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Time-base deflection circuits
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G01R13/24
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R13/00
Arrangements for displaying electric variables or waveforms
Current Industry
G01R13/24
Time-base deflection circuits
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Patents Grants
last 30 patents
Information
Patent Grant
System and method for performing lossless compressed serial decoding
Patent number
11,698,391
Issue date
Jul 11, 2023
Keysight Technologies, Inc.
Joseph D. Shaker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Signal waveform display system
Patent number
5,933,129
Issue date
Aug 3, 1999
Leader Electronics Corp.
Haruhisa Egami
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Method of signal analysis employing histograms to establish stable,...
Patent number
5,495,168
Issue date
Feb 27, 1996
Fluke Corporation
Johan de Vries
G01 - MEASURING TESTING
Information
Patent Grant
Signal acquisition system utilizing ultra-wide time range time base
Patent number
5,444,459
Issue date
Aug 22, 1995
Zeelan Technology, Inc.
Hiro Moriyasu
G01 - MEASURING TESTING
Information
Patent Grant
Digital storage oscilloscope with automatic time base
Patent number
5,397,981
Issue date
Mar 14, 1995
Fluke Corporation
Berts H. Wiggers
G01 - MEASURING TESTING
Information
Patent Grant
Deflection circuit having a controllable sawtooth generator
Patent number
5,250,879
Issue date
Oct 5, 1993
Thomson Consumer Electronics, S.A.
Kark R. Koblitz
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Signal acquisition system utilizing ultra-wide time range time base
Patent number
5,243,343
Issue date
Sep 7, 1993
Zeelan Technology, Inc.
Hiro Moriyasu
G01 - MEASURING TESTING
Information
Patent Grant
Raster distortion correction circuit
Patent number
5,115,171
Issue date
May 19, 1992
RCA Licensing Corporation
Peter E. Haferl
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Scan loss detector for cathode ray tube
Patent number
5,111,119
Issue date
May 5, 1992
Thomson Consumer Electronics, Inc.
Walter Truskalo
G01 - MEASURING TESTING
Information
Patent Grant
Wide band trigger system having switchable signal paths for extendi...
Patent number
5,063,302
Issue date
Nov 5, 1991
U.S. Philips Corporation
Wilhelmus D. H. van Groningen
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic deflection circuit with stabilized retrace
Patent number
5,023,525
Issue date
Jun 11, 1991
MegaScan Technology, Inc.
J. Stanley Kriz
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measurement gate display
Patent number
4,999,573
Issue date
Mar 12, 1991
Hewlett-Packard Company
Atul Tambe
G01 - MEASURING TESTING
Information
Patent Grant
Black level tracking for multiple frequency apparatus
Patent number
4,985,665
Issue date
Jan 15, 1991
RCA Licensing Corporation
Gene K. Sendelweck
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Method and apparatus for selecting and displaying a high resolution...
Patent number
4,975,636
Issue date
Dec 4, 1990
Hewlett-Packard Company
Patricia A. Desautels
G01 - MEASURING TESTING
Information
Patent Grant
Deflecting voltage generating circuit
Patent number
4,914,359
Issue date
Apr 3, 1990
Hamamatsu Photonics Kabushiki Kaisha
Akira Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Sweep generator error characterization
Patent number
4,868,465
Issue date
Sep 19, 1989
Tektronix, Inc.
Douglas C. Stevens
G01 - MEASURING TESTING
Information
Patent Grant
CRT video display device with automatically adjustable scanning amp...
Patent number
4,864,405
Issue date
Sep 5, 1989
British Broadcasting Corporation
John P. Chambers
G01 - MEASURING TESTING
Information
Patent Grant
Mode discriminator for monitor
Patent number
4,837,621
Issue date
Jun 6, 1989
Goldstar Co., Ltd.
Geun J. Yug
G01 - MEASURING TESTING
Information
Patent Grant
Sweep circuit for oscilloscope
Patent number
4,812,717
Issue date
Mar 14, 1989
Kabushiki Kaisha Kenwood
Hiroshi Ichijyo
G01 - MEASURING TESTING
Information
Patent Grant
Jitter-free sweep generator for a cathode ray oscilloscope
Patent number
4,651,065
Issue date
Mar 17, 1987
Iwatsu Electric Co., Ltd.
Tatsumi Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for automatically calibrating a sweep waveform...
Patent number
4,581,585
Issue date
Apr 8, 1986
Tektronix, Inc.
L. Rodney Bristol
G01 - MEASURING TESTING
Information
Patent Grant
Oscilloscope having dual time base system for accurate differential...
Patent number
4,551,656
Issue date
Nov 5, 1985
Tektronix, Inc.
Arthur J. Metz
G01 - MEASURING TESTING
Information
Patent Grant
Alternate sweeping system for use in oscilloscope
Patent number
4,529,916
Issue date
Jul 16, 1985
Hitachi Denshi Kabushiki Kaisha
Atsushi Nozawa
G01 - MEASURING TESTING
Information
Patent Grant
Oscilloscope trigger circuit combining wideband trigger signal ampl...
Patent number
4,517,523
Issue date
May 14, 1985
Tektronix, Inc.
Frank Miles
G01 - MEASURING TESTING
Information
Patent Grant
High duty-cycle sweep generator for a cathode ray oscilloscope
Patent number
4,227,124
Issue date
Oct 7, 1980
Texaco Inc.
Lloyd E. Elliott
G01 - MEASURING TESTING
Information
Patent Grant
Drive circuit for electrostatic deflection type cathode-ray tube
Patent number
4,224,556
Issue date
Sep 23, 1980
Trio Kabushiki Kaisha
Yasuhiko Muto
G01 - MEASURING TESTING
Information
Patent Grant
Zero delay trigger view
Patent number
4,195,252
Issue date
Mar 25, 1980
Tektronix, Inc.
Ronald W. Roberts
G01 - MEASURING TESTING
Information
Patent Grant
Vertical deflection drive circuit
Patent number
4,184,105
Issue date
Jan 15, 1980
The Magnavox Company
Merle D. Skelton
G01 - MEASURING TESTING
Information
Patent Grant
Sweep control circuit for oscilloscope
Patent number
4,145,662
Issue date
Mar 20, 1979
Hitachi Denshi Kabushiki Kaisha
Kiyoshi Otofuji
G01 - MEASURING TESTING
Information
Patent Grant
Delayed sweep system for an oscilloscope
Patent number
4,109,182
Issue date
Aug 22, 1978
Tektronix, Inc.
Oliver Dalton
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF ANALYZING A SIGNAL AND SIGNAL ANALYSIS DEVICE
Publication number
20220043031
Publication date
Feb 10, 2022
ROHDE & SCHWARZ GMBH & CO. KG
Markus Freidhof
G01 - MEASURING TESTING