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using a plurality of spring-mass systems being arranged on one common planar substrate, the systems not being mechanically coupled and the sensitive direction of each system being different
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G01P2015/0845
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PHYSICS
G01
Measuring instruments
G01P
MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
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G01P2015/0845
using a plurality of spring-mass systems being arranged on one common planar substrate, the systems not being mechanically coupled and the sensitive direction of each system being different
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Patents Grants
last 30 patents
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Patent Grant
MEMS tri-axial accelerometer with one or more decoupling elements
Patent number
11,650,221
Issue date
May 16, 2023
STMicroelectronics S.r.l.
Alessandro Tocchio
G01 - MEASURING TESTING
Information
Patent Grant
MEMS tri-axial accelerometer with one or more decoupling elements
Patent number
10,768,199
Issue date
Sep 8, 2020
STMicroelectronics S.r.l.
Alessandro Tocchio
G01 - MEASURING TESTING
Information
Patent Grant
Integrated motion processing unit (MPU) with MEMS inertial sensing...
Patent number
10,288,427
Issue date
May 14, 2019
Invensense, Inc.
Steven S. Nasiri
G01 - MEASURING TESTING
Information
Patent Grant
Micro-electro-mechanical system (MEMS) device with multi-dimensiona...
Patent number
9,733,269
Issue date
Aug 15, 2017
Richtek Technology Corporation
Yu-Wen Hsu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
MEMS-based dual and single proof-mass accelerometer methods and app...
Patent number
9,246,017
Issue date
Jan 26, 2016
MCube, Inc.
Dolf van der Heide
G01 - MEASURING TESTING
Information
Patent Grant
Three-dimensional micro-electro-mechanical-system sensor
Patent number
9,010,185
Issue date
Apr 21, 2015
Pixart Imaging Incorporation, R.O.C.
Ming-Han Tsai
G01 - MEASURING TESTING
Information
Patent Grant
Integrated motion processing unit (MPU) with MEMS inertial sensing...
Patent number
8,997,564
Issue date
Apr 7, 2015
Invensense, Inc.
Steven S. Nasiri
G01 - MEASURING TESTING
Information
Patent Grant
Element structure, inertia sensor, and electronic device
Patent number
8,950,259
Issue date
Feb 10, 2015
Seiko Epson Corporation
Shigekazu Takagi
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and method for manufacturing same
Patent number
8,946,786
Issue date
Feb 3, 2015
Rohm Co., Ltd.
Goro Nakatani
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Inertial force sensor
Patent number
8,857,258
Issue date
Oct 14, 2014
Panasonic Corporation
Hideo Ohkoshi
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity detector
Patent number
8,659,101
Issue date
Feb 25, 2014
Hitachi Automotive Systems, Ltd.
Kiyoko Yamanaka
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Acceleration sensor
Patent number
8,497,672
Issue date
Jul 30, 2013
Kabushiki Kaisha Toshiba
Takashi Kawakubo
G01 - MEASURING TESTING
Information
Patent Grant
Acceleration sensor
Patent number
8,327,708
Issue date
Dec 11, 2012
Panasonic Corporation
Isao Hattori
G01 - MEASURING TESTING
Information
Patent Grant
Integrated motion processing unit (MPU) with MEMS inertial sensing...
Patent number
8,250,921
Issue date
Aug 28, 2012
Invensense, Inc.
Steven S. Nasiri
G01 - MEASURING TESTING
Information
Patent Grant
Micromechanical capacitive acceleration sensor
Patent number
7,343,801
Issue date
Mar 18, 2008
Conti Temic microelectronic GmbH
Konrad Kapser
G01 - MEASURING TESTING
Information
Patent Grant
System for the measurement of acceleration in three axes
Patent number
6,122,965
Issue date
Sep 26, 2000
Temic Telefunken microelectronic GmbH
Helmut Seidel
G01 - MEASURING TESTING
Information
Patent Grant
Instrument for measuring accelerations and process of making the same
Patent number
5,065,628
Issue date
Nov 19, 1991
Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
Wolfgang Benecke
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INERTIAL SENSOR AND INERTIAL MEASUREMENT UNIT
Publication number
20230349945
Publication date
Nov 2, 2023
SEIKO EPSON CORPORATION
Teruo Takizawa
G01 - MEASURING TESTING
Information
Patent Application
MEMS TRI-AXIAL ACCELEROMETER WITH ONE OR MORE DECOUPLING ELEMENTS
Publication number
20230314469
Publication date
Oct 5, 2023
STMicroelectronics S.r.l.
