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Y10S977/873

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YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10USPC classification Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10S977/00Nanotechnology

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for micromachines, microstructures, nanomachin...
- Patent number 8,631,511
- Issue date Jan 14, 2014
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Near-field optical probe based on SOI substrate and fabrication met...
- Patent number 7,871,530
- Issue date Jan 18, 2011
- Electronics and Telecommunications Research Institute
- Eunkyoung Kim
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for microfabricating a probe with integrated handle, cantile...
- Patent number 7,861,315
- Issue date Dec 28, 2010
- Asylum Research Corporation
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Self-sensing tweezer devices and associated methods for micro and n...
- Patent number 7,735,358
- Issue date Jun 15, 2010
- Insitutec, Inc.
- Marcin B. Bauza
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope capable of measuring samples having overh...
- Patent number 7,644,447
- Issue date Jan 5, 2010
- Park Systems Corp.
- Sang-il Park
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for micromachines, microstructures, nanomachin...
- Patent number 7,631,549
- Issue date Dec 15, 2009
- General Nanotechnology L.L.C.
- Victor B. Kley
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Scanning probe microscope system
- Patent number 7,578,853
- Issue date Aug 25, 2009
- Honda Motor Co., Ltd.
- Tatsuya Hattori
- G01 - MEASURING TESTING
Information Patent Grant
Near-field optical probe based on SOI substrate and fabrication met...
- Patent number 7,550,311
- Issue date Jun 23, 2009
- Electronics and Telecommunications Research Institute
- Eunkyoung Kim
- G01 - MEASURING TESTING
Information Patent Grant
Harmonic cantilevers and imaging methods for atomic force microscopy
- Patent number 7,451,638
- Issue date Nov 18, 2008
- The Board of Trustees of the Leland Stanford Junior University
- Ozgur Sahin
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for micromachines, microstructures, nanomachin...
- Patent number 7,266,998
- Issue date Sep 11, 2007
- General Nanotechnology L.L.C.
- Victor B. Kley
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Active cantilever for nanomachining and metrology
- Patent number 7,137,292
- Issue date Nov 21, 2006
- General Nanotechnology L.L.C.
- Victor B. Kley
- B24 - GRINDING POLISHING
Information Patent Grant
Nanotube probe and method for manufacturing same
- Patent number 7,138,627
- Issue date Nov 21, 2006
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a carbon nanotube device
- Patent number 7,076,871
- Issue date Jul 18, 2006
- Fuji Xerox Co., Ltd.
- Kazunaga Horiuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coated nanotube surface signal probe
- Patent number 7,064,341
- Issue date Jun 20, 2006
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope with improved probe head mount
- Patent number 6,951,129
- Issue date Oct 4, 2005
- PSIA Corporation
- Joonhyung Kwon
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope with improved probe tip mount
- Patent number 6,945,100
- Issue date Sep 20, 2005
- PSIA Corporation
- Joonhyung Kwon
- G01 - MEASURING TESTING
Information Patent Grant
Harmonic cantilevers and imaging methods for atomic force microscopy
- Patent number 6,935,167
- Issue date Aug 30, 2005
- The Board of Trustees of the Leland Stanford Junior University
- Ozgur Sahin
- G01 - MEASURING TESTING
Information Patent Grant
Active cantilever for nanomachining and metrology
- Patent number 6,923,044
- Issue date Aug 2, 2005
- General Nanotechnology L.L.C.
- Victor B. Kley
- B24 - GRINDING POLISHING
Information Patent Grant
Apparatus and method for improving tuning of a probe-based instrument
- Patent number 6,912,893
- Issue date Jul 5, 2005
- Veeco Instruments Inc.
- Stephen C. Minne
- G01 - MEASURING TESTING
Information Patent Grant
Active cantilever for nanomachining and metrology
- Patent number 6,880,388
- Issue date Apr 19, 2005
- General Nanotechnology L.L.C.
- Victor B. Kley
- B24 - GRINDING POLISHING
Information Patent Grant
Cantilever for scanning probe microscope
- Patent number 6,851,301
- Issue date Feb 8, 2005
- LG Electronics Inc.
- Young Sik Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for micromachines, microstructures, nanomachin...
- Patent number 6,813,937
- Issue date Nov 9, 2004
- General Nanotechnology L.L.C.
- Victor B. Kley
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Coated nanotube surface signal probe and method of attaching nanotu...
- Patent number 6,800,865
- Issue date Oct 5, 2004
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for tool and tip design for nanomachining and...
- Patent number 6,787,768
- Issue date Sep 7, 2004
- General Nanotechnology L.L.C.
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe system with spring probe
- Patent number 6,788,086
- Issue date Sep 7, 2004
- Xerox Corporation
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Grant
Catalyst-induced growth of carbon nanotubes on tips of cantilevers...
- Patent number 6,755,956
- Issue date Jun 29, 2004
- UT-Battelle, LLC
- James Weifu Lee
- G01 - MEASURING TESTING
Information Patent Grant
Ultra-high density storage device with resonant scanning micromover
- Patent number 6,735,163
- Issue date May 11, 2004
- Hewlett-Packard Development Company, L.P.
- Daniel R. Marshall
- G11 - INFORMATION STORAGE
Information Patent Grant
Scanning probe system with spring probe and actuation/sensing struc...
- Patent number 6,734,425
- Issue date May 11, 2004
- Xerox Corporation
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Grant
Nano-magnetic head and nano-magnetic head device using the same
- Patent number 6,735,046
- Issue date May 11, 2004
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G11 - INFORMATION STORAGE
Information Patent Grant
Probe and method of manufacturing mounted AFM probes
- Patent number 6,690,008
