thin films, coatings

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CPC
G01N2223/61

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/61thin films, coatings

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Specimen radiography system comprising a cabinet and a specimen dra...
- Patent number 12,364,443
- Issue date Jul 22, 2025
- Hologic, Inc.
- Kenneth Defreitas
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System and method for soil characterization
- Patent number 12,360,099
- Issue date Jul 15, 2025
- X-Centric Sciences Inc.
- Roozbeh Ravansari
- G01 - MEASURING TESTING
Information Patent Grant
X-ray radioscope
- Patent number 12,360,061
- Issue date Jul 15, 2025
- BEAMSENSE Co., Ltd.
- Sueki Baba
- G01 - MEASURING TESTING
Information Patent Grant
In situ and tunable deposition of a film
- Patent number 12,359,307
- Issue date Jul 15, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chia-Hsi Wang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of calculating thickness of graphene layer and method of mea...
- Patent number 12,359,911
- Issue date Jul 15, 2025
- Samsung Electronics Co., Ltd.
- Eunkyu Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inline scanning and cutting assembly and method of operation
- Patent number 12,350,747
- Issue date Jul 8, 2025
- Eagle Machinery & Supply, Inc.
- Andrew D. Timmer
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Battery module comprising metal particle-dispersed thermal conducti...
- Patent number 12,355,044
- Issue date Jul 8, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Been You
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantum mechanical X-ray crystallography and Cryo-EM diagnostic for...
- Patent number 12,347,524
- Issue date Jul 1, 2025
- QuantumBio Inc.
- Lance Michael Westerhoff
- G01 - MEASURING TESTING
Information Patent Grant
Calculation method for fractal dimension of shale pores
- Patent number 12,345,665
- Issue date Jul 1, 2025
- SOUTHWEST PETROLEUM UNIVERSITY
- Xinyang He
- G01 - MEASURING TESTING
Information Patent Grant
Diffractive analyzer of patient tissue
- Patent number 12,336,851
- Issue date Jun 24, 2025
- Arion Diagnostics, Inc.
- Alexander P. Lazarev
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method of failure analysis for defect locations
- Patent number 12,339,202
- Issue date Jun 24, 2025
- Shanghai Huali Integrated Circuit Corporation
- Qiang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detection of soil heavy metal pollution using unmanned a...
- Patent number 12,339,240
- Issue date Jun 24, 2025
- University of Electronic Science and Technology of China
- Fang Huang
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Pulsed neutron apparatus and method for using same to analyze core...
- Patent number 12,332,193
- Issue date Jun 17, 2025
- Core Laboratories LP
- Derek Raymond Beckett
- G01 - MEASURING TESTING
Information Patent Grant
Prediction of cement longevity using digital cement modeling
- Patent number 12,332,230
- Issue date Jun 17, 2025
- Saudi Arabian Oil Company
- Arpita P. Bathija
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lithium detection techniques using neutrons and/or alpha particles
- Patent number 12,332,400
- Issue date Jun 17, 2025
- Schlumberger Technology Corporation
- Shikha Prasad
- E21 - EARTH DRILLING MINING
Information Patent Grant
Charged particle beam device
- Patent number 12,334,299
- Issue date Jun 17, 2025
- HITACHI HIGH-TECH CORPORATION
- U Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron spectroscopy based techniques for determining various chem...
- Patent number 12,326,410
- Issue date Jun 10, 2025
- COZAI LTD
- Hagai Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a film comprising cavities with determinat...
- Patent number 12,325,171
- Issue date Jun 10, 2025
- ALEPH SAS
- Jan Gaudaen
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Large die wafer, large die and method of forming the same
- Patent number 12,322,707
- Issue date Jun 3, 2025
- Wuhan Xinxin Semiconductor Manufacturing Co., Ltd.
- Sheng Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Full beam metrology for x-ray scatterometry systems
- Patent number 12,320,763
- Issue date Jun 3, 2025
- KLA Corporation
- Antonio Arion Gellineau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of evaluating concentration of sulfur
- Patent number 12,306,117
- Issue date May 20, 2025
- Sumitomo Rubber Industries, Ltd.
- Tomomi Shiozawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for analyzing prostate biopsy
- Patent number 12,306,172
- Issue date May 20, 2025
- ProSight Ltd.
- Meir Weksler
- G01 - MEASURING TESTING
Information Patent Grant
Sensor apparatus and water amount measurement apparatus
- Patent number 12,306,115
- Issue date May 20, 2025
- Sony Group Corporation
- Atsushi Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for biological analyte studying using x-ray fl...
- Patent number 12,306,120
- Issue date May 20, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis system and method with multi-source design
- Patent number 12,292,396
- Issue date May 6, 2025
- SHENZHEN ANGSTROM EXCELLENCE TECHNOLOGY CO. LTD
- Xuena Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Deterioration diagnosis device, deterioration diagnosis method, and...
- Patent number 12,292,388
- Issue date May 6, 2025
- NEC Corporation
- Chisato Sugawara
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for computed tomography system calibration
- Patent number 12,292,394
- Issue date May 6, 2025
- Baker Hughes Holdings LLC
- Alexander Suppes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Processing head for a forestry machine
- Patent number 12,290,029
- Issue date May 6, 2025
- MICROTEC S.R.L.
- Federico Giudiceandrea
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
System and method for utilization of photon counting for colorizati...
- Patent number 12,287,298
- Issue date Apr 29, 2025
