thin films, coatings

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CPC
G01N2223/61

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/61thin films, coatings

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Inspection device
- Patent number 12,228,527
- Issue date Feb 18, 2025
- Saki Corporation
- Hiroyuki Murata
- G01 - MEASURING TESTING
Information Patent Grant
Food product monitoring solution
- Patent number 12,228,528
- Issue date Feb 18, 2025
- MEKITEC OY
- Peng Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface asset management mapping system
- Patent number 12,228,522
- Issue date Feb 18, 2025
- Mike Morgan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for moisture measurement
- Patent number 12,228,530
- Issue date Feb 18, 2025
- Chrysos Corporation Limited
- James Tickner
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 12,222,303
- Issue date Feb 11, 2025
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for real-time monitoring of organic matter porosity evolu...
- Patent number 12,222,273
- Issue date Feb 11, 2025
- Saudi Arabian Oil Company
- Abrar Alabbad
- G01 - MEASURING TESTING
Information Patent Grant
Detecting downhole fluid composition utilizing photon emission
- Patent number 12,221,884
- Issue date Feb 11, 2025
- Halliburton Energy Services, Inc.
- Christopher Michael Jones
- G01 - MEASURING TESTING
Information Patent Grant
Method of preparing an organic material sample for LIBS analysis an...
- Patent number 12,216,035
- Issue date Feb 4, 2025
- Foss Analytical A/S
- Ahmed Fadil
- G01 - MEASURING TESTING
Information Patent Grant
Insulating device
- Patent number 12,216,070
- Issue date Feb 4, 2025
- Kabushiki Kaisha Toshiba
- Takuo Kikuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deposition system and method
- Patent number 12,211,756
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Hao Cheng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Transmission electron microscopy with square beams
- Patent number 12,205,789
- Issue date Jan 21, 2025
- New York Structural Biology Center
- Eugene Yue Dao Chua
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image processing and detection of discontinuities in battery cells
- Patent number 12,203,880
- Issue date Jan 21, 2025
- GM Global Technology Operations LLC
- Sean Robert Wagner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Industrial x-ray workpiece measuring system and method for operatin...
- Patent number 12,203,876
- Issue date Jan 21, 2025
- Intom GmbH
- Severin Ebner
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for voltage contrast defect detection
- Patent number 12,196,692
- Issue date Jan 14, 2025
- ASML Netherlands B.V.
- Weiming Ren
- G01 - MEASURING TESTING
Information Patent Grant
X-ray based measurements in patterned structure
- Patent number 12,196,691
- Issue date Jan 14, 2025
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for efficient high harmonic generation
- Patent number 12,196,688
- Issue date Jan 14, 2025
- ASML Netherlands B.V.
- Petrus Wilhelmus Smorenburg
- G01 - MEASURING TESTING
Information Patent Grant
Image pickup device and image generation method
- Patent number 12,181,425
- Issue date Dec 31, 2024
- Kioxia Corporation
- Takeshi Yamane
- G01 - MEASURING TESTING
Information Patent Grant
Utilize machine learning in selecting high quality averaged SEM ima...
- Patent number 12,182,983
- Issue date Dec 31, 2024
- ASML Netherlands B.V.
- Chen Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray-based test device and method for plugging removal effect of s...
- Patent number 12,174,133
- Issue date Dec 24, 2024
- SOUTHWEST PETROLEUM UNIVERSITY
- Xiao Guo
- G01 - MEASURING TESTING
Information Patent Grant
Bonding wire for semiconductor devices
- Patent number 12,166,006
- Issue date Dec 10, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for x-ray computed tomography
- Patent number 12,163,901
- Issue date Dec 10, 2024
- Orimtech, Ltd.
- Boris S. Goldberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bonding wire for semiconductor devices
- Patent number 12,132,026
- Issue date Oct 29, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for estimating the occurrence of defects, and computer-reada...
- Patent number 12,111,272
- Issue date Oct 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-axis specimen imaging device with embedded orientation markers
- Patent number 12,104,997
- Issue date Oct 1, 2024
- FAXITRON BIOPTICS, LLC
- Donogh O'Driscoll
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Method and apparatus for monitoring beam profile and power
- Patent number 12,105,036
- Issue date Oct 1, 2024
- ASML Netherlands B.V.
- Jian Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Assessing characteristics of subterranean formations using micro-co...
- Patent number 12,105,077
- Issue date Oct 1, 2024
- Saudi Arabian Oil Company
- Osman Hamid
- G01 - MEASURING TESTING
Information Patent Grant
Diffractometer-based global in situ diagnostic system for animals
- Patent number 12,094,609
- Issue date Sep 17, 2024
- Arion Diagnostics, Inc.
- Alexander Lazarev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diffraction-based global in vitro diagnostic system
- Patent number 12,094,610
- Issue date Sep 17, 2024
- Bragg Analytics, Inc.
- Alexander Lazarev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for measuring the relative permeability of proppe...
- Patent number 12,092,592
- Issue date Sep 17, 2024
- SOUTHWEST PETROLEUM UNIVERSITY
- Zhenglan Li
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of metal or alloy coating
- Patent number 12,092,594
- Issue date Sep 17, 2024
- Schlumberger Technology Corporation
- Jill F. Geddes
