thin films, coatings

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CPC
G01N2223/61

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/61thin films, coatings

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Diffractive analyzer of patient tissue
- Patent number 12,336,851
- Issue date Jun 24, 2025
- Arion Diagnostics, Inc.
- Alexander P. Lazarev
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method of failure analysis for defect locations
- Patent number 12,339,202
- Issue date Jun 24, 2025
- Shanghai Huali Integrated Circuit Corporation
- Qiang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detection of soil heavy metal pollution using unmanned a...
- Patent number 12,339,240
- Issue date Jun 24, 2025
- University of Electronic Science and Technology of China
- Fang Huang
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Pulsed neutron apparatus and method for using same to analyze core...
- Patent number 12,332,193
- Issue date Jun 17, 2025
- Core Laboratories LP
- Derek Raymond Beckett
- G01 - MEASURING TESTING
Information Patent Grant
Prediction of cement longevity using digital cement modeling
- Patent number 12,332,230
- Issue date Jun 17, 2025
- Saudi Arabian Oil Company
- Arpita P. Bathija
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lithium detection techniques using neutrons and/or alpha particles
- Patent number 12,332,400
- Issue date Jun 17, 2025
- Schlumberger Technology Corporation
- Shikha Prasad
- E21 - EARTH DRILLING MINING
Information Patent Grant
Charged particle beam device
- Patent number 12,334,299
- Issue date Jun 17, 2025
- HITACHI HIGH-TECH CORPORATION
- U Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron spectroscopy based techniques for determining various chem...
- Patent number 12,326,410
- Issue date Jun 10, 2025
- COZAI LTD
- Hagai Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a film comprising cavities with determinat...
- Patent number 12,325,171
- Issue date Jun 10, 2025
- ALEPH SAS
- Jan Gaudaen
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Large die wafer, large die and method of forming the same
- Patent number 12,322,707
- Issue date Jun 3, 2025
- Wuhan Xinxin Semiconductor Manufacturing Co., Ltd.
- Sheng Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Full beam metrology for x-ray scatterometry systems
- Patent number 12,320,763
- Issue date Jun 3, 2025
- KLA Corporation
- Antonio Arion Gellineau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for analyzing prostate biopsy
- Patent number 12,306,172
- Issue date May 20, 2025
- ProSight Ltd.
- Meir Weksler
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaluating concentration of sulfur
- Patent number 12,306,117
- Issue date May 20, 2025
- Sumitomo Rubber Industries, Ltd.
- Tomomi Shiozawa
- G01 - MEASURING TESTING
Information Patent Grant
Sensor apparatus and water amount measurement apparatus
- Patent number 12,306,115
- Issue date May 20, 2025
- Sony Group Corporation
- Atsushi Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for biological analyte studying using x-ray fl...
- Patent number 12,306,120
- Issue date May 20, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis system and method with multi-source design
- Patent number 12,292,396
- Issue date May 6, 2025
- SHENZHEN ANGSTROM EXCELLENCE TECHNOLOGY CO. LTD
- Xuena Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Deterioration diagnosis device, deterioration diagnosis method, and...
- Patent number 12,292,388
- Issue date May 6, 2025
- NEC Corporation
- Chisato Sugawara
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for computed tomography system calibration
- Patent number 12,292,394
- Issue date May 6, 2025
- Baker Hughes Holdings LLC
- Alexander Suppes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Processing head for a forestry machine
- Patent number 12,290,029
- Issue date May 6, 2025
- MICROTEC S.R.L.
- Federico Giudiceandrea
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
System and method for utilization of photon counting for colorizati...
- Patent number 12,287,298
- Issue date Apr 29, 2025
- Kub Technologies Inc
- Chester Lowe
- G01 - MEASURING TESTING
Information Patent Grant
Single piece droplet generation and injection device for serial cry...
- Patent number 12,287,299
- Issue date Apr 29, 2025
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- G01 - MEASURING TESTING
Information Patent Grant
Parameterizing x-ray scattering measurement using slice-and-image t...
- Patent number 12,288,706
- Issue date Apr 29, 2025
- Carl Zeiss SMT GmbH
- Hans Michael Stiepan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Downhole lithium detection systems and methods
- Patent number 12,282,136
- Issue date Apr 22, 2025
- Schlumberger Technology Corporation
- Christian Stoller
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 12,281,893
- Issue date Apr 22, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Agricultural machine with resonance vibration response detection
- Patent number 12,270,802
- Issue date Apr 8, 2025
- Deere & Company
- Mahesh N. Bhanu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Distance and direction-sensitive cosmogenic neutron sensors
- Patent number 12,259,507
- Issue date Mar 25, 2025
- QUAESTA INSTRUMENTS, LLC
- Marek Zreda
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus, and program for determining condition related to...
- Patent number 12,243,711
- Issue date Mar 4, 2025
- HITACHI HIGH-TECH CORPORATION
- Takahiro Nishihata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diffraction-based global in vitro diagnostic system
- Patent number 12,237,083
- Issue date Feb 25, 2025
- Bragg Analytics, Inc.
- Pavel Lazarev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device
- Patent number 12,228,527
- Issue date Feb 18, 2025
- Saki Corporation
- Hiroyuki Murata
- G01 - MEASURING TESTING
Information Patent Grant
Food product monitoring solution
- Patent number 12,228,528
