using a design-rule based approach

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GPHYSICS G06Computing G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL G06T7/00Image analysis

Current Industry

G06T7/0006using a design-rule based approach

Industries

Patents Grantslast 30 patents

Information Patent Grant
Control of a manufacturing process using contour curvature analysis...
- Patent number 12,299,868
- Issue date May 13, 2025
- Applied Materials Israel Ltd.
- Einat Frishman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computing device for predicting a profile using deep learning and o...
- Patent number 12,299,869
- Issue date May 13, 2025
- Samsung Electronics Co., Ltd.
- Hyeok Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Experimental set up for studying temperature gradient driven cracking
- Patent number 12,288,320
- Issue date Apr 29, 2025
- University of South Carolina
- Travis Knight
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
FIB-SEM 3D tomography for measuring shape deviations of HAR structures
- Patent number 12,288,705
- Issue date Apr 29, 2025
- Carl Zeiss SMT GmbH
- Amir Avishai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Parameterizing x-ray scattering measurement using slice-and-image t...
- Patent number 12,288,706
- Issue date Apr 29, 2025
- Carl Zeiss SMT GmbH
- Hans Michael Stiepan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for predicting substrate image
- Patent number 12,271,114
- Issue date Apr 8, 2025
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Battery cell electrode alignment inspection method for battery pack...
- Patent number 12,266,093
- Issue date Apr 1, 2025
- Hyundai Motor Company
- Hokyeong Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fabricated layout correlation
- Patent number 12,260,160
- Issue date Mar 25, 2025
- Battelle Memorial Institute
- Adam Kimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method of measuring uniformity based on pupil image a...
- Patent number 12,260,539
- Issue date Mar 25, 2025
- Samsung Electronics Co., Ltd.
- Minho Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stack assist system
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- Issue date Mar 25, 2025
- SAT Technologies USA Holdings, Inc.
- Marcel van Schijndel
- B66 - HOISTING LIFTING HAULING
Information Patent Grant
Automated bot for error-free racking-stacking
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- Issue date Mar 18, 2025
- RELIANCE JIO INFOCOMM USA, INC.
- Arun Rajagopal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Intelligent real-time defect prediction, detection, and AI driven a...
- Patent number 12,254,383
- Issue date Mar 18, 2025
- Accenture Global Solutions Limited
- Shoban Babu Balasubramani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Real-time anomaly detection for industrial processes
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- Issue date Mar 18, 2025
- Intel Corporation
- Tara K. Thimmanaik
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for real-time quality control of a film in a sp...
- Patent number 12,255,110
- Issue date Mar 18, 2025
- Samsung Electronics Co., Ltd.
- Gaurav Kumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for inspection of IC devices
- Patent number 12,254,613
- Issue date Mar 18, 2025
- Battelle Memorial Institute
- Nicholas Darby
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ingot growing apparatus and monitoring method thereof
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- Issue date Mar 11, 2025
- SK SILTRON CO., LTD.
- Min Jae Yoon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for scanning wafer
- Patent number 12,243,218
- Issue date Mar 4, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Pei-Hsuan Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Localization of lens focus parameter estimation and subsequent came...
- Patent number 12,236,643
- Issue date Feb 25, 2025
- Edge 3 Technologies
- Tarek El Dokor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Unit or an apparatus for controlling or managing products or rolls
- Patent number 12,234,047
- Issue date Feb 25, 2025
- Pulsar S.r.l.
- Massimo Franzaroli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Variation trimming for re-programmable and/or reconfigurable analog...
- Patent number 12,236,179
- Issue date Feb 25, 2025
- ASPINITY, INC.
