thin films, coatings

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CPC
G01N2223/61

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/61thin films, coatings

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Bonding wire for semiconductor devices
- Patent number 12,166,006
- Issue date Dec 10, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for x-ray computed tomography
- Patent number 12,163,901
- Issue date Dec 10, 2024
- Orimtech, Ltd.
- Boris S. Goldberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bonding wire for semiconductor devices
- Patent number 12,132,026
- Issue date Oct 29, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for estimating the occurrence of defects, and computer-reada...
- Patent number 12,111,272
- Issue date Oct 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-axis specimen imaging device with embedded orientation markers
- Patent number 12,104,997
- Issue date Oct 1, 2024
- FAXITRON BIOPTICS, LLC
- Donogh O'Driscoll
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Method and apparatus for monitoring beam profile and power
- Patent number 12,105,036
- Issue date Oct 1, 2024
- ASML Netherlands B.V.
- Jian Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Assessing characteristics of subterranean formations using micro-co...
- Patent number 12,105,077
- Issue date Oct 1, 2024
- Saudi Arabian Oil Company
- Osman Hamid
- G01 - MEASURING TESTING
Information Patent Grant
Diffractometer-based global in situ diagnostic system for animals
- Patent number 12,094,609
- Issue date Sep 17, 2024
- Arion Diagnostics, Inc.
- Alexander Lazarev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diffraction-based global in vitro diagnostic system
- Patent number 12,094,610
- Issue date Sep 17, 2024
- Bragg Analytics, Inc.
- Alexander Lazarev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for measuring the relative permeability of proppe...
- Patent number 12,092,592
- Issue date Sep 17, 2024
- SOUTHWEST PETROLEUM UNIVERSITY
- Zhenglan Li
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of metal or alloy coating
- Patent number 12,092,594
- Issue date Sep 17, 2024
- Schlumberger Technology Corporation
- Jill F. Geddes
- G01 - MEASURING TESTING
Information Patent Grant
Small-angle X-ray scatterometry
- Patent number 12,085,521
- Issue date Sep 10, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring properties of X-ray beam during X-ray analysis
- Patent number 12,078,604
- Issue date Sep 3, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Petro-steering methodologies during under balanced coiled tubing (U...
- Patent number 12,065,929
- Issue date Aug 20, 2024
- Saudi Arabian Oil Company
- Ferney Geovany Moreno Sierra
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 12,066,391
- Issue date Aug 20, 2024
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect characterization method and apparatus
- Patent number 12,067,704
- Issue date Aug 20, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Ning Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Battery holder device and battery test system including the same
- Patent number 12,061,157
- Issue date Aug 13, 2024
- SK ON CO., LTD.
- Hye Ju Jang
- G01 - MEASURING TESTING
Information Patent Grant
Estimating heights of defects in a wafer by scaling a 3D model usin...
- Patent number 12,057,336
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Shashank Shrikant Agashe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method, inspection system, and semiconductor fabrication...
- Patent number 12,055,861
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Kihyun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray automated calibration and monitoring
- Patent number 12,044,634
- Issue date Jul 23, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
System and method for multi-axis imaging of specimens
- Patent number 12,030,058
- Issue date Jul 9, 2024
- FAXITRON BIOPTICS, LLC
- Ciaran Purdy
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Soft x-ray optics with improved filtering
- Patent number 12,025,575
- Issue date Jul 2, 2024
- KLA Corporation
- Alexander Kuznetsov
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 12,019,036
- Issue date Jun 25, 2024
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Diagnosis of cause of degradation of lithium secondary battery
- Patent number 12,013,356
- Issue date Jun 18, 2024
- LG ENERGY SOLUTION, LTD.
- Hyo Jung Yoon
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for compact, small spot size soft x-ray scatter...
- Patent number 12,013,355
- Issue date Jun 18, 2024
- KLA Corporation
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder, system and method
- Patent number 12,007,339
- Issue date Jun 11, 2024
- Carl Zeiss SMT Inc.
- Thomas Anthony Case
- G01 - MEASURING TESTING
Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray unit technology modules and automated application training
- Patent number 11,988,617
- Issue date May 21, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 11,988,502
- Issue date May 21, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- G01 - MEASURING TESTING
Information Patent Grant
Material properties from two-dimensional image
- Patent number 11,982,635
- Issue date May 14, 2024
- BP Corporation North America Inc.
- Glen L. Gettemy
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
- Publication number 20240418633
- Publication date Dec 19, 2024
- KLA Corporation
- Shova Subedi
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MONITORING SLOPE STABILITY
- Publication number 20240410842