- Issue date Feb 10, 2004
- Interuniversitair Microelektronica Centrum (IMEC)
- Thomas Hantschel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods and apparatus for nanolapping
- Publication number 20140051333
- Publication date Feb 20, 2014
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR MICROMACHINES, MICROSTRUCTURES, NANOMACHIN...
- Publication number 20120036603
- Publication date Feb 9, 2012
- General Nanotechnology LLC
- Victor B. Kley
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Application
Method and Apparatus for Micromachines, Microstructures, Nanomachin...
- Publication number 20100192268
- Publication date Jul 29, 2010
- General Nanotechnology LLC
- Victor B. Kley
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Application
NEAR-FIELD OPTICAL PROBE BASED ON SOI SUBSTRATE AND FABRICATION MET...
- Publication number 20090218648
- Publication date Sep 3, 2009
- Eunkyoung KIM
- G01 - MEASURING TESTING
Information Patent Application
Method for microfabricating a probe with integrated handle, cantile...
- Publication number 20090178166
- Publication date Jul 9, 2009
- ASYLUM RESEARCH CORPORATION
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope capable of measuring samples having overh...
- Publication number 20080078932
- Publication date Apr 3, 2008
- PSIA Co, LTD
- Sang-il Park
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope System
- Publication number 20080017809
- Publication date Jan 24, 2008
- Honda Motor Co., Ltd.
- Tatsuya Hattori
- G01 - MEASURING TESTING
Information Patent Application
Self-sensing tweezer devices and associated methods for micro and n...
- Publication number 20070240516
- Publication date Oct 18, 2007
- INSITUTEC, INC.
- Marcin B. Bauza
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Near-field optical probe based on SOI substrate and fabrication met...
- Publication number 20070128854
- Publication date Jun 7, 2007
- Eunkyoung Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING A CARBON NANOTUBE DEVICE
- Publication number 20060123628
- Publication date Jun 15, 2006
- FUJI XEROX CO., LTD
- Kazunaga Horiuchi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and apparatus for micromachines, microstructures, nanomachin...
- Publication number 20050172739
- Publication date Aug 11, 2005
- General Nanotechnology LLC
- Victor B. Kley
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Application
Apparatus and method for improving tuning of a probe-based instrument
- Publication number 20040206165
- Publication date Oct 21, 2004
- NonoDevices, Inc.
- Stephen C. Minne
- G01 - MEASURING TESTING
Information Patent Application
Coated nanotube surface signal probe
- Publication number 20040168527
- Publication date Sep 2, 2004
- DAIKEN CHEMICAL CO., LTD.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope with improved probe tip mount
- Publication number 20040140424
- Publication date Jul 22, 2004
- PSIA Corporation
- Joonhyung Kwon
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope with improved probe head mount
- Publication number 20040140426
- Publication date Jul 22, 2004
- PSIA Corporation
- Joonhyung Kwon
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe system with spring probe
- Publication number 20040123651
- Publication date Jul 1, 2004
- Xerox Corporation.
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe system with spring probe and actuation/sensing struc...
- Publication number 20030183761
- Publication date Oct 2, 2003
- Xerox Corporation.
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe system with spring probe
- Publication number 20030182993
- Publication date Oct 2, 2003
- Xerox Corporation.
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for micromachines, microstructures, nanomachin...
- Publication number 20030167831
- Publication date Sep 11, 2003
- General Nanotechnology LLC
- Victor B. Kley
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Application
Scanning probe microscope
- Publication number 20030155481
- Publication date Aug 21, 2003
- Jaewan Hong
- G01 - MEASURING TESTING
Information Patent Application
Coated nanotube surface signal probe and method of attaching nanotu...
- Publication number 20030122073
- Publication date Jul 3, 2003
- YOSHIKAZU NAKAYAMA and DAIKEN CHEMICAL CO., LTD.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Nano-magnetic head and nano-magnetic head device using the same
- Publication number 20030095356
- Publication date May 22, 2003
- YOSHIKAZU NAKAYAMA and DAIKEN CHEMICAL CO., LTD.
- Yoshikazu Nakayama
- G11 - INFORMATION STORAGE
Information Patent Application
Cantilever for scanning probe microscope
- Publication number 20020174715
- Publication date Nov 28, 2002
- LG Electronics Inc.
- Young Sik Kim
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ultra-high density storage device with resonant scanning micromover
- Publication number 20020122373
- Publication date Sep 5, 2002
- Daniel R. Marshall
- B82 - NANO-TECHNOLOGY
Information Patent Application
Sensor apparatus and cantilever for it
- Publication number 20020092359
- Publication date Jul 18, 2002
- Dirk Lange
- B82 - NANO-TECHNOLOGY
Information Patent Application
Four- terminal measuring device that uses nanotube terminals
- Publication number 20020084790
- Publication date Jul 4, 2002
- Yoshikazu Nakayama
- B82 - NANO-TECHNOLOGY
Information Patent Application
Probe and method of manufacturing mounted AFM probes
- Publication number 20020079445
- Publication date Jun 27, 2002
- Thomas Hantschel
- B82 - NANO-TECHNOLOGY
Information Patent Application
Catalyst-induced growth of carbon nanotubes on tips of cantilevers...
- Publication number 20020046953
- Publication date Apr 25, 2002
- James Weifu Lee
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning tunneling charge transfer microscope
- Publication number 20020005481
- Publication date Jan 17, 2002
- Clayton C. Williams
- B82 - NANO-TECHNOLOGY
Information Patent Application
Microprobe and sample surface measuring apparatus
- Publication number 20010028033
- Publication date Oct 11, 2001
- Nobuhiro Shimizu
- B82 - NANO-TECHNOLOGY

