Two or more reference or object arms in one interferometer

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CPC
G01B9/02028

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02028Two or more reference or object arms in one interferometer

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Systems, methods, and media for multiple reference arm spectral dom...
- Patent number 12,181,280
- Issue date Dec 31, 2024
- The General Hospital Corporation
- Guillermo J. Tearney
- G01 - MEASURING TESTING
Information Patent Grant
Composite measurement system for measuring nanometer displacement
- Patent number 12,174,017
- Issue date Dec 24, 2024
- National Institute of Metrology, China
- Yushu Shi
- G01 - MEASURING TESTING
Information Patent Grant
Parallel optical coherence tomography apparatuses, systems, and rel...
- Patent number 12,029,481
- Issue date Jul 9, 2024
- Digital Diagnostics Inc.
- Michael D. Abramoff
- G01 - MEASURING TESTING
Information Patent Grant
System and method for correcting optical path length measurement er...
- Patent number 11,920,928
- Issue date Mar 5, 2024
- Tokyo Electron Limited
- Kenji Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measurement method and interferometric measurement...
- Patent number 11,879,721
- Issue date Jan 23, 2024
- Carl Zeiss SMT GmbH
- Alexander Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Multi-environment Rayleigh interferometer
- Patent number 11,761,750
- Issue date Sep 19, 2023
- Aaron Pung
- G01 - MEASURING TESTING
Information Patent Grant
Demodulation of fiber optic interferometric sensors
- Patent number 11,747,133
- Issue date Sep 5, 2023
- Board of Trustees of Michigan State University
- Ming Han
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and media for multiple reference arm spectral dom...
- Patent number 11,713,961
- Issue date Aug 1, 2023
- The General Hospital Corporation
- Guillermo J. Tearney
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne photonic integrated circuit for absolute metrology
- Patent number 11,703,317
- Issue date Jul 18, 2023
- Raytheon Company
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
Multi-fiber optical probe and optical coherence tomography system
- Patent number 11,701,004
- Issue date Jul 18, 2023
- SYNAPTIVE MEDICAL INC.
- Siu Wai Jacky Mak
- G01 - MEASURING TESTING
Information Patent Grant
High dynamic range picometer metrology systems and methods
- Patent number 11,598,628
- Issue date Mar 7, 2023
- Ball Aerospace & Technologies Corp.
- Jordan Wachs
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device for determining a distance between a laser process...
- Patent number 11,549,798
- Issue date Jan 10, 2023
- Precitec GmbH & Co. KG
- Matthias Strebel
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Wavelength tracking system, method to calibrate a wavelength tracki...
- Patent number 11,525,737
- Issue date Dec 13, 2022
- ASML Netherland B.V.
- Maarten Jozef Jansen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electronic speckle pattern interferometer (ESPI) for long-range mea...
- Patent number 11,525,667
- Issue date Dec 13, 2022
- United States of America as represented by the Secretary of the Air Force
- Jennie Burns
- G01 - MEASURING TESTING
Information Patent Grant
System and method for stabilization of multi-path optical interfero...
- Patent number 11,506,477
- Issue date Nov 22, 2022
- INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Mehedi Islam
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for interferometric measurement of a two or three...
- Patent number 11,493,325
- Issue date Nov 8, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Lun Kai Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Non-invasive optical detection system and method using partially ba...
- Patent number 11,448,496
- Issue date Sep 20, 2022
- HI LLC
- Haowen Ruan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
OCT system and OCT method
- Patent number 11,382,504
- Issue date Jul 12, 2022
- Haag-Streit AG
- Lucio Robledo
- G01 - MEASURING TESTING
Information Patent Grant
Fiber splitter device for digital holographic imaging and interfero...
- Patent number 11,340,438
- Issue date May 24, 2022
- Lyncee Tec S.A.