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HYBRID X-RAY AND OPTICAL METROLOGY AND NAVIGATION
- Publication number 20250060324
- Publication date Feb 20, 2025
- TOKYO ELECTRON LIMITED
- Francisco Machuca
- G01 - MEASURING TESTING
Information Patent Application
METHOD, DEVICES AND ARRANGEMENTS FOR LOCATING BONY PARTS PRESENT IN...
- Publication number 20250052699
- Publication date Feb 13, 2025
- FPI FOOD PROCESSING INNOVATION GMBH & CO. KG
- Christoph Fabian Isernhagen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20250052704
- Publication date Feb 13, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Wei Ti LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ANALYSING A GEOLOGICAL SAMPLE
- Publication number 20250052700
- Publication date Feb 13, 2025
- Adaptix Ltd.
- Mark Evans
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING THE BENDING STIFFNESS OF HIGH ASPECT RATIO NA...
- Publication number 20250052703
- Publication date Feb 13, 2025
- IMEC vzw
- XiuMei Xu
- B82 - NANO-TECHNOLOGY
Information Patent Application
LITHIUM DETECTION TECHNIQUES USING NEUTRONS AND/OR ALPHA PARTICLES
- Publication number 20250044476
- Publication date Feb 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Shikha Prasad
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND METHOD FOR GENERATING INSPECTION IMAGE
- Publication number 20250037269
- Publication date Jan 30, 2025
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIFFERENTIATION OF CLASTIC SEDIMENTARY SYSTEMS USING MARCH-DOLLASE...
- Publication number 20250027891
- Publication date Jan 23, 2025
- Saudi Arabian Oil Company
- Mohamed SOUA
- G01 - MEASURING TESTING
Information Patent Application
Transmission electron microscopy with square beams
- Publication number 20250029806
- Publication date Jan 23, 2025
- New York Structural Biology Center
- Eugene Yue Dao Chua
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD...
- Publication number 20250028253
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- YEN-FONG CHAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BOND-SELECTIVE FULL-FIELD OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20250012557
- Publication date Jan 9, 2025
- Trustees of Boston University
- Ji-Xin Cheng
- G01 - MEASURING TESTING
Information Patent Application
Substrate Alloy Influence Compensation
- Publication number 20250003897
- Publication date Jan 2, 2025
- THERMO FISHER SCIENTIFIC MESSTECHNIK GMBH
- Alexander Britting
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESS...
- Publication number 20250003895
- Publication date Jan 2, 2025
- Canon Kabushiki Kaisha
- Atsushi IWASHITA
- G01 - MEASURING TESTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
- Publication number 20240418633
- Publication date Dec 19, 2024
- KLA Corporation
- Shova Subedi
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MONITORING SLOPE STABILITY
- Publication number 20240410842
- Publication date Dec 12, 2024
- Muon Vision Inc.
- Tancredi Botto
- E21 - EARTH DRILLING MINING
Information Patent Application
ELECTROMAGNETIC IMAGING CALIBRATION METHOD
- Publication number 20240402099
- Publication date Dec 5, 2024
- EMvision Medical Devices Ltd
- Amin ABBOSH
- G01 - MEASURING TESTING
Information Patent Application
ANATOMICAL IMAGING SYSTEM WITH CENTIPEDE BELT DRIVE
- Publication number 20240398364
- Publication date Dec 5, 2024
- NEUROLOGICA CORP.
- Andrew P. Tybinkowski
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...
- Publication number 20240402098
- Publication date Dec 5, 2024
- Rapiscan Holdings, Inc.
- Brendan Edward Allman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...
- Publication number 20240401940
- Publication date Dec 5, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CHARACTERIZING A NETWORK TO BE ANALYSED COMPRISING PERIO...
- Publication number 20240394867
- Publication date Nov 28, 2024
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Lucas JALOUSTRE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analysis System
- Publication number 20240393270
- Publication date Nov 28, 2024
- Hitachi High-Tech Corporation
- Azusa KONNO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR ANALYSING AN IMAGE OF A MICROLITHOGRAPHIC MIC...
- Publication number 20240393269
- Publication date Nov 28, 2024
- Carl Zeiss SMT GMBH
- Jens Oster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analysis Device and Analysis Method
- Publication number 20240385131
- Publication date Nov 21, 2024
- JEOL Ltd.
- Takeshi Otsuka
- G01 - MEASURING TESTING
Information Patent Application
ROENTGEN INTEGRATED METROLOGY FOR HYBRID BONDING PROCESS CONTROL IN...
- Publication number 20240387448
- Publication date Nov 21, 2024
- TOKYO ELECTRON LIMITED
- Francisco MACHUCA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR CABINET X-RAY IRRADIATOR SYSTEMS WITH CAMERA
- Publication number 20240377339
- Publication date Nov 14, 2024
- KUB TECHNOLOGIES, INC. DBA KUBTEC
- Vikram Butani
- G01 - MEASURING TESTING
Information Patent Application
Small-Angle X-Ray Scatterometry
- Publication number 20240377342
- Publication date Nov 14, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONVERTING METROLOGY DATA
- Publication number 20240377343
- Publication date Nov 14, 2024
- ASML NETHERLANDS B.V.
- Yunbo GUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR MULTI-AXIS IMAGING OF SPECIMENS
- Publication number 20240359187
- Publication date Oct 31, 2024
- Faxitron Bioptics, LLC
- Ciaran Purdy
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
APPARATUS AND METHODS FOR CHEMICAL MECHANICAL POLISHING
- Publication number 20240363447
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Te-Chien HOU
- B24 - GRINDING POLISHING

