Two or more interferometric channels or interferometers

Industry

CPC
G01B9/02027

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02027Two or more interferometric channels or interferometers

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Self-configuration and error correction in linear photonic circuits
- Patent number 12,174,018
- Issue date Dec 24, 2024
- Massachusetts Institute of Technology
- Ryan Hamerly
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomography system
- Patent number 12,140,426
- Issue date Nov 12, 2024
- AIT Austrian Institute of Technology GmbH
- Rainer Hainberger
- G01 - MEASURING TESTING
Information Patent Grant
Four-quadrant interferometry system based on an integrated array wa...
- Patent number 12,140,425
- Issue date Nov 12, 2024
- National Institute of Metrology, China
- Xiaofei Diao
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, systems and methods for detecting light
- Patent number 12,072,188
- Issue date Aug 27, 2024
- PANTECH CORPORATION
- Xin Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Parallel optical coherence tomography apparatuses, systems, and rel...
- Patent number 12,029,481
- Issue date Jul 9, 2024
- Digital Diagnostics Inc.
- Michael D. Abramoff
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus with cantilever light guide
- Patent number 11,828,592
- Issue date Nov 28, 2023
- Nokia Technologies Oy
- David Bitauld
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring interfaces of an optical element
- Patent number 11,808,656
- Issue date Nov 7, 2023
- FOGALE NANOTECH
- Alain Courteville
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne grating interferometric method and system for two-degree...
- Patent number 11,802,757
- Issue date Oct 31, 2023
- Harbin Institute of Technology
- Pengcheng Hu
- G01 - MEASURING TESTING
Information Patent Grant
System, method, and computer-accessible medium for subsurface capil...
- Patent number 11,771,321
- Issue date Oct 3, 2023
- The Research Foundation for SUNY
- Yingtian Pan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
System for spatial multiplexing
- Patent number 11,768,068
- Issue date Sep 26, 2023
- Ramot at Tel Aviv University Ltd.
- Natan Tzvi Shaked
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Heterodyne photonic integrated circuit for absolute metrology
- Patent number 11,703,317
- Issue date Jul 18, 2023
- Raytheon Company
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
Multi-fiber optical probe and optical coherence tomography system
- Patent number 11,701,004
- Issue date Jul 18, 2023
- SYNAPTIVE MEDICAL INC.
- Siu Wai Jacky Mak
- G01 - MEASURING TESTING
Information Patent Grant
Differential height measurement using interstitial mirror plate
- Patent number 11,566,887
- Issue date Jan 31, 2023
- KLA Corporation
- Frank Chilese
- G01 - MEASURING TESTING
Information Patent Grant
Chamber for vibrational and environmental isolation of thin wafers
- Patent number 11,555,791
- Issue date Jan 17, 2023
- Corning Incorporated
- John Weston Frankovich
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for interferometric measurement of a two or three...
- Patent number 11,493,325
- Issue date Nov 8, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Lun Kai Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Fast phase-shift interferometry by laser frequency shift
- Patent number 11,469,571
- Issue date Oct 11, 2022
- KLA Corporation
- Haifeng Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for automatic detection of error conditions in...
- Patent number 11,429,900
- Issue date Aug 30, 2022
- Tractian Limited
- Igor Vinicius Alvarenga Marinelli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Single sideband frequency modulated laser measurement for detecting...
- Patent number 11,415,406
- Issue date Aug 16, 2022
- Mitutoyo Corporation
- Shinji Komatsuzaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser interference device
- Patent number 11,353,315
- Issue date Jun 7, 2022
- Mitutoyo Corporation
- Yuichiro Yokoyama
- G02 - OPTICS
Information Patent Grant