- Etienne Cuche
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for interferometry
- Patent number 11,333,484
- Issue date May 17, 2022
- Ariel Scientific Innovations Ltd.
- Shmuel Sternklar
- G01 - MEASURING TESTING
Information Patent Grant
Retro-interferometer having active readjustment
- Patent number 11,326,950
- Issue date May 10, 2022
- BRUKER OPTICS GMBH & CO. KG
- Axel Keens
- G02 - OPTICS
Information Patent Grant
Swept frequency photonic integrated circuit for absolute metrology
- Patent number 11,320,255
- Issue date May 3, 2022
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Grant
Methods for the stabilization of interferometric systems and interf...
- Patent number 11,313,667
- Issue date Apr 26, 2022
- LightOn SAS
- Kilian Müller
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer system and application thereof
- Patent number 11,231,271
- Issue date Jan 25, 2022
- Technology Innovation Momentum Fund (Israel) Limited Partnership
- Haim Suchowski
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne photonic integrated circuit for absolute metrology
- Patent number 11,221,204
- Issue date Jan 11, 2022
- Raytheon Company
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
Machining head for a laser machining device
- Patent number 11,219,967
- Issue date Jan 11, 2022
- Precitec Optronik GmbH
- Markus Kogel-Hollacher
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Multi-fiber optical probe and optical coherence tomography system
- Patent number 11,202,572
- Issue date Dec 21, 2021
- SYNAPTIVE MEDICAL INC.
- Siu Wai Jacky Mak
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Separated beams displacement measurement with a grating
- Patent number 11,156,449
- Issue date Oct 26, 2021
- Keysight Technologies, Inc.
- Greg C. Felix
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne laser interferometer based on integrated secondary beam...
- Patent number 11,150,077
- Issue date Oct 19, 2021
- Harbin Institute of Technology
- Pengcheng Hu
- G01 - MEASURING TESTING
Information Patent Grant
OCT apparatus
- Patent number 11,129,528
- Issue date Sep 28, 2021
- Nidek Co., Ltd.
- Keiji Murata
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR MAPPING AND RANGE DETECTION
- Publication number 20240384979
- Publication date Nov 21, 2024
- LIDWAVE LTD.
- Yehuda HAI VIDAL
- G01 - MEASURING TESTING
Information Patent Application
PARALLEL OPTICAL COHERENCE TOMOGRAPHY APPARATUSES, SYSTEMS, AND REL...
- Publication number 20240324875
- Publication date Oct 3, 2024
- Digital Diagnostics Inc.
- Michael D. Abramoff
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OPTICAL MEASUREMENT SYSTEM
- Publication number 20240035801
- Publication date Feb 1, 2024
- National Cheng Kung University
- Chien-Sheng Liu
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE REFERENCE ARM SPECTRAL DOM...
- Publication number 20230400293
- Publication date Dec 14, 2023
- The General Hospital Corporation
- Guillermo J. Tearney
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE BEAM OPTICAL COHERENCE TOM...
- Publication number 20230341222
- Publication date Oct 26, 2023
- The General Hospital Corporation
- Benjamin Vakoc
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM AND LITHOGRAPHIC APPARATUS
- Publication number 20230332880
- Publication date Oct 19, 2023
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G01 - MEASURING TESTING
Information Patent Application
Multi-environment Rayleigh Interferometer
- Publication number 20230273009
- Publication date Aug 31, 2023
- Utah State University Space Dynamics Laboratory
- Aaron Pung
- G02 - OPTICS
Information Patent Application
Wavelength Tracking System, Method to Calibrate a Wavelength Tracki...
- Publication number 20230056872
- Publication date Feb 23, 2023
- ASML NETHERLANDS B.V.
- Engelbertus Antonius Fransiscus VAN DER PASCH
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
COMPOSITE MEASUREMENT SYSTEM FOR MEASURING NANOMETER DISPLACEMENT
- Publication number 20220412719
- Publication date Dec 29, 2022
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- Yushu SHI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CORRECTING OPTICAL PATH LENGTH MEASUREMENT ER...
- Publication number 20220357146
