor Co., Ltd.
- Koya Shimada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for forming compacted powder products
- Patent number 11,345,060
- Issue date May 31, 2022
- Sacmi Cooperativa Meccanici Imola Societa Cooperativa
- Enrico Ursella
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Grant
Charged particle beam device
- Patent number 11,328,897
- Issue date May 10, 2022
- HITACHI HIGH-TECH CORPORATION
- Minami Shouji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conveyor system and measuring device for determining water content...
- Patent number 11,280,748
- Issue date Mar 22, 2022
- Troxler Electronic Laboratories, Inc.
- Wewage Hiran Linus Dep
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Radiograph density detection device
- Patent number 11,266,368
- Issue date Mar 8, 2022
- SCARLET IMAGING RADIOLOGY, LLC
- Michael Scott Echols
- G01 - MEASURING TESTING
Information Patent Grant
Method to radiographically determine geometrical parameters and/or...
- Patent number 11,085,886
- Issue date Aug 10, 2021
- Péter Teleki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation-based thickness gauge
- Patent number 11,079,222
- Issue date Aug 3, 2021
- NDC Technologies Inc.
- Vahe Ghazikhanian
- G01 - MEASURING TESTING
Information Patent Grant
Analysis of antimicrobial coatings using XRF
- Patent number 11,029,266
- Issue date Jun 8, 2021
- ALLIED BIOSCIENCE, INC.
- Parham Asgari
- G01 - MEASURING TESTING
Information Patent Grant
Cross sectional depth composition generation utilizing scanning ele...
- Patent number 10,830,715
- Issue date Nov 10, 2020
- International Business Machines Corporation
- Eric J. Campbell
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
THIN FILM THICKNESS MEASURING DEVICE AND THIN FILM THICKNESS MEASUR...
- Publication number 20250237621
- Publication date Jul 24, 2025
- SAMSUNG DISPLAY CO., LTD.
- Won Hyuk JANG
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR ELECTRODE PLATE TESTING
- Publication number 20250198952
- Publication date Jun 19, 2025
- CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
- Bingyang Zhan
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, AND STORAGE MEDIA FOR OBTAINING ENERGY SPECTRA
- Publication number 20250164653
- Publication date May 22, 2025
- Shanghai United Imaging Healthcare Co., Ltd.
- Zhi SHI
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED BACKSCATTER X-RAY ASSEMBLIES FOR DETECTING BACKSCATTER X...
- Publication number 20250137946
- Publication date May 1, 2025
- The Boeing Company
- Morteza Safai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF S...
- Publication number 20250130185
- Publication date Apr 24, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Uri Hadar
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20250052704
- Publication date Feb 13, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Wei Ti LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Substrate Alloy Influence Compensation
- Publication number 20250003897
- Publication date Jan 2, 2025
- THERMO FISHER SCIENTIFIC MESSTECHNIK GMBH
- Alexander Britting
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESS...
- Publication number 20250003895
- Publication date Jan 2, 2025
- Canon Kabushiki Kaisha
- Atsushi IWASHITA
- G01 - MEASURING TESTING
Information Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
- Publication number 20240418633
- Publication date Dec 19, 2024
- KLA Corporation
- Shova Subedi
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...
- Publication number 20240402098
- Publication date Dec 5, 2024
- Rapiscan Holdings, Inc.
- Brendan Edward Allman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...
- Publication number 20240401940
- Publication date Dec 5, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VARIABLE DETECTOR AND IMAGE-CAPTURING APPARATUS COMPRISING THE SAME
- Publication number 20240385126
- Publication date Nov 21, 2024
- VIEWORKS CO., LTD.
- Jungmin CHOI
- G01 - MEASURING TESTING
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240297142
- Publication date Sep 5, 2024
- NIPPON MICROMETAL CORPORATION
- Daizo ODA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...
- Publication number 20240210332
- Publication date Jun 27, 2024
- TROXLER ELECTRONIC LABORATORIES, INC.
- Wewage Hiran Linus Dep
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20230408430
- Publication date Dec 21, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEPOSITION SYSTEM AND METHOD
- Publication number 20230386942
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wen-Hao CHENG
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Pattern Measurement Device
- Publication number 20230375338
- Publication date Nov 23, 2023
- Hitachi High-Tech Corporation
- Long ZHANG
- G01 - MEASURING TESTING
Information Patent Application
DRY ICE CLEANING AND RECYCLING DEVICE AND METHOD FOR CONNECTING ROD
- Publication number 20230294242
- Publication date Sep 21, 2023
- GUANGDONG UNIVERSITY OF TECHNOLOGY
- Guan WANG
- B08 - CLEANING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20230044361
- Publication date Feb 9, 2023
- Rigaku Corporation
- Shinya HARA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF METAL OR ALLOY COATING
- Publication number 20230018020
- Publication date Jan 19, 2023
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Jill F. Geddes
- G01 - MEASURING TESTING
Information Patent Application
DEPOSITION SYSTEM AND METHOD
- Publication number 20220336297
- Publication date Oct 20, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wen-Hao CHENG
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
BOEHMITE DETECTION AND WARNING SYSTEM, AND CONCENTRATION INDICATOR...
- Publication number 20220276185
- Publication date Sep 1, 2022
- Honeywell Limited
- Tobias Nebel
- G01 - MEASURING TESTING
Information Patent Application
CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...
- Publication number 20220205933
- Publication date Jun 30, 2022
- TROXLER ELECTRONIC LABORATORIES, INC.
- Wewage Hiran Linus Dep
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20220074878
- Publication date Mar 10, 2022
- NOVA LTD
- Wei Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR INSPECTING MEMBRANE ELECTRODE STRUCTURE
- Publication number 20210239463
- Publication date Aug 5, 2021
- Honda Motor Co., Ltd.
- Koya Shimada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS OF ANTIMICROBIAL COATINGS USING XRF
- Publication number 20210239630
- Publication date Aug 5, 2021
- Allied Bioscience, Inc.
- Parham Asgari
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20210066029
- Publication date Mar 4, 2021
- HITACHI HIGH-TECH CORPORATION
- Minami Shouji
- G01 - MEASURING TESTING
Information Patent Application
CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...
- Publication number 20200363346
- Publication date Nov 19, 2020
- TROXLER ELECTRONIC LABORATORIES, INC.
- Wewage Hiran Linus Dep
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPH DENSITY DETECTION DEVICE
- Publication number 20200359982
- Publication date Nov 19, 2020
- Scarlet Imaging Radiology, LLC
- Michael Scott Echols
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
RADIATION-BASED THICKNESS GAUGE
- Publication number 20200240776
- Publication date Jul 30, 2020
- NDC Technologies Inc.
- Vahe GHAZIKHANIAN
- G01 - MEASURING TESTING

