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using absorption using polarisation using extinction effect
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G01J5/58
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Measuring instruments
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MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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Radiation pyrometry
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G01J5/58
using absorption using polarisation using extinction effect
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last 30 patents
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Thermal measurement system
Patent number
12,098,958
Issue date
Sep 24, 2024
Unison Industries, LLC
Aaron Jay Knobloch
G01 - MEASURING TESTING
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Patent Grant
Etalon thermometry for plasma environments
Patent number
12,078,547
Issue date
Sep 3, 2024
Applied Materials, Inc.
Bruce E. Adams
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Workpiece processing apparatus with thermal processing systems
Patent number
12,046,489
Issue date
Jul 23, 2024
Beijing E-Town Semiconductor Technology Co., Ltd.
Rolf Bremensdorfer
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Combined near and mid infrared sensor in a chip scale package
Patent number
11,953,380
Issue date
Apr 9, 2024
NEXTINPUT, INC.
Ali Foughi
G01 - MEASURING TESTING
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Patent Grant
Long-wave infrared sensor and electronic device including the same
Patent number
11,906,365
Issue date
Feb 20, 2024
Samsung Electronics Co., Ltd.
Byungkyu Lee
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Grant
Continuous spectra transmission pyrometry
Patent number
11,703,391
Issue date
Jul 18, 2023
Applied Materials, Inc.
Samuel C. Howells
G01 - MEASURING TESTING
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Patent Grant
Detection component including black pixels and method for manufactu...
Patent number
11,652,119
Issue date
May 16, 2023
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Jérôme Le Perchec
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
System for measuring gas temperature and component concentrations i...
Patent number
11,644,415
Issue date
May 9, 2023
CHONGQING INSTITUTE OF EAST CHINA NORMAL UNIVERSITY
Heping Zeng
G01 - MEASURING TESTING
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Radiation temperature measuring device
Patent number
11,629,998
Issue date
Apr 18, 2023
Asahi Kasei Kabushiki Kaisha
Hiroyuki Sasaki
G01 - MEASURING TESTING
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Security system with temperature sensing
Patent number
11,495,067
Issue date
Nov 8, 2022
Johnson Controls Tyco IP Holdings LLP
Nikhil D. Mirkar
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
MEMS device having curved reflective layer and method for manufactu...
Patent number
11,359,973
Issue date
Jun 14, 2022
Korea Advanced Institute of Science and Technology
Jong-Kwon Lee
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Component sensor
Patent number
11,320,372
Issue date
May 3, 2022
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Takafumi Okudo
G01 - MEASURING TESTING
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Patent Grant
Laser noise elimination in transmission thermometry
Patent number
11,292,079
Issue date
Apr 5, 2022
Applied Materials, Inc.
Jiping Li
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Patent Grant
Frequency-selective metasurface integrated uncooled microbolometers
Patent number
11,118,981
Issue date
Sep 14, 2021
The Curators of the University of Missouri
Mahmoud Almasri
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Circuit interrupter and method of determining contact wear based up...
Patent number
11,004,620
Issue date
May 11, 2021
EATON INTELLIGENT POWER LIMITED
James Jeffery Benke
G01 - MEASURING TESTING
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Patent Grant
3D polarimetric face recognition system
Patent number
10,915,737
Issue date
Feb 9, 2021
The United States of America as represented by the Secretary of the Army
Shuowen Hu
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Apparatus and method for online and real-time detection of temperat...
Patent number
10,908,024
Issue date
Feb 2, 2021
AK OPTICS TECHNOLOGY CO., LTD.
Dong Yan
G01 - MEASURING TESTING
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Radiation temperature measuring device
Patent number
10,890,488
Issue date
Jan 12, 2021
Asahi Kasei Kabushiki Kaisha
Hiroyuki Sasaki
G01 - MEASURING TESTING
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Indicator device and method
Patent number
10,871,405
Issue date
Dec 22, 2020
The Boeing Company
Paul G. Vahey
G01 - MEASURING TESTING
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Continuous spectra transmission pyrometry
Patent number
10,845,249
Issue date
Nov 24, 2020
Applied Materials, Inc.
Samuel C. Howells
G01 - MEASURING TESTING
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Radiometry device
Patent number
10,816,407
Issue date
Oct 27, 2020
INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATIONHIG
Osamu Tajima
G01 - MEASURING TESTING
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Infrared imaging detector
Patent number
10,788,372
Issue date
Sep 29, 2020
IRnova AB
Anders Gamfeldt
G01 - MEASURING TESTING
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Infrared imaging detector
Patent number
10,527,497
Issue date
Jan 7, 2020
IRnova AB
Anders Gamfeldt
G01 - MEASURING TESTING
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Patent Grant
Short wave infrared polarimeter
Patent number
10,451,483
Issue date
Oct 22, 2019
Polaris Sensor Technologies, Inc.