- Brandon David Rumberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fully automated SEM sampling system for e-beam image enhancement
- Patent number 12,230,013
- Issue date Feb 18, 2025
- ASML Netherlands B.V.
- Wentian Zhou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process recipe search apparatus, etching recipe search method and s...
- Patent number 12,222,690
- Issue date Feb 11, 2025
- HITACHI HIGH-TECH CORPORATION
- Takashi Dobashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for manufacturing personalized naturally designed mitral pro...
- Patent number 12,202,202
- Issue date Jan 21, 2025
- National University of Singapore
- Theodoros Kofidis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microscopic non-destructive measurement method of microstructure li...
- Patent number 12,190,495
- Issue date Jan 7, 2025
- NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Zhishan Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image measurement apparatus
- Patent number 12,190,494
- Issue date Jan 7, 2025
- Keyence Corporation
- Takashi Naruse
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Coating size correction method and apparatus, device, storage mediu...
- Patent number 12,182,988
- Issue date Dec 31, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
- Yinhang Tu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining optimal size and shape of additive manufactured packaging
- Patent number 12,182,478
- Issue date Dec 31, 2024
- International Business Machines Corporation
- Craig M. Trim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Processing image data sets
- Patent number 12,175,650
- Issue date Dec 24, 2024
- Carl Zeiss SMT GmbH
- Jens Timo Neumann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and non-transitory computer-readable medium for identifying...
- Patent number 12,175,652
- Issue date Dec 24, 2024
- NANYA TECHNOLOGY CORPORATION
- Ken-Huan Ho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cloud based smart alerting system for machine vision system
- Patent number 12,165,360
- Issue date Dec 10, 2024
- Samsara Inc.
- Anubhav Jain
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR EMPLOYING ADAPTIVE PIXEL SELECTOR TECHNIQUES...
- Publication number 20250157094
- Publication date May 15, 2025
- Bank of America Corporation
- Kumar Gaurav Gupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE MEASURING APPARATUS AND PROGRAM
- Publication number 20250116503
- Publication date Apr 10, 2025
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE MEASURING APPARATUS
- Publication number 20250116504
- Publication date Apr 10, 2025
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACTIVE LEARNING TO IMPROVE WAFER DEFECT CLASSIFICATION
- Publication number 20250117921
- Publication date Apr 10, 2025
- ASML NETHERLANDS B.V.
- Blagorodna ILIEVSKA ALCHEVA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD TO CALIBRATE, PREDICT, AND CONTROL STOCHASTIC DEFECTS IN EUV...
- Publication number 20250104216
- Publication date Mar 27, 2025
- KLA Corporation
- Pradeep Vukkadala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PROCESSING DATA DERIVED FROM A SAMPLE
- Publication number 20250095133
- Publication date Mar 20, 2025
- ASML NETHERLANDS B.V.
- Vincent Sylvester KUIPER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT RATE REDUCTION METHOD FOR FINISHED PRODUCTS BASED ON TRADEMA...
- Publication number 20250091750
- Publication date Mar 20, 2025
- HONGYUN HONGHE TOBACCO (GROUP) CO., LTD.
- Jun Jiao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LIQUID LEAKAGE DETECTION METHOD, APPARATUS, AND DEVICE, AND COMPUTE...
- Publication number 20250095140
- Publication date Mar 20, 2025
- CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
- Zhongbao HUANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONCENTRICITY OFFSET MEASUREMENT FOR HYBRID BONDING
- Publication number 20250086780
- Publication date Mar 13, 2025
- KLA Corporation
- Hemang Ashvinbhai Bhatt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PRODUCT DESIGN GENERATION ASSISTANCE DEVICE, PRODUCT DESIGN GENERAT...
- Publication number 20250086354
- Publication date Mar 13, 2025
- NEC Corporation
- Hanae Shimomura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD
- Publication number 20250086779
- Publication date Mar 13, 2025
- Kabushiki Kaisha Toshiba
