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Two or more frequencies or sources used for interferometric measurement
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G01B9/02007
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PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B9/00
Instruments as specified in the subgroups and characterised by the use of optical measuring means
Current Industry
G01B9/02007
Two or more frequencies or sources used for interferometric measurement
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Patents Grants
last 30 patents
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Patent Grant
Quantum interferometer with improved entangled photon identification
Patent number
11,933,608
Issue date
Mar 19, 2024
Qubit Moving and Storage, LLC
Gary Vacon
G01 - MEASURING TESTING
Information
Patent Grant
Optical tomography system and method of using
Patent number
11,933,610
Issue date
Mar 19, 2024
NEC Corporation
John Kenji David Clark
G01 - MEASURING TESTING
Information
Patent Grant
Light-sheet photonic-force optical coherence elastography
Patent number
11,920,930
Issue date
Mar 5, 2024
Cornell University
Steven G Adie
G01 - MEASURING TESTING
Information
Patent Grant
Interferometric measurement method and interferometric measurement...
Patent number
11,879,721
Issue date
Jan 23, 2024
Carl Zeiss SMT GmbH
Alexander Wolf
G01 - MEASURING TESTING
Information
Patent Grant
System for precision displacement measurement based on self-traceab...
Patent number
11,802,758
Issue date
Oct 31, 2023
Tongji University
Xiao Deng
G01 - MEASURING TESTING
Information
Patent Grant
Heterodyne grating interferometric method and system for two-degree...
Patent number
11,802,757
Issue date
Oct 31, 2023
Harbin Institute of Technology
Pengcheng Hu
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for generating independent coherent photons frequ...
Patent number
11,719,530
Issue date
Aug 8, 2023
Pusan National University Industry-University Cooperation Foundation
Han Seb Moon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods, systems and apparatus of interferometry for imaging and se...
Patent number
11,598,627
Issue date
Mar 7, 2023
Virginia Tech Intellectual Properties, Inc.
Yizheng Zhu
G01 - MEASURING TESTING
Information
Patent Grant
Optical interference measurement apparatus
Patent number
11,578,963
Issue date
Feb 14, 2023
Omron Corporation
Kazuya Kimura
G01 - MEASURING TESTING
Information
Patent Grant
Wavelength tracking system, method to calibrate a wavelength tracki...
Patent number
11,525,737
Issue date
Dec 13, 2022
ASML Netherland B.V.
Maarten Jozef Jansen
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
System and method for stabilization of multi-path optical interfero...
Patent number
11,506,477
Issue date
Nov 22, 2022
INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE
Mehedi Islam
G01 - MEASURING TESTING
Information
Patent Grant
Ophthalmic apparatus
Patent number
11,369,265
Issue date
Jun 28, 2022
Tomey Corporation
Yuji Nozawa
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Interferometry with pixelated color discriminating elements combine...
Patent number
11,353,316
Issue date
Jun 7, 2022
Onto Innovation Inc.
Neal Brock
G01 - MEASURING TESTING
Information
Patent Grant
Fiber splitter device for digital holographic imaging and interfero...
Patent number
11,340,438
Issue date
May 24, 2022
Lyncee Tec S.A.
Etienne Cuche
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Common path mode fiber tip diffraction interferometer for wavefront...
Patent number
11,333,487
Issue date
May 17, 2022
KLA Corporation
Haifeng Huang
G01 - MEASURING TESTING
Information
Patent Grant
Methods for the stabilization of interferometric systems and interf...
Patent number
11,313,667
Issue date
Apr 26, 2022
LightOn SAS
Kilian Müller
G01 - MEASURING TESTING
Information
Patent Grant
(Multi-) heterodyne detection spectrometer setup
Patent number
11,287,319
Issue date
Mar 29, 2022
IRsweep AG
Andreas Hugi
G01 - MEASURING TESTING
Information
Patent Grant
Cyclic error measurements and calibration procedures in interferome...
Patent number
11,287,242
Issue date
Mar 29, 2022
ASML Netherlands B.V.
Maarten Jozef Jansen
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer with multiple wavelength sources of different cohere...
Patent number
11,274,915
Issue date
Mar 15, 2022
Arizona Board of Regents on behalf of the University of Arizona
Stanley Pau
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for deriving a topography of an object surface
Patent number
11,248,899
Issue date
Feb 15, 2022
QSO Interferometer Systems AB
Lars Baath
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for cyclic error correction in a heterodyne int...
Patent number
11,236,985
Issue date
Feb 1, 2022
Keysight Technologies, Inc.