J Larry Pezzaniti
G01 - MEASURING TESTING
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Patent Grant
Laser noise elimination in transmission thermometry
Patent number
10,421,151
Issue date
Sep 24, 2019
Applied Materials, Inc.
Jiping Li
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Patent Grant
Method and system for visualising infrared electromagnetic radiatio...
Patent number
10,260,955
Issue date
Apr 16, 2019
Universite de Bordeaux
Eric Freysz
G01 - MEASURING TESTING
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Patent Grant
System and process for calibrating pyrometers in thermal processing...
Patent number
10,190,915
Issue date
Jan 29, 2019
Mattson Technology, Inc.
Paul Janis Timans
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Short wave infrared polarimeter
Patent number
10,031,026
Issue date
Jul 24, 2018
Polaris Sensor Technologies, Inc.
J Larry Pezzaniti
G02 - OPTICS
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Patent Grant
Optical temperature sensor and method of controlling same
Patent number
9,885,612
Issue date
Feb 6, 2018
Tokyo Electron Limited
Kenichiro Yamada
G01 - MEASURING TESTING
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Electromagnetic (EM) power density and field characterization techn...
Patent number
9,876,969
Issue date
Jan 23, 2018
The United States of America as represented by the Secretary of the Navy
Peter Marandos
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
ETALON THERMOMETRY FOR PLASMA ENVIRONMENTS
Publication number
20240385048
Publication date
Nov 21, 2024
Applied Materials, Inc.
Bruce E. ADAMS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Workpiece Processing Apparatus with Thermal Processing Systems
Publication number
20240347356
Publication date
Oct 17, 2024
Beijing E-Town Semiconductor Technology Co., Ltd.
Rolf Bremensdorfer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LONG WAVELENGTH INFRARED SENSOR AND ELECTRONIC DEVICE INCLUDING THE...
Publication number
20230213390
Publication date
Jul 6, 2023
Samsung Electronics Co., Ltd.
Jinmyoung KIM
G01 - MEASURING TESTING
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Patent Application
ELECTRONIC DEVICE INCLUDING A PLURALITY OF TEMPERATURE SENSORS
Publication number
20230184599
Publication date
Jun 15, 2023
Samsung Electronics Co., Ltd.
Seongwook JO
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Patent Application
INFRARED SENSING DEVICE AND VARIABLE RESISTANCE FILM INCLUDED IN TH...
Publication number
20230184592
Publication date
Jun 15, 2023
KYOTO UNIVERSITY
Masanori SAKAMOTO
G01 - MEASURING TESTING
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Patent Application
LONG-WAVE INFRARED SENSOR AND ELECTRONIC DEVICE INCLUDING THE SAME
Publication number
20230124189
Publication date
Apr 20, 2023
Samsung Electronics Co., Ltd.
Byungkyu LEE
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
ETALON THERMOMETRY FOR PLASMA ENVIRONMENTS
Publication number
20230102821
Publication date
Mar 30, 2023
Applied Materials, Inc.
Bruce E. ADAMS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PHOTONIC BOLOMETER AND PERFORMING BROADBAND HIGH-ABSORPTION PHOTONI...
Publication number
20230032022
Publication date
Feb 2, 2023
Government of the United States of America, as Represented by the Secretary o...
Nikolai Nikolaevich Klimov
G01 - MEASURING TESTING
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Patent Application
HOTSPOT MONITORING SYSTEM FOR SUPERCONDUCTING DEVICE
Publication number
20220291049
Publication date
Sep 15, 2022
ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
Zhisheng YANG
G01 - MEASURING TESTING
Information
Patent Application
THERMAL MEASUREMENT SYSTEM
Publication number
20220228923
Publication date
Jul 21, 2022
UNISON INDUSTRIES, LLC
Aaron Jay Knobloch
G01 - MEASURING TESTING
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Patent Application
COMBINED NEAR AND MID INFRARED SENSOR IN A CHIP SCALE PACKAGE
Publication number
20220214223
Publication date
Jul 7, 2022
Ali FOUGHI
G01 - MEASURING TESTING
Information
Patent Application
Workpiece Processing Apparatus with Thermal Processing Systems
Publication number
20220208572
Publication date
Jun 30, 2022
Mattson Technology, Inc.
