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H01J2237/22

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/22Treatment of data

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Fiducial guided cross-sectioning and lamella preparation with tomog...
- Patent number 12,255,044
- Issue date Mar 18, 2025
- FIBICS INCORPORATED
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for determining the virtual source location of a liquid met...
- Patent number 12,237,142
- Issue date Feb 25, 2025
- FEI Company
- Sean M. Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and cell evaluation method
- Patent number 12,215,308
- Issue date Feb 4, 2025
- HITACHI HIGH-TECH CORPORATION
- Akira Ikeuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods of determining aberrations in images obtained b...
- Patent number 12,183,540
- Issue date Dec 31, 2024
- ASML Netherlands B.V.
- Yifeng Shao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, device and system for reducing off-axial aberration in elec...
- Patent number 12,176,179
- Issue date Dec 24, 2024
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle microscope device and method for adjusting field-o...
- Patent number 12,170,183
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Mitsutoshi Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated ion-beam alignment for dual-beam instrument
- Patent number 12,154,757
- Issue date Nov 26, 2024
- FEI Company
- Jeremy Graham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation method by means of scanning transmission electron micro...
- Patent number 12,154,758
- Issue date Nov 26, 2024
- The University of Tokyo
- Naoya Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and image acquiring method
- Patent number 12,148,594
- Issue date Nov 19, 2024
- Jeol Ltd.
- Takeshi Otsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning charged-particle-beam microscopy with energy-dispersive x-...
- Patent number 12,094,684
- Issue date Sep 17, 2024
- Mochii, Inc.
- Christopher Su-Yan Own
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for high-performance electron microscopy
- Patent number 12,073,541
- Issue date Aug 27, 2024
- The Board of Regents of the University of Texas System
- Zbyszek Otwinowski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rotating sample holder for random angle sampling in tomography
- Patent number 12,074,007
- Issue date Aug 27, 2024
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 12,046,446
- Issue date Jul 23, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroyuki Chiba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for cross-sectioning a sample with a preset thick...
- Patent number RE50001
- Issue date Jun 4, 2024
- FIBICS INCORPORATED
- Michael William Phaneuf
Information Patent Grant
Image generation for examination of a semiconductor specimen
- Patent number 11,995,848
- Issue date May 28, 2024
- Applied Materials Israel Ltd.
- David Uliel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for image enhancement for a multi-beam charged-...
- Patent number 11,961,700
- Issue date Apr 16, 2024
- ASML Netherlands B.V.
- Maikel Robert Goosen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for real time stereo imaging using multiple ele...
- Patent number 11,942,303
- Issue date Mar 26, 2024
- ASML Netherlands B.V.
- Yan Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data generation method, charged particle beam irradiation device, a...
- Patent number 11,942,305
- Issue date Mar 26, 2024
- NuFlare Technology, Inc.
- Kenichi Yasui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscopy imaging method for 3D tomography with predictive drift t...
- Patent number 11,923,168
- Issue date Mar 5, 2024
- FIBICS INCORPORATED
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection and correction of system responses in real-time
- Patent number 11,894,214
- Issue date Feb 6, 2024
- KLA Corporation
- Henning Stoschus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Biological tissue image processing system, and machine learning method
- Patent number 11,854,201
- Issue date Dec 26, 2023
- Nikon Corporation
- Kohki Konishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, device and system for reducing off-axial aberration in elec...
- Patent number 11,817,290
- Issue date Nov 14, 2023
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of imaging a specimen using a transmission charged particle...
- Patent number 11,810,751
- Issue date Nov 7, 2023
- FEI Company
- Peter Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rotating sample holder for random angle sampling in tomography
- Patent number 11,756,762
- Issue date Sep 12, 2023
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defective pixel management in charged particle microscopy
- Patent number 11,742,175
- Issue date Aug 29, 2023
- FEI Company
- Erik Michiel Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of recording an image using a particle microscope
- Patent number 11,728,130
- Issue date Aug 15, 2023
- Carl Zeiss SMT GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,728,127
- Issue date Aug 15, 2023
- HITACHI HIGH-TECH CORPORATION
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sparse sampling using a programmatically randomized signal modulati...
- Patent number 11,721,519
- Issue date Aug 8, 2023
- SYNCHROTRON RESEARCH, INC.
- Edward Principe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and analysis method
- Patent number 11,710,615
- Issue date Jul 25, 2023
- Jeol Ltd.
- Kenichi Tsutsumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TEM-based metrology method and system
- Patent number 11,710,616
- Issue date Jul 25, 2023
- Vladimir Machavariani
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF PROCESSING DATA DERIVED FROM A SAMPLE
