Transmission microscopes

Industry

CPC
H01J2237/2802

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2802Transmission microscopes

Industries

Patents Grantslast 30 patents

Information Patent Grant
Electron microscope and specimen contamination prevention method
- Patent number 12,131,881
- Issue date Oct 29, 2024
- Jeol Ltd.
- Takeshi Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron detector
- Patent number 12,106,932
- Issue date Oct 1, 2024
- DECTRIS AG
- Radosav Pantelic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis method
- Patent number 12,094,682
- Issue date Sep 17, 2024
- Kioxia Corporation
- Takeshi Owaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for tilting characterization by microscopy
- Patent number 12,078,791
- Issue date Sep 3, 2024
- Yangtze Memory Technologies Co., Ltd.
- Jun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods of clamp compensation
- Patent number 12,057,286
- Issue date Aug 6, 2024
- FEI Company
- Edwin Verschueren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum transfer assembly
- Patent number 11,994,663
- Issue date May 28, 2024
- HennyZ B.V.
- Hendrik Willem Zandbergen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement and correction of optical aberrations in charged partic...
- Patent number 11,990,315
- Issue date May 21, 2024
- FEI Company
- Erik Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication of in situ HR-LCTEM nanofluidic cell for nanobubble int...
- Patent number 11,961,702
- Issue date Apr 16, 2024
- Saudi Arabian Oil Company
- Hassan Alqahtani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission charged particle microscope with an electron energy lo...
- Patent number 11,955,310
- Issue date Apr 9, 2024
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lateral recess measurement in a semiconductor specimen
- Patent number 11,921,063
- Issue date Mar 5, 2024
- Applied Materials Israel Ltd.
- Michael Chemama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hyperdimensional scanning transmission electron microscopy and exam...
- Patent number 11,852,598
- Issue date Dec 26, 2023
- Battelle Energy Alliance, LLC
- Jeffery A. Aguiar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for event modulated electron microscopy
- Patent number 11,848,173
- Issue date Dec 19, 2023
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Bryan Walter Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Estimation model generation method and electron microscope
- Patent number 11,842,880
- Issue date Dec 12, 2023
- Jeol Ltd.
- Ryusuke Sagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of measuring relative rotational angle and scanning transmis...
- Patent number 11,837,433
- Issue date Dec 5, 2023
- Jeol Ltd.
- Akiho Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, device and system for reducing off-axial aberration in elec...
- Patent number 11,817,290
- Issue date Nov 14, 2023
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for acquiring three-dimensional electron diffra...
- Patent number 11,815,476
- Issue date Nov 14, 2023
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical objective lens
- Patent number 11,808,930
- Issue date Nov 7, 2023
- ASML Netherlands B.V.
- Jian Zhang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
High framerate and high dynamic range electron microscopy
- Patent number 11,804,359
- Issue date Oct 31, 2023
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Ruth Bloom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method for controlling charged...
- Patent number 11,791,131
- Issue date Oct 17, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Dobashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for microscopic image generation and system for same
- Patent number 11,764,031
- Issue date Sep 19, 2023
- Leica Mikrosysteme GmbH
- Peer Oliver Kellermann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method of controlling charged p...
- Patent number 11,756,764
- Issue date Sep 12, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Dobashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid chip for electron microscope having excellent bulging resist...
- Patent number 11,747,286
- Issue date Sep 5, 2023
- Jongmin Yuk
- G01 - MEASURING TESTING
Information Patent Grant
Transmission electron microscope and method of adjusting optical sy...
- Patent number 11,742,176
- Issue date Aug 29, 2023
- Jeol Ltd.
- Kazuki Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sparse sampling using a programmatically randomized signal modulati...
- Patent number 11,721,519
- Issue date Aug 8, 2023
- SYNCHROTRON RESEARCH, INC.
- Edward Principe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Operating a particle beam apparatus with an object holder
- Patent number 11,688,583
- Issue date Jun 27, 2023
- Carl Zeiss Microscopy GmbH
- Alexander Orchowski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Super-resolution microscopy
- Patent number 11,676,794
- Issue date Jun 13, 2023
- United Kingdom Research and Innovation
- Lin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rapid and automatic virus imaging and analysis system as well as me...
- Patent number 11,593,938
- Issue date Feb 28, 2023
- BORRIRS PTE. LTD.
- Zhongwei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, device and system for reducing off-axial aberration in elec...
- Patent number 11,587,759
- Issue date Feb 21, 2023
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods of clamp compensation
- Patent number 11,562,877
- Issue date Jan 24, 2023
- FEI Company
- Edwin Verschueren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope and adjustment method of...
- Patent number 11,545,337
- Issue date Jan 3, 2023
- Jeol Ltd.
- Ryusuke Sagawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR EVENT MODULATED ELECTRON MICROSCOPY