Swept frequency photonic integrated circuit for absolute metrology
- Patent number 11,320,255
- Issue date May 3, 2022
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Grant
Two-degree-of-freedom heterodyne grating interferometry measurement...
- Patent number 11,307,018
- Issue date Apr 19, 2022
- Tsinghua University
- Yu Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Grey-mode scanning scatterometry overlay metrology
- Patent number 11,300,405
- Issue date Apr 12, 2022
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Differential sinusoidal phase modulation laser interferometric nano...
- Patent number 11,255,655
- Issue date Feb 22, 2022
- Zhejiang Sci-Tech University
- Liping Yan
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne photonic integrated circuit for absolute metrology
- Patent number 11,221,204
- Issue date Jan 11, 2022
- Raytheon Company
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
All-optical ultrasonic detection device based on light-induced ultr...
- Patent number 11,209,259
- Issue date Dec 28, 2021
- Beihang University
- Jianguo Ma
- G01 - MEASURING TESTING
Information Patent Grant
Multi-fiber optical probe and optical coherence tomography system
- Patent number 11,202,572
- Issue date Dec 21, 2021
- SYNAPTIVE MEDICAL INC.
- Siu Wai Jacky Mak
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Coherent receiver array
- Patent number 11,187,517
- Issue date Nov 30, 2021
- Acacia Communications, Inc.
- Christopher Doerr
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry systems and methods
- Patent number 11,162,781
- Issue date Nov 2, 2021
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Multi-probe gauge for slab characterization
- Patent number 11,112,234
- Issue date Sep 7, 2021
- APPLEJACK 199 L.P.
- Wojciech J. Walecki
- G01 - MEASURING TESTING
Information Patent Grant
Multi-probe gauge for slab characterization
- Patent number 11,073,372
- Issue date Jul 27, 2021
- APPLEJACK 199 L.P.
- Wojciech J. Walecki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PARALLEL OPTICAL COHERENCE TOMOGRAPHY APPARATUSES, SYSTEMS, AND REL...
- Publication number 20240324875
- Publication date Oct 3, 2024
- Digital Diagnostics Inc.
- Michael D. Abramoff
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
INTERFEROMETRIC DISPLACEMENT MEASUREMENT APPARATUS
- Publication number 20240310158
- Publication date Sep 19, 2024
- Oxford University Innovation Limited
- Armin REICHOLD
- G01 - MEASURING TESTING
Information Patent Application
On-Chip Opto-Digital Wavelength Meter
- Publication number 20240175672
- Publication date May 30, 2024
- Axalume, Inc.
- Yossef Ehrlichman
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE, SYSTEM AND METHOD FOR DETERMINATION OF INCIDENCE...
- Publication number 20230375337
- Publication date Nov 23, 2023
- Valstybinis Moksliniu Tyrimu Institutas Fiziniu Ir Technologijos Mokslu Centras
- Julijanas ZELUDEVICIUS
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERFERENCE RANGE SENSOR
- Publication number 20230288188
- Publication date Sep 14, 2023
- Omron Corporation
- Yusuke NAGASAKI
- G01 - MEASURING TESTING
Information Patent Application
COMPACT SNAPSHOT DUAL-MODE INTERFEROMETRIC SYSTEM
- Publication number 20230168075
- Publication date Jun 1, 2023
- Arizona Board of Regents on behalf of The University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Application
FOUR-QUADRANT INTERFEROMETRY SYSTEM BASED ON AN INTEGRATED ARRAY WA...
- Publication number 20230127285
- Publication date Apr 27, 2023
- National Institute of Metrology,China
- Xiaofei Diao
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING THE POSITION OF AN ELEMENT OF AN...
- Publication number 20230013339
- Publication date Jan 19, 2023
- Adige S.p.A.
- Simone Donadello
- G01 - MEASURING TESTING
Information Patent Application
Self-Configuration and Error Correction in Linear Photonic Circuits
- Publication number 20220397383
- Publication date Dec 15, 2022
- Ryan HAMERLY
- G01 - MEASURING TESTING
Information Patent Application
PARALLEL OPTICAL SCANNING INSPECTION DEVICE
- Publication number 20220341724
- Publication date Oct 27, 2022