- Issue date Feb 18, 2025
- MEKITEC OY
- Peng Zhang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Analysis System, Analysis Method, and Analysis Program
- Publication number 20250208076
- Publication date Jun 26, 2025
- Hitachi High-Tech Corporation
- Keiichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION
- Publication number 20250208074
- Publication date Jun 26, 2025
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM
- Publication number 20250209587
- Publication date Jun 26, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM
- Publication number 20250209585
- Publication date Jun 26, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM
- Publication number 20250209586
- Publication date Jun 26, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Collimator for an X-ray inspection system, X-ray laminography syste...
- Publication number 20250198951
- Publication date Jun 19, 2025
- Comet Yxlon GmbH
- André Schu
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING GROUP-III ELEMENT NITRIDE SUBSTRATE, METHOD OF...
- Publication number 20250201636
- Publication date Jun 19, 2025
- NGK Insulators, Ltd.
- Yoshitaka KURAOKA
- C30 - CRYSTAL GROWTH
Information Patent Application
THERMAL CHARACTERIZATION METHOD AND MANUFACTURING OF SEMICONDUCTOR...
- Publication number 20250201633
- Publication date Jun 19, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sam Vaziri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING THE FLUID FLOW WITH TRACER IN FRA...
- Publication number 20250198901
- Publication date Jun 19, 2025
- Petroleo Brasileiro S.A. - PETROBRAS
- Mario Germino Ferreira da Silva
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALCULATING FILM THICKNESS OF GRAIN BOUNDARY OXIDE LAYER...
- Publication number 20250164422
- Publication date May 22, 2025
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Koji SASAKI
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Spectral Measurements Based On Perturbed Sp...
- Publication number 20250164411
- Publication date May 22, 2025
- KLA Corporation
- William McGahan
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, AND STORAGE MEDIA FOR OBTAINING ENERGY SPECTRA
- Publication number 20250164653
- Publication date May 22, 2025
- Shanghai United Imaging Healthcare Co., Ltd.
- Zhi SHI
- G01 - MEASURING TESTING
Information Patent Application
Transmission electron microscopy with square beams
- Publication number 20250166956
- Publication date May 22, 2025
- New York Structural Biology Center
- Eugene Yue Dao Chau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD OF VIEW SELECTION FOR METROLOGY ASSOCIATED WITH SEMICONDUCTOR...
- Publication number 20250147433
- Publication date May 8, 2025
- ASML NETHERLANDS B.V.
- Tsung-Pao FANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250137944
- Publication date May 1, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF
- Publication number 20250124564
- Publication date Apr 17, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF
- Publication number 20250125431
- Publication date Apr 17, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FOOD ASSESSMENT DEVICE AND METHOD THEREOF
- Publication number 20250116596
- Publication date Apr 10, 2025
- HCL Technologies Limited
- GURGENIUS SINGH KAPOOR
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASUREMENT DEVICE, RADIOGRAPHY SYSTEM, OPERATION METHOD O...
- Publication number 20250110063
- Publication date Apr 3, 2025
- FUJIFILM CORPORATION
- Hisatsugu HORIUCHI
- G01 - MEASURING TESTING
Information Patent Application
Component authentication using x-ray detectable unique features
- Publication number 20250111497
- Publication date Apr 3, 2025
- Guilherme Cardoso
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DOWNHOLE LITHIUM DETECTION SYSTEMS AND METHODS
- Publication number 20250102699
- Publication date Mar 27, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Christian Stoller
- G01 - MEASURING TESTING
Information Patent Application
Forward Library Based Seeding For Efficient X-Ray Scatterometry Mea...
- Publication number 20250085241
- Publication date Mar 13, 2025
- KLA Corporation
- Rebecca Shen
- G01 - MEASURING TESTING
Information Patent Application
XRF AND CALCIMETRY EVALUATION OF MULTIPHASE OILFIELD FLUIDS
- Publication number 20250076229
- Publication date Mar 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Reda Karoum
- G01 - MEASURING TESTING
Information Patent Application
UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...
- Publication number 20250078244
- Publication date Mar 6, 2025
- ASML NETHERLANDS B.V.
- Chen ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PDMS (POLY(DIMETHYL SILOXANE))-BASED ANALYSIS METHOD OF COSMETIC FI...
- Publication number 20250076223
- Publication date Mar 6, 2025
- AMOREPACIFIC CORPORATION
- Chaeyeon SONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MATCHING CALIBRATIONS OF DETECTORS IN A DETEC...
- Publication number 20250067685
- Publication date Feb 27, 2025
- Thermo EGS Gauging LLC
- Carter WATSON
- G01 - MEASURING TESTING
Information Patent Application
PRODUCTION SOLUTIONS FOR HIGH-THROUGHPUT/PRECISION XPS METROLOGY US...
- Publication number 20250067691
- Publication date Feb 27, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- G01 - MEASURING TESTING
Information Patent Application
HYBRID X-RAY AND OPTICAL METROLOGY AND NAVIGATION
- Publication number 20250060324
- Publication date Feb 20, 2025
- TOKYO ELECTRON LIMITED
- Francisco Machuca
- G01 - MEASURING TESTING
Information Patent Application
METHOD, DEVICES AND ARRANGEMENTS FOR LOCATING BONY PARTS PRESENT IN...
- Publication number 20250052699
- Publication date Feb 13, 2025
- FPI FOOD PROCESSING INNOVATION GMBH & CO. KG
- Christoph Fabian Isernhagen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20250052704
- Publication date Feb 13, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Wei Ti LEE
- H01 - BASIC ELECTRIC ELEMENTS