- Publication number 20250095133
- Publication date Mar 20, 2025
- ASML NETHERLANDS B.V.
- Vincent Sylvester KUIPER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED REGION SELECTION FOR AUTO SWEEP
- Publication number 20250095159
- Publication date Mar 20, 2025
- FEI Company
- Umesh ADIGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM INSPECTION SYSTEM AND CHARGED PARTICLE BEAM I...
- Publication number 20250095956
- Publication date Mar 20, 2025
- Hitachi High-Tech Corporation
- Hang DU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DELAYERING APPARATUS AND METHODS
- Publication number 20250095959
- Publication date Mar 20, 2025
- FEI Company
- Chad Rue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR HIGH-PERFORMANCE ELECTRON MICROSCOPY
- Publication number 20250069208
- Publication date Feb 27, 2025
- The Board of Regents of the University of Texas System
- Zbyszek Otwinowski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR SELECTIVELY MANAGING IMAGE AND METADATA FRO...
- Publication number 20250029810
- Publication date Jan 23, 2025
- PROTOCHIPS, INC.
- Franklin Stampley Walden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM MICROSCOPE IMAGE PROCESSING SYSTEM AND CONTRO...
- Publication number 20250022679
- Publication date Jan 16, 2025
- HITACHI HIGH-TECH CORPORATION
- Takashi AMANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20250006454
- Publication date Jan 2, 2025
- HITACHI HIGH-TECH CORPORATION
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR DEFECT DETECTION AND DEFECT LOCATION IDENTI...
- Publication number 20250005739
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Shengcheng JIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MANUFACTURING DEVICE AND CONTROL OF THE SAME
- Publication number 20240412407
- Publication date Dec 12, 2024
- Samsung Electronics Co., Ltd.
- Junghee Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENTROPY BASED IMAGE PROCESSING FOR FOCUSED ION BEAM DELAYER – EDGE...
- Publication number 20240379327
- Publication date Nov 14, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Yuval Tsedek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE CHARGED PARTICLE BEAM SYSTEM WITH A MIRROR MODE OF OPERATI...
- Publication number 20240371596
- Publication date Nov 7, 2024
- Carl Zeiss MultiSEM GmbH
- Ingo Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETERMINING AN ENERGY SPECTRUM OR ENERGY WIDTH OF A CHARG...
- Publication number 20240371600
- Publication date Nov 7, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- John Breuer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FEW-SHOT LEARNING FOR PROCESSING MICROSCOPY IMAGES
- Publication number 20240354924
- Publication date Oct 24, 2024
- FEI Company
- John Flanagan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electron Microscope, Aberration Correction Method, And Imaging Method
- Publication number 20240274402
- Publication date Aug 15, 2024
- JEOL Ltd.
- Motofumi Saitoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Inspection Apparatus
- Publication number 20240255556
- Publication date Aug 1, 2024
- Hitachi High-Tech Corporation
- Tomoko SHIMAMORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DEFECT DETECTION IN A SEMICONDUCTOR SAMPLE IN SAMPLE IMA...
- Publication number 20240242334
- Publication date Jul 18, 2024
- Carl Zeiss MultiSEM GmbH
- Thomas Korb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, AND SAMPLE OBSERVATION METHOD EMPLOYI...
- Publication number 20240242925
- Publication date Jul 18, 2024
- Hitachi, Ltd
- Shunya TANAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE ANALYSIS OF PLASMA CONDITIONS
- Publication number 20240234112
- Publication date Jul 11, 2024
- LAM RESEARCH CORPORATION
- Michal Danek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING...
- Publication number 20240203688
- Publication date Jun 20, 2024
- Samsung Electronics Co., Ltd.
- Kunsu KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR AN IMAGING SYSTEM
- Publication number 20240186104
- Publication date Jun 6, 2024
- Frederick A. Flitsch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
- Publication number 20240177966
- Publication date May 30, 2024
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20240177963
- Publication date May 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuki UCHIOKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM LITHOGRAPHY APPARATUS, ELECTRON BEAM LITHOGRAPHY METH...
- Publication number 20240145212
- Publication date May 2, 2024
- NIPPON CONTROL SYSTEM CORPORATION
- Masakazu HAMAJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PREPARING A MICROSCOPIC SAMPLE FOR FIB/SEM TOMOGRAPHY
- Publication number 20240120175
- Publication date Apr 11, 2024
- CARL ZEISS MICROSCOPY GMBH
- Lorenz Lechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
- Publication number 20240094150
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA PROCESSING DEVICE AND METHOD, CHARGED PARTICLE ASSESSMENT SYST...
- Publication number 20240087842
- Publication date Mar 14, 2024
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PROCESSING SUBSTRATE
- Publication number 20240078663
- Publication date Mar 7, 2024
- PSK INC.
- KWANG SUNG YOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR PROCESS DEVICE
- Publication number 20240047247
- Publication date Feb 8, 2024
- Samsung Electronics Co., Ltd.
- Chansoo KANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYOGENIC ELECTRON MICROSCOPY FULLY AUTOMATED ACQUISITION FOR SINGL...
- Publication number 20240038488
- Publication date Feb 1, 2024
- Health Technology Innovations, Inc.
- Narasimha KUMAR
- G06 - COMPUTING CALCULATING COUNTING

Treatment of data

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Fiducial guided cross-sectioning and lamella preparation with tomog...

