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Tubes in which one or a few electrodes are secondary-electron emitting electrodes
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H01J43/02
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H
ELECTRICITY
H01
Electric elements
H01J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J43/00
Secondary-emission tubes Electron-multiplier tubes
Current Industry
H01J43/02
Tubes in which one or a few electrodes are secondary-electron emitting electrodes
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Patents Grants
last 30 patents
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Patent Grant
Microchannel plate and method of making the microchannel plate with...
Patent number
11,948,786
Issue date
Apr 2, 2024
Elbit Systems of America, LLC
Stephen Carroll
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Detector comprising transmission secondary electron emission means
Patent number
11,869,757
Issue date
Jan 9, 2024
ADAPTAS SOLUTIONS PTY LTD
Russell Jurek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion detection system
Patent number
11,476,104
Issue date
Oct 18, 2022
Micromass UK Limited
Martin Raymond Green
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion detection system
Patent number
11,031,220
Issue date
Jun 8, 2021
Micromass UK Limited
Martin Raymond Green
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron multipliers
Patent number
10,916,413
Issue date
Feb 9, 2021
ADAPTAS SOLUTIONS PTY LTD
Wayne Sheils
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Image intensifier with stray particle shield
Patent number
10,332,732
Issue date
Jun 25, 2019
Eagle Technology, LLC
Arlynn W. Smith
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semi-transparent photocathode with improved absorption rate
Patent number
9,960,004
Issue date
May 1, 2018
Photonis France
Gert Nützel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Microwave cavity resonator detector
Patent number
9,812,309
Issue date
Nov 7, 2017
Micromass UK Limited
John Brian Hoyes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detector apparatus
Patent number
9,450,118
Issue date
Sep 20, 2016
Leica Microsystems CMS GmbH
Bernd Widzgowski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charge read-out structure for a photon / particle detector
Patent number
9,396,913
Issue date
Jul 19, 2016
University of Leicester
Jonathan Stephen Lapington
G01 - MEASURING TESTING
Information
Patent Grant
Detector apparatus having a cooling component
Patent number
9,130,079
Issue date
Sep 8, 2015
Leica Microsystems CMS GmbH
Frank Schreiber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detector apparatus having a cooling component
Patent number
9,117,947
Issue date
Aug 25, 2015
Leica Microsystems CMS GmbH
Frank Schreiber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detector apparatus including light sensor and active cooling compon...
Patent number
8,791,402
Issue date
Jul 29, 2014
Leica Microsystems CMS GmbH
Bernd Widzgowski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for producing secondary electrons, a secondary electrode,...
Patent number
7,772,572
Issue date
Aug 10, 2010
Infineon Technologies AG
Andreas Kyek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Efficient detection for ion traps
Patent number
7,456,398
Issue date
Nov 25, 2008
Thermo Finnigan LLC.
Michael W. Senko
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for producing secondary electrons, a secondary electrode,...
Patent number
7,417,240
Issue date
Aug 26, 2008
Infineon Technologies AG
Andreas Kyek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Photodetector
Patent number
6,818,885
Issue date
Nov 16, 2004
Hamamatsu Photonics K.K.
Yasuharu Negi
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Apparatus and method for radiation detection with radiation beam im...
Patent number
6,731,065
Issue date
May 4, 2004
XCounter AB
Tom Francke
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for gating a power supply in a radiation detector
Patent number
6,690,098
Issue date
Feb 10, 2004
Litton Systems, Inc.
Michael R. Saldana
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Thin diamond electron beam amplifier for amplifying an electron bea...
Patent number
6,100,639
Issue date
Aug 8, 2000
Thermotrex Corporation
Lawrence H. Sverdrup
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Thin diamond electron beam amplifier
Patent number
6,060,839
Issue date
May 9, 2000
Thermotrex Corporation
Lawrence H. Sverdrup
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Flat panel display device using thin diamond electron beam amplifier
Patent number
6,005,351
Issue date
Dec 21, 1999
Thermotrex Corporation
Lawrence H. Sverdrup
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion generator with ionization chamber constructed from or coated wi...
Patent number
5,434,469
Issue date
Jul 18, 1995
Proel Tecnologie S.p.A.
Gianfranco Cirri
F03 - MACHINES OR ENGINES FOR LIQUIDS WIND, SPRING WEIGHT AND MISCELLANEOUS M...