- Publication date Dec 12, 2024
- Muon Vision Inc.
- Tancredi Botto
- E21 - EARTH DRILLING MINING
Information Patent Application
ELECTROMAGNETIC IMAGING CALIBRATION METHOD
- Publication number 20240402099
- Publication date Dec 5, 2024
- EMvision Medical Devices Ltd
- Amin ABBOSH
- G01 - MEASURING TESTING
Information Patent Application
ANATOMICAL IMAGING SYSTEM WITH CENTIPEDE BELT DRIVE
- Publication number 20240398364
- Publication date Dec 5, 2024
- NEUROLOGICA CORP.
- Andrew P. Tybinkowski
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...
- Publication number 20240402098
- Publication date Dec 5, 2024
- Rapiscan Holdings, Inc.
- Brendan Edward Allman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...
- Publication number 20240401940
- Publication date Dec 5, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CHARACTERIZING A NETWORK TO BE ANALYSED COMPRISING PERIO...
- Publication number 20240394867
- Publication date Nov 28, 2024
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Lucas JALOUSTRE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analysis System
- Publication number 20240393270
- Publication date Nov 28, 2024
- Hitachi High-Tech Corporation
- Azusa KONNO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR ANALYSING AN IMAGE OF A MICROLITHOGRAPHIC MIC...
- Publication number 20240393269
- Publication date Nov 28, 2024
- Carl Zeiss SMT GMBH
- Jens Oster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analysis Device and Analysis Method
- Publication number 20240385131
- Publication date Nov 21, 2024
- JEOL Ltd.
- Takeshi Otsuka
- G01 - MEASURING TESTING
Information Patent Application
ROENTGEN INTEGRATED METROLOGY FOR HYBRID BONDING PROCESS CONTROL IN...
- Publication number 20240387448
- Publication date Nov 21, 2024
- TOKYO ELECTRON LIMITED
- Francisco MACHUCA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR CABINET X-RAY IRRADIATOR SYSTEMS WITH CAMERA
- Publication number 20240377339
- Publication date Nov 14, 2024
- KUB TECHNOLOGIES, INC. DBA KUBTEC
- Vikram Butani
- G01 - MEASURING TESTING
Information Patent Application
Small-Angle X-Ray Scatterometry
- Publication number 20240377342
- Publication date Nov 14, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONVERTING METROLOGY DATA
- Publication number 20240377343
- Publication date Nov 14, 2024
- ASML NETHERLANDS B.V.
- Yunbo GUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR MULTI-AXIS IMAGING OF SPECIMENS
- Publication number 20240359187
- Publication date Oct 31, 2024
- Faxitron Bioptics, LLC
- Ciaran Purdy
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
APPARATUS AND METHODS FOR CHEMICAL MECHANICAL POLISHING
- Publication number 20240363447
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Te-Chien HOU
- B24 - GRINDING POLISHING
Information Patent Application
SYSTEM AND METHOD FOR DENOISING A REGION OF INTEREST OF A PATTERN
- Publication number 20240361262
- Publication date Oct 31, 2024
- ETROLOGY, LLC
- Vladislav Kaplan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BATTERY HOLDER DEVICE AND BATTERY TEST SYSTEM INCLUDING THE SAME
- Publication number 20240345004
- Publication date Oct 17, 2024
- SK On Co., Ltd.
- Hye Ju JANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF 3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREAS...
- Publication number 20240328970
- Publication date Oct 3, 2024
- Carl Zeiss SMT GMBH
- Dmitry Klochkov
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ANOMALY-BASED DEFECT INSPECTION
- Publication number 20240331132
- Publication date Oct 3, 2024
- ASML NETHERLANDS B.V.
- Haoyi LIANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREASED ACCURACY
- Publication number 20240331179
- Publication date Oct 3, 2024
- Carl Zeiss SMT GMBH
- Dmitry Klochkov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRAINING SCANNING ELECTRON MICROSCOPY IMAGE SELECTION METHOD AND SE...
- Publication number 20240320816
- Publication date Sep 26, 2024
- Samsung Electronics Co., Ltd.
- Nohong Kwak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR GENERATING A MAP REPRESENTING MECHANICALLY ALTERED AREAS...
- Publication number 20240319115
- Publication date Sep 26, 2024
- Universite Toulouse III - Paul Sabatier
- Francis COLLOMBET
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...
- Publication number 20240319123
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Achim WOESSNER
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD AND APPARATUS FOR SEMICONDUCTOR FEATURES WITH IN...
- Publication number 20240311698
- Publication date Sep 19, 2024
- Carl Zeiss SMT GMBH
- Alexander Freytag
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR X-RAY IMAGING OF BATTERY LAYERS DURING MANUFA...
- Publication number 20240310307
- Publication date Sep 19, 2024
- Curpow Inc.
- Michael LeClair
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE FOR EXAMINING A SPECIMEN
- Publication number 20240302304
- Publication date Sep 12, 2024
- Carl Zeiss SMT GMBH
- Moritz Becker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA ANALYSIS DEVICE, DATA ANALYIS METHOD, PROGRAM, AND RECORDING M...
- Publication number 20240302305
- Publication date Sep 12, 2024
- Sumitomo Electric Industries, Ltd.
- Yutaka HOSHINA
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Scatterometry Based Measurements Of Memory Array Structures S...
- Publication number 20240302301
- Publication date Sep 12, 2024
- KLA Corporation
- Sandeep Inampudi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240297142
- Publication date Sep 5, 2024
- NIPPON MICROMETAL CORPORATION
- Daizo ODA
- H01 - BASIC ELECTRIC ELEMENTS