Alessandro TOCCHIO
G01 - MEASURING TESTING
Information
Patent Application
DUAL AND TRIPLE AXIS ACCELEROMETERS
Publication number
20230204622
Publication date
Jun 29, 2023
CAMBRIDGE ENTERPRISE LIMITED
Ashwin SESHIA
G01 - MEASURING TESTING
Information
Patent Application
MEMS TRI-AXIAL ACCELEROMETER WITH ONE OR MORE DECOUPLING ELEMENTS
Publication number
20200363448
Publication date
Nov 19, 2020
STMicroelectronics S.r.l.
Alessandro TOCCHIO
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED MOTION PROCESSING UNIT (MPU) WITH MEMS INERTIAL SENSING...
Publication number
20190226848
Publication date
Jul 25, 2019
InvenSense, Inc.
Steven S. NASIRI
G01 - MEASURING TESTING
Information
Patent Application
INERTIAL FORCE SENSOR
Publication number
20140373626
Publication date
Dec 25, 2014
HIDEO OHKOSHI
G01 - MEASURING TESTING
Information
Patent Application
Physical Quantity Detector
Publication number
20130241013
Publication date
Sep 19, 2013
Hitachi Automotive Systems, Ltd.
Kiyoko Yamanaka
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MEMS-BASED DUAL AND SINGLE PROOF-MASS ACCELEROMETER METHODS AND APP...
Publication number
20130214367
Publication date
Aug 22, 2013
mCube, Incorporated
Dolf van der Heide
G01 - MEASURING TESTING
Information
Patent Application
Three-Dimensional Micro-Electro-Mechanical-System Sensor
Publication number
20130139595
Publication date
Jun 6, 2013
PixArt Imaging Incorporation, R.O.C.
Ming-Han Tsai
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
Publication number
20130099292
Publication date
Apr 25, 2013
Rohm Co., Ltd.
Goro Nakatani
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
INERTIA SENSING APPARATUS
Publication number
20130042686
Publication date
Feb 21, 2013
SITRONIX TECHNOLOGY CORP.
CHIUNG-WEN LIN
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED MOTION PROCESSING UNIT (MPU) WITH MEMS INERTIAL SENSING...
Publication number
20120253738
Publication date
Oct 4, 2012
INVENSENSE, INC.
Steven S. NASIRI
G01 - MEASURING TESTING
Information
Patent Application
Interconnection system on a plane adjacent to a solid-state device...
Publication number
20120126351
Publication date
May 24, 2012
Leslie Bruce Wilner
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ACCELERATION SENSOR
Publication number
20120125102
Publication date
May 24, 2012
PANASONIC CORPORATION
Isao Hattori
G01 - MEASURING TESTING
Information
Patent Application
MEMS SENSOR
Publication number
20120104520
Publication date
May 3, 2012
Alps Electric Co., Ltd.
Yoshitaka UTO
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Low Cost Optical Accelerometer
Publication number
20120024062
Publication date
Feb 2, 2012
Simeon E. Tiefel
G01 - MEASURING TESTING
Information
Patent Application
ELEMENT STRUCTURE, INERTIA SENSOR, AND ELECTRONIC DEVICE
Publication number
20110290023
Publication date
Dec 1, 2011
SEIKO EPSON CORPORATION
Shigekazu TAKAGI
G01 - MEASURING TESTING
Information
Patent Application
INERTIAL FORCE SENSOR
Publication number
20110271760
Publication date
Nov 10, 2011
PANASONIC CORPORATION
Hideo Ohkoshi
G01 - MEASURING TESTING
Information
Patent Application
ACCELERATION SENSOR
Publication number
20110234206
Publication date
Sep 29, 2011
Kabushiki Kaisha Toshiba
Takashi KAWAKUBO
G01 - MEASURING TESTING
Information
Patent Application
Integrated Motion Processing Unit (MPU) With MEMS Inertial Sensing...
Publication number
20090007661
Publication date
Jan 8, 2009
InvenSense Inc.
Steven S. NASIRI
G01 - MEASURING TESTING
Information
Patent Application
Micromechanical capacitive acceleration sensor
Publication number
20060156818
Publication date
Jul 20, 2006
Konrad Kapser
G01 - MEASURING TESTING
Information
Patent Application
Multiaxial monolithic acceleration sensor
Publication number
20060021436
Publication date
Feb 2, 2006
Konrad Kapser
G01 - MEASURING TESTING