Tubes in which one or a few electrodes are secondary-electron emitting electrodes

Industry

CPC
H01J43/02

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J43/00Secondary-emission tubes Electron-multiplier tubes

Current Industry

H01J43/02Tubes in which one or a few electrodes are secondary-electron emitting electrodes

Industries

Patents Grantslast 30 patents

Information Patent Grant
Microchannel plate and method of making the microchannel plate with...
- Patent number 11,948,786
- Issue date Apr 2, 2024
- Elbit Systems of America, LLC
- Stephen Carroll
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Detector comprising transmission secondary electron emission means
- Patent number 11,869,757
- Issue date Jan 9, 2024
- ADAPTAS SOLUTIONS PTY LTD
- Russell Jurek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detection system
- Patent number 11,476,104
- Issue date Oct 18, 2022
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detection system
- Patent number 11,031,220
- Issue date Jun 8, 2021
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron multipliers
- Patent number 10,916,413
- Issue date Feb 9, 2021
- ADAPTAS SOLUTIONS PTY LTD
- Wayne Sheils
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image intensifier with stray particle shield
- Patent number 10,332,732
- Issue date Jun 25, 2019
- Eagle Technology, LLC
- Arlynn W. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semi-transparent photocathode with improved absorption rate
- Patent number 9,960,004
- Issue date May 1, 2018
- Photonis France
- Gert Nützel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microwave cavity resonator detector
- Patent number 9,812,309
- Issue date Nov 7, 2017
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector apparatus
- Patent number 9,450,118
- Issue date Sep 20, 2016
- Leica Microsystems CMS GmbH
- Bernd Widzgowski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charge read-out structure for a photon / particle detector
- Patent number 9,396,913
- Issue date Jul 19, 2016
- University of Leicester
- Jonathan Stephen Lapington
- G01 - MEASURING TESTING
Information Patent Grant
Detector apparatus having a cooling component
- Patent number 9,130,079
- Issue date Sep 8, 2015
- Leica Microsystems CMS GmbH
- Frank Schreiber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector apparatus having a cooling component
- Patent number 9,117,947
- Issue date Aug 25, 2015
- Leica Microsystems CMS GmbH
- Frank Schreiber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector apparatus including light sensor and active cooling compon...
- Patent number 8,791,402
- Issue date Jul 29, 2014
- Leica Microsystems CMS GmbH
- Bernd Widzgowski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for producing secondary electrons, a secondary electrode,...
- Patent number 7,772,572
- Issue date Aug 10, 2010
- Infineon Technologies AG
- Andreas Kyek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Efficient detection for ion traps
- Patent number 7,456,398
- Issue date Nov 25, 2008
- Thermo Finnigan LLC.
- Michael W. Senko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for producing secondary electrons, a secondary electrode,...
- Patent number 7,417,240
- Issue date Aug 26, 2008
- Infineon Technologies AG
- Andreas Kyek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photodetector
- Patent number 6,818,885
- Issue date Nov 16, 2004
- Hamamatsu Photonics K.K.
- Yasuharu Negi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus and method for radiation detection with radiation beam im...
- Patent number 6,731,065
- Issue date May 4, 2004
- XCounter AB
- Tom Francke
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for gating a power supply in a radiation detector
- Patent number 6,690,098
- Issue date Feb 10, 2004
- Litton Systems, Inc.
- Michael R. Saldana
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin diamond electron beam amplifier for amplifying an electron bea...
- Patent number 6,100,639
- Issue date Aug 8, 2000
- Thermotrex Corporation
- Lawrence H. Sverdrup
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin diamond electron beam amplifier
- Patent number 6,060,839
- Issue date May 9, 2000
- Thermotrex Corporation
- Lawrence H. Sverdrup
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flat panel display device using thin diamond electron beam amplifier
- Patent number 6,005,351
- Issue date Dec 21, 1999
- Thermotrex Corporation
- Lawrence H. Sverdrup
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion generator with ionization chamber constructed from or coated wi...
- Patent number 5,434,469
- Issue date Jul 18, 1995
- Proel Tecnologie S.p.A.
- Gianfranco Cirri
- F03 - MACHINES OR ENGINES FOR LIQUIDS WIND, SPRING WEIGHT AND MISCELLANEOUS M...
Information Patent Grant
Radiation detector for elementary particles
- Patent number 5,093,566
- Issue date Mar 3, 1992
- U.S. Philips Corporation
- Gerardus Van Aller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation detector
- Patent number 4,564,753
- Issue date Jan 14, 1986
- U.S. Philips Corporation
- Gerardus van Aller
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for detecting negative ions
- Patent number 4,423,324
- Issue date Dec 27, 1983
- Finnigan Corporation
- George C. Stafford
- G01 - MEASURING TESTING
Information Patent Grant
Reduction of hysteresis in photomultiplier detectors
- Patent number 4,367,404
- Issue date Jan 4, 1983
- Beckman Instruments, Inc.
- Wilbur I. Kaye
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photomultiplier tube having directional alkali metal vapor evaporat...
- Patent number 4,333,031
- Issue date Jun 1, 1982
- RCA Corporation
- Gilbert N. Butterwick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focusing structure for photomultiplier tubes
- Patent number 4,306,171
- Issue date Dec 15, 1981
- RCA Corporation
- Richard D. Faulkner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion electron converter
- Patent number 4,101,771
- Issue date Jul 18, 1978
- Wolfgang O. Hofer
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METASURFACE ELEMENT, ELECTRON TUBE, AND METHOD FOR PRODUCING ELECTR...
- Publication number 20240021398
- Publication date Jan 18, 2024
- Hamamatsu Photonics K.K.
- Naoya KAWAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROCHANNEL PLATE AND METHOD OF MAKING THE MICROCHANNEL PLATE WITH...
- Publication number 20230386810
- Publication date Nov 30, 2023
- Elbit Systems of America, LLC
- Stephen Carroll
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Application
IMPROVED ION CONVERSION PLATE
- Publication number 20230215712
- Publication date Jul 6, 2023
- ADAPTAS SOLUTIONS PTY LTD
- Russell Jurek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detector Comprising Transmission Secondary Electron Emmission Means
- Publication number 20220293402
- Publication date Sep 15, 2022
- ADAPTAS SOLUTIONS PTY LTD
- Russell Jurek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTION SYSTEM
- Publication number 20210327697
- Publication date Oct 21, 2021
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVEMENTS IN ELECTRON MULTIPLIERS
- Publication number 20190259590
- Publication date Aug 22, 2019
- ETP ION DETECT PTY LTD
- Wayne Sheils
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMI-TRANSPARENT PHOTOCATHODE WITH IMPROVED ABSORPTION RATE
- Publication number 20150279606
- Publication date Oct 1, 2015
- PHOTONIS FRANCE
- Gert Nützel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTOR APPARATUS
- Publication number 20140306098
- Publication date Oct 16, 2014
- Leica Microsystems CMS GmbH
- Bernd Widzgowski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Source Employing Secondary Electron Generation
- Publication number 20140166872
- Publication date Jun 19, 2014
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Jani Reijonen
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR DEVICE
- Publication number 20130043376
- Publication date Feb 21, 2013
- Leica Microsystems CMS GmbH
- Bernd Widzgowski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTOR APPARATUS
- Publication number 20130043377
- Publication date Feb 21, 2013
- Leica Microsystems CMS GmbH
- Frank Schreiber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTOR APPARATUS
- Publication number 20130043378
- Publication date Feb 21, 2013
- Leica Microsystems CMS GmbH
- Frank Schreiber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGE READ-OUT STRUCTURE FOR A PHOTON / PARTICLE DETECTOR
- Publication number 20120293192
- Publication date Nov 22, 2012
- Jonathan Stephen Lapington
- G01 - MEASURING TESTING
Information Patent Application
Collection of Atmospheric Ions
- Publication number 20120286172
- Publication date Nov 15, 2012
- Sefe, Inc.
- Ryan Coulson
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for Producing Secondary Electrons, a Secondary Electrode,...
- Publication number 20080185952
- Publication date Aug 7, 2008
- Infineon Technologies AG
- Andreas Kyek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Efficient detection for ion traps
- Publication number 20080067361
- Publication date Mar 20, 2008
- Michael W. Senko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Photodetector
- Publication number 20040135071
- Publication date Jul 15, 2004
- Hamamatsu Photonics K.K.
- Yasuharu Negi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Apparatus for producing secondary electrons, a secondary electrode,...
- Publication number 20040104657
- Publication date Jun 3, 2004
- Andreas Kyek
- H01 - BASIC ELECTRIC ELEMENTS

