using an intermediate adapter

Industry

CPC
G01R1/07378

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/07378using an intermediate adapter

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Probe head and probe card comprising same
- Patent number 12,169,212
- Issue date Dec 17, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and probe card comprising same
- Patent number 12,135,338
- Issue date Nov 5, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Maintaining the shape of a circuit board
- Patent number 12,127,334
- Issue date Oct 22, 2024
- Dis Tech America, LLC
- Heng-Kit Too
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe card and wafer testing assembly thereof
- Patent number 12,099,078
- Issue date Sep 24, 2024
- MPI Corporation
- Yi-Chien Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for electronic devices and corresponding probe card
- Patent number 12,032,003
- Issue date Jul 9, 2024
- Technoprobe, S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of integrated substrate
- Patent number 12,009,329
- Issue date Jun 11, 2024
- Dyi-Chung Hu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection jig and board inspection apparatus including the same
- Patent number 11,988,687
- Issue date May 21, 2024
- NIDEC READ CORPORATION
- Kohei Tsumura
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for reduced-pitch applications
- Patent number 11,953,522
- Issue date Apr 9, 2024
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Portable probe card assembly
- Patent number 11,933,816
- Issue date Mar 19, 2024
- Celadon Systems, Inc.
- William A. Funk
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,921,133
- Issue date Mar 5, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Probe card structure
- Patent number 11,879,913
- Issue date Jan 23, 2024
- XINZHUO TECHNOLOGY (ZHEJIANG) CO., LTD.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe arrays and improved methods for making using tempora...
- Patent number 11,828,775
- Issue date Nov 28, 2023
- Microfabrica Inc.
- Michael S. Lockard
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,808,788
- Issue date Nov 7, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Relay pogo charged device model tester using electrostatic discharg...
- Patent number 11,782,083
- Issue date Oct 10, 2023
- Wei Huang
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for a testing apparatus of electronic devices
- Patent number 11,782,075
- Issue date Oct 10, 2023
- TECHNOPROBE S.P.A.
- Riccardo Liberini
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and testing equipment thereof
- Patent number 11,761,984
- Issue date Sep 19, 2023
- TECAT TECHNOLOGIES (SUZHOU) LIMITED
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Anodic aluminum oxide structure, probe head having same, and probe...
- Patent number 11,696,398
- Issue date Jul 4, 2023
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Interposer test structures and methods
- Patent number 11,682,593
- Issue date Jun 20, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tzuan-Horng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,668,732
- Issue date Jun 6, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for testing wafer
- Patent number 11,630,129
- Issue date Apr 18, 2023
- PRO-2000 Co., LTD
- Jun Soo Cho
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and die set having horizontally fine adjustable die and...
- Patent number 11,619,656
- Issue date Apr 4, 2023
- MPI Corporation
- Chin-Yi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Test probing structure
- Patent number 11,585,831
- Issue date Feb 21, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mill-Jer Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Board-like connector, dual-ring bridge of board-like connector, and...
- Patent number 11,561,244
- Issue date Jan 24, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and corresponding testing head of an apparatus for te...
- Patent number 11,549,965
- Issue date Jan 10, 2023
- Technoprobe S.p.A.
- Daniele Perego
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and spring-like probe
- Patent number 11,460,486
- Issue date Oct 4, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and relative probe head of an apparatus for testing e...
- Patent number 11,442,080
- Issue date Sep 13, 2022
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for high frequency signal test and medium or low frequen...
- Patent number 11,346,860
- Issue date May 31, 2022
- MPI Corporation
- Chin-Tien Yang
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever contact probe and corresponding probe head
- Patent number 11,307,221
- Issue date Apr 19, 2022
- Technoprobe S.p.A.
- Riccardo Vettori
- G01 - MEASURING TESTING
Information Patent Grant
Split thin-film probe card
