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G01R31/318314

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/318314Tools

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for controlling actions of testbench components w...
- Patent number 12,188,983
- Issue date Jan 7, 2025
- HCL America Inc.
- Manickam Muthiah
- G01 - MEASURING TESTING
Information Patent Grant
Method, a device and a computer program for operating a modular tes...
- Patent number 12,153,091
- Issue date Nov 26, 2024
- Volkswagen Aktiengesellschaft
- Andreas Aal
- G01 - MEASURING TESTING
Information Patent Grant
System and method for access control of a plurality of instruments...
- Patent number 12,111,356
- Issue date Oct 8, 2024
- Erik Larsson
- G01 - MEASURING TESTING
Information Patent Grant
Secure testing mode
- Patent number 12,105,139
- Issue date Oct 1, 2024
- Advanced Micro Devices, Inc.
- Vidyashankar Viswanathan
- G01 - MEASURING TESTING
Information Patent Grant
Emulation of JTAG/SCAN test interface protocols using SPI communica...
- Patent number 12,092,690
- Issue date Sep 17, 2024
- SILICONCH SYSTEMS PVT LTD
- Rakesh Kumar Polasa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor package test apparatus and method
- Patent number 12,072,370
- Issue date Aug 27, 2024
- Samsung Electronics Co., Ltd.
- Sung Ok Kim
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and devices for high-speed input/output margin te...
- Patent number 12,055,584
- Issue date Aug 6, 2024
- Tektronix, Inc.
- Daniel S. Froelich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hybrid solver for integrated circuit diagnostics and testing
- Patent number 12,038,478
- Issue date Jul 16, 2024
- Xerox Corporation
- Aleksandar B. Feldman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit including test circuit and method of manufacturi...
- Patent number 12,000,888
- Issue date Jun 4, 2024
- Samsung Electronics Co., Ltd.
- Changho Han
- G01 - MEASURING TESTING
Information Patent Grant
Verification of hardware design for data transformation component
- Patent number 11,995,386
- Issue date May 28, 2024
- Imagination Technologies Limited
- Sam Elliott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-die debug stop clock trigger
- Patent number 11,946,969
- Issue date Apr 2, 2024
- Apple Inc.
- Charles J. Fleckenstein
- G01 - MEASURING TESTING
Information Patent Grant
Techniques to enable integrated circuit debug across low power states
- Patent number 11,933,843
- Issue date Mar 19, 2024
- Intel Corporation
- Keith A. Jones
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and devices for high-speed input/output margin te...
- Patent number 11,927,627
- Issue date Mar 12, 2024
- Tektronix, Inc.
- Daniel S. Froelich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and measurement instrument for testing a device under test
- Patent number 11,906,583
- Issue date Feb 20, 2024
- Rohde & Schwarz GmbH & Co. KG
- Kevin Guo
- G01 - MEASURING TESTING
Information Patent Grant
System and method to weight defects with co-located modeled faults
- Patent number 11,899,065
- Issue date Feb 13, 2024
- KLA Corporation
- David W. Price
- G01 - MEASURING TESTING
Information Patent Grant
Memory device test method, apparatus, and system, medium, and elect...
- Patent number 11,867,755
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yu Yu
- G01 - MEASURING TESTING
Information Patent Grant
Parameter setting method and apparatus, system, and storage medium
- Patent number 11,867,760
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Hao He
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for testing system-on-chip, electronic device usi...
- Patent number 11,846,672
- Issue date Dec 19, 2023
- Hon Hai Precision Industry Co., Ltd.
- Jun-Kui Huang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus and non-transitory computer-readable storage m...
- Patent number 11,841,398
- Issue date Dec 12, 2023
- Silicon Motion, Inc.
- Yu-Lin Jiang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for formal fault propagation analysis
- Patent number 11,816,410
- Issue date Nov 14, 2023
- Siemens Electronic Design Automation Gmbh
