Time-base deflection circuits

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G01R13/24

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R13/00Arrangements for displaying electric variables or waveforms

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G01R13/24Time-base deflection circuits

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Patents Grantslast 30 patents

Information Patent Grant
System and method for performing lossless compressed serial decoding
- Patent number 11,698,391
- Issue date Jul 11, 2023
- Keysight Technologies, Inc.
- Joseph D. Shaker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signal waveform display system
- Patent number 5,933,129
- Issue date Aug 3, 1999
- Leader Electronics Corp.
- Haruhisa Egami
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method of signal analysis employing histograms to establish stable,...
- Patent number 5,495,168
- Issue date Feb 27, 1996
- Fluke Corporation
- Johan de Vries
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition system utilizing ultra-wide time range time base
- Patent number 5,444,459
- Issue date Aug 22, 1995
- Zeelan Technology, Inc.
- Hiro Moriyasu
- G01 - MEASURING TESTING
Information Patent Grant
Digital storage oscilloscope with automatic time base
- Patent number 5,397,981
- Issue date Mar 14, 1995
- Fluke Corporation
- Berts H. Wiggers
- G01 - MEASURING TESTING
Information Patent Grant
Deflection circuit having a controllable sawtooth generator
- Patent number 5,250,879
- Issue date Oct 5, 1993
- Thomson Consumer Electronics, S.A.
- Kark R. Koblitz
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Signal acquisition system utilizing ultra-wide time range time base
- Patent number 5,243,343
- Issue date Sep 7, 1993
- Zeelan Technology, Inc.
- Hiro Moriyasu
- G01 - MEASURING TESTING
Information Patent Grant
Raster distortion correction circuit
- Patent number 5,115,171
- Issue date May 19, 1992
- RCA Licensing Corporation
- Peter E. Haferl
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Scan loss detector for cathode ray tube
- Patent number 5,111,119
- Issue date May 5, 1992
- Thomson Consumer Electronics, Inc.
- Walter Truskalo
- G01 - MEASURING TESTING
Information Patent Grant
Wide band trigger system having switchable signal paths for extendi...
- Patent number 5,063,302
- Issue date Nov 5, 1991
- U.S. Philips Corporation
- Wilhelmus D. H. van Groningen
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic deflection circuit with stabilized retrace
- Patent number 5,023,525
- Issue date Jun 11, 1991
- MegaScan Technology, Inc.
- J. Stanley Kriz
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measurement gate display
- Patent number 4,999,573
- Issue date Mar 12, 1991
- Hewlett-Packard Company
- Atul Tambe
- G01 - MEASURING TESTING
Information Patent Grant
Black level tracking for multiple frequency apparatus
- Patent number 4,985,665
- Issue date Jan 15, 1991
- RCA Licensing Corporation
- Gene K. Sendelweck
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method and apparatus for selecting and displaying a high resolution...
- Patent number 4,975,636
- Issue date Dec 4, 1990
- Hewlett-Packard Company
- Patricia A. Desautels
- G01 - MEASURING TESTING
Information Patent Grant
Deflecting voltage generating circuit
- Patent number 4,914,359
- Issue date Apr 3, 1990
- Hamamatsu Photonics Kabushiki Kaisha
- Akira Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Sweep generator error characterization
- Patent number 4,868,465
- Issue date Sep 19, 1989
- Tektronix, Inc.
- Douglas C. Stevens
- G01 - MEASURING TESTING
Information Patent Grant
CRT video display device with automatically adjustable scanning amp...
- Patent number 4,864,405
- Issue date Sep 5, 1989
- British Broadcasting Corporation
- John P. Chambers
- G01 - MEASURING TESTING
Information Patent Grant
Mode discriminator for monitor
- Patent number 4,837,621
- Issue date Jun 6, 1989
- Goldstar Co., Ltd.
- Geun J. Yug
- G01 - MEASURING TESTING
Information Patent Grant
Sweep circuit for oscilloscope
- Patent number 4,812,717
- Issue date Mar 14, 1989
- Kabushiki Kaisha Kenwood
- Hiroshi Ichijyo
- G01 - MEASURING TESTING
Information Patent Grant
Jitter-free sweep generator for a cathode ray oscilloscope
- Patent number 4,651,065
- Issue date Mar 17, 1987
- Iwatsu Electric Co., Ltd.
- Tatsumi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for automatically calibrating a sweep waveform...
- Patent number 4,581,585
- Issue date Apr 8, 1986
- Tektronix, Inc.
- L. Rodney Bristol
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope having dual time base system for accurate differential...
- Patent number 4,551,656
- Issue date Nov 5, 1985
- Tektronix, Inc.
- Arthur J. Metz
- G01 - MEASURING TESTING
Information Patent Grant
Alternate sweeping system for use in oscilloscope
- Patent number 4,529,916
- Issue date Jul 16, 1985
- Hitachi Denshi Kabushiki Kaisha
- Atsushi Nozawa
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope trigger circuit combining wideband trigger signal ampl...
- Patent number 4,517,523
- Issue date May 14, 1985
- Tektronix, Inc.
- Frank Miles
- G01 - MEASURING TESTING
Information Patent Grant
High duty-cycle sweep generator for a cathode ray oscilloscope
- Patent number 4,227,124
- Issue date Oct 7, 1980
- Texaco Inc.
- Lloyd E. Elliott
- G01 - MEASURING TESTING
Information Patent Grant
Drive circuit for electrostatic deflection type cathode-ray tube
- Patent number 4,224,556
- Issue date Sep 23, 1980
- Trio Kabushiki Kaisha
- Yasuhiko Muto
- G01 - MEASURING TESTING
Information Patent Grant
Zero delay trigger view
- Patent number 4,195,252
- Issue date Mar 25, 1980
- Tektronix, Inc.
- Ronald W. Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Vertical deflection drive circuit
- Patent number 4,184,105
- Issue date Jan 15, 1980
- The Magnavox Company
- Merle D. Skelton
- G01 - MEASURING TESTING
Information Patent Grant
Sweep control circuit for oscilloscope
- Patent number 4,145,662
- Issue date Mar 20, 1979
- Hitachi Denshi Kabushiki Kaisha
- Kiyoshi Otofuji
- G01 - MEASURING TESTING
Information Patent Grant
Delayed sweep system for an oscilloscope
- Patent number 4,109,182
- Issue date Aug 22, 1978
- Tektronix, Inc.
- Oliver Dalton
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF ANALYZING A SIGNAL AND SIGNAL ANALYSIS DEVICE
- Publication number 20220043031
- Publication date Feb 10, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Markus Freidhof
- G01 - MEASURING TESTING

