Two or more frequencies or sources used for interferometric measurement

Industry

CPC
G01B9/02007

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02007Two or more frequencies or sources used for interferometric measurement

Industries

Patents Grantslast 30 patents

Information Patent Grant
Device and method for imaging and interferometry measurements
- Patent number 12,163,777
- Issue date Dec 10, 2024
- FOGALE NANOTECH
- Alain Courteville
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Device and method for measuring laser displacement
- Patent number 12,158,340
- Issue date Dec 3, 2024
- National Institute of Metrology, China
- Jianjun Cui
- G01 - MEASURING TESTING
Information Patent Grant
Geometric tools and methods to measure closure phase for robust fea...
- Patent number 12,104,901
- Issue date Oct 1, 2024
- Associated Universities, Inc.
- Nithyanandan Thyagarajan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Eye accommodation distance measuring device and method for head-mou...
- Patent number 12,085,716
- Issue date Sep 10, 2024
- Samsung Electronics Co., Ltd.
- Vladislav Valerievich Lychagov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-frequency hybrid heterodyne laser tracker system based on sin...
- Patent number 12,055,391
- Issue date Aug 6, 2024
- Harbin Institute of Technology
- Hongxing Yang
- G01 - MEASURING TESTING
Information Patent Grant
System, method, and apparatus for digital holographic vibration ima...
- Patent number 12,045,010
- Issue date Jul 23, 2024
- EXCITING TECHNOLOGY LLC
- Matthew P. Dierking
- G01 - MEASURING TESTING
Information Patent Grant
Microstructured optical fiber, supercontinuum light source comprisi...
- Patent number 11,982,834
- Issue date May 14, 2024
- NKT Photonics A/S
- Carsten L. Thomsen
- G01 - MEASURING TESTING
Information Patent Grant
Quantum interferometer with improved entangled photon identification
- Patent number 11,933,608
- Issue date Mar 19, 2024
- Qubit Moving and Storage, LLC
- Gary Vacon
- G01 - MEASURING TESTING
Information Patent Grant
Optical tomography system and method of using
- Patent number 11,933,610
- Issue date Mar 19, 2024
- NEC Corporation
- John Kenji David Clark
- G01 - MEASURING TESTING
Information Patent Grant
Light-sheet photonic-force optical coherence elastography
- Patent number 11,920,930
- Issue date Mar 5, 2024
- Cornell University
- Steven G Adie
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measurement method and interferometric measurement...
- Patent number 11,879,721
- Issue date Jan 23, 2024
- Carl Zeiss SMT GmbH
- Alexander Wolf
- G01 - MEASURING TESTING
Information Patent Grant
System for precision displacement measurement based on self-traceab...
- Patent number 11,802,758
- Issue date Oct 31, 2023
- Tongji University
- Xiao Deng
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne grating interferometric method and system for two-degree...
- Patent number 11,802,757
- Issue date Oct 31, 2023
- Harbin Institute of Technology
- Pengcheng Hu
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for generating independent coherent photons frequ...
- Patent number 11,719,530
- Issue date Aug 8, 2023
- Pusan National University Industry-University Cooperation Foundation
- Han Seb Moon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods, systems and apparatus of interferometry for imaging and se...
- Patent number 11,598,627
- Issue date Mar 7, 2023
- Virginia Tech Intellectual Properties, Inc.
- Yizheng Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Optical interference measurement apparatus
- Patent number 11,578,963
- Issue date Feb 14, 2023
- Omron Corporation
- Kazuya Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength tracking system, method to calibrate a wavelength tracki...
- Patent number 11,525,737
- Issue date Dec 13, 2022
- ASML Netherland B.V.
- Maarten Jozef Jansen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for stabilization of multi-path optical interfero...
- Patent number 11,506,477
- Issue date Nov 22, 2022
- INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Mehedi Islam
- G01 - MEASURING TESTING
Information Patent Grant
Ophthalmic apparatus
- Patent number 11,369,265
- Issue date Jun 28, 2022
