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G01R31/318591

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/318591Tools

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Patents Grantslast 30 patents

Information Patent Grant
Scan apparatus capable of fault diagnosis and scan chain fault diag...
- Patent number 11,567,132
- Issue date Jan 31, 2023
- UIF (University Industry Foundation), Yonsei University
- Sungho Kang
- G01 - MEASURING TESTING
Information Patent Grant
JTAG bus communication method and apparatus
- Patent number 11,549,982
- Issue date Jan 10, 2023
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
JTAG scans through packetization
- Patent number 11,199,586
- Issue date Dec 14, 2021
- Intel Corporation
- Enrico D. Carrieri
- G01 - MEASURING TESTING
Information Patent Grant
Serial data communication modes on TDI/TDO, receive TMS, send TMS
- Patent number 10,976,365
- Issue date Apr 13, 2021
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reducing X-masking effect for linear time compactors
- Patent number 10,908,213
- Issue date Feb 2, 2021
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Grant
Low-power shift with clock staggering
- Patent number 10,775,435
- Issue date Sep 15, 2020
- Cadence Design Systems, Inc.
- Christos Papameletis
- G01 - MEASURING TESTING
Information Patent Grant
Tap, counter storing value of serial access by communication circuitry
- Patent number 10,557,887
- Issue date Feb 11, 2020
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signals on tap bi-directional TMS terminal selecting serial communi...
- Patent number 10,267,851
- Issue date Apr 23, 2019
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Internal circuit TMS input, FIFO coupled to parallel-input serial-o...
- Patent number 10,145,895
- Issue date Dec 4, 2018
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
TMS pin for mode signal and output for read data
- Patent number 10,036,776
- Issue date Jul 31, 2018
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
TMS serial communication circuitry coupled to tap IR enable output
- Patent number 9,891,278
- Issue date Feb 13, 2018
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bi-directional TCK lead carrying TCK and frame data in/out signal
- Patent number 9,494,643
- Issue date Nov 15, 2016
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tap, data input, output circuitry coupled to mode select lead
- Patent number 9,134,369
- Issue date Sep 15, 2015
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Test techniques and circuitry
- Patent number 9,021,323
- Issue date Apr 28, 2015
- Altera Corporation
- Jayabrata Gosh Dastidar
- G01 - MEASURING TESTING
Information Patent Grant
I/O circuitry free of test clock coupled with destination/source ci...
- Patent number 8,972,810
- Issue date Mar 3, 2015
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Test access port and TMS communication circuitry with state machines
- Patent number 8,826,090
- Issue date Sep 2, 2014
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
IC state machine controlling communicating data over TDI/TDO or TMS
- Patent number 8,826,089
- Issue date Sep 2, 2014
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Mechanism to instantiate a JTAG debugger in a browser
- Patent number 8,661,303
- Issue date Feb 25, 2014
- Texas Instruments Incorporated
- Stephen Yee Shun Lau
- G01 - MEASURING TESTING
Information Patent Grant
Communications under active and inert state machine sequences
- Patent number 8,635,504
- Issue date Jan 21, 2014
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Bi-directional TMS lead carrying TMS and frame data in/out signals
- Patent number 8,392,773
- Issue date Mar 5, 2013
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Source and destination data circuitry coupled to bi-directional TMS...
- Patent number 8,230,280
- Issue date Jul 24, 2012
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Enhancing speed of simulation of an IC design while testing scan ci...
- Patent number 7,925,940
- Issue date Apr 12, 2011
- Synopsys, Inc.
- Yogesh Pandey
- G01 - MEASURING TESTING
Information Patent Grant
JTAG bus communication method and apparatus
- Patent number 7,873,889
- Issue date Jan 18, 2011
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Scan test circuit, semiconductor integrated circuit and scan enable...
- Patent number 7,836,370
- Issue date Nov 16, 2010
- Ricoh Company, Ltd.
- Tomoki Satoi
- G01 - MEASURING TESTING
Information Patent Grant
JTAG bus communication method and apparatus
- Patent number 7,747,918
- Issue date Jun 29, 2010
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for broadcasting scan patterns in a scan-based...
- Patent number 7,721,173
- Issue date May 18, 2010
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for broadcasting test patterns in a scan-based...
- Patent number 7,721,172
- Issue date May 18, 2010
- Syntest Technologies, Inc.
- Laung-Terng (L.-T.) Wang
- G01 - MEASURING TESTING
Information Patent Grant
Scheme to optimize scan chain ordering in designs
- Patent number 7,721,171
- Issue date May 18, 2010
- International Business Machines Corporation
- Mark A. Erle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chip level scan chain planning for hierarchical design flows
- Patent number 7,657,850
- Issue date Feb 2, 2010
- Synopsys, Inc.
- Lin Huang
- G01 - MEASURING TESTING
Information Patent Grant
Boundary scan connector test method capable of fully utilizing test...
- Patent number 7,610,535
- Issue date Oct 27, 2009
- Function Research Inc.
- Yu-Jen Huang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC DEVICE AND METHOD OF TESTING ELECTRONIC DEVICE