Greg C. Felix
G01 - MEASURING TESTING
Information
Patent Grant
Iterative optical diffraction tomography (iODT) method and applicat...
Patent number
11,221,205
Issue date
Jan 11, 2022
University of Central Florida Research Foundation, Inc.
Guifang Li
G01 - MEASURING TESTING
Information
Patent Grant
Supercontinuum light source comprising tapered microstructured opti...
Patent number
11,221,445
Issue date
Jan 11, 2022
NKT Photonics A/S
Carsten L. Thomsen
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic optical interferometer locking using entangled photons
Patent number
11,193,750
Issue date
Dec 7, 2021
Honeywell International Inc.
Chad Fertig
G01 - MEASURING TESTING
Information
Patent Grant
Separated beams displacement measurement with a grating
Patent number
11,156,449
Issue date
Oct 26, 2021
Keysight Technologies, Inc.
Greg C. Felix
G01 - MEASURING TESTING
Information
Patent Grant
Heterodyne laser interferometer based on integrated secondary beam...
Patent number
11,150,077
Issue date
Oct 19, 2021
Harbin Institute of Technology
Pengcheng Hu
G01 - MEASURING TESTING
Information
Patent Grant
Retro-reflective interferometer
Patent number
11,092,478
Issue date
Aug 17, 2021
X-BEAMER TECHNOLOGIES LTD.
Igal Zlochin
G01 - MEASURING TESTING
Information
Patent Grant
System for interrogating an interferometer, an interferometric syst...
Patent number
11,067,416
Issue date
Jul 20, 2021
H NU PTY LTD
John Haywood
G01 - MEASURING TESTING
Information
Patent Grant
Optical phase measurement method and system
Patent number
11,029,258
Issue date
Jun 8, 2021
Nova Measuring Instruments Ltd.
Gilad Barak
G01 - MEASURING TESTING
Information
Patent Grant
Distance measuring arrangement for determining a distance from an o...
Patent number
11,015,916
Issue date
May 25, 2021
TAYLOR HOBSON LTD.
Christian Am Weg
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL TOMOGRAPHY SYSTEM AND METHOD OF USING
Publication number
20240035803
Publication date
Feb 1, 2024
NEC Corporation
John Kenji David CLARK
G01 - MEASURING TESTING
Information
Patent Application
SINGLE FRAME-TILTED WAVE INTERFEROMETER
Publication number
20240003672
Publication date
Jan 4, 2024
UNIVERSITAT STUTTGART
Christof PRUß
G01 - MEASURING TESTING
Information
Patent Application
A POSITIONING SYSTEM, A LITHOGRAPHIC APPARATUS, AN ABSOLUTE POSITIO...
Publication number
20230408933
Publication date
Dec 21, 2023
ASML NETHERLANDS B.V.
Maarten Jozef JANSEN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Quantum Interferometer with Improved Entangled Photon Identification
Publication number
20230375327
Publication date
Nov 23, 2023
Qubit Moving and Storage, LLC
Gary Vacon
G01 - MEASURING TESTING
Information
Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
Publication number
20230366668
Publication date
Nov 16, 2023
CKD CORPORATION
Hiroyuki Ishigaki
G01 - MEASURING TESTING
Information
Patent Application
Laser Interferometer
Publication number
20230288184
Publication date
Sep 14, 2023
SEIKO EPSON CORPORATION
Jun KITAGAWA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL INTERFERENCE RANGE SENSOR
Publication number
20230288188
Publication date
Sep 14, 2023
Omron Corporation
Yusuke NAGASAKI
G01 - MEASURING TESTING
Information
Patent Application
LASER INTERFEROMETER
Publication number
20230243636
Publication date
Aug 3, 2023
SEIKO EPSON CORPORATION
Kohei YAMADA
G01 - MEASURING TESTING
Information
Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
Publication number
20230243643
Publication date
Aug 3, 2023
CKD CORPORATION
Hiroyuki Ishigaki
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CALIBRATION OF AN OPTICAL MEASUREMENT SYSTEM AND OPTICAL...
Publication number
20230168077
Publication date
Jun 1, 2023
ASML NETHERLANDS B.V.
Maarten Jozef JANSEN
G01 - MEASURING TESTING
Information
Patent Application
LIGHT-SHEET PHOTONIC-FORCE OPTICAL COHERENCE ELASTOGRAPHY
Publication number
20230072425
Publication date
Mar 9, 2023
Cornell University
Steven G ADIE
G01 - MEASURING TESTING
Information
Patent Application
HETERODYNE LIGHT SOURCE FOR USE IN METROLOGY SYSTEM
Publication number
20230062525
Publication date
Mar 2, 2023
MITUTOYO CORPORATION
Nick HARTMANN
G01 - MEASURING TESTING
Information
Patent Application
MULTI-FREQUENCY HYBRID HETERODYNE LASER TRACKER SYSTEM BASED ON SIN...