- Tomey Corporation
- Yuji Nozawa
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Interferometry with pixelated color discriminating elements combine...
- Patent number 11,353,316
- Issue date Jun 7, 2022
- Onto Innovation Inc.
- Neal Brock
- G01 - MEASURING TESTING
Information Patent Grant
Fiber splitter device for digital holographic imaging and interfero...
- Patent number 11,340,438
- Issue date May 24, 2022
- Lyncee Tec S.A.
- Etienne Cuche
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Common path mode fiber tip diffraction interferometer for wavefront...
- Patent number 11,333,487
- Issue date May 17, 2022
- KLA Corporation
- Haifeng Huang
- G01 - MEASURING TESTING
Information Patent Grant
Methods for the stabilization of interferometric systems and interf...
- Patent number 11,313,667
- Issue date Apr 26, 2022
- LightOn SAS
- Kilian Müller
- G01 - MEASURING TESTING
Information Patent Grant
(Multi-) heterodyne detection spectrometer setup
- Patent number 11,287,319
- Issue date Mar 29, 2022
- IRsweep AG
- Andreas Hugi
- G01 - MEASURING TESTING
Information Patent Grant
Cyclic error measurements and calibration procedures in interferome...
- Patent number 11,287,242
- Issue date Mar 29, 2022
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer with multiple wavelength sources of different cohere...
- Patent number 11,274,915
- Issue date Mar 15, 2022
- Arizona Board of Regents on behalf of the University of Arizona
- Stanley Pau
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for deriving a topography of an object surface
- Patent number 11,248,899
- Issue date Feb 15, 2022
- QSO Interferometer Systems AB
- Lars Baath
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for cyclic error correction in a heterodyne int...
- Patent number 11,236,985
- Issue date Feb 1, 2022
- Keysight Technologies, Inc.
- Greg C. Felix
- G01 - MEASURING TESTING
Information Patent Grant
Iterative optical diffraction tomography (iODT) method and applicat...
- Patent number 11,221,205
- Issue date Jan 11, 2022
- University of Central Florida Research Foundation, Inc.
- Guifang Li
- G01 - MEASURING TESTING
Information Patent Grant
Supercontinuum light source comprising tapered microstructured opti...
- Patent number 11,221,445
- Issue date Jan 11, 2022
- NKT Photonics A/S
- Carsten L. Thomsen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR MAPPING AND RANGE DETECTION
- Publication number 20240384979
- Publication date Nov 21, 2024
- LIDWAVE LTD.
- Yehuda HAI VIDAL
- G01 - MEASURING TESTING
Information Patent Application
Multi-Channel Self-Mixing Interferometric Sensor
- Publication number 20240384980
- Publication date Nov 21, 2024
- Apple Inc.
- Tong Chen
- G01 - MEASURING TESTING
Information Patent Application
Laser Interferometer And Method Of Adjusting Optical Axis Of Laser...
- Publication number 20240384978
- Publication date Nov 21, 2024
- SEIKO EPSON CORPORATION
- Jun KITAGAWA
- G01 - MEASURING TESTING
Information Patent Application
Three-Wavelengths Interferometric Measuring Device And Method
- Publication number 20240377183
- Publication date Nov 14, 2024
- TAYLOR HOBSON LTD.
- Christian Am Weg
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20240361253
- Publication date Oct 31, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
Interferometric Measurement System Using Time-Correlated Photons
- Publication number 20240263936
- Publication date Aug 8, 2024
- Qubit Moving and Storage, LLC
- Gary Vacon
- G01 - MEASURING TESTING
Information Patent Application
LONG COHERENCE RANGE OPTICAL ANALYSIS
- Publication number 20240240931
- Publication date Jul 18, 2024
- Medlumics S.L.
- Matthieu DUPERRON
- G01 - MEASURING TESTING
Information Patent Application
Microstructured Optical Fiber, Supercontinuum Light Source Comprisi...
- Publication number 20240230985
- Publication date Jul 11, 2024
- NKT PHOTONICS A/S
- Carsten L. THOMSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RAPID COHERENT SYNTHETIC WAVELENGTH INTERFEROMETRIC ABSOLUTE DISTAN...
- Publication number 20240219167
- Publication date Jul 4, 2024
- DUKE UNIVERSITY
- Joseph A. IZATT
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC SYSTEM WITH DEEP LEARNING ALGORITHM TO PROCESS TWO...
