Three-dimensional ion traps

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H01J49/424

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/424Three-dimensional ion traps

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Ion trap array for high throughput charge detection mass spectrometry
- Patent number 12,159,780
- Issue date Dec 3, 2024
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass analyser with spatial focussing
- Patent number 12,131,895
- Issue date Oct 29, 2024
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic ion trap
- Patent number 12,119,215
- Issue date Oct 15, 2024
- NINGBO UNIVERSITY
- Fu-Xing Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for pulsed mode charge detection mass spectrom...
- Patent number 12,112,936
- Issue date Oct 8, 2024
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device having one or more first level ion traps
- Patent number 12,080,541
- Issue date Sep 3, 2024
- Infineon Technologies Austria AG
- Clemens Roessler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inception electrostatic linear ion trap
- Patent number 12,057,306
- Issue date Aug 6, 2024
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charge detection mass spectrometry utilizing harmonic oscillation a...
- Patent number 12,051,579
- Issue date Jul 30, 2024
- Thermo Finnigan LLC.
- Michael W. Senko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analyzer
- Patent number 12,031,943
- Issue date Jul 9, 2024
- Shimadzu Corporation
- Hidenori Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transformer for applying an ac voltage to electrodes
- Patent number 12,033,840
- Issue date Jul 9, 2024
- Micromass UK Limited
- Kenneth Worthington
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion traps with y-directional ion manipulation for mass spectrometry...
- Patent number 12,014,915
- Issue date Jun 18, 2024
- The University of North Carolina at Chapel Hill
- John Michael Ramsey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas analysis device and method for detecting sample gas
- Patent number 11,994,492
- Issue date May 28, 2024
- Nuctech Company Limited
- Yan Wang
- G01 - MEASURING TESTING
Information Patent Grant
Ion trap
- Patent number 11,990,329
- Issue date May 21, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analyzer with 3D electrostatic field
- Patent number 11,942,318
- Issue date Mar 26, 2024
- Shimadzu Corporation
- Vyacheslav Shchepunov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap with ring-shaped ion storage cell and mass spectrometer
- Patent number 11,935,734
- Issue date Mar 19, 2024
- LEYBOLD GMBH
- Michel Aliman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer comprising an ionization device
- Patent number 11,875,985
- Issue date Jan 16, 2024
- LEYBOLD GMBH
- Leonid Gorkhover
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Instrument, including an electrostatic linear ion trap with charge...
- Patent number 11,862,448
- Issue date Jan 2, 2024
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion injection to an electrostatic trap
- Patent number 11,842,892
- Issue date Dec 12, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Mikhail Belov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Accelerator for multi-pass mass spectrometers
- Patent number 11,817,303
- Issue date Nov 14, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for crosstalk compensation
- Patent number 11,817,301
- Issue date Nov 14, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Kholomeev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiplex charge detection mass spectrometry
- Patent number 11,791,146
- Issue date Oct 17, 2023
- The Regents of the University of California
- Evan R. Williams
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion injection into an electrostatic linear ion trap using Zeno pulsing
- Patent number 11,764,052
- Issue date Sep 19, 2023
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Precursor and neutral loss scan in an ion trap
- Patent number 11,764,046
- Issue date Sep 19, 2023
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic trap mass spectrometer with improved ion injection
- Patent number 11,742,192
- Issue date Aug 29, 2023
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for contolling trapped ions
- Patent number 11,721,537
- Issue date Aug 8, 2023
- Infineon Technologies Austria AG
- Clemens Roessler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spherical ion trap and trapping ions
- Patent number 11,651,949
- Issue date May 16, 2023
- GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
- David Ray Leibrandt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Instrument, including an electrostatic linear ion trap, for separat...
- Patent number 11,646,191
- Issue date May 9, 2023
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting time of flight mass analyser
- Patent number 11,621,156
- Issue date Apr 4, 2023
- Micromass UK Limited
- Boris Kozlov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry
- Patent number 11,600,483
- Issue date Mar 7, 2023
- The University of Warwick
- Peter O'Connor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charge detection mass spectrometer including gain drift compensation
- Patent number 11,594,405
- Issue date Feb 28, 2023
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for simultaneously analyzing multiple ions wit...
- Patent number 11,562,896
- Issue date Jan 24, 2023
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR PULSED MODE CHARGE DETECTION MASS SPECTROM...
- Publication number 20240412967
- Publication date Dec 12, 2024
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CALIBRATION OF ANALYTICAL INSTRUMENT
- Publication number 20240393301
