Claims
- 1. An instrument for analyzing particles comprising:
a source for a modulated particle beam, the modulated particle beam containing a stream of particles modulated according to a modulation sequence having substantially broadband frequency content; a propagation path for carrying the modulated particle beam, the propagation path for separating particles according to different particle properties; a detector for detecting attributes of the particle beam and generating a data output signal in response thereto; and a processor for recovering information concerning the particle beam from the data output signal using a probability based estimation method which obtains a corrected data output signal given a model of how the data output signal was affected by components of the instrument.
- 2. An apparatus as in claim 1 wherein a maximum likelihood method is used that maximizes the probability of properly detecting the data.
- 3. An apparatus as in claim 1 wherein a Bayesian method is used to optimize the correctness of the component model.
- 4. An apparatus as in claim 1 wherein the model of how the data was generated consists of a model of at least one or more of the components of the instrument selected from a group consisting of the modulated particle beam source, the propagation path, the beam source, and the particle detector.
- 5. An apparatus as in claim 4 wherein the model of how data was generated characterizes noise in the selected component.
- 6. An apparatus as in claim 5 wherein the noise characterization is selected from a group consisting of Gaussian and Poisson.
- 7. An apparatus as in claim 1 wherein the information recovery processor is a software program running in a digital signal processor.
- 8. An apparatus as in claim 1 wherein the results of the information recovery processor are histogrammed.
- 9. An apparatus as in claim 1 wherein the particle beam is one selected from a group consisting of ions, electrons, neutrons, molecules, and photons.
- 10. An apparatus as in claim 1 wherein the particles are charged.
- 11. An apparatus as in claim 1 wherein the particles are uncharged.
- 12. An apparatus as in claim 1 wherein the modulated source is a continuous beam of particles having substantially constant flux, modulated by a beam chopper selected from a group consisting of a spinning disk chopper, deflection plates and a grid chopper.
- 13. An apparatus as in claim 12 wherein the beam chopper is selected from a group consisting of a Bradbury-Nielson gate and a shifted Hadamard mask.
- 14. An apparatus as in claim 1 wherein a modulator modulates the particle beam in a dimension selected from a group consisting of time, space, and frequency.
- 15. An apparatus as in claim 1 wherein the beam modulator operates on the particle beam prior to the particle beam being exposed to a sample.
- 16. An apparatus as in claim 1 wherein the particle beam modulator is applied after the particle beam is exposed to a sample.
- 17. An apparatus as in claim 1 wherein the propagation path is selected from a group consisting of drift tube, reflectron, and Hadamard mask with an optical dispersive element.
- 18. An apparatus as in claim 1 wherein the propagation path separates particles of different properties wherein the properties are selected from a group consisting of mass, energy, spin, and a combination thereof.
- 19. An apparatus as in claim 1 wherein the particle detector has sufficient time resolution relative to the modulator frequency to oversample the chopper response.
- 20. An apparatus as in claim 1 wherein the particle detector generates a data output signal that is binned in time.
- 21. An apparatus as in claim 1 wherein the beam modulator modulates the data by a non-fifty-percent duty cycle binary sequence.
- 22. An apparatus as in claim 1 where statistical estimation techniques are used to obtain a sampled continuous actual response function of the instrument.
- 23. An apparatus as in claim 22 where statistical estimation techniques are used to obtain the response function of the gate of a time-of-flight mass spectrometer.
- 24. An apparatus as in claim 22 where statistical estimation techniques are used to obtain the response function of the gate of a time-of-flight electron spectrometer.
- 25. An apparatus as in claim 24 where a monochromator is used to obtain the response function.
- 26. An apparatus as in claim 22 where a theoretical simulation is used to obtain the response function.
- 27. An apparatus as in claim 22 where statistical estimation techniques are used to obtain the response function of an optical spectrometer.
- 28. An apparatus as in claim 27 where a laser or narrow atomic line is used.
- 29. An apparatus as in claim 23 where a mass selected ion source is used.
- 30. An apparatus as in claim 23 where a theoretical simulation is used.
- 31. An apparatus as in claim 27 where a theoretical simulation is used.
- 32. An apparatus as in claim 22 wherein a single pulse and pseudo-random bit sequence are used in a deconvolution method.
- 33. An apparatus as in claim 1 wherein the statistical estimation technique is used to obtain an initial estimate.
- 34. An instrument for analyzing particles comprising:
a particle beam source providing a continuous beam of particles, the beam having substantially constant flux; a modulator for modulating the particle beam by passing it substantially unaltered during on periods, and affecting the beam during off periods according to a binary sequence having substantially broadband frequency content; a propagation path for carrying the modulated particle beam, the propagation path for separating particles according to different particle properties; a detector for detecting attributes of the particle beam and generating a measured data output signal in response thereto; and a processor for recovering information concerning the particle beam from the measured data output signal using a probability based estimation method, the probability based estimation method
i. compensating for non-ideal characteristics of the components of the system; and ii. allowing higher resolution to be obtained than the nominal time unit provides, depending upon the information content of the measured data.
CROSS REFERENCE TO RELATED APPLICATIONS
[0001] This application claims the benefit of an earlier filed U.S. Provisional Patent Application Ser. No. 60/296,850 filed Jun. 8, 2001, entitled “Method for Enhancement of Electron Spectrometer Operation Using Maximum Likelihood Spectral EstimationTechniques”, the entire contents of which are hereby incorporated by reference.
Provisional Applications (1)
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Number |
Date |
Country |
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60296850 |
Jun 2001 |
US |