Publication number
20230061358
Publication date
Mar 2, 2023
HARBIN INSTITUTE OF TECHNOLOGY
Hongxing YANG
G01 - MEASURING TESTING
Information
Patent Application
Wavelength Tracking System, Method to Calibrate a Wavelength Tracki...
Publication number
20230056872
Publication date
Feb 23, 2023
ASML NETHERLANDS B.V.
Engelbertus Antonius Fransiscus VAN DER PASCH
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
FREQUENCY SHIFTER FOR HETERODYNE INTERFEROMETRY MEASUREMENTS AND DE...
Publication number
20230046152
Publication date
Feb 16, 2023
ROCKLEY PHOTONICS LIMITED
Richard GROTE
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR MEASURING LASER DISPLACEMENT
Publication number
20230047877
Publication date
Feb 16, 2023
NATIONAL INSTITUTE OF METROLOGY, CHINA
Jianjun CUI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR PRECISION DISPLACEMENT MEASUREMENT BASED ON SELF-TRACEAB...
Publication number
20230042098
Publication date
Feb 9, 2023
Tongji University
Xiao DENG
G01 - MEASURING TESTING
Information
Patent Application
GEOMETRIC TOOLS AND METHODS TO MEASURE CLOSURE PHASE FOR ROBUST FEA...
Publication number
20230017478
Publication date
Jan 19, 2023
Associated Universities, Inc.
Nithyanandan Thyagarajan
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
COMPOSITE MEASUREMENT SYSTEM FOR MEASURING NANOMETER DISPLACEMENT
Publication number
20220412719
Publication date
Dec 29, 2022
NATIONAL INSTITUTE OF METROLOGY, CHINA
Yushu SHI
G01 - MEASURING TESTING
Information
Patent Application
MICROSTRUCTURED OPTICAL FIBER, SUPERCONTINUUM LIGHT SOURCE COMPRISI...
Publication number
20220326433
Publication date
Oct 13, 2022
NKT PHOTONICS A/S
Carsten L. THOMSEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTERFEROMETRIC MEASUREMENT METHOD AND INTERFEROMETRIC MEASUREMENT...
Publication number
20220307822
Publication date
Sep 29, 2022
Carl Zeiss SMT GMBH
Alexander Wolf
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR GENERATING INDEPENDENT COHERENT PHOTONS FREQU...
Publication number
20220260358
Publication date
Aug 18, 2022
Han Seb MOON
G01 - MEASURING TESTING
Information
Patent Application
AUDIO SYSTEM THAT USES AN OPTICAL MICROPHONE
Publication number
20220201403
Publication date
Jun 23, 2022
Facebook Technologies, LLC
Morteza Khaleghimeybodi
G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information
Patent Application
EYE ACCOMMODATION DISTANCE MEASURING DEVICE AND METHOD FOR HEAD-MOU...
Publication number
20220155599
Publication date
May 19, 2022
Samsung Electronics Co., Ltd.
Vladislav Valerievich LYCHAGOV
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HETERODYNE GRATING INTERFEROMETRIC METHOD AND SYSTEM FOR TWO-DEGREE...
Publication number
20220090907
Publication date
Mar 24, 2022
HARBIN INSTITUTE OF TECHNOLOGY
Pengcheng HU
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
Publication number
20210364451
Publication date
Nov 25, 2021
NOVA MEASURING INSTRUMENTS LTD.
Gilad BARAK
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL INTERFERENCE MEASUREMENT APPARATUS
Publication number
20210285755
Publication date
Sep 16, 2021
Omron Corporation
Kazuya KIMURA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR CYCLIC ERROR CORRECTION IN A HETERODYNE INT...
Publication number
20210148691
Publication date
May 20, 2021
KEYSIGHT TECHNOLOGIES, INC.
Greg C. Felix
G01 - MEASURING TESTING
Information
Patent Application
COMMON PATH MODE FIBER TIP DIFFRACTION INTERFEROMETER FOR WAVEFRONT...
Publication number
20210123716
Publication date
Apr 29, 2021
KLA Corporation
Haifeng Huang
G01 - MEASURING TESTING
Information
Patent Application
METHODS FOR THE STABILIZATION OF NITERFEROMETRIC SYSTEMS AND INTERF...
Publication number
20210041219
Publication date
Feb 11, 2021
LightOn SAS
Kilian Müller
G01 - MEASURING TESTING