Membership
Tour
Register
Log in
Three-dimensional ion traps
Follow
Industry
CPC
H01J49/424
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
H
ELECTRICITY
H01
Electric elements
H01J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J49/00
Particle spectrometer or separator tubes
Current Industry
H01J49/424
Three-dimensional ion traps
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Gas analysis device and method for detecting sample gas
Patent number
11,994,492
Issue date
May 28, 2024
Nuctech Company Limited
Yan Wang
G01 - MEASURING TESTING
Information
Patent Grant
Ion trap
Patent number
11,990,329
Issue date
May 21, 2024
Thermo Fisher Scientific (Bremen) GmbH
Hamish Stewart
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass analyzer with 3D electrostatic field
Patent number
11,942,318
Issue date
Mar 26, 2024
Shimadzu Corporation
Vyacheslav Shchepunov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion trap with ring-shaped ion storage cell and mass spectrometer
Patent number
11,935,734
Issue date
Mar 19, 2024
LEYBOLD GMBH
Michel Aliman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer comprising an ionization device
Patent number
11,875,985
Issue date
Jan 16, 2024
LEYBOLD GMBH
Leonid Gorkhover
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Instrument, including an electrostatic linear ion trap with charge...
Patent number
11,862,448
Issue date
Jan 2, 2024
The Trustees of Indiana University
Martin F. Jarrold
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion injection to an electrostatic trap
Patent number
11,842,892
Issue date
Dec 12, 2023
Thermo Fisher Scientific (Bremen) GmbH
Mikhail Belov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Accelerator for multi-pass mass spectrometers
Patent number
11,817,303
Issue date
Nov 14, 2023
Micromass UK Limited
Anatoly Verenchikov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and device for crosstalk compensation
Patent number
11,817,301
Issue date
Nov 14, 2023
Thermo Fisher Scientific (Bremen) GmbH
Alexander Kholomeev
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multiplex charge detection mass spectrometry
Patent number
11,791,146
Issue date
Oct 17, 2023
The Regents of the University of California
Evan R. Williams
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion injection into an electrostatic linear ion trap using Zeno pulsing
Patent number
11,764,052
Issue date
Sep 19, 2023
DH Technologies Development Pte. Ltd.
Eric Thomas Dziekonski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Precursor and neutral loss scan in an ion trap
Patent number
11,764,046
Issue date
Sep 19, 2023
Purdue Research Foundation
Robert Graham Cooks
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrostatic trap mass spectrometer with improved ion injection
Patent number
11,742,192
Issue date
Aug 29, 2023
Leco Corporation
Anatoly N. Verenchikov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device for contolling trapped ions
Patent number
11,721,537
Issue date
Aug 8, 2023
Infineon Technologies Austria AG
Clemens Roessler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spherical ion trap and trapping ions
Patent number
11,651,949
Issue date
May 16, 2023
GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
David Ray Leibrandt
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Instrument, including an electrostatic linear ion trap, for separat...
Patent number
11,646,191
Issue date
May 9, 2023
The Trustees of Indiana University
Martin F. Jarrold
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-reflecting time of flight mass analyser
Patent number
11,621,156
Issue date
Apr 4, 2023
Micromass UK Limited
Boris Kozlov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometry
Patent number
11,600,483
Issue date
Mar 7, 2023
The University of Warwick
Peter O'Connor
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charge detection mass spectrometer including gain drift compensation
Patent number
11,594,405
Issue date
Feb 28, 2023
The Trustees of Indiana University
Martin F. Jarrold
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for simultaneously analyzing multiple ions wit...
Patent number
11,562,896
Issue date
Jan 24, 2023
The Trustees of Indiana University
Martin F. Jarrold
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spectrum calculation processing device, spectrum calculation proces...
