Membership
Tour
Register
Log in
Use of plane parallel plate
Follow
Industry
CPC
G01J2003/067
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
Current Industry
G01J2003/067
Use of plane parallel plate
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Gas detector
Patent number
8,786,858
Issue date
Jul 22, 2014
IEE International Electronics & Engineering S.A.
Cécile Jouanique-Dubuis
G01 - MEASURING TESTING
Information
Patent Grant
Tunable interferometric scanning spectrometer
Patent number
8,717,573
Issue date
May 6, 2014
Lockheed Martin Corporation
Jason D. Mudge
G01 - MEASURING TESTING
Information
Patent Grant
Photodiode array spectrometer
Patent number
4,930,892
Issue date
Jun 5, 1990
Hewlett-Packard Company
Detlev Hadbawnik
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
GAS DETECTOR
Publication number
20130229658
Publication date
Sep 5, 2013
IEE International Electronics & Engineering S.A.
Cécile Jouanique-Dubuis
G01 - MEASURING TESTING
Information
Patent Application
Fourier-transform spectrometers
Publication number
20080068612
Publication date
Mar 20, 2008
Christopher J. Manning
G01 - MEASURING TESTING