- Publication date Nov 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Kyle Fort
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGE DETECTION MASS SPECTROMETRY UTILIZING HARMONIC OSCILLATION A...
- Publication number 20240387159
- Publication date Nov 21, 2024
- Thermo Finnigan LLC
- Michael W. Senko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
3D Ion Traps With Connection Through Substrate
- Publication number 20240371624
- Publication date Nov 7, 2024
- Alpine Quantum Technologies GmbH
- Philip Holz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONDITIONAL OPERATIONS IN QUANTUM OBJECT CONFINEMENT APPARATUS USIN...
- Publication number 20240355613
- Publication date Oct 24, 2024
- Quantinuum LLC
- Christopher E. LANGER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRICAL ISOLATION OF DEVICES OPERATING AT CRYOGENIC TEMPERATURES
- Publication number 20240355573
- Publication date Oct 24, 2024
- IonQ, Inc.
- Ismail Volkan INLEK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTROSTATIC ION TRAP
- Publication number 20240347334
- Publication date Oct 17, 2024
- NINGBO UNIVERSITY
- Fu-Xing Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD
- Publication number 20240290605
- Publication date Aug 29, 2024
- HGSG LTD
- John Brian HOYES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Systems for Injecting Ions into an Electrostatic Linear...
- Publication number 20240274429
- Publication date Aug 15, 2024
- DH Technologies Development Pte. Ltd.
- Eric Thomas DZIEKONSKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR CONTROLLING TRAPPED IONS WITH AN ELECTRODE LAYER OF LOW...
- Publication number 20240249932
- Publication date Jul 25, 2024
- Infineon Technologies Austria AG
- Clemens Rössler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reducing AC Effects on Ions Entering Ion Guide with Pulsing Auxilia...
- Publication number 20240242958
- Publication date Jul 18, 2024
- DH Technologies Development Pte. Ltd.
- Igor Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR CONTROLLING TRAPPED IONS
- Publication number 20240242959
- Publication date Jul 18, 2024
- Infineon Technologies Austria AG
- Clemens Rössler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Nested Electrostatic Linear Ion Traps and Methods of Operating the...
- Publication number 20240194472
- Publication date Jun 13, 2024
- DH Technologies Development Pte. Ltd.
- Eric Thomas DZIEKONSKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD
- Publication number 20240136167
- Publication date Apr 25, 2024
- HGSG LTD
- John Brian HOYES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-STAGE TANDEM MASS SPECTROMETRY FOR PROTONATED GLYCAN ISOMER A...
- Publication number 20240085387
- Publication date Mar 14, 2024
- University of Washington
- Abhigya Mookherjee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION TRAP WITH REDUCED RADIO FREQUENCY (RF) CURRENTS USING MULTIPLE...
- Publication number 20240014023
- Publication date Jan 11, 2024
- Quantinuum LLC
- Adam Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR MULTISTAGE MASS SPECTROMETRY UTILIZING AN E...
- Publication number 20230402272
- Publication date Dec 14, 2023
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE HAVING ONE OR MORE FIRST LEVEL ION TRAPS
- Publication number 20230343576
- Publication date Oct 26, 2023
- Infineon Technologies Austria AG
- Clemens Roessler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-LAYER ION TRAP ON SHAPED GLASS OR DIELECTRIC SUBSTRATE
- Publication number 20230343577
- Publication date Oct 26, 2023
- IonQ, Inc.
- Jason Madjdi AMINI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR SUPER MASS SPECTROMETRY
- Publication number 20230298875
- Publication date Sep 21, 2023
- Trace Matters Scientific LLC
- Mazdak Taghioskoui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Trap Apparatus and Saddle Point Moving Method for Ion Trap Appa...
- Publication number 20230260777
- Publication date Aug 17, 2023
- SOUTHERN UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Zhao WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOROIDAL ION TRAP
- Publication number 20230253199
- Publication date Aug 10, 2023
- PerkinElmer Health Sciences, Inc.
- Stephen D. Lammert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSTRUMENT, INCLUDING AN ELECTROSTATIC LINEAR ION TRAP, FOR ANALYZI...
- Publication number 20230245879
- Publication date Aug 3, 2023
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Reducing the Amplitude of an Oscillating Elec...
- Publication number 20230230828
- Publication date Jul 20, 2023
- Alpine Quantum Technologies GmbH
- Gerard Higgins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING A CHARGE DETECTION MASS SPECTROMETER AND A CHAR...
- Publication number 20230187198
- Publication date Jun 15, 2023
- WATERS TECHNOLOGIES CORPORATION
- Joseph A. Jarrell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS
- Publication number 20230170204
- Publication date Jun 1, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSTRUMENT, INCLUDING AN ELECROSTATIC LINEAR ION TRAP WITH CHARGE D...
- Publication number 20230154736
- Publication date May 18, 2023
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSTRUMENT FOR SEPARATING IONS INCLUDING AN ELECTROSTATIC LINEAR IO...
- Publication number 20230154741
- Publication date May 18, 2023
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-DOMAIN ANALYSIS OF SIGNALS FOR CHARGE DETECTION MASS SPECTROMETRY
- Publication number 20230046906
- Publication date Feb 16, 2023
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS ANALYSIS DEVICE AND METHOD FOR DETECTING SAMPLE GAS
- Publication number 20220404312
- Publication date Dec 22, 2022
- Nuctech Company Limited
- Yan Wang
- H01 - BASIC ELECTRIC ELEMENTS

