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H01J2237/22

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/22Treatment of data

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Live-assisted image acquisition method and system with charged part...
- Patent number 12,288,667
- Issue date Apr 29, 2025
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Entropy based image processing for focused ion beam delayer-edge sl...
- Patent number 12,288,668
- Issue date Apr 29, 2025
- Applied Materials Israel Ltd.
- Yuval Tsedek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid scanning electron microscopy and acousto-optic based metrology
- Patent number 12,278,085
- Issue date Apr 15, 2025
- Applied Materials Israel Ltd.
- Guy Shwartz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and image generation method
- Patent number 12,278,084
- Issue date Apr 15, 2025
- Jeol Ltd.
- Motohiro Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fiducial guided cross-sectioning and lamella preparation with tomog...
- Patent number 12,255,044
- Issue date Mar 18, 2025
- FIBICS INCORPORATED
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for determining the virtual source location of a liquid met...
- Patent number 12,237,142
- Issue date Feb 25, 2025
- FEI Company
- Sean M. Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and cell evaluation method
- Patent number 12,215,308
- Issue date Feb 4, 2025
- HITACHI HIGH-TECH CORPORATION
- Akira Ikeuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods of determining aberrations in images obtained b...
- Patent number 12,183,540
- Issue date Dec 31, 2024
- ASML Netherlands B.V.
- Yifeng Shao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, device and system for reducing off-axial aberration in elec...
- Patent number 12,176,179
- Issue date Dec 24, 2024
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle microscope device and method for adjusting field-o...
- Patent number 12,170,183
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Mitsutoshi Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated ion-beam alignment for dual-beam instrument
- Patent number 12,154,757
- Issue date Nov 26, 2024
- FEI Company
- Jeremy Graham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation method by means of scanning transmission electron micro...
- Patent number 12,154,758
- Issue date Nov 26, 2024
- The University of Tokyo
- Naoya Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and image acquiring method
- Patent number 12,148,594
- Issue date Nov 19, 2024
- Jeol Ltd.
- Takeshi Otsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning charged-particle-beam microscopy with energy-dispersive x-...
- Patent number 12,094,684
- Issue date Sep 17, 2024
- Mochii, Inc.
- Christopher Su-Yan Own
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for high-performance electron microscopy
- Patent number 12,073,541
- Issue date Aug 27, 2024
- The Board of Regents of the University of Texas System
- Zbyszek Otwinowski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rotating sample holder for random angle sampling in tomography
- Patent number 12,074,007
- Issue date Aug 27, 2024
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 12,046,446
- Issue date Jul 23, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroyuki Chiba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for cross-sectioning a sample with a preset thick...
- Patent number RE50001
- Issue date Jun 4, 2024
- FIBICS INCORPORATED
- Michael William Phaneuf
Information Patent Grant
Image generation for examination of a semiconductor specimen
- Patent number 11,995,848
- Issue date May 28, 2024
- Applied Materials Israel Ltd.
- David Uliel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for image enhancement for a multi-beam charged-...
- Patent number 11,961,700
- Issue date Apr 16, 2024
- ASML Netherlands B.V.
- Maikel Robert Goosen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for real time stereo imaging using multiple ele...
- Patent number 11,942,303
- Issue date Mar 26, 2024
- ASML Netherlands B.V.
- Yan Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data generation method, charged particle beam irradiation device, a...
- Patent number 11,942,305
- Issue date Mar 26, 2024
- NuFlare Technology, Inc.
- Kenichi Yasui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscopy imaging method for 3D tomography with predictive drift t...
- Patent number 11,923,168
- Issue date Mar 5, 2024
- FIBICS INCORPORATED
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection and correction of system responses in real-time
- Patent number 11,894,214
- Issue date Feb 6, 2024
- KLA Corporation
- Henning Stoschus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Biological tissue image processing system, and machine learning method
- Patent number 11,854,201
- Issue date Dec 26, 2023
- Nikon Corporation
- Kohki Konishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, device and system for reducing off-axial aberration in elec...
- Patent number 11,817,290
- Issue date Nov 14, 2023
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of imaging a specimen using a transmission charged particle...
- Patent number 11,810,751
- Issue date Nov 7, 2023
- FEI Company
- Peter Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rotating sample holder for random angle sampling in tomography
- Patent number 11,756,762
- Issue date Sep 12, 2023
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defective pixel management in charged particle microscopy
- Patent number 11,742,175
- Issue date Aug 29, 2023
- FEI Company
- Erik Michiel Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of recording an image using a particle microscope
- Patent number 11,728,130
- Issue date Aug 15, 2023
- Carl Zeiss SMT GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR AUTOMATIC FOCUSING AND ASTIGMATISM CORRECTION FOR AN ELE...
- Publication number 20250174427
