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G01J2003/1842
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PHYSICS
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Measuring instruments
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MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2003/1842
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Patents Grants
last 30 patents
Information
Patent Grant
Manufacturing method of concave diffraction grating, concave diffra...
Patent number
11,391,871
Issue date
Jul 19, 2022
HITACHI HIGH-TECH CORPORATION
Kenta Yaegashi
G01 - MEASURING TESTING
Information
Patent Grant
Cubesat infrared atmospheric sounder (CIRAS)
Patent number
11,378,453
Issue date
Jul 5, 2022
California Institute of Technology
Thomas S. Pagano
G01 - MEASURING TESTING
Information
Patent Grant
Concave diffraction grating, method for producing the same, and opt...
Patent number
11,366,255
Issue date
Jun 21, 2022
HITACHI HIGH-TECH CORPORATION
Takanori Aono
G01 - MEASURING TESTING
Information
Patent Grant
Spectral resolution enhancement device
Patent number
11,307,096
Issue date
Apr 19, 2022
Huazhong University of Science & Technology
Chen Liu
G02 - OPTICS
Information
Patent Grant
Optical emission spectrometer with cascaded charge storage devices
Patent number
10,712,201
Issue date
Jul 14, 2020
Alexej Witzig
G01 - MEASURING TESTING
Information
Patent Grant
System and method for selective resolution for concave grating spec...
Patent number
10,571,334
Issue date
Feb 25, 2020
Horiba Instruments Incorporated
Harry Jerome Oana
G01 - MEASURING TESTING
Information
Patent Grant
Frame, spectroscope, spectrometry unit, and image forming apparatus
Patent number
10,444,073
Issue date
Oct 15, 2019
Ricoh Company, Ltd.
Hidetaka Noguchi
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer and manufacturing method thereof
Patent number
10,393,586
Issue date
Aug 27, 2019
OTO PHOTONICS INC.
Chien-Hsiang Hung
G01 - MEASURING TESTING
Information
Patent Grant
Compact spectroscopic optical instrument
Patent number
10,386,232
Issue date
Aug 20, 2019
Horiba Instruments Incorporated
Ronald Joseph Kovach
G01 - MEASURING TESTING
Information
Patent Grant
Method of spectrometer and spectrometer
Patent number
10,345,149
Issue date
Jul 9, 2019
GRADUATE SCHOOL AT SHENZHEN, TSINGHUA UNIVERSITY
Kai Ni
G01 - MEASURING TESTING
Information
Patent Grant
Optical sensor having external cavity laser outputting sensing and...
Patent number
10,211,596
Issue date
Feb 19, 2019
Electronics and Telecommunications Research Institute
Kwang Ryong Oh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Curved grating spectrometer and wavelength multiplexer or demultipl...
Patent number
9,939,320
Issue date
Apr 10, 2018
Electronic Photonic IC Inc. (EPIC Inc.)
Seng-Tiong Ho
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
SPECTROFEROMETER
Publication number
20230092539
Publication date
Mar 23, 2023
Layer Metrics Inc.
Dominic Murphy
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL RESOLUTION ENHANCEMENT DEVICE
Publication number
20210318170
Publication date
Oct 14, 2021
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
Chen LIU
G01 - MEASURING TESTING
Information
Patent Application
CONCAVE DIFFRACTION GRATING, METHOD FOR PRODUCING THE SAME, AND OPT...
Publication number
20210271008
Publication date
Sep 2, 2021
HITACHI HIGH-TECH CORPORATION
Takanori AONO
G01 - MEASURING TESTING
Information
Patent Application
MANUFACTURING METHOD OF CONCAVE DIFFRACTION GRATING, CONCAVE DIFFRA...
Publication number
20200278481
Publication date
Sep 3, 2020
Hitachi High-Technologies Corporation
Kenta YAEGASHI
G01 - MEASURING TESTING
Information
Patent Application
CUBESAT INFRARED ATMOSPHERIC SOUNDER (CIRAS)
Publication number
20200096388
Publication date
Mar 26, 2020
California Institute of Technology
Thomas S. Pagano
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER AND MANUFACTURING METHOD THEREOF
Publication number
20190339129
Publication date
Nov 7, 2019
OtO Photonics Inc.
CHIEN-HSIANG HUNG
G01 - MEASURING TESTING
Information
Patent Application
COMPACT SPECTROSCOPIC OPTICAL INSTRUMENT
Publication number
20190186991
Publication date
Jun 20, 2019
HORIBA INSTRUMENTS INCORPORATED
Ronald Joseph KOVACH
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL EMISSION SPECTROMETER WITH CASCADED CHARGE STORAGE DEVICES
Publication number
20190170580
Publication date
Jun 6, 2019
Bruker AXS GmbH
Alexej WITZIG
G01 - MEASURING TESTING
Information
Patent Application
MOBILE GRATING-DETECTOR ARRANGEMENT
Publication number
20180035961
Publication date
Feb 8, 2018
Siemens Healthcare GmbH
PETER BARTL
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER AND MANUFACTURING METHOD THEREOF
Publication number
20180017443
Publication date
Jan 18, 2018
OtO Photonics Inc.
Chien-Hsiang Hung
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SENSOR
Publication number
20170244218
Publication date
Aug 24, 2017
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
Kwang Ryong OH
G01 - MEASURING TESTING
Information
Patent Application
Curved Grating Spectrometer and Wavelength Multiplexer or Demultipl...
Publication number
20170102270
Publication date
Apr 13, 2017
Electronic Photonic IC Inc. (EPIC Inc.)
Seng-Tiong Ho
G02 - OPTICS
Information
Patent Application
METHOD OF SPECTROMETER AND SPECTROMETER
Publication number
20160320237
Publication date
Nov 3, 2016
GRADUATE SCHOOL AT SHENZHEN, TSINGHUA UNIVERSITY
Kai NI
G01 - MEASURING TESTING