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Tungsten (W) as principal constituent
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H01L2224/45684
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ELECTRICITY
H01
Electric elements
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SEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
H01L2224/00
Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
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H01L2224/45684
Tungsten (W) as principal constituent
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Patents Grants
last 30 patents
Information
Patent Grant
Stack package and methods of manufacturing the same
Patent number
11,929,262
Issue date
Mar 12, 2024
Samsung Electronics Co., Ltd.
Jae-in Won
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Stack package and methods of manufacturing the same
Patent number
11,651,975
Issue date
May 16, 2023
Samsung Electronics Co., Ltd.
Jae-in Won
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Stack package and methods of manufacturing the same
Patent number
10,770,311
Issue date
Sep 8, 2020
Samsung Electronics Co., Ltd.
Jae-in Won
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light emitting apparatus
Patent number
10,374,136
Issue date
Aug 6, 2019
Nichia Corporation
Ryohei Yamashita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light emitting device mount, leadframe, and light emitting apparatus
Patent number
10,115,876
Issue date
Oct 30, 2018
Nichia Corporation
Ryohei Yamashita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light emitting device mount, leadframe, and light emitting apparatus
Patent number
9,583,688
Issue date
Feb 28, 2017
Nichia Corporation
Ryohei Yamashita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Bonding wire for semiconductor device
Patent number
9,112,059
Issue date
Aug 18, 2015
Nippon Steel & Sumikin Materials Co., Ltd.
Tomohiro Uno
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Power semiconductor device, method of manufacturing the device and...
Patent number
9,059,003
Issue date
Jun 16, 2015
NIPPON MICROMETAL CORPORATION
Kohei Tatsumi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor module system having encapsulated through wire interc...
Patent number
9,018,751
Issue date
Apr 28, 2015
Micron Technology, Inc.
David R. Hembree
G01 - MEASURING TESTING
Information
Patent Grant
Method for fabricating a through wire interconnect (TWI) on a semic...
Patent number
8,741,667
Issue date
Jun 3, 2014
Micron Technology, Inc.
David R. Hembree
G01 - MEASURING TESTING
Information
Patent Grant
Through wire interconnect (TWI) having bonded connection and encaps...
Patent number
8,581,387
Issue date
Nov 12, 2013
Micron Technology, Inc.
David R. Hembree
G01 - MEASURING TESTING
Information
Patent Grant
Connecting wire and method for manufacturing same
Patent number
8,450,611
Issue date
May 28, 2013
Heraeus Materials Technology GmbH & Co. KG
Rainer Dohle
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method for fabricating stacked semiconductor system with encapsulat...
Patent number
8,404,523
Issue date
Mar 26, 2013
Micron Technoloy, Inc.
David R. Hembree
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor chip stacked body and method of manufacturing the same
Patent number
8,394,678
Issue date
Mar 12, 2013
Shinko Electric Industries Co., Ltd.
Kei Murayama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor module system having stacked components with encapsul...
Patent number
8,217,510
Issue date
Jul 10, 2012
Micron Technology, Inc.
David R. Hembree
G01 - MEASURING TESTING
Information
Patent Grant
System with semiconductor components having encapsulated through wi...
Patent number
8,120,167
Issue date
Feb 21, 2012
Micron Technology, Inc.
David R. Hembree
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device bonding wire and wire bonding method
Patent number
8,102,061
Issue date
Jan 24, 2012
Nippon Steel Materials Co., Ltd.
Tomohiro Uno
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Printed circuit board for harsh environments
Patent number
8,076,587
Issue date
Dec 13, 2011
SIEMENS ENERGY, INC.
David J. Mitchell
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Laminated body of semiconductor chips including pads mutually conne...
Patent number
8,058,717
Issue date
Nov 15, 2011
Shinko Electric Industries Co., Ltd.
Akihito Takano
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for fabricating semiconductor component having encapsulated...
Patent number
7,883,908
Issue date
Feb 8, 2011
Micron Technology, Inc.
David R. Hembree
G01 - MEASURING TESTING
Information
Patent Grant
Wire bond method for angularly disposed conductive pads and a devic...
Patent number
7,772,045
Issue date
Aug 10, 2010
Randy Wayne Bindrup
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Semiconductor components having encapsulated through wire interconn...
Patent number
7,659,612
Issue date
Feb 9, 2010
Micron Technology, Inc.