- Publication date May 29, 2025
- Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V.
- Jörgen KORNFELD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR CORRECTING IMAGE ERRORS WHEN SCANNING A CHARG...
- Publication number 20250174429
- Publication date May 29, 2025
- Carl Zeiss SMT GMBH
- Michael Budach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DISTORTION MEASUREMENT AND PARAMETER SETTING FOR CHARGED...
- Publication number 20250166962
- Publication date May 22, 2025
- Carl Zeiss SMT GMBH
- Dmitry KLOCHKOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
- Publication number 20250166961
- Publication date May 22, 2025
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20250157786
- Publication date May 15, 2025
- Hitachi, Ltd
- Fumiaki ICHIHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR DETERMINING THE VIRTUAL SOURCE LOCATION OF A LIQUID MET...
- Publication number 20250157780
- Publication date May 15, 2025
- FEI Company
- Sean M. Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MACHINING METHOD AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20250140518
- Publication date May 1, 2025
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Toshiyuki NAGAMINE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20250132123
- Publication date Apr 24, 2025
- Hitachi High-Tech Corporation
- Hiroyuki YAMAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CORRECTION OF OPTICAL ABERRATIONS IN CHARGED PARTICLE BEAM MICROSCOPY
- Publication number 20250125116
- Publication date Apr 17, 2025
- FEI Company
- Erik Franken
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD
- Publication number 20250118528
- Publication date Apr 10, 2025
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYO-ELECTRON MICROSCOPY IMAGE PROCESSING METHOD AND APPARATUS, TER...
- Publication number 20250112021
- Publication date Apr 3, 2025
- Beijing Youzhuju Network Technology Co., Ltd.
- Jing YUAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM INSPECTION SYSTEM AND CHARGED PARTICLE BEAM I...
- Publication number 20250095956
- Publication date Mar 20, 2025
- Hitachi High-Tech Corporation
- Hang DU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PROCESSING DATA DERIVED FROM A SAMPLE
- Publication number 20250095133
- Publication date Mar 20, 2025
- ASML NETHERLANDS B.V.
- Vincent Sylvester KUIPER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED REGION SELECTION FOR AUTO SWEEP
- Publication number 20250095159
- Publication date Mar 20, 2025
- FEI Company
- Umesh ADIGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DELAYERING APPARATUS AND METHODS
- Publication number 20250095959
- Publication date Mar 20, 2025
- FEI Company
- Chad Rue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR HIGH-PERFORMANCE ELECTRON MICROSCOPY
- Publication number 20250069208
- Publication date Feb 27, 2025
- The Board of Regents of the University of Texas System
- Zbyszek Otwinowski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR SELECTIVELY MANAGING IMAGE AND METADATA FRO...
- Publication number 20250029810
- Publication date Jan 23, 2025
- PROTOCHIPS, INC.
- Franklin Stampley Walden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM MICROSCOPE IMAGE PROCESSING SYSTEM AND CONTRO...
- Publication number 20250022679
- Publication date Jan 16, 2025
- HITACHI HIGH-TECH CORPORATION
- Takashi AMANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20250006454
- Publication date Jan 2, 2025
- HITACHI HIGH-TECH CORPORATION
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR DEFECT DETECTION AND DEFECT LOCATION IDENTI...
- Publication number 20250005739
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Shengcheng JIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MANUFACTURING DEVICE AND CONTROL OF THE SAME
- Publication number 20240412407
- Publication date Dec 12, 2024
- Samsung Electronics Co., Ltd.
- Junghee Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENTROPY BASED IMAGE PROCESSING FOR FOCUSED ION BEAM DELAYER – EDGE...
- Publication number 20240379327
- Publication date Nov 14, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yuval Tsedek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE CHARGED PARTICLE BEAM SYSTEM WITH A MIRROR MODE OF OPERATI...
- Publication number 20240371596
- Publication date Nov 7, 2024
- Carl Zeiss MultiSEM GmbH
- Ingo Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETERMINING AN ENERGY SPECTRUM OR ENERGY WIDTH OF A CHARG...
- Publication number 20240371600
- Publication date Nov 7, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- John Breuer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FEW-SHOT LEARNING FOR PROCESSING MICROSCOPY IMAGES
- Publication number 20240354924
- Publication date Oct 24, 2024
- FEI Company
- John Flanagan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electron Microscope, Aberration Correction Method, And Imaging Method
- Publication number 20240274402
- Publication date Aug 15, 2024
- JEOL Ltd.
- Motofumi Saitoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Inspection Apparatus
- Publication number 20240255556
- Publication date Aug 1, 2024
- Hitachi High-Tech Corporation
- Tomoko SHIMAMORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DEFECT DETECTION IN A SEMICONDUCTOR SAMPLE IN SAMPLE IMA...
- Publication number 20240242334
- Publication date Jul 18, 2024
- Carl Zeiss MultiSEM GmbH
- Thomas Korb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, AND SAMPLE OBSERVATION METHOD EMPLOYI...
- Publication number 20240242925
- Publication date Jul 18, 2024
- Hitachi, Ltd
- Shunya TANAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE ANALYSIS OF PLASMA CONDITIONS
- Publication number 20240234112
- Publication date Jul 11, 2024
- LAM RESEARCH CORPORATION
- Michal Danek
- G06 - COMPUTING CALCULATING COUNTING

Treatment of data

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Live-assisted image acquisition method and system with charged part...