- Publication number 20240355581
- Publication date Oct 24, 2024
- Integrated Dynamic Electron Solutions, Inc.
- Bryan Walter REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS OF CLAMP COMPENSATION
- Publication number 20240339286
- Publication date Oct 10, 2024
- FEI Company
- Edwin Verschueren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PREPARING A SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPY (...
- Publication number 20240297015
- Publication date Sep 5, 2024
- FEI Company
- Ludek Cervinka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEM Orientation Mapping via Dark-Field Vector Images
- Publication number 20240272097
- Publication date Aug 15, 2024
- Virginia Commonwealth University
- Carl R. Mayer
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIZATION DEVICE FOR AN ELECTRON MICROSCOPE AND METHOD
- Publication number 20240258064
- Publication date Aug 1, 2024
- FORSCHUNGSZENTRUM JULICH GmbH
- Amir Hossein TAVABI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH AN ELECTRON ENERGY LO...
- Publication number 20240258067
- Publication date Aug 1, 2024
- FEI Company
- Peter Christiaan TIEMEIJER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High-Voltage Insulating Structure, Charged Particle Gun, and Charge...
- Publication number 20240242917
- Publication date Jul 18, 2024
- Hitachi High-Tech Corporation
- Yasuchika SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF SAMPLE PREPARATON AND ANALYSIS
- Publication number 20240162001
- Publication date May 16, 2024
- FEI Company
- Michal Valík
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Laser Thermal Epitaxy in a Charged Particle Microscope
- Publication number 20240161999
- Publication date May 16, 2024
- FEI Company
- Rudolf Geurink
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope, Multipole Element for Use Therein, and Control...
- Publication number 20240145210
- Publication date May 2, 2024
- JEOL Ltd.
- Shigeyuki Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCTION OF POWER CONSUMPTION FOR A CHARGED PARTICLE SYSTEM
- Publication number 20240120171
- Publication date Apr 11, 2024
- FEI Company
- Casper Smit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH FRAMERATE AND HIGH DYNAMIC RANGE ELECTRON MICROSCOPY
- Publication number 20240105418
- Publication date Mar 28, 2024
- Integrated Dynamic Electron Solutions, Inc.
- Ruth BLOOM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission Electron Microscope
- Publication number 20240096588
- Publication date Mar 21, 2024
- JEOL Ltd.
- Kanako Noguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Simple Spherical Aberration Corrector for SEM
- Publication number 20240047170
- Publication date Feb 8, 2024
- FEI Company
- Ali MOHAMMADI-GHEIDARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle optics components and their fabrication
- Publication number 20240047171
- Publication date Feb 8, 2024
- FEI Company
- Ali MOHAMMADI-GHEIDARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR PREPARING SAMPLES FOR IMAGING
- Publication number 20240038486
- Publication date Feb 1, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Ching Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...
- Publication number 20240029993
- Publication date Jan 25, 2024
- FEI Company
- Maarten BISCHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SPECTROMETER CALIBRATION METHOD
- Publication number 20230402250
- Publication date Dec 14, 2023
- ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
- Paolo CATTANEO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES
- Publication number 20230343546
- Publication date Oct 26, 2023
- CARL ZEISS MICROSCOPY GMBH
- Michele Nicoletti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System and Control Method Therefor
- Publication number 20230343550
- Publication date Oct 26, 2023
- JEOL Ltd.
- Takamitsu Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENDPOINTING WITH DETERMINATION OF REMAINING DISTANCE
- Publication number 20230307209
- Publication date Sep 28, 2023
- FEI Company
- Zoltán Orémus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT AND CORRECTION OF OPTICAL ABERRATIONS IN CHARGED PARTIC...
- Publication number 20230274908
- Publication date Aug 31, 2023
- FEI Company
- Erik Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...
- Publication number 20230223231
- Publication date Jul 13, 2023
- FEI Company
- Maarten BISCHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFERENCE SCANNING TRANSMISSION ELECTRON MICROSCOPE
- Publication number 20230207258
- Publication date Jun 29, 2023
- Hitachi, Ltd
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FABRICATION OF IN SITU HR-LCTEM NANOFLUIDIC CELL FOR NANOBUBBLE INT...
- Publication number 20230187170
- Publication date Jun 15, 2023
- Saudi Arabian Oil Company
- Hassan Alqahtani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RAPID AND AUTOMATIC VIRUS IMAGING AND ANALYSIS SYSTEM AS WELL AS ME...
- Publication number 20230170178
- Publication date Jun 1, 2023
- BORRIES PTE. LTD.
- Zhongwei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS OF CLAMP COMPENSATION
- Publication number 20230120177
- Publication date Apr 20, 2023
- FEI Company
- Edwin Verschueren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS OF HYSTERESIS COMPENSATION
- Publication number 20230101676
- Publication date Mar 30, 2023
- FEI Company
- Edwin Verschueren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR TILTING CHARACTERIZATION BY MICROSCOPY
- Publication number 20230073472
- Publication date Mar 9, 2023
- Yangtze Memory Technologies Co., Ltd.
- Jun LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Analysis System
- Publication number 20230063192
- Publication date Mar 2, 2023
- Hitachi High-Tech Corporation
- Yudai KUBO
- H01 - BASIC ELECTRIC ELEMENTS