Patent number
11,527,393
Issue date
Dec 13, 2022
Shimadzu Corporation
Hideharu Shichi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass calibration of mass spectrometer
Patent number
11,410,840
Issue date
Aug 9, 2022
Thermo Fisher Scientifc (Bremen) GmbH
Anastassios Giannakopulos
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and device for crosstalk compensation
Patent number
11,361,952
Issue date
Jun 14, 2022
Thermo Fisher Scientific (Bremen) GmbH
Alexander Kholomeev
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Precursor and neutral loss scan in an ion trap
Patent number
11,348,778
Issue date
May 31, 2022
Purdue Research Foundation
Robert Graham Cooks
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Time of flight mass analyser with spatial focussing
Patent number
11,328,920
Issue date
May 10, 2022
Micromass UK Limited
John Brian Hoyes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion injection to an electrostatic trap
Patent number
11,328,922
Issue date
May 10, 2022
Thermo Fisher Scientific (Bremen) GmbH
Mikhail Belov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
MEMS-based 3D ion trapping device for using laser penetrating ion t...
Patent number
11,315,773
Issue date
Apr 26, 2022
ALPINE QUANTUM TECHNOLOGIES GMBH
Taehyun Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Time-of-flight mass spectrometer and method for improving mass and...
Patent number
11,264,229
Issue date
Mar 1, 2022
Guennadi Lebedev
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrostatic linear ion trap design for charge detection mass spec...
Patent number
11,232,941
Issue date
Jan 25, 2022
The Trustees of Indiana University
Martin F. Jarrold
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion trap array for high throughput charge detection mass spectrometry
Patent number
11,227,759
Issue date
Jan 18, 2022
The Trustees of Indiana University
Martin F. Jarrold
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
MASS SPECTROMETER AND METHOD
Publication number
20240136167
Publication date
Apr 25, 2024
HGSG LTD
John Brian HOYES
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI-STAGE TANDEM MASS SPECTROMETRY FOR PROTONATED GLYCAN ISOMER A...
Publication number
20240085387
Publication date
Mar 14, 2024
University of Washington
Abhigya Mookherjee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION TRAP WITH REDUCED RADIO FREQUENCY (RF) CURRENTS USING MULTIPLE...
Publication number
20240014023
Publication date
Jan 11, 2024
Quantinuum LLC
Adam Reed
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR MULTISTAGE MASS SPECTROMETRY UTILIZING AN E...
Publication number
20230402272
Publication date
Dec 14, 2023
DH Technologies Development Pte. Ltd.
Eric Thomas Dziekonski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEVICE HAVING ONE OR MORE FIRST LEVEL ION TRAPS
Publication number
20230343576
Publication date
Oct 26, 2023
Infineon Technologies Austria AG
Clemens Roessler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI-LAYER ION TRAP ON SHAPED GLASS OR DIELECTRIC SUBSTRATE
Publication number
20230343577
Publication date
Oct 26, 2023
IonQ, Inc.
Jason Madjdi AMINI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR SUPER MASS SPECTROMETRY
Publication number
20230298875
Publication date
Sep 21, 2023
Trace Matters Scientific LLC
Mazdak Taghioskoui
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion Trap Apparatus and Saddle Point Moving Method for Ion Trap Appa...
Publication number
20230260777
Publication date
Aug 17, 2023
SOUTHERN UNIVERSITY OF SCIENCE AND TECHNOLOGY
Zhao WANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TOROIDAL ION TRAP
Publication number
20230253199
Publication date
Aug 10, 2023
PerkinElmer Health Sciences, Inc.
Stephen D. Lammert
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INSTRUMENT, INCLUDING AN ELECTROSTATIC LINEAR ION TRAP, FOR ANALYZI...
Publication number
20230245879
Publication date
Aug 3, 2023
THE TRUSTEES OF INDIANA UNIVERSITY
Martin F. JARROLD
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and System for Reducing the Amplitude of an Oscillating Elec...
Publication number
20230230828
Publication date
Jul 20, 2023
Alpine Quantum Technologies GmbH
Gerard Higgins
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF OPERATING A CHARGE DETECTION MASS SPECTROMETER AND A CHAR...