- Hideo NISHIUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR ROAD CONDITION ASSESSMENT AND FEEDBACK
- Publication number 20250086985
- Publication date Mar 13, 2025
- Purdue Research Foundation
- Mohammad Reza Jahanshahi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR THE ASSESSMENT OF FATIGUE STRENGTH OF CELLU...
- Publication number 20250086353
- Publication date Mar 13, 2025
- GE AVIO S.r.L.
- Simone Romano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
JUDGMENT APPARATUS
- Publication number 20250076211
- Publication date Mar 6, 2025
- Kabushiki Kaisha Toshiba
- Tomoyuki YAHAGI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FULLY AUTOMATED SEM SAMPLING SYSTEM FOR E-BEAM IMAGE ENHANCEMENT
- Publication number 20250078478
- Publication date Mar 6, 2025
- ASML NETHERLANDS B.V.
- Wentian ZHOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electrode Cutting Device and Cell Manufacturing Device Comprising t...
- Publication number 20250079430
- Publication date Mar 6, 2025
- LG ENERGY SOLUTION, LTD.
- Taemin Hwang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING ROD-SHAPED ARTICLE, AND DEVICE AND...
- Publication number 20250069249
- Publication date Feb 27, 2025
- Japan Tobacco Inc.
- Satoshi NAKAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VARIATION TRIMMING FOR RE-PROGRAMMABLE AND/OR RECONFIGURABLE ANALOG...
- Publication number 20250068817
- Publication date Feb 27, 2025
- ASPINITY, INC.
- Brandon David RUMBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE INSPECTION EQUIPMENT AND IMAGE PROCESSING METHOD
- Publication number 20250061559
- Publication date Feb 20, 2025
- Hitachi High-Tech Corporation
- Kosuke FUKUDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Wafer Map Recognition Method Using Artificial Intelligence AND Comp...
- Publication number 20250054130
- Publication date Feb 13, 2025
- MEDIATEK INC.
- En Jen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Lug Defect Detection Method and System
- Publication number 20250037264
- Publication date Jan 30, 2025
- REPT BATTERO Energy Co., Ltd.
- Hui CAO
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Information Patent Application
METHOD FOR ADJUSTMENT OF A COMPONENT
- Publication number 20250029231
- Publication date Jan 23, 2025
- VOITH PATENT GmbH
- Jose Luiz CAMPOS SOUZA
- G06 - COMPUTING CALCULATING COUNTING
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OPTIMIZATION OF A METROLOGY ALGORITHM FOR EXAMINATION OF SEMICONDUC...
- Publication number 20240428395
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- APPLIED MATERIALS ISRAEL LTD.
- Rafael BISTRITZER
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INSPECTION METHOD AND SYSTEM FOR THREE-DIMENSIONAL IMAGE GEOMETRIC...
- Publication number 20240411940
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- Inventec (Pudong) Technology Corp.
- Hsueh-Liang Chen
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Metrology Apparatus And Method For Determining A Characteristic Of...
- Publication number 20240412067
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- ASML NETHERLANDS B.V.
- Lorenzo Tripodi
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Information Patent Application
MULTI-DEVICE AUTOMATED OPTICAL INSPECTION
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- Publication date Nov 28, 2024
- Nanotronics Imaging, Inc.
- Nadine Wong
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Information Patent Application
MOUNTING DEVICE AND MOUNTING METHOD
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- Samsung Electronics Co., Ltd.
- Takamasa Sugiura
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Information Patent Application
GRAPH-LEARNING NEURAL NETWORKS USING SPECTRAL DATA FOR DETECTION OF...
- Publication number 20240394538
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- The Boeing Company
- Qin Jiang
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Information Patent Application
DEFORMATION ANALYSIS DEVICE AND METHOD FOR SECONDARY BATTERY
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- Samsung SDI Co., Ltd.
- Seong Ho WOO
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Information Patent Application
ROLLER GAP MEASUREMENT SYSTEM USING LIGHT AND ROLLER GAP MEASUREMEN...
- Publication number 20240384982
- Publication date Nov 21, 2024
- Korea Institute of Machinery and Materials
- Dongwoo KANG
- G06 - COMPUTING CALCULATING COUNTING