- Publication number 20240210158
- Publication date Jun 27, 2024
- Arizona Board of Regents on behalf of The University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TOMOGRAPHY SYSTEM AND METHOD OF USING
- Publication number 20240167807
- Publication date May 23, 2024
- NEC Corporation
- John Kenji David CLARK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TOMOGRAPHY SYSTEM AND METHOD OF USING
- Publication number 20240035803
- Publication date Feb 1, 2024
- NEC Corporation
- John Kenji David CLARK
- G01 - MEASURING TESTING
Information Patent Application
SINGLE FRAME-TILTED WAVE INTERFEROMETER
- Publication number 20240003672
- Publication date Jan 4, 2024
- UNIVERSITAT STUTTGART
- Christof PRUß
- G01 - MEASURING TESTING
Information Patent Application
A POSITIONING SYSTEM, A LITHOGRAPHIC APPARATUS, AN ABSOLUTE POSITIO...
- Publication number 20230408933
- Publication date Dec 21, 2023
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Quantum Interferometer with Improved Entangled Photon Identification
- Publication number 20230375327
- Publication date Nov 23, 2023
- Qubit Moving and Storage, LLC
- Gary Vacon
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
- Publication number 20230366668
- Publication date Nov 16, 2023
- CKD CORPORATION
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Application
Laser Interferometer
- Publication number 20230288184
- Publication date Sep 14, 2023
- SEIKO EPSON CORPORATION
- Jun KITAGAWA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERFERENCE RANGE SENSOR
- Publication number 20230288188
- Publication date Sep 14, 2023
- Omron Corporation
- Yusuke NAGASAKI
- G01 - MEASURING TESTING
Information Patent Application
LASER INTERFEROMETER
- Publication number 20230243636
- Publication date Aug 3, 2023
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
- Publication number 20230243643
- Publication date Aug 3, 2023
- CKD CORPORATION
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATION OF AN OPTICAL MEASUREMENT SYSTEM AND OPTICAL...
- Publication number 20230168077
- Publication date Jun 1, 2023
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G01 - MEASURING TESTING
Information Patent Application
LIGHT-SHEET PHOTONIC-FORCE OPTICAL COHERENCE ELASTOGRAPHY
- Publication number 20230072425
- Publication date Mar 9, 2023
- Cornell University
- Steven G ADIE
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE LIGHT SOURCE FOR USE IN METROLOGY SYSTEM
- Publication number 20230062525
- Publication date Mar 2, 2023
- MITUTOYO CORPORATION
- Nick HARTMANN
- G01 - MEASURING TESTING
Information Patent Application
MULTI-FREQUENCY HYBRID HETERODYNE LASER TRACKER SYSTEM BASED ON SIN...
- Publication number 20230061358
- Publication date Mar 2, 2023
- HARBIN INSTITUTE OF TECHNOLOGY
- Hongxing YANG
- G01 - MEASURING TESTING
Information Patent Application
Wavelength Tracking System, Method to Calibrate a Wavelength Tracki...
- Publication number 20230056872
- Publication date Feb 23, 2023
- ASML NETHERLANDS B.V.
- Engelbertus Antonius Fransiscus VAN DER PASCH
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
FREQUENCY SHIFTER FOR HETERODYNE INTERFEROMETRY MEASUREMENTS AND DE...
- Publication number 20230046152
- Publication date Feb 16, 2023
- ROCKLEY PHOTONICS LIMITED
- Richard GROTE
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING LASER DISPLACEMENT
- Publication number 20230047877
- Publication date Feb 16, 2023
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- Jianjun CUI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR PRECISION DISPLACEMENT MEASUREMENT BASED ON SELF-TRACEAB...
- Publication number 20230042098
- Publication date Feb 9, 2023
- Tongji University
- Xiao DENG
- G01 - MEASURING TESTING
Information Patent Application
GEOMETRIC TOOLS AND METHODS TO MEASURE CLOSURE PHASE FOR ROBUST FEA...
- Publication number 20230017478
- Publication date Jan 19, 2023
- Associated Universities, Inc.
- Nithyanandan Thyagarajan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
COMPOSITE MEASUREMENT SYSTEM FOR MEASURING NANOMETER DISPLACEMENT
- Publication number 20220412719
- Publication date Dec 29, 2022
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- Yushu SHI
- G01 - MEASURING TESTING