- Publication number 20240210471
- Publication date Jun 27, 2024
- Samsung Electronics Co., Ltd.
- Seaeun Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Processing Devices for reducing scan traffic, Method and Computer P...
- Publication number 20240159829
- Publication date May 16, 2024
- Intel Corporation
- Min LIU
- G01 - MEASURING TESTING
Information Patent Application
SCAN APPARATUS CAPABLE OF FAULT DIAGNOSIS AND SCAN CHAIN FAULT DIAG...
- Publication number 20220381825
- Publication date Dec 1, 2022
- UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY
- Sungho KANG
- G01 - MEASURING TESTING
Information Patent Application
JTAG BUS COMMUNICATION METHOD AND APPARATUS
- Publication number 20210215759
- Publication date Jul 15, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
JTAG BUS COMMUNICATION METHOD AND APPARATUS
- Publication number 20200116788
- Publication date Apr 16, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN METHOD FOR SCAN TEST CIRCUIT, DESIGN PROGRAM FOR SCAN TEST C...
- Publication number 20200096570
- Publication date Mar 26, 2020
- Kabushiki Kaisha Toshiba
- Chikako Tokunaga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
JTAG BUS COMMUNICATION METHOD AND APPARATUS
- Publication number 20190195946
- Publication date Jun 27, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
JTAG BUS COMMUNICATION METHOD AND APPARATUS
- Publication number 20190064266
- Publication date Feb 28, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
JTAG BUS COMMUNICATION METHOD AND APPARATUS
- Publication number 20180149697
- Publication date May 31, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
JTAG BUS COMMUNICATION METHOD AND APPARATUS
- Publication number 20180136280
- Publication date May 17, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
JTAG BUS COMMUNICATION METHOD AND APPARATUS
- Publication number 20140337679
- Publication date Nov 13, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
JTAG BUS COMMUNICATION METHOD AND APPARATUS
- Publication number 20140143622
- Publication date May 22, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
JTAG BUS COMMUNICATION METHOD AND APPARATUS
- Publication number 20140101504
- Publication date Apr 10, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
JTAG BUS COMMUNICATION METHOD AND APPARATUS
- Publication number 20130198579
- Publication date Aug 1, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
Mechanism to Instantiate a JTAG Debugger in a Browser
- Publication number 20120331359
- Publication date Dec 27, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Stephen Yee Shun Lau
- G01 - MEASURING TESTING
Information Patent Application
JTAG BUS COMMUNICATION METHOD AND APPARATUS
- Publication number 20120221908
- Publication date Aug 30, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
JTAG BUS COMMUNICATION METHOD AND APPARATUS
- Publication number 20110087940
- Publication date Apr 14, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
JTAG BUS COMMUNICATION METHOD AND APPARATUS
- Publication number 20100229059
- Publication date Sep 9, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EDA TOOL, SEMICONDUCTOR DEVICE, AND SCAN CHAIN CONFIGURATION METHOD
- Publication number 20100169727
- Publication date Jul 1, 2010
- RENESAS TECHNOLOGY CORP.
- Daisuke ITO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR BROADCASTING SCAN PATTERNS IN A SCAN-BASED...
- Publication number 20090235132
- Publication date Sep 17, 2009
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Application
JTAG BUS COMMUNICATION METHOD AND APPARATUS
- Publication number 20090119558
- Publication date May 7, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENHANCING SPEED OF SIMULATION OF AN IC DESIGN WHILE TESTING SCAN CI...
- Publication number 20090106612
- Publication date Apr 23, 2009
- Yogesh Pandey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCHEME TO OPTIMIZE SCAN CHAIN ORDERING IN DESIGNS
- Publication number 20090049353
- Publication date Feb 19, 2009
- International Business Machines Corporation
- Mark A. Erle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
JTAG TEST CODE AND DATA COMPILER AND METHOD
- Publication number 20090031179
- Publication date Jan 29, 2009
- Sam Michael
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for broadcasting scan patterns in a random acc...
- Publication number 20080276143
- Publication date Nov 6, 2008
- Syntest Technologies, Inc.
- Laung-Terng (L.-T.) Wang
- G01 - MEASURING TESTING
Information Patent Application
BOUNDARY SCAN CONNECTOR TEST METHOD CAPABLE OF FULLY UTILIZING TEST...
- Publication number 20080270857
- Publication date Oct 30, 2008
- Yu-Jen Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCAN TEST CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT AND SCAN ENABLE...
- Publication number 20080222470
- Publication date Sep 11, 2008
- Tomoki Satoi
- G01 - MEASURING TESTING
Information Patent Application
Double-edge triggered scannable pulsed flip-flop for high frequency...
- Publication number 20080215941
- Publication date Sep 4, 2008
- International Business Machines Corporation
- Christopher M. Durham
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR IMPLEMENTING DETERMINIS...
- Publication number 20080189583
- Publication date Aug 7, 2008
- International Business Machines Corporation
- Adrian C. Anderson
- G01 - MEASURING TESTING
Information Patent Application
Chip level scan chain planning for hierarchical design flows
- Publication number 20080141086
- Publication date Jun 12, 2008
- Synopsys, Inc.
- Lin Huang
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Scan apparatus capable of fault diagnosis and scan chain fault diag...