thin films, coatings

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Bonding wire for semiconductor devices

Systems and methods for x-ray computed tomography

Bonding wire for semiconductor devices

System for estimating the occurrence of defects, and computer-reada...

Multi-axis specimen imaging device with embedded orientation markers

Method and apparatus for monitoring beam profile and power

Assessing characteristics of subterranean formations using micro-co...

Diffractometer-based global in situ diagnostic system for animals

Diffraction-based global in vitro diagnostic system

Device and method for measuring the relative permeability of proppe...

Measurement of metal or alloy coating

Small-angle X-ray scatterometry

Monitoring properties of X-ray beam during X-ray analysis

Petro-steering methodologies during under balanced coiled tubing (U...

Method and system for non-destructive metrology of thin layers

Defect characterization method and apparatus

Battery holder device and battery test system including the same

Estimating heights of defects in a wafer by scaling a 3D model usin...

Inspection method, inspection system, and semiconductor fabrication...

X-ray automated calibration and monitoring

System and method for multi-axis imaging of specimens

Soft x-ray optics with improved filtering

Transmissive small-angle scattering device

Diagnosis of cause of degradation of lithium secondary battery

Methods and systems for compact, small spot size soft x-ray scatter...

Sample holder, system and method

Patterned x-ray emitting target

X-ray unit technology modules and automated application training

Characterizing and measuring in small boxes using XPS with multiple...

Material properties from two-dimensional image

Patents Applicationslast 30 patents

COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...

SYSTEMS AND METHODS FOR MONITORING SLOPE STABILITY

ELECTROMAGNETIC IMAGING CALIBRATION METHOD

ANATOMICAL IMAGING SYSTEM WITH CENTIPEDE BELT DRIVE

Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...

CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...

METHOD FOR CHARACTERIZING A NETWORK TO BE ANALYSED COMPRISING PERIO...

Analysis System

METHOD AND DEVICE FOR ANALYSING AN IMAGE OF A MICROLITHOGRAPHIC MIC...

Analysis Device and Analysis Method

ROENTGEN INTEGRATED METROLOGY FOR HYBRID BONDING PROCESS CONTROL IN...

SYSTEM AND METHOD FOR CABINET X-RAY IRRADIATOR SYSTEMS WITH CAMERA

Small-Angle X-Ray Scatterometry

METHOD FOR CONVERTING METROLOGY DATA

SYSTEM AND METHOD FOR MULTI-AXIS IMAGING OF SPECIMENS

APPARATUS AND METHODS FOR CHEMICAL MECHANICAL POLISHING

SYSTEM AND METHOD FOR DENOISING A REGION OF INTEREST OF A PATTERN

BATTERY HOLDER DEVICE AND BATTERY TEST SYSTEM INCLUDING THE SAME

METHOD OF 3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREAS...

METHOD AND SYSTEM FOR ANOMALY-BASED DEFECT INSPECTION

3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREASED ACCURACY

TRAINING SCANNING ELECTRON MICROSCOPY IMAGE SELECTION METHOD AND SE...

METHOD FOR GENERATING A MAP REPRESENTING MECHANICALLY ALTERED AREAS...

SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...

MEASUREMENT METHOD AND APPARATUS FOR SEMICONDUCTOR FEATURES WITH IN...

SYSTEM AND METHOD FOR X-RAY IMAGING OF BATTERY LAYERS DURING MANUFA...

ELECTRON MICROSCOPE FOR EXAMINING A SPECIMEN

DATA ANALYSIS DEVICE, DATA ANALYIS METHOD, PROGRAM, AND RECORDING M...

X-Ray Scatterometry Based Measurements Of Memory Array Structures S...

BONDING WIRE FOR SEMICONDUCTOR DEVICES