thin films, coatings

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Inspection device

Food product monitoring solution

Surface asset management mapping system

Method for moisture measurement

Transmissive small-angle scattering device

Apparatus for real-time monitoring of organic matter porosity evolu...

Detecting downhole fluid composition utilizing photon emission

Method of preparing an organic material sample for LIBS analysis an...

Insulating device

Deposition system and method

Transmission electron microscopy with square beams

Image processing and detection of discontinuities in battery cells

Industrial x-ray workpiece measuring system and method for operatin...

Systems and methods for voltage contrast defect detection

X-ray based measurements in patterned structure

Method and apparatus for efficient high harmonic generation

Image pickup device and image generation method

Utilize machine learning in selecting high quality averaged SEM ima...

X-ray-based test device and method for plugging removal effect of s...

Bonding wire for semiconductor devices

Systems and methods for x-ray computed tomography

Bonding wire for semiconductor devices

System for estimating the occurrence of defects, and computer-reada...

Multi-axis specimen imaging device with embedded orientation markers

Method and apparatus for monitoring beam profile and power

Assessing characteristics of subterranean formations using micro-co...

Diffractometer-based global in situ diagnostic system for animals

Diffraction-based global in vitro diagnostic system

Device and method for measuring the relative permeability of proppe...

Measurement of metal or alloy coating

Patents Applicationslast 30 patents

HYBRID X-RAY AND OPTICAL METROLOGY AND NAVIGATION

METHOD, DEVICES AND ARRANGEMENTS FOR LOCATING BONY PARTS PRESENT IN...

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

METHOD OF ANALYSING A GEOLOGICAL SAMPLE

METHOD FOR EVALUATING THE BENDING STIFFNESS OF HIGH ASPECT RATIO NA...

LITHIUM DETECTION TECHNIQUES USING NEUTRONS AND/OR ALPHA PARTICLES

INSPECTION APPARATUS AND METHOD FOR GENERATING INSPECTION IMAGE

DIFFERENTIATION OF CLASTIC SEDIMENTARY SYSTEMS USING MARCH-DOLLASE...

Transmission electron microscopy with square beams

METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD...

BOND-SELECTIVE FULL-FIELD OPTICAL COHERENCE TOMOGRAPHY

Substrate Alloy Influence Compensation

IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESS...

PATTERNED X-RAY EMITTING TARGET

COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...

SYSTEMS AND METHODS FOR MONITORING SLOPE STABILITY

ELECTROMAGNETIC IMAGING CALIBRATION METHOD

ANATOMICAL IMAGING SYSTEM WITH CENTIPEDE BELT DRIVE

Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...

CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...

METHOD FOR CHARACTERIZING A NETWORK TO BE ANALYSED COMPRISING PERIO...

Analysis System

METHOD AND DEVICE FOR ANALYSING AN IMAGE OF A MICROLITHOGRAPHIC MIC...

Analysis Device and Analysis Method

ROENTGEN INTEGRATED METROLOGY FOR HYBRID BONDING PROCESS CONTROL IN...

SYSTEM AND METHOD FOR CABINET X-RAY IRRADIATOR SYSTEMS WITH CAMERA

Small-Angle X-Ray Scatterometry

METHOD FOR CONVERTING METROLOGY DATA

SYSTEM AND METHOD FOR MULTI-AXIS IMAGING OF SPECIMENS

APPARATUS AND METHODS FOR CHEMICAL MECHANICAL POLISHING