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ELECTRICITY
H01
Electric elements
H01J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J2237/00
Discharge tubes exposing object to beam
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H01J2237/22
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Patents Grants
last 30 patents
Information
Patent Grant
Systems and methods for image enhancement for a multi-beam charged-...
Patent number
11,961,700
Issue date
Apr 16, 2024
ASML Netherlands B.V.
Maikel Robert Goosen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for real time stereo imaging using multiple ele...
Patent number
11,942,303
Issue date
Mar 26, 2024
ASML Netherlands B.V.
Yan Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Data generation method, charged particle beam irradiation device, a...
Patent number
11,942,305
Issue date
Mar 26, 2024
NuFlare Technology, Inc.
Kenichi Yasui
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Microscopy imaging method for 3D tomography with predictive drift t...
Patent number
11,923,168
Issue date
Mar 5, 2024
FIBICS INCORPORATED
Michael William Phaneuf
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detection and correction of system responses in real-time
Patent number
11,894,214
Issue date
Feb 6, 2024
KLA Corporation
Henning Stoschus
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Biological tissue image processing system, and machine learning method
Patent number
11,854,201
Issue date
Dec 26, 2023
Nikon Corporation
Kohki Konishi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method, device and system for reducing off-axial aberration in elec...
Patent number
11,817,290
Issue date
Nov 14, 2023
FEI Company
Maarten Bischoff
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of imaging a specimen using a transmission charged particle...
Patent number
11,810,751
Issue date
Nov 7, 2023
FEI Company
Peter Tiemeijer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Rotating sample holder for random angle sampling in tomography
Patent number
11,756,762
Issue date
Sep 12, 2023
FEI Company
Bart Jozef Janssen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Defective pixel management in charged particle microscopy
Patent number
11,742,175
Issue date
Aug 29, 2023
FEI Company
Erik Michiel Franken
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of recording an image using a particle microscope
Patent number
11,728,130
Issue date
Aug 15, 2023
Carl Zeiss SMT GmbH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device
Patent number
11,728,127
Issue date
Aug 15, 2023
HITACHI HIGH-TECH CORPORATION
Takuma Yamamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sparse sampling using a programmatically randomized signal modulati...
Patent number
11,721,519
Issue date
Aug 8, 2023
SYNCHROTRON RESEARCH, INC.
Edward Principe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device and analysis method
Patent number
11,710,615
Issue date
Jul 25, 2023
Jeol Ltd.
Kenichi Tsutsumi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
TEM-based metrology method and system
Patent number
11,710,616
Issue date
Jul 25, 2023
Vladimir Machavariani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Charged particle beam device
Patent number
11,670,481
Issue date
Jun 6, 2023
HITACHI HIGH-TECH CORPORATION
Motonobu Hommi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus
Patent number
11,646,172
Issue date
May 9, 2023
HITACHI HIGH-TECH CORPORATION
Takafumi Miwa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus and control method
Patent number
11,610,756
Issue date
Mar 21, 2023
HITACHI HIGH-TECH CORPORATION
Kaori Bizen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of examining a sample using a charged particle microscope
Patent number
11,598,733
Issue date
Mar 7, 2023
FEI Company
Tomas Tûma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method, device and system for reducing off-axial aberration in elec...
Patent number
11,587,759
Issue date
Feb 21, 2023
FEI Company
Maarten Bischoff
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Beam trajectory via combination of image shift and hardware alpha tilt
Patent number
11,574,794
Issue date
Feb 7, 2023
FEI Company
OndOnd{hacek over (r)}ej L. Shánel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pattern inspection apparatus and pattern outline position acquisiti...
Patent number
11,569,057
Issue date
Jan 31, 2023
NuFlare Technology, Inc.
Shinji Sugihara
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detection and correction of system responses in real-time
Patent number
11,508,551
Issue date
Nov 22, 2022
KLA Corporation
Henning Stoschus
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Operating a particle beam device
Patent number
11,501,948
Issue date
Nov 15, 2022
Carl Zeiss Microscopy GmbH
Luyang Han
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Wafer inspection based on electron beam induced current
Patent number
11,501,949
Issue date
Nov 15, 2022
ASML Netherlands B.V.
Long Ma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Three-dimensional (3D) imaging system and method for nanostructure
Patent number
11,488,801
Issue date
Nov 1, 2022
INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
Zhongming Du
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for imaging a multi-pillar sample
Patent number
11,476,079
Issue date
Oct 18, 2022
FEI Company
Jakub Kuba
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for iteratively cross-sectioning a sample to corr...
Patent number
11,462,383
Issue date
Oct 4, 2022
Fibics Incorporated
Michael William Phaneuf
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and systems for acquiring 3D diffraction data
Patent number
11,456,149
Issue date
Sep 27, 2022
FEI Company
Bart Buijsse
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
BBP assisted defect detection flow for SEM images
Patent number
11,450,012
Issue date
Sep 20, 2022
KLA Corporation
Santosh Bhattacharyya
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
ELECTRON BEAM LITHOGRAPHY APPARATUS, ELECTRON BEAM LITHOGRAPHY METH...
Publication number
20240145212
Publication date
May 2, 2024
NIPPON CONTROL SYSTEM CORPORATION
Masakazu HAMAJI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR PREPARING A MICROSCOPIC SAMPLE FOR FIB/SEM TOMOGRAPHY
Publication number
20240120175
Publication date
Apr 11, 2024
CARL ZEISS MICROSCOPY GMBH
Lorenz Lechner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
Publication number
20240094150
Publication date
Mar 21, 2024
APPLIED MATERIALS ISRAEL LTD.