- Kub Technologies Inc
- Chester Lowe
- G01 - MEASURING TESTING
Information Patent Grant
Single piece droplet generation and injection device for serial cry...
- Patent number 12,287,299
- Issue date Apr 29, 2025
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
THIN FILM THICKNESS MEASURING DEVICE AND THIN FILM THICKNESS MEASUR...
- Publication number 20250237621
- Publication date Jul 24, 2025
- SAMSUNG DISPLAY CO., LTD.
- Won Hyuk JANG
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION METHOD
- Publication number 20250231121
- Publication date Jul 17, 2025
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- G01 - MEASURING TESTING
Information Patent Application
E-BEAM OPTIMIZATION FOR OVERLAY MEASUREMENT OF BURIED FEATURES
- Publication number 20250231129
- Publication date Jul 17, 2025
- ASML NETHERLANDS B.V.
- Benoit Herve GAURY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING SYSTEMS WITH SMALL X-RAY SOURCES
- Publication number 20250231131
- Publication date Jul 17, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Yurun LIU
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VI...
- Publication number 20250231132
- Publication date Jul 17, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE AND DIRECTION-SENSITIVE COSMOGENIC NEUTRON SENSORS
- Publication number 20250224346
- Publication date Jul 10, 2025
- QUAESTA INSTRUMENTS, LLC
- MAREK ZREDA
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
DEFECT REGION DETECTION DEVICE AND WAFER DEFECT DETECTION SYSTEM IN...
- Publication number 20250217960
- Publication date Jul 3, 2025
- Samsung Electronics Co., Ltd.
- Minsu Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM
- Publication number 20250216346
- Publication date Jul 3, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Ron MEIRY
- G01 - MEASURING TESTING
Information Patent Application
Analysis System, Analysis Method, and Analysis Program
- Publication number 20250208076
- Publication date Jun 26, 2025
- Hitachi High-Tech Corporation
- Keiichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM
- Publication number 20250209587
- Publication date Jun 26, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION
- Publication number 20250208074
- Publication date Jun 26, 2025
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM
- Publication number 20250209585
- Publication date Jun 26, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM
- Publication number 20250209586
- Publication date Jun 26, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Collimator for an X-ray inspection system, X-ray laminography syste...
- Publication number 20250198951
- Publication date Jun 19, 2025
- Comet Yxlon GmbH
- André Schu
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING GROUP-III ELEMENT NITRIDE SUBSTRATE, METHOD OF...
- Publication number 20250201636
- Publication date Jun 19, 2025
- NGK Insulators, Ltd.
- Yoshitaka KURAOKA
- C30 - CRYSTAL GROWTH
Information Patent Application
THERMAL CHARACTERIZATION METHOD AND MANUFACTURING OF SEMICONDUCTOR...
- Publication number 20250201633
- Publication date Jun 19, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sam Vaziri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING THE FLUID FLOW WITH TRACER IN FRA...
- Publication number 20250198901
- Publication date Jun 19, 2025
- Petroleo Brasileiro S.A. - PETROBRAS
- Mario Germino Ferreira da Silva
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALCULATING FILM THICKNESS OF GRAIN BOUNDARY OXIDE LAYER...
- Publication number 20250164422
- Publication date May 22, 2025
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Koji SASAKI
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Spectral Measurements Based On Perturbed Sp...
- Publication number 20250164411
- Publication date May 22, 2025
- KLA Corporation
- William McGahan
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, AND STORAGE MEDIA FOR OBTAINING ENERGY SPECTRA
- Publication number 20250164653
- Publication date May 22, 2025
- Shanghai United Imaging Healthcare Co., Ltd.
- Zhi SHI
- G01 - MEASURING TESTING
Information Patent Application
Transmission electron microscopy with square beams
- Publication number 20250166956
- Publication date May 22, 2025
- New York Structural Biology Center
- Eugene Yue Dao Chau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD OF VIEW SELECTION FOR METROLOGY ASSOCIATED WITH SEMICONDUCTOR...
- Publication number 20250147433
- Publication date May 8, 2025
- ASML NETHERLANDS B.V.
- Tsung-Pao FANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250137944
- Publication date May 1, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF
- Publication number 20250124564
- Publication date Apr 17, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF
- Publication number 20250125431
- Publication date Apr 17, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FOOD ASSESSMENT DEVICE AND METHOD THEREOF
- Publication number 20250116596
- Publication date Apr 10, 2025
- HCL Technologies Limited
- GURGENIUS SINGH KAPOOR
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASUREMENT DEVICE, RADIOGRAPHY SYSTEM, OPERATION METHOD O...
- Publication number 20250110063
- Publication date Apr 3, 2025
- FUJIFILM CORPORATION
- Hisatsugu HORIUCHI
- G01 - MEASURING TESTING
Information Patent Application
Component authentication using x-ray detectable unique features
- Publication number 20250111497
- Publication date Apr 3, 2025
- Guilherme Cardoso
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DOWNHOLE LITHIUM DETECTION SYSTEMS AND METHODS
- Publication number 20250102699
- Publication date Mar 27, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Christian Stoller
- G01 - MEASURING TESTING
Information Patent Application
Forward Library Based Seeding For Efficient X-Ray Scatterometry Mea...
- Publication number 20250085241
- Publication date Mar 13, 2025
- KLA Corporation
- Rebecca Shen
- G01 - MEASURING TESTING