Entropy based image processing for focused ion beam delayer-edge sl...

Hybrid scanning electron microscopy and acousto-optic based metrology

Electron microscope and image generation method

Fiducial guided cross-sectioning and lamella preparation with tomog...

Methods for determining the virtual source location of a liquid met...

Charged particle beam apparatus and cell evaluation method

Systems and methods of determining aberrations in images obtained b...

Method, device and system for reducing off-axial aberration in elec...

Charged particle microscope device and method for adjusting field-o...

Automated ion-beam alignment for dual-beam instrument

Observation method by means of scanning transmission electron micro...

Charged particle beam apparatus and image acquiring method

Scanning charged-particle-beam microscopy with energy-dispersive x-...

Methods for high-performance electron microscopy

Rotating sample holder for random angle sampling in tomography

Charged particle beam device

Method and system for cross-sectioning a sample with a preset thick...

Image generation for examination of a semiconductor specimen

Systems and methods for image enhancement for a multi-beam charged-...

Systems and methods for real time stereo imaging using multiple ele...

Data generation method, charged particle beam irradiation device, a...

Microscopy imaging method for 3D tomography with predictive drift t...

Detection and correction of system responses in real-time

Biological tissue image processing system, and machine learning method

Method, device and system for reducing off-axial aberration in elec...

Method of imaging a specimen using a transmission charged particle...

Rotating sample holder for random angle sampling in tomography

Defective pixel management in charged particle microscopy

Method of recording an image using a particle microscope

Patents Applicationslast 30 patents

METHOD FOR AUTOMATIC FOCUSING AND ASTIGMATISM CORRECTION FOR AN ELE...

METHOD AND DEVICE FOR CORRECTING IMAGE ERRORS WHEN SCANNING A CHARG...

METHOD FOR DISTORTION MEASUREMENT AND PARAMETER SETTING FOR CHARGED...

MICROSCOPY IMAGING METHOD AND SYSTEM

Charged Particle Beam Apparatus

METHODS FOR DETERMINING THE VIRTUAL SOURCE LOCATION OF A LIQUID MET...

MACHINING METHOD AND CHARGED PARTICLE BEAM DEVICE

Charged Particle Beam Device

CORRECTION OF OPTICAL ABERRATIONS IN CHARGED PARTICLE BEAM MICROSCOPY

CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD

CRYO-ELECTRON MICROSCOPY IMAGE PROCESSING METHOD AND APPARATUS, TER...

CHARGED PARTICLE BEAM INSPECTION SYSTEM AND CHARGED PARTICLE BEAM I...

METHOD OF PROCESSING DATA DERIVED FROM A SAMPLE

AUTOMATED REGION SELECTION FOR AUTO SWEEP

DELAYERING APPARATUS AND METHODS

METHODS FOR HIGH-PERFORMANCE ELECTRON MICROSCOPY

METHODS AND SYSTEMS FOR SELECTIVELY MANAGING IMAGE AND METADATA FRO...

CHARGED PARTICLE BEAM MICROSCOPE IMAGE PROCESSING SYSTEM AND CONTRO...

CHARGED PARTICLE BEAM DEVICE

SYSTEMS AND METHODS FOR DEFECT DETECTION AND DEFECT LOCATION IDENTI...

SEMICONDUCTOR MANUFACTURING DEVICE AND CONTROL OF THE SAME

ENTROPY BASED IMAGE PROCESSING FOR FOCUSED ION BEAM DELAYER – EDGE...

MULTIPLE CHARGED PARTICLE BEAM SYSTEM WITH A MIRROR MODE OF OPERATI...

METHOD OF DETERMINING AN ENERGY SPECTRUM OR ENERGY WIDTH OF A CHARG...

FEW-SHOT LEARNING FOR PROCESSING MICROSCOPY IMAGES

Electron Microscope, Aberration Correction Method, And Imaging Method

Sample Inspection Apparatus

METHOD FOR DEFECT DETECTION IN A SEMICONDUCTOR SAMPLE IN SAMPLE IMA...

CHARGED PARTICLE BEAM DEVICE, AND SAMPLE OBSERVATION METHOD EMPLOYI...

IMAGE ANALYSIS OF PLASMA CONDITIONS