- Dominik Strasser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for reusing manufacturing content across multi...
- Patent number 11,808,811
- Issue date Nov 7, 2023
- Intel Corporation
- Kalyana Kantipudi
- G01 - MEASURING TESTING
Information Patent Grant
Compiler-based code generation for post-silicon validation
- Patent number 11,796,593
- Issue date Oct 24, 2023
- Synopsys, Inc.
- Hillel Mendelson
- G01 - MEASURING TESTING
Information Patent Grant
Parameter space reduction for device testing
- Patent number 11,789,074
- Issue date Oct 17, 2023
- National Instruments Corporation
- James C. Nagle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-rate sampling for hierarchical system analysis
- Patent number 11,774,498
- Issue date Oct 3, 2023
- International Business Machines Corporation
- David Wells Winston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of converting a serial vector format (SVF) file to a vector...
- Patent number 11,747,400
- Issue date Sep 5, 2023
- The United States of America, as represented by the Secretary of the Navy
- Daniel M. Dosado
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for identifying flaws and bugs in integrated ci...
- Patent number 11,733,295
- Issue date Aug 22, 2023
- International Business Machines Corporation
- Arun Joseph
- G01 - MEASURING TESTING
Information Patent Grant
Converting formal verification testbench drivers with nondeterminis...
- Patent number 11,675,009
- Issue date Jun 13, 2023
- International Business Machines Corporation
- Bradley Donald Bingham
- G01 - MEASURING TESTING
Information Patent Grant
High-speed functional protocol based test and debug
- Patent number 11,662,383
- Issue date May 30, 2023
- Synopsys, Inc.
- Anubhav Sinha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Verification of hardware design for data transformation component
- Patent number 11,657,198
- Issue date May 23, 2023
- Imagination Technologies Limited
- Sam Elliott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for real-time firmware configuration and debugging apparatus
- Patent number 11,585,850
- Issue date Feb 21, 2023
- Realtek Semiconductor Corp.
- Yue-Feng Chen
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...
- Publication number 20240418774
- Publication date Dec 19, 2024
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TESTING BLOCKS WITHIN DEVICE UNDER TEST (DUT)...
- Publication number 20240418778
- Publication date Dec 19, 2024
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TRACKING AND MANAGING ACTIVITIES OF TESTBENCH...
- Publication number 20240418775
- Publication date Dec 19, 2024
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Utilizing Idle Computing Capacity
- Publication number 20240329133
- Publication date Oct 3, 2024
- Tapster Robotics, Inc.
- Jason Randolph Huggins
- G01 - MEASURING TESTING
Information Patent Application
VERIFICATION OF HARDWARE DESIGN FOR DATA TRANSFORMATION COMPONENT
- Publication number 20240320407
- Publication date Sep 26, 2024
- Imagination Technologies Limited
- Sam Elliott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EMULATION OF JTAG/SCAN TEST INTERFACE PROTOCOLS USING SPI COMMUNICA...
- Publication number 20240219464
- Publication date Jul 4, 2024
- SILICONCH SYSTEMS PVT LTD
- Rakesh Kumar POLASA
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR USING A TESTBED T...
- Publication number 20240069099
- Publication date Feb 29, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Christian Paul Sommers
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ACCESS CONTROL OF A PLURALITY OF INSTRUMENTS...
- Publication number 20240061041
- Publication date Feb 22, 2024
- Erik Larsson
- G01 - MEASURING TESTING
Information Patent Application
CONTAINERIZED ORCHESTRATION OF SECURE SOCKET LAYER VIRTUAL PRIVATE...
- Publication number 20240036112
- Publication date Feb 1, 2024
- AT&T INTELLECTUAL PROPERTY I, L.P.
- Elmer Cruz
- G01 - MEASURING TESTING
Information Patent Application
HYBRID SOLVER FOR INTEGRATED CIRCUIT DIAGNOSTICS AND TESTING
- Publication number 20240003970
- Publication date Jan 4, 2024
- Palo Alto Research Center Incorporated
- Aleksandar B. Feldman
- G01 - MEASURING TESTING
Information Patent Application
VERIFICATION OF HARDWARE DESIGN FOR DATA TRANSFORMATION COMPONENT