Dror Shemesh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DATA PROCESSING DEVICE AND METHOD, CHARGED PARTICLE ASSESSMENT SYST...
Publication number
20240087842
Publication date
Mar 14, 2024
ASML NETHERLANDS B.V.
Marco Jan-Jaco WIELAND
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR PROCESSING SUBSTRATE
Publication number
20240078663
Publication date
Mar 7, 2024
PSK INC.
KWANG SUNG YOO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR PROCESS DEVICE
Publication number
20240047247
Publication date
Feb 8, 2024
Samsung Electronics Co., Ltd.
Chansoo KANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CRYOGENIC ELECTRON MICROSCOPY FULLY AUTOMATED ACQUISITION FOR SINGL...
Publication number
20240038488
Publication date
Feb 1, 2024
Health Technology Innovations, Inc.
Narasimha KUMAR
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...
Publication number
20240029993
Publication date
Jan 25, 2024
FEI Company
Maarten BISCHOFF
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEM IMAGE ENHANCEMENT
Publication number
20240005463
Publication date
Jan 4, 2024
ASML NETHERLANDS B.V.
Shakeeb Bin HASAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT INSPECTION APPARATUS
Publication number
20230402249
Publication date
Dec 14, 2023
HITACHI HIGH-TECH CORPORATION
Yasuhiro YOSHIDA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PART...
Publication number
20230395351
Publication date
Dec 7, 2023
FEI Company
Pavel Potocek
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ROTATING SAMPLE HOLDER FOR RANDOM ANGLE SAMPLING IN TOMOGRAPHY
Publication number
20230377835
Publication date
Nov 23, 2023
FEI Company
Bart Jozef Janssen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and Scanning Transmission Charged-Particle Microscope
Publication number
20230352269
Publication date
Nov 2, 2023
FEI Company
Eric Bosch
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for Beam Interference Compensation Based on Computer Vision
Publication number
20230335371
Publication date
Oct 19, 2023
FEI Company
Lukáลก Malý
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HYBRID SCANNING ELECTRON MICROSCOPY AND ACOUSTO-OPTIC BASED METROLOGY
Publication number
20230326713
Publication date
Oct 12, 2023
APPLIED MATERIALS ISRAEL LTD.
Guy Shwartz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STROBOSCOPIC ELECTRON-BEAM SIGNAL IMAGE MAPPING
Publication number
20230317408
Publication date
Oct 5, 2023
Intel Corporation
Xianghong Tong
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IMAGING METHOD AND APPARATUS FOR DIRECT ELECTRON DETECTION CAMERAS...
Publication number
20230260743
Publication date
Aug 17, 2023
INSTITUTE OF BIOPHYSICS,CHINESE ACADEMY OF SCIENCES
Xinzheng ZHANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MATERIAL ANALYSIS WITH MULTIPLE DETECTORS
Publication number
20230258587
Publication date
Aug 17, 2023
OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Simon BURGESS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCANNING ELECTRON MICROSCOPE IMAGE-BASED PITCH WALK INSPECTION METH...
Publication number
20230253179
Publication date
Aug 10, 2023
Samsung Electronics Co., Ltd.
SUNG MIN NAM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR COMPRESSED SENSING AND PROCESSING OF IMAGE DATA
Publication number
20230230209
Publication date
Jul 20, 2023
CARL ZEISS MICROSCOPY GMBH
Manuel AMTHOR
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SAMPLE IMAGE OBSERVATION DEVICE AND METHOD FOR SAME
Publication number
20230230799
Publication date
Jul 20, 2023
HITACHI HIGH-TECH CORPORATION
Yuta IMAI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...
Publication number
20230223231
Publication date
Jul 13, 2023
FEI Company
Maarten BISCHOFF
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF GENERATING A CRYSTALLINE ORIENTATION MAP OF A SURFACE POR...
Publication number
20230178332
Publication date
Jun 8, 2023
CARL ZEISS MICROSCOPY GMBH
Luyang Han
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR REAL TIME STEREO IMAGING USING MULTIPLE ELE...
Publication number
20230154723
Publication date
May 18, 2023
ASML NETHERLANDS B.V.
Yan REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor Analysis System
Publication number
20230063192
Publication date
Mar 2, 2023
Hitachi High-Tech Corporation
Yudai KUBO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DATA GENERATION METHOD, CHARGED PARTICLE BEAM IRRADIATION DEVICE, A...
Publication number
20230053272
Publication date
Feb 16, 2023
NuFlare Technology, Inc.
Kenichi YASUI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Detection and Correction of System Responses in Real-Time
Publication number
20230045072
Publication date
Feb 9, 2023
KLA Corporation
Henning Stoschus
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
Publication number
20230044598
Publication date
Feb 9, 2023
Fibics Incorporated
Michael William Phaneuf
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OBSERVATION METHOD BY MEANS OF SCANNING TRANSMISSION ELECTRON MICRO...
Publication number
20230040811
Publication date
Feb 9, 2023
THE UNIVERSITY OF TOKYO
Naoya Shibata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SPARSE SAMPLING USING A PROGRAMMATICALLY RANDOMIZED SIGNAL MODULATI...
Publication number
20230037773
Publication date
Feb 9, 2023
Synchrotron Research, Inc.
Edward Principe
H01 - BASIC ELECTRIC ELEMENTS