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and apparatus for micromachines, microstructures, nanomachin...

Near-field optical probe based on SOI substrate and fabrication met...

Method for microfabricating a probe with integrated handle, cantile...

Self-sensing tweezer devices and associated methods for micro and n...

Scanning probe microscope capable of measuring samples having overh...

Method and apparatus for micromachines, microstructures, nanomachin...

Scanning probe microscope system

Near-field optical probe based on SOI substrate and fabrication met...

Harmonic cantilevers and imaging methods for atomic force microscopy

Method and apparatus for micromachines, microstructures, nanomachin...

Active cantilever for nanomachining and metrology

Nanotube probe and method for manufacturing same

Method of manufacturing a carbon nanotube device

Coated nanotube surface signal probe

Scanning probe microscope with improved probe head mount

Scanning probe microscope with improved probe tip mount

Harmonic cantilevers and imaging methods for atomic force microscopy

Active cantilever for nanomachining and metrology

Apparatus and method for improving tuning of a probe-based instrument

Active cantilever for nanomachining and metrology

Cantilever for scanning probe microscope

Method and apparatus for micromachines, microstructures, nanomachin...

Coated nanotube surface signal probe and method of attaching nanotu...

Method and apparatus for tool and tip design for nanomachining and...

Scanning probe system with spring probe

Catalyst-induced growth of carbon nanotubes on tips of cantilevers...

Ultra-high density storage device with resonant scanning micromover

Scanning probe system with spring probe and actuation/sensing struc...

Nano-magnetic head and nano-magnetic head device using the same

Probe and method of manufacturing mounted AFM probes

Patents Applicationslast 30 patents

Methods and apparatus for nanolapping

METHOD AND APPARATUS FOR MICROMACHINES, MICROSTRUCTURES, NANOMACHIN...

Method and Apparatus for Micromachines, Microstructures, Nanomachin...

NEAR-FIELD OPTICAL PROBE BASED ON SOI SUBSTRATE AND FABRICATION MET...

Method for microfabricating a probe with integrated handle, cantile...

Scanning probe microscope capable of measuring samples having overh...

Scanning Probe Microscope System

Self-sensing tweezer devices and associated methods for micro and n...

Near-field optical probe based on SOI substrate and fabrication met...

METHOD OF MANUFACTURING A CARBON NANOTUBE DEVICE

Method and apparatus for micromachines, microstructures, nanomachin...

Apparatus and method for improving tuning of a probe-based instrument

Coated nanotube surface signal probe

Scanning probe microscope with improved probe tip mount

Scanning probe microscope with improved probe head mount

Scanning probe system with spring probe

Scanning probe system with spring probe and actuation/sensing struc...

Scanning probe system with spring probe

Method and apparatus for micromachines, microstructures, nanomachin...

Scanning probe microscope

Coated nanotube surface signal probe and method of attaching nanotu...

Nano-magnetic head and nano-magnetic head device using the same

Cantilever for scanning probe microscope

Ultra-high density storage device with resonant scanning micromover

Sensor apparatus and cantilever for it

Four- terminal measuring device that uses nanotube terminals

Probe and method of manufacturing mounted AFM probes

Catalyst-induced growth of carbon nanotubes on tips of cantilevers...

Scanning tunneling charge transfer microscope

Microprobe and sample surface measuring apparatus