- Publication number 20230297747
- Publication date Sep 21, 2023
- Imagination Technologies Limited
- Sam Elliott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR REUSING MANUFACTURING CONTENT ACROSS MULTI...
- Publication number 20230288479
- Publication date Sep 14, 2023
- Intel Corporation
- Kalyana KANTIPUDI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD TO WEIGHT DEFECTS WITH CO-LOCATED MODELED FAULTS
- Publication number 20230280399
- Publication date Sep 7, 2023
- David W. Price
- G01 - MEASURING TESTING
Information Patent Application
Test Abstraction Data Model
- Publication number 20230266390
- Publication date Aug 24, 2023
- National Instruments Corporation
- Andrew Philip Dove
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUES TO PERFORM SEMICONDUCTOR TESTING
- Publication number 20230258716
- Publication date Aug 17, 2023
- Intel Corporation
- Swadesh Choudhary
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND MEASUREMENT INSTRUMENT FOR TESTING A DEVICE UNDER TEST
- Publication number 20230176122
- Publication date Jun 8, 2023
- Rohde& Schwarz GmbH & Co. KG
- Kevin Guo
- G01 - MEASURING TESTING
Information Patent Application
SECURE TESTING MODE
- Publication number 20230146154
- Publication date May 11, 2023
- ADVANCED MICRO DEVICES, INC.
- Vidyashankar Viswanathan
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR IDENTIFYING FLAWS AND BUGS IN INTEGRATED CI...
- Publication number 20230080463
- Publication date Mar 16, 2023
- International Business Machines Corporation
- Arun Joseph
- G01 - MEASURING TESTING
Information Patent Application
PARAMETER SETTING METHOD AND APPARATUS, SYSTEM, AND STORAGE MEDIUM
- Publication number 20230055833
- Publication date Feb 23, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Hao He
- G01 - MEASURING TESTING
Information Patent Application
A Method, a Device and a Computer Program for Operating a Modular T...
- Publication number 20230047570
- Publication date Feb 16, 2023
- Volkswagen Aktiengesellschaft
- Andreas Aal
- G01 - MEASURING TESTING
Information Patent Application
Multi-Die Debug Stop Clock Trigger
- Publication number 20230025207
- Publication date Jan 26, 2023
- Apple Inc.
- Charles J. Fleckenstein
- G01 - MEASURING TESTING
Information Patent Application
DEBUG SYSTEM AND DEBUG METHOD
- Publication number 20220413042
- Publication date Dec 29, 2022
- XEPIC CORPORATION LIMITED
- Tsair-Chin Lin
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR FORMAL FAULT PROPAGATION ANALYSIS
- Publication number 20220414306
- Publication date Dec 29, 2022
- Onespin Solutions GmbH
- Dominik Strasser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS AND NON-TRANSITORY COMPUTER-READABLE STORAGE M...
- Publication number 20220413047
- Publication date Dec 29, 2022
- SILICON MOTION, INC.
- Yu-Lin JIANG
- G01 - MEASURING TESTING
Information Patent Application
MULTI-RATE SAMPLING FOR HIERARCHICAL SYSTEM ANALYSIS
- Publication number 20220390514
- Publication date Dec 8, 2022
- International Business Machines Corporation
- David Wells Winston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERAL DIGITAL SIGNAL PROCESSING WAVEFORM MACHINE LEARNING CONTROL...
- Publication number 20220390515
- Publication date Dec 8, 2022
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
COMPILER-BASED CODE GENERATION FOR POST-SILICON VALIDATION
- Publication number 20220381824
- Publication date Dec 1, 2022
- International Business Machines Corporation
- Hillel Mendelson
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR REAL-TIME FIRMWARE CONFIGURATION AND DEBUGGING APPARATUS
- Publication number 20220334179
- Publication date Oct 20, 2022
- Realtek Semiconductor Corp.
- YUE-FENG CHEN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MEMORY DEVICE TEST METHOD, APPARATUS, AND SYSTEM, MEDIUM, AND ELECT...
- Publication number 20220291284
- Publication date Sep 15, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Yu Yu
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT SYSTEM
- Publication number 20220268839
- Publication date Aug 25, 2022
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and system for controlling actions of testbench components w...