Three-dimensional ion traps

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Ion trap array for high throughput charge detection mass spectrometry

Time of flight mass analyser with spatial focussing

Electrostatic ion trap

Apparatus and method for pulsed mode charge detection mass spectrom...

Device having one or more first level ion traps

Inception electrostatic linear ion trap

Charge detection mass spectrometry utilizing harmonic oscillation a...

Ion analyzer

Transformer for applying an ac voltage to electrodes

Ion traps with y-directional ion manipulation for mass spectrometry...

Gas analysis device and method for detecting sample gas

Ion trap

Mass analyzer with 3D electrostatic field

Ion trap with ring-shaped ion storage cell and mass spectrometer

Mass spectrometer comprising an ionization device

Instrument, including an electrostatic linear ion trap with charge...

Ion injection to an electrostatic trap

Accelerator for multi-pass mass spectrometers

Method and device for crosstalk compensation

Multiplex charge detection mass spectrometry

Ion injection into an electrostatic linear ion trap using Zeno pulsing

Precursor and neutral loss scan in an ion trap

Electrostatic trap mass spectrometer with improved ion injection

Device for contolling trapped ions

Spherical ion trap and trapping ions

Instrument, including an electrostatic linear ion trap, for separat...

Multi-reflecting time of flight mass analyser

Mass spectrometry

Charge detection mass spectrometer including gain drift compensation

Apparatus and method for simultaneously analyzing multiple ions wit...

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR PULSED MODE CHARGE DETECTION MASS SPECTROM...

CALIBRATION OF ANALYTICAL INSTRUMENT

CHARGE DETECTION MASS SPECTROMETRY UTILIZING HARMONIC OSCILLATION A...

3D Ion Traps With Connection Through Substrate

CONDITIONAL OPERATIONS IN QUANTUM OBJECT CONFINEMENT APPARATUS USIN...

ELECTRICAL ISOLATION OF DEVICES OPERATING AT CRYOGENIC TEMPERATURES

ELECTROSTATIC ION TRAP

MASS SPECTROMETER AND METHOD

Methods and Systems for Injecting Ions into an Electrostatic Linear...

DEVICE FOR CONTROLLING TRAPPED IONS WITH AN ELECTRODE LAYER OF LOW...

Reducing AC Effects on Ions Entering Ion Guide with Pulsing Auxilia...

DEVICE FOR CONTROLLING TRAPPED IONS

Nested Electrostatic Linear Ion Traps and Methods of Operating the...

MASS SPECTROMETER AND METHOD

MULTI-STAGE TANDEM MASS SPECTROMETRY FOR PROTONATED GLYCAN ISOMER A...

ION TRAP WITH REDUCED RADIO FREQUENCY (RF) CURRENTS USING MULTIPLE...

SYSTEMS AND METHODS FOR MULTISTAGE MASS SPECTROMETRY UTILIZING AN E...

DEVICE HAVING ONE OR MORE FIRST LEVEL ION TRAPS

MULTI-LAYER ION TRAP ON SHAPED GLASS OR DIELECTRIC SUBSTRATE

SYSTEMS AND METHODS FOR SUPER MASS SPECTROMETRY

Ion Trap Apparatus and Saddle Point Moving Method for Ion Trap Appa...

TOROIDAL ION TRAP

INSTRUMENT, INCLUDING AN ELECTROSTATIC LINEAR ION TRAP, FOR ANALYZI...

Method and System for Reducing the Amplitude of an Oscillating Elec...

METHOD OF OPERATING A CHARGE DETECTION MASS SPECTROMETER AND A CHAR...

ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS

INSTRUMENT, INCLUDING AN ELECROSTATIC LINEAR ION TRAP WITH CHARGE D...

INSTRUMENT FOR SEPARATING IONS INCLUDING AN ELECTROSTATIC LINEAR IO...

TIME-DOMAIN ANALYSIS OF SIGNALS FOR CHARGE DETECTION MASS SPECTROMETRY

GAS ANALYSIS DEVICE AND METHOD FOR DETECTING SAMPLE GAS