Two or more frequencies or sources used for interferometric measurement

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device and method for imaging and interferometry measurements

Device and method for measuring laser displacement

Geometric tools and methods to measure closure phase for robust fea...

Eye accommodation distance measuring device and method for head-mou...

Multi-frequency hybrid heterodyne laser tracker system based on sin...

System, method, and apparatus for digital holographic vibration ima...

Microstructured optical fiber, supercontinuum light source comprisi...

Quantum interferometer with improved entangled photon identification

Optical tomography system and method of using

Light-sheet photonic-force optical coherence elastography

Interferometric measurement method and interferometric measurement...

System for precision displacement measurement based on self-traceab...

Heterodyne grating interferometric method and system for two-degree...

Method and system for generating independent coherent photons frequ...

Methods, systems and apparatus of interferometry for imaging and se...

Optical interference measurement apparatus

Wavelength tracking system, method to calibrate a wavelength tracki...

System and method for stabilization of multi-path optical interfero...

Ophthalmic apparatus

Interferometry with pixelated color discriminating elements combine...

Fiber splitter device for digital holographic imaging and interfero...

Common path mode fiber tip diffraction interferometer for wavefront...

Methods for the stabilization of interferometric systems and interf...

(Multi-) heterodyne detection spectrometer setup

Cyclic error measurements and calibration procedures in interferome...

Interferometer with multiple wavelength sources of different cohere...

Method and apparatus for deriving a topography of an object surface

Systems and methods for cyclic error correction in a heterodyne int...

Iterative optical diffraction tomography (iODT) method and applicat...

Supercontinuum light source comprising tapered microstructured opti...

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR MAPPING AND RANGE DETECTION

Multi-Channel Self-Mixing Interferometric Sensor

Laser Interferometer And Method Of Adjusting Optical Axis Of Laser...

Three-Wavelengths Interferometric Measuring Device And Method

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

Interferometric Measurement System Using Time-Correlated Photons

LONG COHERENCE RANGE OPTICAL ANALYSIS

Microstructured Optical Fiber, Supercontinuum Light Source Comprisi...

RAPID COHERENT SYNTHETIC WAVELENGTH INTERFEROMETRIC ABSOLUTE DISTAN...

INTERFEROMETRIC SYSTEM WITH DEEP LEARNING ALGORITHM TO PROCESS TWO...

OPTICAL TOMOGRAPHY SYSTEM AND METHOD OF USING

OPTICAL TOMOGRAPHY SYSTEM AND METHOD OF USING

SINGLE FRAME-TILTED WAVE INTERFEROMETER

A POSITIONING SYSTEM, A LITHOGRAPHIC APPARATUS, AN ABSOLUTE POSITIO...

Quantum Interferometer with Improved Entangled Photon Identification

THREE-DIMENSIONAL MEASUREMENT DEVICE

Laser Interferometer

OPTICAL INTERFERENCE RANGE SENSOR

LASER INTERFEROMETER

THREE-DIMENSIONAL MEASUREMENT DEVICE

METHOD FOR CALIBRATION OF AN OPTICAL MEASUREMENT SYSTEM AND OPTICAL...

LIGHT-SHEET PHOTONIC-FORCE OPTICAL COHERENCE ELASTOGRAPHY

HETERODYNE LIGHT SOURCE FOR USE IN METROLOGY SYSTEM

MULTI-FREQUENCY HYBRID HETERODYNE LASER TRACKER SYSTEM BASED ON SIN...

Wavelength Tracking System, Method to Calibrate a Wavelength Tracki...

FREQUENCY SHIFTER FOR HETERODYNE INTERFEROMETRY MEASUREMENTS AND DE...

DEVICE AND METHOD FOR MEASURING LASER DISPLACEMENT

SYSTEM FOR PRECISION DISPLACEMENT MEASUREMENT BASED ON SELF-TRACEAB...

GEOMETRIC TOOLS AND METHODS TO MEASURE CLOSURE PHASE FOR ROBUST FEA...

COMPOSITE MEASUREMENT SYSTEM FOR MEASURING NANOMETER DISPLACEMENT