- Publication date Nov 10, 2022
- TOKYO ELECTRON LIMITED
- Kenji NAGAI
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY
- Publication number 20220187055
- Publication date Jun 16, 2022
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Application
SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE REFERENCE ARM SPECTRAL DOM...
- Publication number 20220170732
- Publication date Jun 2, 2022
- The General Hospital Corporation
- Guillermo J. Tearney
- G01 - MEASURING TESTING
Information Patent Application
MULTI-FIBER OPTICAL PROBE AND OPTICAL COHERENCE TOMOGRAPHY SYSTEM
- Publication number 20220071492
- Publication date Mar 10, 2022
- SYNAPTIVE MEDICAL INC.
- Siu Wai Jacky Mak
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DEMODULATION OF FIBER OPTIC INTERFEROMETRIC SENSORS
- Publication number 20210333089
- Publication date Oct 28, 2021
- Board of Trustees of Michigan State University
- Ming HAN
- G01 - MEASURING TESTING
Information Patent Application
OCT SYSTEM AND OCT METHOD
- Publication number 20210244269
- Publication date Aug 12, 2021
- HAAG-STREIT AG
- Lucio Robledo
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM AND APPLICATION THEREOF
- Publication number 20210199419
- Publication date Jul 1, 2021
- Technology Innovation Momentum Fund (Israel) Limited Partnership
- Haim SUCHOWSKI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR STABALIZATION OF MULTI-PATH OPTICAL INTERFERO...
- Publication number 20210063136
- Publication date Mar 4, 2021
- Institut National de la Recherche Scientifique
- MEHEDI ISLAM
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR THE STABILIZATION OF NITERFEROMETRIC SYSTEMS AND INTERF...
- Publication number 20210041219
- Publication date Feb 11, 2021
- LightOn SAS
- Kilian Müller
- G01 - MEASURING TESTING
Information Patent Application
RETRO-INTERFEROMETER HAVING ACTIVE READADJUSTMENT
- Publication number 20210033381
- Publication date Feb 4, 2021
- Bruker Optik GmbH
- Axel KEENS
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR INTERFEROMETRY
- Publication number 20210033380
- Publication date Feb 4, 2021
- Ariel Scientific Innovations Ltd.
- Shmuel STERNKLAR
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE REFERENCE ARM SPECTRAL DOM...
- Publication number 20210025690
- Publication date Jan 28, 2021
- The General Hospital Corporation
- Guillermo J. Tearney
- G01 - MEASURING TESTING
Information Patent Application
PARALLEL OPTICAL COHERENCE TOMOGRAPHY APPARATUSES, SYSTEMS, AND REL...
- Publication number 20200383566
- Publication date Dec 10, 2020
- IDx Technologies, Inc.
- Michael Abramoff
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
PLANE WAVE IMAGER WITH SYNTHETIC APERTURE CAPABILITY
- Publication number 20200370878
- Publication date Nov 26, 2020
- Richard H. Vollmerhausen
- G01 - MEASURING TESTING
Information Patent Application
NON-INVASIVE OPTICAL DETECTION SYSTEM AND METHOD USING PARTIALLY BA...
- Publication number 20200333130
- Publication date Oct 22, 2020
- HI LLC
- Haowen Ruan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SPACE DIVISION MULTIPLEXING OPTICAL COHERENCE TOMOGRAPHY USING AN I...
- Publication number 20200166328
- Publication date May 28, 2020
- LEHIGH UNIVERSITY
- Chao Zhou
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
FOURIER-TRANSFORM INTERFEROMETER USING META SURFACE
- Publication number 20200110323
- Publication date Apr 9, 2020
- Samsung Electronics Co., Ltd.
- Yeonsang PARK
- G02 - OPTICS
Information Patent Application
MEASURING DEVICE FOR DETERMINING A DISTANCE BETWEEN A LASER PROCESS...
- Publication number 20200041249
- Publication date Feb 6, 2020
- Precitec GmbH & Co. KG
- Matthias Strebel
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ILLUMINATION APPARATUS
- Publication number 20190339055
- Publication date Nov 7, 2019
- OLYMPUS CORPORATION
- Daichi WATANABE
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY OF MULTI-LAYER STACKS
- Publication number 20190265023
- Publication date Aug 29, 2019
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
Single-Chip Optical Coherence Tomography Device
- Publication number 20190257640
- Publication date Aug 22, 2019
- IXA AMC Office / Academic Medical Center
- Bakiye Imran AVCI
- G01 - MEASURING TESTING