thin films, coatings

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Specimen radiography system comprising a cabinet and a specimen dra...

System and method for soil characterization

X-ray radioscope

In situ and tunable deposition of a film

Method of calculating thickness of graphene layer and method of mea...

Inline scanning and cutting assembly and method of operation

Battery module comprising metal particle-dispersed thermal conducti...

Quantum mechanical X-ray crystallography and Cryo-EM diagnostic for...

Calculation method for fractal dimension of shale pores

Diffractive analyzer of patient tissue

Method of failure analysis for defect locations

Method for detection of soil heavy metal pollution using unmanned a...

Pulsed neutron apparatus and method for using same to analyze core...

Prediction of cement longevity using digital cement modeling

Lithium detection techniques using neutrons and/or alpha particles

Charged particle beam device

Electron spectroscopy based techniques for determining various chem...

Method for manufacturing a film comprising cavities with determinat...

Large die wafer, large die and method of forming the same

Full beam metrology for x-ray scatterometry systems

Method of evaluating concentration of sulfur

Method and system for analyzing prostate biopsy

Sensor apparatus and water amount measurement apparatus

Apparatus and method for biological analyte studying using x-ray fl...

X-ray analysis system and method with multi-source design

Deterioration diagnosis device, deterioration diagnosis method, and...

Apparatus and method for computed tomography system calibration

Processing head for a forestry machine

System and method for utilization of photon counting for colorizati...

Single piece droplet generation and injection device for serial cry...

Patents Applicationslast 30 patents

THIN FILM THICKNESS MEASURING DEVICE AND THIN FILM THICKNESS MEASUR...

WAFER INSPECTION METHOD

E-BEAM OPTIMIZATION FOR OVERLAY MEASUREMENT OF BURIED FEATURES

IMAGING SYSTEMS WITH SMALL X-RAY SOURCES

NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VI...

DISTANCE AND DIRECTION-SENSITIVE COSMOGENIC NEUTRON SENSORS

DEFECT REGION DETECTION DEVICE AND WAFER DEFECT DETECTION SYSTEM IN...

DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM

Analysis System, Analysis Method, and Analysis Program

APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM

SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION

APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM

APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM

Collimator for an X-ray inspection system, X-ray laminography syste...

METHOD OF INSPECTING GROUP-III ELEMENT NITRIDE SUBSTRATE, METHOD OF...

THERMAL CHARACTERIZATION METHOD AND MANUFACTURING OF SEMICONDUCTOR...

SYSTEM AND METHOD FOR DETERMINING THE FLUID FLOW WITH TRACER IN FRA...

METHOD FOR CALCULATING FILM THICKNESS OF GRAIN BOUNDARY OXIDE LAYER...

Methods And Systems For Spectral Measurements Based On Perturbed Sp...

METHODS, SYSTEMS, AND STORAGE MEDIA FOR OBTAINING ENERGY SPECTRA

Transmission electron microscopy with square beams

FIELD OF VIEW SELECTION FOR METROLOGY ASSOCIATED WITH SEMICONDUCTOR...

X-RAY INSPECTION APPARATUS

DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF

DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF

FOOD ASSESSMENT DEVICE AND METHOD THEREOF

DISTANCE MEASUREMENT DEVICE, RADIOGRAPHY SYSTEM, OPERATION METHOD O...

Component authentication using x-ray detectable unique features

DOWNHOLE LITHIUM DETECTION SYSTEMS AND METHODS

Forward Library Based Seeding For Efficient X-Ray Scatterometry Mea...