thickness, density, surface weight (unit area)

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for quantifying amine compound constituting separator active...

Method and system utilizing imaging analysis for golf balls

Characterizing and measuring in small boxes using XPS with multiple...

Deposition system and method

Measurement of metal or alloy coating

Method and system for non-destructive metrology of thin layers

Characterizing and measuring in small boxes using XPS with multiple...

Dry ice cleaning and recycling device and method for connecting rod

Method and system utilizing imaging analysis for golf balls

Method and system for non-destructive metrology of thin layers

X-ray collimator and related X-ray inspection apparatus

Quantitative phase analysis device, quantitative phase analysis met...

Deposition system and method

Conveyor system and measuring device for determining water content...

Method and system for non-destructive metrology of thin layers

X-ray fluorescence spectrometer

Dimension measurement method using projection image obtained by X-r...

System and method using x-rays for depth-resolving metrology and an...

Apparatus and method for analysing and processing granular material

X-ray fluorescence spectrometer

Analysis of antimicrobial coatings using XRF

Method for inspecting membrane electrode structure

Method and apparatus for forming compacted powder products

Charged particle beam device

Conveyor system and measuring device for determining water content...

Radiograph density detection device

Method to radiographically determine geometrical parameters and/or...

Radiation-based thickness gauge

Analysis of antimicrobial coatings using XRF

Cross sectional depth composition generation utilizing scanning ele...

Patents Applicationslast 30 patents

THIN FILM THICKNESS MEASURING DEVICE AND THIN FILM THICKNESS MEASUR...

DEVICE FOR ELECTRODE PLATE TESTING

METHODS, SYSTEMS, AND STORAGE MEDIA FOR OBTAINING ENERGY SPECTRA

INTEGRATED BACKSCATTER X-RAY ASSEMBLIES FOR DETECTING BACKSCATTER X...

NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF S...

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

Substrate Alloy Influence Compensation

IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESS...

COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...

Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...

CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...

VARIABLE DETECTOR AND IMAGE-CAPTURING APPARATUS COMPRISING THE SAME

BONDING WIRE FOR SEMICONDUCTOR DEVICES

CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

DEPOSITION SYSTEM AND METHOD

Pattern Measurement Device

DRY ICE CLEANING AND RECYCLING DEVICE AND METHOD FOR CONNECTING ROD

X-RAY FLUORESCENCE SPECTROMETER

MEASUREMENT OF METAL OR ALLOY COATING

DEPOSITION SYSTEM AND METHOD

BOEHMITE DETECTION AND WARNING SYSTEM, AND CONCENTRATION INDICATOR...

CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

METHOD FOR INSPECTING MEMBRANE ELECTRODE STRUCTURE

ANALYSIS OF ANTIMICROBIAL COATINGS USING XRF

CHARGED PARTICLE BEAM DEVICE

CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...

RADIOGRAPH DENSITY DETECTION DEVICE

RADIATION-BASED THICKNESS GAUGE