JTAG bus communication method and apparatus

JTAG scans through packetization

Serial data communication modes on TDI/TDO, receive TMS, send TMS

Reducing X-masking effect for linear time compactors

Low-power shift with clock staggering

Tap, counter storing value of serial access by communication circuitry

Signals on tap bi-directional TMS terminal selecting serial communi...

Internal circuit TMS input, FIFO coupled to parallel-input serial-o...

TMS pin for mode signal and output for read data

TMS serial communication circuitry coupled to tap IR enable output

Bi-directional TCK lead carrying TCK and frame data in/out signal

Tap, data input, output circuitry coupled to mode select lead

Test techniques and circuitry

I/O circuitry free of test clock coupled with destination/source ci...

Test access port and TMS communication circuitry with state machines

IC state machine controlling communicating data over TDI/TDO or TMS

Mechanism to instantiate a JTAG debugger in a browser

Communications under active and inert state machine sequences

Bi-directional TMS lead carrying TMS and frame data in/out signals

Source and destination data circuitry coupled to bi-directional TMS...

Enhancing speed of simulation of an IC design while testing scan ci...

JTAG bus communication method and apparatus

Scan test circuit, semiconductor integrated circuit and scan enable...

JTAG bus communication method and apparatus

Method and apparatus for broadcasting scan patterns in a scan-based...

Method and apparatus for broadcasting test patterns in a scan-based...

Scheme to optimize scan chain ordering in designs

Chip level scan chain planning for hierarchical design flows

Boundary scan connector test method capable of fully utilizing test...

Patents Applicationslast 30 patents

ELECTRONIC DEVICE AND METHOD OF TESTING ELECTRONIC DEVICE

Processing Devices for reducing scan traffic, Method and Computer P...

SCAN APPARATUS CAPABLE OF FAULT DIAGNOSIS AND SCAN CHAIN FAULT DIAG...

JTAG BUS COMMUNICATION METHOD AND APPARATUS

JTAG BUS COMMUNICATION METHOD AND APPARATUS

DESIGN METHOD FOR SCAN TEST CIRCUIT, DESIGN PROGRAM FOR SCAN TEST C...

JTAG BUS COMMUNICATION METHOD AND APPARATUS

JTAG BUS COMMUNICATION METHOD AND APPARATUS

JTAG BUS COMMUNICATION METHOD AND APPARATUS

JTAG BUS COMMUNICATION METHOD AND APPARATUS

JTAG BUS COMMUNICATION METHOD AND APPARATUS

JTAG BUS COMMUNICATION METHOD AND APPARATUS

JTAG BUS COMMUNICATION METHOD AND APPARATUS

JTAG BUS COMMUNICATION METHOD AND APPARATUS

Mechanism to Instantiate a JTAG Debugger in a Browser

JTAG BUS COMMUNICATION METHOD AND APPARATUS

JTAG BUS COMMUNICATION METHOD AND APPARATUS

JTAG BUS COMMUNICATION METHOD AND APPARATUS

EDA TOOL, SEMICONDUCTOR DEVICE, AND SCAN CHAIN CONFIGURATION METHOD

METHOD AND APPARATUS FOR BROADCASTING SCAN PATTERNS IN A SCAN-BASED...

JTAG BUS COMMUNICATION METHOD AND APPARATUS

ENHANCING SPEED OF SIMULATION OF AN IC DESIGN WHILE TESTING SCAN CI...

SCHEME TO OPTIMIZE SCAN CHAIN ORDERING IN DESIGNS

JTAG TEST CODE AND DATA COMPILER AND METHOD

Method and apparatus for broadcasting scan patterns in a random acc...

BOUNDARY SCAN CONNECTOR TEST METHOD CAPABLE OF FULLY UTILIZING TEST...

SCAN TEST CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT AND SCAN ENABLE...

Double-edge triggered scannable pulsed flip-flop for high frequency...

APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR IMPLEMENTING DETERMINIS...

Chip level scan chain planning for hierarchical design flows