Tubes in which one or a few electrodes are secondary-electron emitting electrodes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Microchannel plate and method of making the microchannel plate with...

Detector comprising transmission secondary electron emission means

Ion detection system

Ion detection system

Electron multipliers

Image intensifier with stray particle shield

Semi-transparent photocathode with improved absorption rate

Microwave cavity resonator detector

Detector apparatus

Charge read-out structure for a photon / particle detector

Detector apparatus having a cooling component

Detector apparatus having a cooling component

Detector apparatus including light sensor and active cooling compon...

Apparatus for producing secondary electrons, a secondary electrode,...

Efficient detection for ion traps

Apparatus for producing secondary electrons, a secondary electrode,...

Photodetector

Apparatus and method for radiation detection with radiation beam im...

Method and system for gating a power supply in a radiation detector

Thin diamond electron beam amplifier for amplifying an electron bea...

Thin diamond electron beam amplifier

Flat panel display device using thin diamond electron beam amplifier

Ion generator with ionization chamber constructed from or coated wi...

Radiation detector for elementary particles

Radiation detector

Apparatus for detecting negative ions

Reduction of hysteresis in photomultiplier detectors

Photomultiplier tube having directional alkali metal vapor evaporat...

Focusing structure for photomultiplier tubes

Ion electron converter

Patents Applicationslast 30 patents

METASURFACE ELEMENT, ELECTRON TUBE, AND METHOD FOR PRODUCING ELECTR...

MICROCHANNEL PLATE AND METHOD OF MAKING THE MICROCHANNEL PLATE WITH...

IMPROVED ION CONVERSION PLATE

Detector Comprising Transmission Secondary Electron Emmission Means

ION DETECTION SYSTEM

IMPROVEMENTS IN ELECTRON MULTIPLIERS

SEMI-TRANSPARENT PHOTOCATHODE WITH IMPROVED ABSORPTION RATE

DETECTOR APPARATUS

Ion Source Employing Secondary Electron Generation

DETECTOR DEVICE

DETECTOR APPARATUS

DETECTOR APPARATUS

CHARGE READ-OUT STRUCTURE FOR A PHOTON / PARTICLE DETECTOR

Collection of Atmospheric Ions

Apparatus for Producing Secondary Electrons, a Secondary Electrode,...

Efficient detection for ion traps

Photodetector

Apparatus for producing secondary electrons, a secondary electrode,...