- Opxion Technology Incorporation
- WEN-JU CHEN
- G01 - MEASURING TESTING
Information Patent Application
2D Material Detector for Activity Monitoring of Single Living Micro...
- Publication number 20220313091
- Publication date Oct 6, 2022
- Technische Universiteit Delft
- Farbod Alijani
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR SPATIAL MULTIPLEXING
- Publication number 20220307815
- Publication date Sep 29, 2022
- Ramot at Tel Aviv University Ltd.
- Natan Tzvi SHAKED
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY SYSTEM
- Publication number 20220290970
- Publication date Sep 15, 2022
- AIT AUSTRIAN INSTITUTE OF TECHNOLOGY GMBH
- Rainer HAINBERGER
- G01 - MEASURING TESTING
Information Patent Application
HIGH-RESOLUTION PHASE DETECTION METHOD AND SYSTEM BASED ON PLANE GR...
- Publication number 20220196383
- Publication date Jun 23, 2022
- TSINGHUA UNIVERSITY
- Yu ZHU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, SYSTEMS AND METHODS FOR DETECTING LIGHT
- Publication number 20220196385
- Publication date Jun 23, 2022
- Nokia Technologies Oy
- Xin YUAN
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY
- Publication number 20220187055
- Publication date Jun 16, 2022
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Application
HIGH-SPEED, DENTAL OPTICAL COHERENCE TOMOGRAPHY SYSTEM
- Publication number 20220133446
- Publication date May 5, 2022
- CARESTREAM DENTAL LLC
- Xiaodong TAO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
HETERODYNE GRATING INTERFEROMETRIC METHOD AND SYSTEM FOR TWO-DEGREE...
- Publication number 20220090907
- Publication date Mar 24, 2022
- HARBIN INSTITUTE OF TECHNOLOGY
- Pengcheng HU
- G01 - MEASURING TESTING
Information Patent Application
MULTI-FIBER OPTICAL PROBE AND OPTICAL COHERENCE TOMOGRAPHY SYSTEM
- Publication number 20220071492
- Publication date Mar 10, 2022
- SYNAPTIVE MEDICAL INC.
- Siu Wai Jacky Mak
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
GREY-MODE SCANNING SCATTEROMETRY OVERLAY METROLOGY
- Publication number 20220034652
- Publication date Feb 3, 2022
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY SYSTEMS AND METHODS
- Publication number 20220003540
- Publication date Jan 6, 2022
- University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
LASER INTERFERENCE DEVICE
- Publication number 20210293523
- Publication date Sep 23, 2021
- MITUTOYO CORPORATION
- Yuichiro YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL SINUSOIDAL PHASE MODULATION LASER INTERFEROMETRIC NANO...
- Publication number 20210199418
- Publication date Jul 1, 2021
- ZHEJIANG SCI-TECH UNIVERSITY
- Liping YAN
- G01 - MEASURING TESTING
Information Patent Application
LASER APPARATUS, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD
- Publication number 20210190474
- Publication date Jun 24, 2021
- MITUTOYO CORPORATION
- Shinji KOMATSUZAKI
- G01 - MEASURING TESTING
Information Patent Application
TWO-DEGREE-OF-FREEDOM HETERODYNE GRATING INTERFEROMETRY MEASUREMENT...
- Publication number 20210164772
- Publication date Jun 3, 2021
- TSINGHUA UNIVERSITY
- Yu ZHU
- G01 - MEASURING TESTING
Information Patent Application
FAST PHASE-SHIFT INTERFEROMETRY BY LASER FREQUENCY SHIFT
- Publication number 20210159667
- Publication date May 27, 2021
- KLA Corporation
- Haifeng Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARALLEL OPTICAL COHERENCE TOMOGRAPHY APPARATUSES, SYSTEMS, AND REL...
- Publication number 20200383566
- Publication date Dec 10, 2020
- IDx Technologies, Inc.
- Michael Abramoff
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
APPARATUS COMPRISING A CANTILEVER
- Publication number 20200318943
- Publication date Oct 8, 2020
- Nokia Technologies Oy
- David Bitauld
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY SYSTEM
- Publication number 20200225021
- Publication date Jul 16, 2020
- SVISION IMAGING LIMITED
- Xing WEI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MULTI-PROBE GAUGE FOR SLAB CHARACTERIZATION
- Publication number 20200149867
- Publication date May 14, 2020
- Applejack 199 L.P.
- Wojciech J. WALECKI
- G01 - MEASURING TESTING