thin films, coatings

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Diffractive analyzer of patient tissue

Method of failure analysis for defect locations

Method for detection of soil heavy metal pollution using unmanned a...

Pulsed neutron apparatus and method for using same to analyze core...

Prediction of cement longevity using digital cement modeling

Lithium detection techniques using neutrons and/or alpha particles

Charged particle beam device

Electron spectroscopy based techniques for determining various chem...

Method for manufacturing a film comprising cavities with determinat...

Large die wafer, large die and method of forming the same

Full beam metrology for x-ray scatterometry systems

Method and system for analyzing prostate biopsy

Method of evaluating concentration of sulfur

Sensor apparatus and water amount measurement apparatus

Apparatus and method for biological analyte studying using x-ray fl...

X-ray analysis system and method with multi-source design

Deterioration diagnosis device, deterioration diagnosis method, and...

Apparatus and method for computed tomography system calibration

Processing head for a forestry machine

System and method for utilization of photon counting for colorizati...

Single piece droplet generation and injection device for serial cry...

Parameterizing x-ray scattering measurement using slice-and-image t...

Downhole lithium detection systems and methods

Characterizing and measuring in small boxes using XPS with multiple...

Agricultural machine with resonance vibration response detection

Distance and direction-sensitive cosmogenic neutron sensors

Method, apparatus, and program for determining condition related to...

Diffraction-based global in vitro diagnostic system

Inspection device

Food product monitoring solution

Patents Applicationslast 30 patents

Analysis System, Analysis Method, and Analysis Program

SYSTEMS AND METHODS FOR VOLTAGE CONTRAST DEFECT DETECTION

APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM

APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM

APPARATUS AND METHOD FOR DIAGNOSING BATTERY, AND COMPUTER PROGRAM

Collimator for an X-ray inspection system, X-ray laminography syste...

METHOD OF INSPECTING GROUP-III ELEMENT NITRIDE SUBSTRATE, METHOD OF...

THERMAL CHARACTERIZATION METHOD AND MANUFACTURING OF SEMICONDUCTOR...

SYSTEM AND METHOD FOR DETERMINING THE FLUID FLOW WITH TRACER IN FRA...

METHOD FOR CALCULATING FILM THICKNESS OF GRAIN BOUNDARY OXIDE LAYER...

Methods And Systems For Spectral Measurements Based On Perturbed Sp...

METHODS, SYSTEMS, AND STORAGE MEDIA FOR OBTAINING ENERGY SPECTRA

Transmission electron microscopy with square beams

FIELD OF VIEW SELECTION FOR METROLOGY ASSOCIATED WITH SEMICONDUCTOR...

X-RAY INSPECTION APPARATUS

DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF

DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF

FOOD ASSESSMENT DEVICE AND METHOD THEREOF

DISTANCE MEASUREMENT DEVICE, RADIOGRAPHY SYSTEM, OPERATION METHOD O...

Component authentication using x-ray detectable unique features

DOWNHOLE LITHIUM DETECTION SYSTEMS AND METHODS

Forward Library Based Seeding For Efficient X-Ray Scatterometry Mea...

XRF AND CALCIMETRY EVALUATION OF MULTIPHASE OILFIELD FLUIDS

UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...

PDMS (POLY(DIMETHYL SILOXANE))-BASED ANALYSIS METHOD OF COSMETIC FI...

METHOD AND SYSTEM FOR MATCHING CALIBRATIONS OF DETECTORS IN A DETEC...

PRODUCTION SOLUTIONS FOR HIGH-THROUGHPUT/PRECISION XPS METROLOGY US...

HYBRID X-RAY AND OPTICAL METROLOGY AND NAVIGATION

METHOD, DEVICES AND ARRANGEMENTS FOR LOCATING BONY PARTS PRESENT IN...

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS