using a solid target which is not previously vapourised

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H01J49/142

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/142using a solid target which is not previously vapourised

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 12,165,863
- Issue date Dec 10, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single cell analysis using secondary ion mass spectrometry
- Patent number 12,135,300
- Issue date Nov 5, 2024
- The Board of Trustees of the Leland Stanford Junior University
- Garry P. Nolan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer sample analysis method and device
- Patent number 12,033,313
- Issue date Jul 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Gaofeng Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Source-detector synchronization in multiplexed secondary ion mass s...
- Patent number 12,020,920
- Issue date Jun 25, 2024
- IONpath, Inc.
- David Stumbo
- G01 - MEASURING TESTING
Information Patent Grant
High resolution imaging apparatus and method
- Patent number 11,967,496
- Issue date Apr 23, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In situ chemical transformation and ionization of inorganic perchlo...
- Patent number 11,959,846
- Issue date Apr 16, 2024
- SMITHS DETECTION MONTREAL INC.
- Jan Hendrikse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectral tissue analysis
- Patent number 11,860,172
- Issue date Jan 2, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample analysis systems and methods of use thereof
- Patent number 11,837,455
- Issue date Dec 5, 2023
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 11,764,050
- Issue date Sep 19, 2023
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 11,430,647
- Issue date Aug 30, 2022
- NOVA MEASURING INSTRUMENTS, INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for determining a tumor margin in a tissue using a desorpti...
- Patent number 11,397,189
- Issue date Jul 26, 2022
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
- Patent number 11,391,681
- Issue date Jul 19, 2022
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and inspection method to qualify semiconductor st...
- Patent number 11,378,532
- Issue date Jul 5, 2022
- Carl Zeiss SMT GmbH
- Brett Lewis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample analysis systems and methods of use thereof
- Patent number 11,380,534
- Issue date Jul 5, 2022
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution imaging apparatus and method
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- Issue date Mar 1, 2022
- Fluidigm Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ambient ionisation spot measurement and validation
- Patent number 11,133,169
- Issue date Sep 28, 2021
- Micromass UK Limited
- Emrys Jones
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Extraction system for charged secondary particles for use in a mass...
- Patent number 11,101,123
- Issue date Aug 24, 2021
- Luxembourg Institute of Science and Technology (LIST)
- David Dowsett
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for measuring inert gas by ion probe
- Patent number 11,101,126
- Issue date Aug 24, 2021
- INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
- Yu Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Source-detector synchronization in multiplexed secondary ion mass s...
- Patent number 11,056,331
- Issue date Jul 6, 2021
- IONpath, Inc.
- David Stumbo
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectral tissue analysis
- Patent number 11,047,869
- Issue date Jun 29, 2021
- Purdue Research Foundation
- Robert Graham Cooks
- G01 - MEASURING TESTING
Information Patent Grant
Data directed DESI-MS imaging
- Patent number 11,031,230
- Issue date Jun 8, 2021
- Micromass UK Limited
- Emrys Jones
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry imaging with automatic parameter varying in ion s...
- Patent number 11,031,231
- Issue date Jun 8, 2021
- Micromass UK Limited
- Steven Derek Pringle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analyzer
- Patent number 10,971,349
- Issue date Apr 6, 2021
- Shimadzu Corporation
- Kei Kodera
- G01 - MEASURING TESTING
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 10,910,208
- Issue date Feb 2, 2021
- NOVA MEASURING INSTRUMENTS, INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
- Patent number 10,876,982
- Issue date Dec 29, 2020
- Ionwerks, Inc.
- J. Albert Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Extraction system for charged secondary particles for use in a mass...
- Patent number 10,770,278
- Issue date Sep 8, 2020
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- David Dowsett
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample analysis systems and methods of use thereof
- Patent number 10,720,316
- Issue date Jul 21, 2020
- Purdue Research Foundation
- Robert Graham Cooks
- G01 - MEASURING TESTING
Information Patent Grant
Cesium primary ion source for secondary ion mass spectrometer
- Patent number 10,672,602
- Issue date Jun 2, 2020
- Arizona Board of Regents on behalf of Arizona State University
- Peter Williams
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 10,636,644
- Issue date Apr 28, 2020
- Nova Measuring Instruments Inc.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface ion trap having a trapping location whose position is contr...
- Patent number 10,510,523
- Issue date Dec 17, 2019
- Duke University
- Jungsang Kim
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ION SOURCE ASSEMBLY
- Publication number 20240395530
- Publication date Nov 28, 2024
- Micromass UK Limited
- Andrew Whatley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CORRECTING AGE OF COLUMBITE-TANTALITE BY USING DOUBLE-RE...
- Publication number 20240377344
- Publication date Nov 14, 2024
- INSTITUTE OF GEOLOGY AND GEOPHYSICS CHINESE ACADEMY OF SCIENCES
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- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20240371622
- Publication date Nov 7, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTRAL TISSUE ANALYSIS
- Publication number 20240219410
- Publication date Jul 4, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF
- Publication number 20240170273
- Publication date May 23, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20240087869
- Publication date Mar 14, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20230091625
- Publication date Mar 23, 2023
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- G01 - MEASURING TESTING
Information Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
- Publication number 20220404298
- Publication date Dec 22, 2022
- Ionwerks, Inc.
- J. Albert Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER SAMPLE ANALYSIS METHOD AND DEVICE
- Publication number 20220318988
- Publication date Oct 6, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Gaofeng XU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF
- Publication number 20220301844
- Publication date Sep 22, 2022
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20220223398
- Publication date Jul 14, 2022
- FLUIDIGM CANADA INC.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED MICROFLUIDIC PROBE (IMFP) AND METHODS OF USE THEREOF
- Publication number 20220208538
- Publication date Jun 30, 2022
- Purdue Research Foundation
- Julia Laskin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOURCE-DETECTOR SYNCHRONIZATION IN MULTIPLEXED SECONDARY ION MASS S...
- Publication number 20220181137
- Publication date Jun 9, 2022
- IONpath, Inc.
- David Stumbo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTRAL TISSUE ANALYSIS
- Publication number 20210356480
- Publication date Nov 18, 2021
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY
- Publication number 20210310970
- Publication date Oct 7, 2021
- The Board of Trustees of the Leland Stanford Junior University
- Garry P. Nolan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20210305037
- Publication date Sep 30, 2021
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
- Publication number 20210116402
- Publication date Apr 22, 2021
- Ionwerks, Inc.
- J. Albert Schultz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD TO QUALIFY SEMICONDUCTOR ST...
- Publication number 20210109046
- Publication date Apr 15, 2021
- Carl Zeiss SMT GMBH
- Brett Lewis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF
- Publication number 20200312650
- Publication date Oct 1, 2020
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN SITU CHEMICAL TRANSFORMATION AND IONIZATION OF INORGANIC PERCHLO...
- Publication number 20200271557
- Publication date Aug 27, 2020
- SMITHS DETECTION MONTREAL INC.
- Jan HENDRIKSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20200258733
- Publication date Aug 13, 2020
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Extraction System For Charged Secondary Particles For Use In A Mass...
- Publication number 20200058480
- Publication date Feb 20, 2020
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- David Dowsett
- G01 - MEASURING TESTING
Information Patent Application
Extraction System For Charged Secondary Particles For Use In A Mass...
- Publication number 20200058481
- Publication date Feb 20, 2020
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- David Dowsett
- G01 - MEASURING TESTING
Information Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
- Publication number 20200013606
- Publication date Jan 9, 2020
- Ionwerks, Inc.
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- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20190385831
- Publication date Dec 19, 2019
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- G01 - MEASURING TESTING
Information Patent Application
SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY
- Publication number 20190339250
- Publication date Nov 7, 2019
- The Board of Trustees of the Leland Stanford Junior University
- Garry P. Nolan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA DIRECTED DESI-MS IMAGING
- Publication number 20190304768
- Publication date Oct 3, 2019
- Micromass UK Limited
- Emrys Jones
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY IMAGING
- Publication number 20190295834
- Publication date Sep 26, 2019
- Micromass UK Limited
- Steven Derek Pringle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING MASS SPECTROMETER
- Publication number 20190272984
- Publication date Sep 5, 2019
- SHIMADZU CORPORATION
- Kengo TAKESHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AMBIENT IONISATION SPOT MEASUREMENT AND VALIDATION
- Publication number 20190198307
- Publication date Jun 27, 2019
- Micromass UK Limited
- Emrys Jones
- H01 - BASIC ELECTRIC ELEMENTS

using a solid target which is not previously vapourised

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and approaches for semiconductor metrology and surface anal...

Single cell analysis using secondary ion mass spectrometry

Wafer sample analysis method and device

Source-detector synchronization in multiplexed secondary ion mass s...

High resolution imaging apparatus and method

In situ chemical transformation and ionization of inorganic perchlo...

Mass spectral tissue analysis

Sample analysis systems and methods of use thereof

Systems and approaches for semiconductor metrology and surface anal...

Systems and approaches for semiconductor metrology and surface anal...

Methods for determining a tumor margin in a tissue using a desorpti...

Nanoparticulate assisted nanoscale molecular imaging by mass spectr...

Inspection system and inspection method to qualify semiconductor st...

Sample analysis systems and methods of use thereof

High resolution imaging apparatus and method

Ambient ionisation spot measurement and validation

Extraction system for charged secondary particles for use in a mass...

Method and system for measuring inert gas by ion probe

Source-detector synchronization in multiplexed secondary ion mass s...

Mass spectral tissue analysis

Data directed DESI-MS imaging

Mass spectrometry imaging with automatic parameter varying in ion s...

Ion analyzer

Systems and approaches for semiconductor metrology and surface anal...

Nanoparticulate assisted nanoscale molecular imaging by mass spectr...

Extraction system for charged secondary particles for use in a mass...

Sample analysis systems and methods of use thereof

Cesium primary ion source for secondary ion mass spectrometer

Systems and approaches for semiconductor metrology and surface anal...

Surface ion trap having a trapping location whose position is contr...

Patents Applicationslast 30 patents

ION SOURCE ASSEMBLY

METHOD FOR CORRECTING AGE OF COLUMBITE-TANTALITE BY USING DOUBLE-RE...

HIGH RESOLUTION IMAGING APPARATUS AND METHOD

MASS SPECTRAL TISSUE ANALYSIS

SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...

WAFER SAMPLE ANALYSIS METHOD AND DEVICE

SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF

HIGH RESOLUTION IMAGING APPARATUS AND METHOD

INTEGRATED MICROFLUIDIC PROBE (IMFP) AND METHODS OF USE THEREOF

SOURCE-DETECTOR SYNCHRONIZATION IN MULTIPLEXED SECONDARY ION MASS S...

MASS SPECTRAL TISSUE ANALYSIS

SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...

INSPECTION SYSTEM AND INSPECTION METHOD TO QUALIFY SEMICONDUCTOR ST...

SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF

IN SITU CHEMICAL TRANSFORMATION AND IONIZATION OF INORGANIC PERCHLO...

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

Extraction System For Charged Secondary Particles For Use In A Mass...

Extraction System For Charged Secondary Particles For Use In A Mass...

NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY

DATA DIRECTED DESI-MS IMAGING

MASS SPECTROMETRY IMAGING

IMAGING MASS SPECTROMETER

AMBIENT IONISATION SPOT MEASUREMENT AND VALIDATION