Methods for determining the virtual source location of a liquid met...

Charged particle beam apparatus and cell evaluation method

Systems and methods of determining aberrations in images obtained b...

Method, device and system for reducing off-axial aberration in elec...

Charged particle microscope device and method for adjusting field-o...

Automated ion-beam alignment for dual-beam instrument

Observation method by means of scanning transmission electron micro...

Charged particle beam apparatus and image acquiring method

Scanning charged-particle-beam microscopy with energy-dispersive x-...

Methods for high-performance electron microscopy

Rotating sample holder for random angle sampling in tomography

Charged particle beam device

Method and system for cross-sectioning a sample with a preset thick...

Image generation for examination of a semiconductor specimen

Systems and methods for image enhancement for a multi-beam charged-...

Systems and methods for real time stereo imaging using multiple ele...

Data generation method, charged particle beam irradiation device, a...

Microscopy imaging method for 3D tomography with predictive drift t...

Detection and correction of system responses in real-time

Biological tissue image processing system, and machine learning method

Method, device and system for reducing off-axial aberration in elec...

Method of imaging a specimen using a transmission charged particle...

Rotating sample holder for random angle sampling in tomography

Defective pixel management in charged particle microscopy

Method of recording an image using a particle microscope

Charged particle beam device

Sparse sampling using a programmatically randomized signal modulati...

Charged particle beam device and analysis method

TEM-based metrology method and system

Patents Applicationslast 30 patents

METHOD OF PROCESSING DATA DERIVED FROM A SAMPLE

AUTOMATED REGION SELECTION FOR AUTO SWEEP

CHARGED PARTICLE BEAM INSPECTION SYSTEM AND CHARGED PARTICLE BEAM I...

DELAYERING APPARATUS AND METHODS

METHODS FOR HIGH-PERFORMANCE ELECTRON MICROSCOPY

METHODS AND SYSTEMS FOR SELECTIVELY MANAGING IMAGE AND METADATA FRO...

CHARGED PARTICLE BEAM MICROSCOPE IMAGE PROCESSING SYSTEM AND CONTRO...

CHARGED PARTICLE BEAM DEVICE

SYSTEMS AND METHODS FOR DEFECT DETECTION AND DEFECT LOCATION IDENTI...

SEMICONDUCTOR MANUFACTURING DEVICE AND CONTROL OF THE SAME

ENTROPY BASED IMAGE PROCESSING FOR FOCUSED ION BEAM DELAYER – EDGE...

MULTIPLE CHARGED PARTICLE BEAM SYSTEM WITH A MIRROR MODE OF OPERATI...

METHOD OF DETERMINING AN ENERGY SPECTRUM OR ENERGY WIDTH OF A CHARG...

FEW-SHOT LEARNING FOR PROCESSING MICROSCOPY IMAGES

Electron Microscope, Aberration Correction Method, And Imaging Method

Sample Inspection Apparatus

METHOD FOR DEFECT DETECTION IN A SEMICONDUCTOR SAMPLE IN SAMPLE IMA...

CHARGED PARTICLE BEAM DEVICE, AND SAMPLE OBSERVATION METHOD EMPLOYI...

IMAGE ANALYSIS OF PLASMA CONDITIONS

APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING...

METHOD AND APPARATUS FOR AN IMAGING SYSTEM

MICROSCOPY IMAGING METHOD AND SYSTEM

Charged Particle Beam Apparatus

ELECTRON BEAM LITHOGRAPHY APPARATUS, ELECTRON BEAM LITHOGRAPHY METH...

METHOD FOR PREPARING A MICROSCOPIC SAMPLE FOR FIB/SEM TOMOGRAPHY

NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES

DATA PROCESSING DEVICE AND METHOD, CHARGED PARTICLE ASSESSMENT SYST...

METHOD FOR PROCESSING SUBSTRATE

SEMICONDUCTOR PROCESS DEVICE

CRYOGENIC ELECTRON MICROSCOPY FULLY AUTOMATED ACQUISITION FOR SINGL...