using a design-rule based approach

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Control of a manufacturing process using contour curvature analysis...

Computing device for predicting a profile using deep learning and o...

Experimental set up for studying temperature gradient driven cracking

FIB-SEM 3D tomography for measuring shape deviations of HAR structures

Parameterizing x-ray scattering measurement using slice-and-image t...

Method and apparatus for predicting substrate image

Battery cell electrode alignment inspection method for battery pack...

Fabricated layout correlation

Apparatus and method of measuring uniformity based on pupil image a...

Stack assist system

Automated bot for error-free racking-stacking

Intelligent real-time defect prediction, detection, and AI driven a...

Real-time anomaly detection for industrial processes

Methods and systems for real-time quality control of a film in a sp...

Systems and methods for inspection of IC devices

Ingot growing apparatus and monitoring method thereof

Method and system for scanning wafer

Localization of lens focus parameter estimation and subsequent came...

Unit or an apparatus for controlling or managing products or rolls

Variation trimming for re-programmable and/or reconfigurable analog...

Fully automated SEM sampling system for e-beam image enhancement

Process recipe search apparatus, etching recipe search method and s...

Method for manufacturing personalized naturally designed mitral pro...

Microscopic non-destructive measurement method of microstructure li...

Image measurement apparatus

Coating size correction method and apparatus, device, storage mediu...

Determining optimal size and shape of additive manufactured packaging

Processing image data sets

System and non-transitory computer-readable medium for identifying...

Cloud based smart alerting system for machine vision system

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR EMPLOYING ADAPTIVE PIXEL SELECTOR TECHNIQUES...

IMAGE MEASURING APPARATUS AND PROGRAM

IMAGE MEASURING APPARATUS

ACTIVE LEARNING TO IMPROVE WAFER DEFECT CLASSIFICATION

METHOD TO CALIBRATE, PREDICT, AND CONTROL STOCHASTIC DEFECTS IN EUV...

METHOD OF PROCESSING DATA DERIVED FROM A SAMPLE

DEFECT RATE REDUCTION METHOD FOR FINISHED PRODUCTS BASED ON TRADEMA...

LIQUID LEAKAGE DETECTION METHOD, APPARATUS, AND DEVICE, AND COMPUTE...

CONCENTRICITY OFFSET MEASUREMENT FOR HYBRID BONDING

PRODUCT DESIGN GENERATION ASSISTANCE DEVICE, PRODUCT DESIGN GENERAT...

INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD

METHODS AND SYSTEMS FOR ROAD CONDITION ASSESSMENT AND FEEDBACK

SYSTEMS AND METHODS FOR THE ASSESSMENT OF FATIGUE STRENGTH OF CELLU...

JUDGMENT APPARATUS

FULLY AUTOMATED SEM SAMPLING SYSTEM FOR E-BEAM IMAGE ENHANCEMENT

Electrode Cutting Device and Cell Manufacturing Device Comprising t...

DEVICE AND METHOD FOR MEASURING ROD-SHAPED ARTICLE, AND DEVICE AND...

VARIATION TRIMMING FOR RE-PROGRAMMABLE AND/OR RECONFIGURABLE ANALOG...

IMAGE INSPECTION EQUIPMENT AND IMAGE PROCESSING METHOD

Wafer Map Recognition Method Using Artificial Intelligence AND Comp...

Lug Defect Detection Method and System

METHOD FOR ADJUSTMENT OF A COMPONENT

OPTIMIZATION OF A METROLOGY ALGORITHM FOR EXAMINATION OF SEMICONDUC...

INSPECTION METHOD AND SYSTEM FOR THREE-DIMENSIONAL IMAGE GEOMETRIC...

Metrology Apparatus And Method For Determining A Characteristic Of...

MULTI-DEVICE AUTOMATED OPTICAL INSPECTION

MOUNTING DEVICE AND MOUNTING METHOD

GRAPH-LEARNING NEURAL NETWORKS USING SPECTRAL DATA FOR DETECTION OF...

DEFORMATION ANALYSIS DEVICE AND METHOD FOR SECONDARY BATTERY

ROLLER GAP MEASUREMENT SYSTEM USING LIGHT AND ROLLER GAP MEASUREMEN...