Method, a device and a computer program for operating a modular tes...

System and method for access control of a plurality of instruments...

Secure testing mode

Emulation of JTAG/SCAN test interface protocols using SPI communica...

Semiconductor package test apparatus and method

Systems, methods, and devices for high-speed input/output margin te...

Hybrid solver for integrated circuit diagnostics and testing

Integrated circuit including test circuit and method of manufacturi...

Verification of hardware design for data transformation component

Multi-die debug stop clock trigger

Techniques to enable integrated circuit debug across low power states

Systems, methods, and devices for high-speed input/output margin te...

Method and measurement instrument for testing a device under test

System and method to weight defects with co-located modeled faults

Memory device test method, apparatus, and system, medium, and elect...

Parameter setting method and apparatus, system, and storage medium

Method and device for testing system-on-chip, electronic device usi...

Method and apparatus and non-transitory computer-readable storage m...

System and method for formal fault propagation analysis

Apparatus and method for reusing manufacturing content across multi...

Compiler-based code generation for post-silicon validation

Parameter space reduction for device testing

Multi-rate sampling for hierarchical system analysis

Method of converting a serial vector format (SVF) file to a vector...

Methods and systems for identifying flaws and bugs in integrated ci...

Converting formal verification testbench drivers with nondeterminis...

High-speed functional protocol based test and debug

Verification of hardware design for data transformation component

Method for real-time firmware configuration and debugging apparatus

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...

METHOD AND SYSTEM FOR TESTING BLOCKS WITHIN DEVICE UNDER TEST (DUT)...

METHOD AND SYSTEM FOR TRACKING AND MANAGING ACTIVITIES OF TESTBENCH...

System and Method for Utilizing Idle Computing Capacity

VERIFICATION OF HARDWARE DESIGN FOR DATA TRANSFORMATION COMPONENT

EMULATION OF JTAG/SCAN TEST INTERFACE PROTOCOLS USING SPI COMMUNICA...

METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR USING A TESTBED T...

SYSTEM AND METHOD FOR ACCESS CONTROL OF A PLURALITY OF INSTRUMENTS...

CONTAINERIZED ORCHESTRATION OF SECURE SOCKET LAYER VIRTUAL PRIVATE...

HYBRID SOLVER FOR INTEGRATED CIRCUIT DIAGNOSTICS AND TESTING

VERIFICATION OF HARDWARE DESIGN FOR DATA TRANSFORMATION COMPONENT

APPARATUS AND METHOD FOR REUSING MANUFACTURING CONTENT ACROSS MULTI...

SYSTEM AND METHOD TO WEIGHT DEFECTS WITH CO-LOCATED MODELED FAULTS

Test Abstraction Data Model

TECHNIQUES TO PERFORM SEMICONDUCTOR TESTING

METHOD AND MEASUREMENT INSTRUMENT FOR TESTING A DEVICE UNDER TEST

SECURE TESTING MODE

METHODS AND SYSTEMS FOR IDENTIFYING FLAWS AND BUGS IN INTEGRATED CI...

PARAMETER SETTING METHOD AND APPARATUS, SYSTEM, AND STORAGE MEDIUM

A Method, a Device and a Computer Program for Operating a Modular T...

Multi-Die Debug Stop Clock Trigger

DEBUG SYSTEM AND DEBUG METHOD

SYSTEM AND METHOD FOR FORMAL FAULT PROPAGATION ANALYSIS

METHOD AND APPARATUS AND NON-TRANSITORY COMPUTER-READABLE STORAGE M...

MULTI-RATE SAMPLING FOR HIERARCHICAL SYSTEM ANALYSIS

GENERAL DIGITAL SIGNAL PROCESSING WAVEFORM MACHINE LEARNING CONTROL...

COMPILER-BASED CODE GENERATION FOR POST-SILICON VALIDATION

METHOD FOR REAL-TIME FIRMWARE CONFIGURATION AND DEBUGGING APPARATUS

MEMORY DEVICE TEST METHOD, APPARATUS, AND SYSTEM, MEDIUM, AND ELECT...

TEST AND MEASUREMENT SYSTEM