Publication number
20230187198
Publication date
Jun 15, 2023
WATERS TECHNOLOGIES CORPORATION
Joseph A. Jarrell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS
Publication number
20230170204
Publication date
Jun 1, 2023
Micromass UK Limited
Anatoly Verenchikov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INSTRUMENT, INCLUDING AN ELECROSTATIC LINEAR ION TRAP WITH CHARGE D...
Publication number
20230154736
Publication date
May 18, 2023
THE TRUSTEES OF INDIANA UNIVERSITY
Martin F. JARROLD
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INSTRUMENT FOR SEPARATING IONS INCLUDING AN ELECTROSTATIC LINEAR IO...
Publication number
20230154741
Publication date
May 18, 2023
THE TRUSTEES OF INDIANA UNIVERSITY
Martin F. JARROLD
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TIME-DOMAIN ANALYSIS OF SIGNALS FOR CHARGE DETECTION MASS SPECTROMETRY
Publication number
20230046906
Publication date
Feb 16, 2023
THE TRUSTEES OF INDIANA UNIVERSITY
Martin F. JARROLD
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
GAS ANALYSIS DEVICE AND METHOD FOR DETECTING SAMPLE GAS
Publication number
20220404312
Publication date
Dec 22, 2022
Nuctech Company Limited
Yan Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION TRAP WITH RING-SHAPED ION STORAGE CELL AND MASS SPECTROMETER
Publication number
20220367168
Publication date
Nov 17, 2022
Leybold GmbH
Michel Aliman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS AND METHOD FOR PULSED MODE CHARGE DETECTION MASS SPECTROM...
Publication number
20220344145
Publication date
Oct 27, 2022
THE TRUSTEES OF INDIANA UNIVERSITY
Martin F. JARROLD
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION TRAP
Publication number
20220319828
Publication date
Oct 6, 2022
Thermo Fisher Scientific (Bremen) GmbH
Hamish STEWART
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND DEVICE FOR CROSSTALK COMPENSATION
Publication number
20220301841
Publication date
Sep 22, 2022
Thermo Fisher Scientific (Bremen) GmbH
Alexander KHOLOMEEV
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION ANALYZER
Publication number
20220260527
Publication date
Aug 18, 2022
SHIMADZU CORPORATION
Hidenori TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
PRECURSOR AND NEUTRAL LOSS SCAN IN AN ION TRAP
Publication number
20220254620
Publication date
Aug 11, 2022
Purdue Research Foundation
Robert Graham Cooks
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGE DETECTION MASS SPECTROMETRY UTILIZING HARMONIC OSCILLATION A...
Publication number
20220246414
Publication date
Aug 4, 2022
Thermo Finnigan LLC
Michael W. SENKO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SPHERICAL ION TRAP AND TRAPPING IONS
Publication number
20220246419
Publication date
Aug 4, 2022
Government of the United States of America, as Represented by the Secretary o...
David Ray Leibrandt
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TIME OF FLIGHT MASS ANALYSER WITH SPATIAL FOCUSSING
Publication number
20220238320
Publication date
Jul 28, 2022
Micromass UK Limited
John Brian Hoyes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION INJECTION TO AN ELECTROSTATIC TRAP
Publication number
20220238321
Publication date
Jul 28, 2022
Thermo Fisher Scientific (Bremen) GmbH
Mikhail BELOV
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SPECTROMETER COMPRISING AN IONIZATION DEVICE
Publication number
20220172941
Publication date
Jun 2, 2022
Leybold GmbH
Leonid Gorkhover
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TRANSFORMER FOR APPLYING AN AC VOLTAGE TO ELECTRODES
Publication number
20220130655
Publication date
Apr 28, 2022
Micromass UK Limited
Kenneth Worthington
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION TRAP ARRAY FOR HIGH THROUGHPUT CHARGE DETECTION MASS SPECTROMETRY
Publication number
20220122831
Publication date
Apr 21, 2022
THE TRUSTEES OF INDIANA UNIVERSITY
Martin F. JARROLD
H01 - BASIC ELECTRIC ELEMENTS