Time-base deflection circuits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for performing lossless compressed serial decoding

Signal waveform display system

Method of signal analysis employing histograms to establish stable,...

Signal acquisition system utilizing ultra-wide time range time base

Digital storage oscilloscope with automatic time base

Deflection circuit having a controllable sawtooth generator

Signal acquisition system utilizing ultra-wide time range time base

Raster distortion correction circuit

Scan loss detector for cathode ray tube

Wide band trigger system having switchable signal paths for extendi...

Magnetic deflection circuit with stabilized retrace

Method and apparatus for measurement gate display

Black level tracking for multiple frequency apparatus

Method and apparatus for selecting and displaying a high resolution...

Deflecting voltage generating circuit

Sweep generator error characterization

CRT video display device with automatically adjustable scanning amp...

Mode discriminator for monitor

Sweep circuit for oscilloscope

Jitter-free sweep generator for a cathode ray oscilloscope

Apparatus and method for automatically calibrating a sweep waveform...

Oscilloscope having dual time base system for accurate differential...

Alternate sweeping system for use in oscilloscope

Oscilloscope trigger circuit combining wideband trigger signal ampl...

High duty-cycle sweep generator for a cathode ray oscilloscope

Drive circuit for electrostatic deflection type cathode-ray tube

Zero delay trigger view

Vertical deflection drive circuit

Sweep control circuit for oscilloscope

Delayed sweep system for an oscilloscope

Patents Applicationslast 30 patents

METHOD OF ANALYZING A SIGNAL AND SIGNAL ANALYSIS DEVICE