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Turn-sensitive devices using vibrating masses
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G01C19/56
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PHYSICS
G01
Measuring instruments
G01C
MEASURING DISTANCES, LEVELS OR BEARINGS SURVEYING NAVIGATION GYROSCOPIC INSTRUMENTS PHOTOGRAMMETRY OR VIDEOGRAMMETRY
G01C19/00
Gyroscopes Turn-sensitive devices using vibrating masses Turn-sensitive devices without moving masses Measuring angular rate using gyroscopic effects
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G01C19/56
Turn-sensitive devices using vibrating masses
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Patents Grants
last 30 patents
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Patent Grant
Vibrator device, electronic apparatus, and vehicle
Patent number
11,940,275
Issue date
Mar 26, 2024
Seiko Epson Corporation
Seiichiro Ogura
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Micro hemispherical resonator gyroscope, and an assembly method and...
Patent number
11,920,932
Issue date
Mar 5, 2024
NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY
Xuezhong Wu
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Inertial sensor and method of inertial sensing with tuneable mode c...
Patent number
11,913,808
Issue date
Feb 27, 2024
SILICON MICROGRAVITY LIMITED
Xin Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Infrared and visible imaging system for monitoring equipment
Patent number
11,902,655
Issue date
Feb 13, 2024
X Development LLC
Leo Francis Casey
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Micromachined multi-axis gyroscopes with reduced stress sensitivity
Patent number
11,898,845
Issue date
Feb 13, 2024
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Cenk Acar
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Shear wave methods, systems, and gyroscope
Patent number
11,898,844
Issue date
Feb 13, 2024
Cornell University
Amit Lal
G01 - MEASURING TESTING
Information
Patent Grant
Vibration element, physical quantity sensor, inertial measurement u...
Patent number
11,888,464
Issue date
Jan 30, 2024
Seiko Epson Corporation
Seiichiro Ogura
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Sensor device
Patent number
11,885,621
Issue date
Jan 30, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Koichiro Nakashima
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Vibration sensor and sensor module
Patent number
11,879,793
Issue date
Jan 23, 2024
Kabushiki Kaisha Toshiba
Yongfang Li
G01 - MEASURING TESTING
Information
Patent Grant
Motion sensor with sigma-delta analog-to-digital converter having r...
Patent number
11,881,874
Issue date
Jan 23, 2024
Invensense, Inc.
Gabriele Pelli
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Short-range position tracking using stationary magnetic field gradient
Patent number
11,860,246
Issue date
Jan 2, 2024
Apple Inc.
Hong Pan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Angular velocity sensor, electronic apparatus, and vehicle
Patent number
11,852,652
Issue date
Dec 26, 2023
Seiko Epson Corporation
Kazuyuki Nagata
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity detection circuit, physical quantity sensor, and...
Patent number
11,855,653
Issue date
Dec 26, 2023
Seiko Epson Corporation
Hideyuki Yamada
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Sensor element, angular velocity sensor, and multi-axis angular vel...
Patent number
11,835,338
Issue date
Dec 5, 2023
Kyocera Corporation
Munetaka Soejima
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Vibration rectification error correction circuit, physical quantity...
Patent number
11,808,572
Issue date
Nov 7, 2023
Seiko Epson Corporation
Masayoshi Todorokihara
G01 - MEASURING TESTING
Information
Patent Grant
Vibrating-mass sensor system
Patent number
11,788,840
Issue date
Oct 17, 2023
Northrop Grumman Systems Corporation
George Attila Pavlath
G01 - MEASURING TESTING
Information
Patent Grant
Piezoelectric frequency-modulated gyroscope
Patent number
11,781,867
Issue date
Oct 10, 2023
Murata Manufacturing Co., Ltd.