Transmission microscopes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electron microscope and specimen contamination prevention method

Electron detector

Analysis method

Method for tilting characterization by microscopy

Systems and methods of clamp compensation

Vacuum transfer assembly

Measurement and correction of optical aberrations in charged partic...

Fabrication of in situ HR-LCTEM nanofluidic cell for nanobubble int...

Transmission charged particle microscope with an electron energy lo...

Lateral recess measurement in a semiconductor specimen

Hyperdimensional scanning transmission electron microscopy and exam...

Methods and systems for event modulated electron microscopy

Estimation model generation method and electron microscope

Method of measuring relative rotational angle and scanning transmis...

Method, device and system for reducing off-axial aberration in elec...

Methods and systems for acquiring three-dimensional electron diffra...

Optical objective lens

High framerate and high dynamic range electron microscopy

Charged particle beam apparatus and method for controlling charged...

Method for microscopic image generation and system for same

Charged particle beam apparatus and method of controlling charged p...

Liquid chip for electron microscope having excellent bulging resist...

Transmission electron microscope and method of adjusting optical sy...

Sparse sampling using a programmatically randomized signal modulati...

Operating a particle beam apparatus with an object holder

Super-resolution microscopy

Rapid and automatic virus imaging and analysis system as well as me...

Method, device and system for reducing off-axial aberration in elec...

Systems and methods of clamp compensation

Scanning transmission electron microscope and adjustment method of...

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR EVENT MODULATED ELECTRON MICROSCOPY

SYSTEMS AND METHODS OF CLAMP COMPENSATION

METHOD OF PREPARING A SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPY (...

TEM Orientation Mapping via Dark-Field Vector Images

MAGNETIZATION DEVICE FOR AN ELECTRON MICROSCOPE AND METHOD

TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH AN ELECTRON ENERGY LO...

High-Voltage Insulating Structure, Charged Particle Gun, and Charge...

METHOD OF SAMPLE PREPARATON AND ANALYSIS

Laser Thermal Epitaxy in a Charged Particle Microscope

Electron Microscope, Multipole Element for Use Therein, and Control...

REDUCTION OF POWER CONSUMPTION FOR A CHARGED PARTICLE SYSTEM

HIGH FRAMERATE AND HIGH DYNAMIC RANGE ELECTRON MICROSCOPY

Transmission Electron Microscope

Simple Spherical Aberration Corrector for SEM

Charged particle optics components and their fabrication

METHOD AND APPARATUS FOR PREPARING SAMPLES FOR IMAGING

METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...

ELECTRON SPECTROMETER CALIBRATION METHOD

DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES

Charged Particle Beam System and Control Method Therefor

ENDPOINTING WITH DETERMINATION OF REMAINING DISTANCE

MEASUREMENT AND CORRECTION OF OPTICAL ABERRATIONS IN CHARGED PARTIC...

METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...

INTERFERENCE SCANNING TRANSMISSION ELECTRON MICROSCOPE

FABRICATION OF IN SITU HR-LCTEM NANOFLUIDIC CELL FOR NANOBUBBLE INT...

RAPID AND AUTOMATIC VIRUS IMAGING AND ANALYSIS SYSTEM AS WELL AS ME...

SYSTEMS AND METHODS OF CLAMP COMPENSATION

SYSTEMS AND METHODS OF HYSTERESIS COMPENSATION

METHOD FOR TILTING CHARACTERIZATION BY MICROSCOPY

Semiconductor Analysis System