Rolf Bremensdorfer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SECURITY SYSTEM WITH TEMPERATURE SENSING
Publication number
20220051497
Publication date
Feb 17, 2022
SENSORMATIC ELECTRONICS, LLC
Nikhil D. MIRKAR
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
TEMPERATURE MEASUREMENT APPARATUS, TEMPERATURE MEASUREMENT SYSTEM,...
Publication number
20220034723
Publication date
Feb 3, 2022
YOKOGAWA ELECTRIC CORPORATION
Junichi OGAWA
G01 - MEASURING TESTING
Information
Patent Application
MEMS DEVICE HAVING CURVED REFLECTIVE LAYER AND METHOD FOR MANUFACTU...
Publication number
20210278282
Publication date
Sep 9, 2021
Korea Advanced Institute of Science and Technology
Jong-Kwon LEE
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SYSTEM FOR MEASURING GAS TEMPERATURE AND COMPONENT CONCENTRATIONS I...
Publication number
20210255095
Publication date
Aug 19, 2021
Chongqing Institute of East China Normal University
Heping ZENG
G01 - MEASURING TESTING
Information
Patent Application
DETECTION COMPONENT INCLUDING BLACK PIXELS AND METHOD FOR MANUFACTU...
Publication number
20210199863
Publication date
Jul 1, 2021
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Jérôme LE PERCHEC
G02 - OPTICS
Information
Patent Application
RADIATION TEMPERATURE MEASURING DEVICE
Publication number
20210088385
Publication date
Mar 25, 2021
Asahi Kasei Kabushiki Kaisha
Hiroyuki Sasaki
G01 - MEASURING TESTING
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Patent Application
CONTINUOUS SPECTRA TRANSMISSION PYROMETRY
Publication number
20210055165
Publication date
Feb 25, 2021
Applied Materials, Inc.
Samuel C. Howells
G01 - MEASURING TESTING
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Patent Application
Circuit Interrupter and Method of Determining Contact Wear Based Up...
Publication number
20200303138
Publication date
Sep 24, 2020
Eaton Intelligent Power Limited
James Jeffery Benke
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
3D POLARIMETRIC FACE RECOGNTION SYSTEM
Publication number
20200285838
Publication date
Sep 10, 2020
U.S. Army Research Laboratory
Shuowen Hu
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
COMPONENT SENSOR
Publication number
20200232917
Publication date
Jul 23, 2020
Panasonic Intellectual Property Management Co., Ltd.
TAKAFUMI OKUDO
G01 - MEASURING TESTING
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Patent Application
INFRARED IMAGING DETECTOR
Publication number
20200080898
Publication date
Mar 12, 2020
Anders Gamfeldt
G01 - MEASURING TESTING
Information
Patent Application
Frequency-Selective Metasurface Integrated Uncooled Microbolometers
Publication number
20200025619
Publication date
Jan 23, 2020
THE CURATORS OF THE UNIVERSITY OF MISSOURI
Mahmoud Almasri
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR ONLINE AND REAL-TIME DETECTION OF TEMPERAT...
Publication number
20190346308
Publication date
Nov 14, 2019
BEI OPTICS TECHNOLOGY COMPANY LIMITED
DONG YAN
G01 - MEASURING TESTING
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Patent Application
INFRARED IMAGING DETECTOR
Publication number
20190187000
Publication date
Jun 20, 2019
Anders Gamfeldt
G01 - MEASURING TESTING
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Patent Application
RADIOMETRY DEVICE
Publication number
20190049310
Publication date
Feb 14, 2019
INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION HIGH ENERGY ACCELERATOR RESEA...
Tajima Osamu
G01 - MEASURING TESTING
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Patent Application
SHORT WAVE INFRARED POLARIMETER
Publication number
20180094980
Publication date
Apr 5, 2018
Polaris Sensor Technologies, Inc.
J Larry PEZZANITI
G02 - OPTICS
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Patent Application
SYSTEMS, METHODS, AND APPARATUS FOR SENSITIVE THERMAL IMAGING
Publication number
20180095306
Publication date
Apr 5, 2018
Robert K. Reich
G02 - OPTICS
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Patent Application
METHOD AND SYSTEM FOR VISUALISING INFRARED ELECTROMAGNETIC RADIATIO...
Publication number
20170010161
Publication date
Jan 12, 2017
UNIVERSITE DE BORDEAUX
Eric FREYSZ
G01 - MEASURING TESTING