Ville Kaajakari
G01 - MEASURING TESTING
Information
Patent Grant
Acoustically decoupled MEMS devices
Patent number
11,777,468
Issue date
Oct 3, 2023
Georgia Tech Research Corporation
Farrokh Ayazi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Coupling device intended to couple two elements in movement
Patent number
11,754,395
Issue date
Sep 12, 2023
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Loïc Joet
G01 - MEASURING TESTING
Information
Patent Grant
Angular velocity sensor, electronic apparatus, and vehicle
Patent number
11,747,358
Issue date
Sep 5, 2023
Seiko Epson Corporation
Kazuyuki Nagata
G01 - MEASURING TESTING
Information
Patent Grant
Inertial sensor
Patent number
11,740,087
Issue date
Aug 29, 2023
Denso Corporation
Shota Harada
G01 - MEASURING TESTING
Information
Patent Grant
Low allan-deviation oscillator
Patent number
11,716,055
Issue date
Aug 1, 2023
SiTime Corporation
Aaron Partridge
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Fused quartz dual shell resonator and method of fabrication
Patent number
11,703,330
Issue date
Jul 18, 2023
The Regents of the University of California
Andrei M. Shkel
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Online trimming device and method for micro-shell resonator gyroscope
Patent number
11,703,356
Issue date
Jul 18, 2023
NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY
Kun Lu
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Three dimensional microstructures with selectively removed regions...
Patent number
11,703,331
Issue date
Jul 18, 2023
The Regents of the University of Michigan
Khalil Najafi
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Sensor module, measurement system, and vehicle
Patent number
11,680,962
Issue date
Jun 20, 2023
Seiko Epson Corporation
Taketo Chino
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor
Patent number
11,680,797
Issue date
Jun 20, 2023
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Takanori Aoyagi
G01 - MEASURING TESTING
Information
Patent Grant
Out-of-plane hinge for micro and nanoelectromechanical systems with...
Patent number
11,674,344
Issue date
Jun 13, 2023
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Samer Dagher
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Vibrator device
Patent number
11,662,204
Issue date
May 30, 2023
Seiko Epson Corporation
Seiichiro Ogura
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Sensor and electronic device
Patent number
11,656,079
Issue date
May 23, 2023
Kabushiki Kaisha Toshiba
Hiroki Hiraga
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR MANUFACTURING VIBRATOR
Publication number
20240110787
Publication date
Apr 4, 2024
SEIKO EPSON CORPORATION
Kosuke Ariizumi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
METHOD FOR MANUFACTURING VIBRATOR
Publication number
20240110786
Publication date
Apr 4, 2024
SEIKO EPSON CORPORATION
Hiyori Sakata
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Inertial Measurement Device
Publication number
20240093994
Publication date
Mar 21, 2024
SEIKO EPSON CORPORATION
Yoshiyuki MATSUURA
G01 - MEASURING TESTING
Information
Patent Application
SENSOR AND ELECTRONIC DEVICE
Publication number
20240085181
Publication date
Mar 14, 2024
Kabushiki Kaisha Toshiba
Kei MASUNISHI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR ACOUSTICALLY ISOLATED RESONATORS
Publication number
20240077312
Publication date
Mar 7, 2024
Panasonic Intellectual Property Management Co., Ltd.
Diego EMILIO SERRANO
G01 - MEASURING TESTING
Information
Patent Application
STRUCTURE, PHYSICAL QUANTITY SENSOR, INERTIAL SENSOR, AND METHOD FO...
Publication number
20240072765
Publication date
Feb 29, 2024
SEIKO EPSON CORPORATION
Kenta Sato
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SURFACE ACOUSTIC WAVE GYROSCOPE
Publication number
20240068811
Publication date
Feb 29, 2024
The University of Newcastle Upon Tyne
James Burdess
G01 - MEASURING TESTING
Information
Patent Application
SENSOR AND ELECTRONIC DEVICE
Publication number
20240060777
Publication date
Feb 22, 2024
Kabushiki Kaisha Toshiba
Fumito MIYAZAKI
G01 - MEASURING TESTING
Information
Patent Application
Angular Velocity Sensor, Electronic Apparatus, And Vehicle
Publication number
20240053375
Publication date
Feb 15, 2024
SEIKO EPSON CORPORATION
Kazuyuki NAGATA
G01 - MEASURING TESTING
Information
Patent Application
Quantum Weak-Value Birefringent Coriolis Vibratory Gyroscope
Publication number
20240044648
Publication date
Feb 8, 2024
United States of America, as Represented by the Secretary of the Navy
Garrett K. Josemans
G01 - MEASURING TESTING
Information
Patent Application
Acoustically Decoupled MEMS Devices
Publication number
20240030887
Publication date
Jan 25, 2024
Georgia Tech Research Corporation
Farrokh Ayazi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Three Dimensional Microstructures With Selectively Removed Regions...
Publication number
20240019249
Publication date
Jan 18, 2024
The Regents of the University of Michigan
Khalil NAJAFI
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Vibration Element, Manufacturing Method of Vibration Element, Physi...
