Time-of-flight spectrometers

Industry

CPC
H01J49/446

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/446Time-of-flight spectrometers

Industries

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for identification of primary immune resistanc...
- Patent number 12,094,587
- Issue date Sep 17, 2024
- Biodesix, Inc.
- Carlos Oliveira
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Agnostic compound elution determination
- Patent number 11,953,478
- Issue date Apr 9, 2024
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting time of flight mass analyser
- Patent number 11,621,156
- Issue date Apr 4, 2023
- Micromass UK Limited
- Boris Kozlov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass spectrometer and method of mass spectrometry
- Patent number 11,387,094
- Issue date Jul 12, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 11,361,956
- Issue date Jun 14, 2022
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Variable discriminator threshold for ion detection
- Patent number 11,315,775
- Issue date Apr 26, 2022
- PERKINELMFR HEALTH SCIENCES CANADA, INC.
- William Fisher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 11,152,201
- Issue date Oct 19, 2021
- Shimadzu Corporation
- Tomoyuki Oshiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer and time-of-flight mass spectromet...
- Patent number 11,120,979
- Issue date Sep 14, 2021
- Kioxia Corporation
- Jun Asakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 10,991,566
- Issue date Apr 27, 2021
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of mass spectrometry and a mass spectrometer
- Patent number 10,153,145
- Issue date Dec 11, 2018
- Micromass UK Limited
- Emmanuelle Claude
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated hydrocarbon analysis
- Patent number 9,417,220
- Issue date Aug 16, 2016
- ExxonMobil Research and Engineering Company
- Frank C. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopy instrument using broadband modulation and statistical...
- Patent number 7,403,867
- Issue date Jul 22, 2008
- University of Maine
- Lawrence J. LeGore
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Fabrication of chopper for particle beam instrument
- Patent number 7,120,998
- Issue date Oct 17, 2006
- University of Maine
- Nicholas LeCursi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Time of flight electron detector
- Patent number 7,030,375
- Issue date Apr 18, 2006
- KLA-Tencor Technologies Corporation
- Anne L. Testoni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectroscopy instrument using broadband modulation and statistical...
- Patent number 7,031,877
- Issue date Apr 18, 2006
- University of Maine
- Lawrence J. LeGore
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Spectroscopy instrument using broadband modulation and statistical...
- Patent number 6,782,342
- Issue date Aug 24, 2004
- University of Maine
- Lawrence J. LeGore
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Fabrication of chopper for particle beam instrument
- Patent number 6,781,120
- Issue date Aug 24, 2004
- University of Maine
- Nicholas LeCursi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Auger electron spectroscopy
- Patent number 5,381,003
- Issue date Jan 10, 1995
- Agency of Industrial Science and Technology
- Ryoichi Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion scattering spectroscope
- Patent number 5,371,366
- Issue date Dec 6, 1994
- Shimadzu Corporation
- Takao Marui
- G01 - MEASURING TESTING
Information Patent Grant
Ion scattering spectrometer
- Patent number 5,182,453
- Issue date Jan 26, 1993
- Shimadzu Corporation
- Shigeki Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Combined magnetic sector mass spectrometer and time-of-flight mass...
- Patent number 5,171,987
- Issue date Dec 15, 1992
- Kratos Analytical Ltd.
- John D. Waldron
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion-scattering spectrometer
- Patent number 5,166,521
- Issue date Nov 24, 1992
- Shimadzu Corporation
- Shigeki Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight ion-scattering spectrometer for scattering and recoi...
- Patent number 5,068,535
- Issue date Nov 26, 1991
- University of Houston - University Park
- J. Wayne Rabalais
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 4,295,046
- Issue date Oct 13, 1981
- Leybold-Heraeus GmbH
- Karl Gruter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3745337
- Patent number 3,745,337
- Issue date Jul 10, 1973
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3582648
- Patent number 3,582,648
- Issue date Jun 1, 1971
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3435207
- Patent number 3,435,207
- Issue date Mar 25, 1969
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Agnostic Compound Elution Determination
- Publication number 20220187260
- Publication date Jun 16, 2022
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20210233761
- Publication date Jul 29, 2021
- Shimadzu Corporation
- Tomoya KUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR IDENTIFICATION OF PRIMARY IMMUNE RESISTANC...
- Publication number 20210118538
- Publication date Apr 22, 2021
- BIODESIX, INC.
- Carlos Oliveira
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method Of Mass Spectrometry And A Mass Spectrometer
- Publication number 20170207072
- Publication date Jul 20, 2017
- Micromass UK Limited
- Emmanuelle Claude
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time-of-Flight Electron Energy Analyzer
- Publication number 20130126727
- Publication date May 23, 2013
- The Regents of the University of California
- Christopher Jozwiak
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopy instrument using broadband modulation and statistical...
- Publication number 20060178844
- Publication date Aug 10, 2006
- Lawrence J. LeGore
- G01 - MEASURING TESTING
Information Patent Application
Fabrication of chopper for particle beam instrument
- Publication number 20050102829
- Publication date May 19, 2005
- University of Maine
- Nicholas LeCursi
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopy instrument using broadband modulation and statistical...
- Publication number 20050086026
- Publication date Apr 21, 2005
- University of Maine
- Lawrence J. LeGore
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopy instrument using broadband modulation and statistical...
- Publication number 20030055573
- Publication date Mar 20, 2003
- Stillwater Scientific Instruments
- Lawrence J. LeGore
- G01 - MEASURING TESTING
Information Patent Application
Fabrication of chopper for particle beam instrument
- Publication number 20030048059
- Publication date Mar 13, 2003
- Stillwater Scientific Instruments
- Nicholas LeCursi
- G01 - MEASURING TESTING

Time-of-flight spectrometers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus and method for identification of primary immune resistanc...

Agnostic compound elution determination

Multi-reflecting time of flight mass analyser

Time of flight mass spectrometer and method of mass spectrometry

Time-of-flight mass spectrometer

Variable discriminator threshold for ion detection

Time-of-flight mass spectrometer

Time-of-flight mass spectrometer and time-of-flight mass spectromet...

Time-of-flight mass spectrometer

Method of mass spectrometry and a mass spectrometer

Integrated hydrocarbon analysis

Spectroscopy instrument using broadband modulation and statistical...

Fabrication of chopper for particle beam instrument

Time of flight electron detector

Spectroscopy instrument using broadband modulation and statistical...

Spectroscopy instrument using broadband modulation and statistical...

Fabrication of chopper for particle beam instrument

Auger electron spectroscopy

Ion scattering spectroscope

Ion scattering spectrometer

Combined magnetic sector mass spectrometer and time-of-flight mass...

Ion-scattering spectrometer

Time-of-flight ion-scattering spectrometer for scattering and recoi...

Mass spectrometer

3745337

3582648

3435207

Patents Applicationslast 30 patents

Agnostic Compound Elution Determination

TIME-OF-FLIGHT MASS SPECTROMETER

APPARATUS AND METHOD FOR IDENTIFICATION OF PRIMARY IMMUNE RESISTANC...

Method Of Mass Spectrometry And A Mass Spectrometer

Time-of-Flight Electron Energy Analyzer

Spectroscopy instrument using broadband modulation and statistical...

Fabrication of chopper for particle beam instrument

Spectroscopy instrument using broadband modulation and statistical...

Spectroscopy instrument using broadband modulation and statistical...

Fabrication of chopper for particle beam instrument