Two or more interferometric channels or interferometers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Self-configuration and error correction in linear photonic circuits

Optical coherence tomography system

Four-quadrant interferometry system based on an integrated array wa...

Apparatus, systems and methods for detecting light

Parallel optical coherence tomography apparatuses, systems, and rel...

Apparatus with cantilever light guide

Device and method for measuring interfaces of an optical element

Heterodyne grating interferometric method and system for two-degree...

System, method, and computer-accessible medium for subsurface capil...

System for spatial multiplexing

Heterodyne photonic integrated circuit for absolute metrology

Multi-fiber optical probe and optical coherence tomography system

Differential height measurement using interstitial mirror plate

Chamber for vibrational and environmental isolation of thin wafers

Device and method for interferometric measurement of a two or three...

Fast phase-shift interferometry by laser frequency shift

Systems and methods for automatic detection of error conditions in...

Single sideband frequency modulated laser measurement for detecting...

Laser interference device

Swept frequency photonic integrated circuit for absolute metrology

Two-degree-of-freedom heterodyne grating interferometry measurement...

Grey-mode scanning scatterometry overlay metrology

Differential sinusoidal phase modulation laser interferometric nano...

Heterodyne photonic integrated circuit for absolute metrology

All-optical ultrasonic detection device based on light-induced ultr...

Multi-fiber optical probe and optical coherence tomography system

Coherent receiver array

Interferometry systems and methods

Multi-probe gauge for slab characterization

Multi-probe gauge for slab characterization

Patents Applicationslast 30 patents

PARALLEL OPTICAL COHERENCE TOMOGRAPHY APPARATUSES, SYSTEMS, AND REL...

INTERFEROMETRIC DISPLACEMENT MEASUREMENT APPARATUS

On-Chip Opto-Digital Wavelength Meter

DETECTION DEVICE, SYSTEM AND METHOD FOR DETERMINATION OF INCIDENCE...

OPTICAL INTERFERENCE RANGE SENSOR

COMPACT SNAPSHOT DUAL-MODE INTERFEROMETRIC SYSTEM

FOUR-QUADRANT INTERFEROMETRY SYSTEM BASED ON AN INTEGRATED ARRAY WA...

METHOD AND SYSTEM FOR DETERMINING THE POSITION OF AN ELEMENT OF AN...

Self-Configuration and Error Correction in Linear Photonic Circuits

PARALLEL OPTICAL SCANNING INSPECTION DEVICE

2D Material Detector for Activity Monitoring of Single Living Micro...

SYSTEM FOR SPATIAL MULTIPLEXING

OPTICAL COHERENCE TOMOGRAPHY SYSTEM

HIGH-RESOLUTION PHASE DETECTION METHOD AND SYSTEM BASED ON PLANE GR...

APPARATUS, SYSTEMS AND METHODS FOR DETECTING LIGHT

HETERODYNE PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY

HIGH-SPEED, DENTAL OPTICAL COHERENCE TOMOGRAPHY SYSTEM

HETERODYNE GRATING INTERFEROMETRIC METHOD AND SYSTEM FOR TWO-DEGREE...

MULTI-FIBER OPTICAL PROBE AND OPTICAL COHERENCE TOMOGRAPHY SYSTEM

GREY-MODE SCANNING SCATTEROMETRY OVERLAY METROLOGY

INTERFEROMETRY SYSTEMS AND METHODS

LASER INTERFERENCE DEVICE

DIFFERENTIAL SINUSOIDAL PHASE MODULATION LASER INTERFEROMETRIC NANO...

LASER APPARATUS, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD

TWO-DEGREE-OF-FREEDOM HETERODYNE GRATING INTERFEROMETRY MEASUREMENT...

FAST PHASE-SHIFT INTERFEROMETRY BY LASER FREQUENCY SHIFT

PARALLEL OPTICAL COHERENCE TOMOGRAPHY APPARATUSES, SYSTEMS, AND REL...

APPARATUS COMPRISING A CANTILEVER

OPTICAL COHERENCE TOMOGRAPHY SYSTEM

MULTI-PROBE GAUGE FOR SLAB CHARACTERIZATION