Two or more reference or object arms in one interferometer

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems, methods, and media for multiple reference arm spectral dom...

Composite measurement system for measuring nanometer displacement

Parallel optical coherence tomography apparatuses, systems, and rel...

System and method for correcting optical path length measurement er...

Interferometric measurement method and interferometric measurement...

Multi-environment Rayleigh interferometer

Demodulation of fiber optic interferometric sensors

Systems, methods, and media for multiple reference arm spectral dom...

Heterodyne photonic integrated circuit for absolute metrology

Multi-fiber optical probe and optical coherence tomography system

High dynamic range picometer metrology systems and methods

Measuring device for determining a distance between a laser process...

Wavelength tracking system, method to calibrate a wavelength tracki...

Electronic speckle pattern interferometer (ESPI) for long-range mea...

System and method for stabilization of multi-path optical interfero...

Device and method for interferometric measurement of a two or three...

Non-invasive optical detection system and method using partially ba...

OCT system and OCT method

Fiber splitter device for digital holographic imaging and interfero...

Method and system for interferometry

Retro-interferometer having active readjustment

Swept frequency photonic integrated circuit for absolute metrology

Methods for the stabilization of interferometric systems and interf...

Interferometer system and application thereof

Heterodyne photonic integrated circuit for absolute metrology

Machining head for a laser machining device

Multi-fiber optical probe and optical coherence tomography system

Separated beams displacement measurement with a grating

Heterodyne laser interferometer based on integrated secondary beam...

OCT apparatus

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR MAPPING AND RANGE DETECTION

PARALLEL OPTICAL COHERENCE TOMOGRAPHY APPARATUSES, SYSTEMS, AND REL...

OPTICAL MEASUREMENT SYSTEM

SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE REFERENCE ARM SPECTRAL DOM...

SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE BEAM OPTICAL COHERENCE TOM...

INTERFEROMETER SYSTEM AND LITHOGRAPHIC APPARATUS

Multi-environment Rayleigh Interferometer

Wavelength Tracking System, Method to Calibrate a Wavelength Tracki...

COMPOSITE MEASUREMENT SYSTEM FOR MEASURING NANOMETER DISPLACEMENT

SYSTEM AND METHOD FOR CORRECTING OPTICAL PATH LENGTH MEASUREMENT ER...

HETERODYNE PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY

SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE REFERENCE ARM SPECTRAL DOM...

MULTI-FIBER OPTICAL PROBE AND OPTICAL COHERENCE TOMOGRAPHY SYSTEM

DEMODULATION OF FIBER OPTIC INTERFEROMETRIC SENSORS

OCT SYSTEM AND OCT METHOD

INTERFEROMETER SYSTEM AND APPLICATION THEREOF

SYSTEM AND METHOD FOR STABALIZATION OF MULTI-PATH OPTICAL INTERFERO...

METHODS FOR THE STABILIZATION OF NITERFEROMETRIC SYSTEMS AND INTERF...

RETRO-INTERFEROMETER HAVING ACTIVE READADJUSTMENT

METHOD AND SYSTEM FOR INTERFEROMETRY

SYSTEMS, METHODS, AND MEDIA FOR MULTIPLE REFERENCE ARM SPECTRAL DOM...

PARALLEL OPTICAL COHERENCE TOMOGRAPHY APPARATUSES, SYSTEMS, AND REL...

PLANE WAVE IMAGER WITH SYNTHETIC APERTURE CAPABILITY

NON-INVASIVE OPTICAL DETECTION SYSTEM AND METHOD USING PARTIALLY BA...

SPACE DIVISION MULTIPLEXING OPTICAL COHERENCE TOMOGRAPHY USING AN I...

FOURIER-TRANSFORM INTERFEROMETER USING META SURFACE

MEASURING DEVICE FOR DETERMINING A DISTANCE BETWEEN A LASER PROCESS...

ILLUMINATION APPARATUS

METROLOGY OF MULTI-LAYER STACKS

Single-Chip Optical Coherence Tomography Device