Publication number
20230387885
Publication date
Nov 30, 2023
SEIKO EPSON CORPORATION
Seiichiro OGURA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
VIBRATING-TYPE GYROSCOPE ELEMENT AND ANGULAR VELOCITY SENSOR INCLUD...
Publication number
20230358539
Publication date
Nov 9, 2023
SUMITOMO PRECISION PRODUCTS CO., LTD.
Ryohei UCHINO
G01 - MEASURING TESTING
Information
Patent Application
MOUNTING STRUCTURE OF MICRO VIBRATOR
Publication number
20230324175
Publication date
Oct 12, 2023
DENSO CORPORATION
Hideaki NISHIKAWA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
PRECISION GYROSCOPE MODE-MATCHING INSENSITIVE TO RATE INPUT
Publication number
20230304799
Publication date
Sep 28, 2023
The Regents of the University of California
Bernhard E. Boser
G01 - MEASURING TESTING
Information
Patent Application
AGITATION MONITORING SYSTEM FOR PLATING PROCESS
Publication number
20230304795
Publication date
Sep 28, 2023
Intel Corporation
Adrian BAYRAKTAROGLU
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
Physical Quantity Detection Circuit And Physical Quantity Detection...
Publication number
20230304796
Publication date
Sep 28, 2023
SEIKO EPSON CORPORATION
Takashi AOYAMA
G01 - MEASURING TESTING
Information
Patent Application
MICRO-OSCILLATOR, METHOD OF MANUFACTURING MICRO-OSCILLATOR, AND APP...
Publication number
20230294210
Publication date
Sep 21, 2023
DENSO CORPORATION
YUUKI INAGAKI
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Sensor Module, Measurement System, And Vehicle
Publication number
20230251282
Publication date
Aug 10, 2023
SEIKO EPSON CORPORATION
Taketo CHINO
G01 - MEASURING TESTING
Information
Patent Application
VIBRATING-TYPE GYROSCOPE ELEMENT AND ANGULAR VELOCITY SENSOR COMPRI...
Publication number
20230243653
Publication date
Aug 3, 2023
SUMITOMO PRECISION PRODUCTS CO., LTD.
Ryohei UCHINO
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
INFRARED AND VISIBLE IMAGING SYSTEM
Publication number
20230239568
Publication date
Jul 27, 2023
X Development LLC
Leo Francis Casey
B60 - VEHICLES IN GENERAL
Information
Patent Application
Angular Velocity Sensor, Electronic Apparatus, And Vehicle
Publication number
20230204618
Publication date
Jun 29, 2023
SEIKO EPSON CORPORATION
Kazuyuki NAGATA
G01 - MEASURING TESTING
Information
Patent Application
4-POINTS PHASE AND SENSITIVITY ESTIMATION ALGORITHM AND RELATED ARC...
Publication number
20230160696
Publication date
May 25, 2023
InvenSense, Inc.
Vito Avantaggiati
G01 - MEASURING TESTING
Information
Patent Application
VIBRATING-MASS SENSOR SYSTEM
Publication number
20230144666
Publication date
May 11, 2023
Northrop Grumman Systems Corporation
GEORGE ATTILA PAVLATH
G01 - MEASURING TESTING
Information
Patent Application
Method For Manufacturing Vibration Element
Publication number
20230127801
Publication date
Apr 27, 2023
SEIKO EPSON CORPORATION
Shigeru SHIRAISHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PHASE LOCKED LOOP AND SENSING DEVICE
Publication number
20230125664
Publication date
Apr 27, 2023
Kabushiki Kaisha Toshiba
Tetsuro ITAKURA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Vibration-Type Angular Velocity Sensor
Publication number
20230123765
Publication date
Apr 20, 2023
Sumitomo Precision Products Co., Ltd.
Takafumi MORIGUCHI
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR CONTROL AND READOUT OF TUNING FORK GYROSCOPE
Publication number
20230119809
Publication date
Apr 20, 2023
The Charles Stark Draper Laboratory, Inc.
Paul A. Ward
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Vibration Element, Physical Quantity Sensor, Inertial Measurement U...
Publication number
20230109944
Publication date
Apr 13, 2023
SEIKO EPSON CORPORATION
Seiichiro OGURA
H03 - BASIC ELECTRONIC CIRCUITRY