David R. Hembree
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor package with crossing conductor assembly and method o...
Patent number
7,256,488
Issue date
Aug 14, 2007
FREESCALE SEMICONDUCTOR, INC.
Yaping Zhou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor package with crossing conductor assembly and method o...
Patent number
7,049,694
Issue date
May 23, 2006
FREESCALE SEMICONDUCTOR, INC.
Yaping Zhou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor package with crossing conductor assembly and method o...
Patent number
6,992,377
Issue date
Jan 31, 2006
FREESCALE SEMICONDUCTOR, INC.
Yaping Zhou
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
STACK PACKAGE AND METHODS OF MANUFACTURING THE SAME
Publication number
20230245902
Publication date
Aug 3, 2023
Samsung Electronics Co., Ltd.
Jae-in Won
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STACK PACKAGE AND METHODS OF MANUFACTURING THE SAME
Publication number
20200381267
Publication date
Dec 3, 2020
Samsung Electronics Co., Ltd.
Jae-in Won
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LIGHT EMITTING APPARATUS
Publication number
20190027667
Publication date
Jan 24, 2019
Nichia Corporation.
Ryohei YAMASHITA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
POWER SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING THE DEVICE AND...
Publication number
20140327018
Publication date
Nov 6, 2014
Kohei Tatsumi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LIGHT EMITTING DEVICE MOUNT, LIGHT EMITTING APPARATUS INCLUDING THE...
Publication number
20140264426
Publication date
Sep 18, 2014
Nichia Corporation.
Ryohei YAMASHITA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR MODULE SYSTEM HAVING ENCAPSULATED THROUGH WIRE INTERC...
Publication number
20140225259
Publication date
Aug 14, 2014
Micron Technology, Inc.
David R. Hembree
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR FABRICATING A THROUGH WIRE INTERCONNECT (TWI) ON A SEMIC...
Publication number
20140038406
Publication date
Feb 6, 2014
Micron Technology, Inc.
David R. Hembree
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR FABRICATING STACKED SEMICONDUCTOR SYSTEM WITH ENCAPSULAT...
Publication number
20120288997
Publication date
Nov 15, 2012
Micron Technology, Inc.
DAVID R. HEMBREE
G01 - MEASURING TESTING
Information
Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICE
Publication number
20120104613
Publication date
May 3, 2012
NIPPON MICROMETAL CORPORATION
Tomohiro Uno
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor Module System Having Stacked Components With Encapsul...
Publication number
20120043670
Publication date
Feb 23, 2012
David R. Hembree
G01 - MEASURING TESTING
Information
Patent Application
System With Semiconductor Components Having Encapsulated Through Wi...
Publication number
20110024745
Publication date
Feb 3, 2011
David R. Hembree
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE BONDING WIRE AND WIRE BONDING METHOD
Publication number
20100327450
Publication date
Dec 30, 2010
Nippon Steel Materials Co., Ltd.
Tomohiro Uno
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR CHIP LAMINATED BODY
Publication number
20100320584
Publication date
Dec 23, 2010
Shinko Electric Industries Co., Ltd.
Akihito TAKANO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR CHIP STACKED BODY AND METHOD OF MANUFACTURING THE SAME
Publication number
20100133677
Publication date
Jun 3, 2010
Shinko Electric Industries Co., Ltd.
Kei Murayama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CONNECTING WIRE AND METHOD FOR MANUFACTURING SAME
Publication number
20100108359
Publication date
May 6, 2010
Rainer Dohle
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Printed Circuit Board for Harsh Environments
Publication number
20100078202
Publication date
Apr 1, 2010
SIEMENS ENERGY, INC.
David J. Mitchell
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Application
Method For Fabricating Semiconductor Component Having Encapsulated...
Publication number
20100047934
Publication date
Feb 25, 2010
David R. Hembree
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor components and systems having encapsulated through wi...
Publication number
20070246819
Publication date
Oct 25, 2007
Micron Technology, Inc.
David R. Hembree
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor package with crossing conductor assembly and method o...
Publication number
20060163716
Publication date
Jul 27, 2006
Yaping Zhou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor package with crossing conductor assembly and method o...
Publication number
20060065966
Publication date
Mar 30, 2006
Yaping Zhou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor package with crossing conductor assembly and method o...
Publication number
20050189643
Publication date
Sep 1, 2005
Yaping Zhou
H01 - BASIC ELECTRIC ELEMENTS