Information
Patent Grant
Radiation detector for elementary particles
Patent number
5,093,566
Issue date
Mar 3, 1992
U.S. Philips Corporation
Gerardus Van Aller
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Radiation detector
Patent number
4,564,753
Issue date
Jan 14, 1986
U.S. Philips Corporation
Gerardus van Aller
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for detecting negative ions
Patent number
4,423,324
Issue date
Dec 27, 1983
Finnigan Corporation
George C. Stafford
G01 - MEASURING TESTING
Information
Patent Grant
Reduction of hysteresis in photomultiplier detectors
Patent number
4,367,404
Issue date
Jan 4, 1983
Beckman Instruments, Inc.
Wilbur I. Kaye
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Photomultiplier tube having directional alkali metal vapor evaporat...
Patent number
4,333,031
Issue date
Jun 1, 1982
RCA Corporation
Gilbert N. Butterwick
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Focusing structure for photomultiplier tubes
Patent number
4,306,171
Issue date
Dec 15, 1981
RCA Corporation
Richard D. Faulkner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion electron converter
Patent number
4,101,771
Issue date
Jul 18, 1978
Wolfgang O. Hofer
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
MICROCHANNEL PLATE AND METHOD OF MAKING THE MICROCHANNEL PLATE WITH...
Publication number
20240186129
Publication date
Jun 6, 2024
Elbit Systems of America, LLC
Stephen Carroll
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
METASURFACE ELEMENT, ELECTRON TUBE, AND METHOD FOR PRODUCING ELECTR...
Publication number
20240021398
Publication date
Jan 18, 2024
Hamamatsu Photonics K.K.
Naoya KAWAI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MICROCHANNEL PLATE AND METHOD OF MAKING THE MICROCHANNEL PLATE WITH...
Publication number
20230386810
Publication date
Nov 30, 2023
Elbit Systems of America, LLC
Stephen Carroll
C03 - GLASS MINERAL OR SLAG WOOL
Information
Patent Application
IMPROVED ION CONVERSION PLATE
Publication number
20230215712
Publication date
Jul 6, 2023
ADAPTAS SOLUTIONS PTY LTD
Russell Jurek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Detector Comprising Transmission Secondary Electron Emmission Means
Publication number
20220293402
Publication date
Sep 15, 2022
ADAPTAS SOLUTIONS PTY LTD
Russell Jurek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION DETECTION SYSTEM
Publication number
20210327697
Publication date
Oct 21, 2021
Micromass UK Limited
Martin Raymond Green
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IMPROVEMENTS IN ELECTRON MULTIPLIERS
Publication number
20190259590
Publication date
Aug 22, 2019
ETP ION DETECT PTY LTD
Wayne Sheils
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMI-TRANSPARENT PHOTOCATHODE WITH IMPROVED ABSORPTION RATE
Publication number
20150279606
Publication date
Oct 1, 2015
PHOTONIS FRANCE
Gert Nützel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETECTOR APPARATUS
Publication number
20140306098
Publication date
Oct 16, 2014
Leica Microsystems CMS GmbH
Bernd Widzgowski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion Source Employing Secondary Electron Generation
Publication number
20140166872
Publication date
Jun 19, 2014
SCHLUMBERGER TECHNOLOGY CORPORATION
Jani Reijonen
G01 - MEASURING TESTING
Information
Patent Application
DETECTOR DEVICE
Publication number
20130043376
Publication date
Feb 21, 2013
Leica Microsystems CMS GmbH
Bernd Widzgowski
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETECTOR APPARATUS
Publication number
20130043377
Publication date
Feb 21, 2013
Leica Microsystems CMS GmbH
Frank Schreiber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETECTOR APPARATUS
Publication number
20130043378
Publication date
Feb 21, 2013
Leica Microsystems CMS GmbH
Frank Schreiber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGE READ-OUT STRUCTURE FOR A PHOTON / PARTICLE DETECTOR
Publication number
20120293192
Publication date
Nov 22, 2012
Jonathan Stephen Lapington
G01 - MEASURING TESTING
Information
Patent Application
Collection of Atmospheric Ions
Publication number
20120286172
Publication date
Nov 15, 2012
Sefe, Inc.
Ryan Coulson
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for Producing Secondary Electrons, a Secondary Electrode,...
Publication number
20080185952
Publication date
Aug 7, 2008
Infineon Technologies AG
Andreas Kyek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Efficient detection for ion traps
Publication number
20080067361
Publication date
Mar 20, 2008
Michael W. Senko
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Photodetector
Publication number
20040135071
Publication date
Jul 15, 2004
Hamamatsu Photonics K.K.
Yasuharu Negi
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Apparatus for producing secondary electrons, a secondary electrode,...
Publication number
20040104657
Publication date
Jun 3, 2004
Andreas Kyek
H01 - BASIC ELECTRIC ELEMENTS