- Patent number 11,287,446
- Issue date Mar 29, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
High density and fine pitch interconnect structures in an electric...
- Patent number 11,249,113
- Issue date Feb 15, 2022
- Intel Corporation
- Pooya Tadayon
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PORTABLE PROBE CARD ASSEMBLY
- Publication number 20240219423
- Publication date Jul 4, 2024
- Celadon Systems, Inc.
- William A. FUNK
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
- Publication number 20240151744
- Publication date May 9, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
CRYOGENIC PROBE CARD
- Publication number 20240118315
- Publication date Apr 11, 2024
- Nielson Scientific, LLC
- Gregory NIELSON
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE ARRAYS AND IMPROVED METHODS FOR MAKING USING TEMPORA...
- Publication number 20240061017
- Publication date Feb 22, 2024
- Microfabrica Inc.
- MIchael S. Lockard
- G01 - MEASURING TESTING
Information Patent Application
PACKAGE STRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20240061037
- Publication date Feb 22, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hao-Cheng Hou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE HEAD AND VERTICAL PROBE CARD COMPRISING THE SAME
- Publication number 20230393172
- Publication date Dec 7, 2023
- Silicon Future Manufacturing Company Ltd.
- WEN-TSUNG SUNG
- G01 - MEASURING TESTING
Information Patent Application
Abbreviated Loopback Attenuation
- Publication number 20230393174
- Publication date Dec 7, 2023
- Ernest Gammon McReynolds
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR PROTECTING PROBE CARD AND PROBES USING THE...
- Publication number 20230358787
- Publication date Nov 9, 2023
- Intel Corporation
- Arthur ISAKHAROV
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
- Publication number 20230333142
- Publication date Oct 19, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND MANUFACTURING METHOD THEREOF
- Publication number 20230266364
- Publication date Aug 24, 2023
- Silicon Future Manufacturing Company Ltd.
- CHIA-HSIANG YU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND SEMICONDUCTOR TEST METHOD USING THE SAME
- Publication number 20230221351
- Publication date Jul 13, 2023
- Samsung Electronics Co., Ltd.
- BYUNGWOOK CHOI
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20230160926
- Publication date May 25, 2023
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD AND PROBE CARD COMPRISING SAME
- Publication number 20230152350
- Publication date May 18, 2023
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND TESTING EQUIPMENT THEREOF
- Publication number 20230147867
- Publication date May 11, 2023
- TECAT TECHNOLOGIES (SUZHOU) LIMITED
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION JIG AND BOARD INSPECTION APPARATUS INCLUDING THE SAME
- Publication number 20230117705
- Publication date Apr 20, 2023
- NIDEC-READ CORPORATION
- Kohei TSUMURA
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND WAFER TESTING ASSEMBLY THEREOF
- Publication number 20230065896
- Publication date Mar 2, 2023
- MPI Corporation
- Yi-Chien Tsai
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD STRUCTURE
- Publication number 20230025864
- Publication date Jan 26, 2023
- teCat Technologies (Suzhou) Limited
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR REDUCED-PITCH APPLICATIONS
- Publication number 20230021227
- Publication date Jan 19, 2023
- TECHNOPROBE S.P.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND SPRING-LIKE PROBE
- Publication number 20220334145
- Publication date Oct 20, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- G01 - MEASURING TESTING
Information Patent Application
INTERPOSER AND MANUFACTURING METHOD THEREOF
- Publication number 20220254708
- Publication date Aug 11, 2022
- Dyi-Chung HU
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD AND DIE SET HAVING HORIZONTALLY FINE ADJUSTABLE DIE AND...
- Publication number 20220214379
- Publication date Jul 7, 2022
- MPI Corporation
- CHIN-YI LIN
- G01 - MEASURING TESTING
Information Patent Application
PORTABLE PROBE CARD ASSEMBLY
- Publication number 20220163562
- Publication date May 26, 2022
- Celadon Systems, Inc.
- William A. FUNK
- G01 - MEASURING TESTING
Information Patent Application
Probe head for electronic devices and corresponding probe card
- Publication number 20220155348
- Publication date May 19, 2022
- Technoprobe, S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
BOARD-LIKE CONNECTOR, DUAL-RING BRIDGE OF BOARD-LIKE CONNECTOR, AND...
- Publication number 20220137095
- Publication date May 5, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD FOR TESTING WAFER
- Publication number 20220128602
- Publication date Apr 28, 2022
- PRO-2000 Co., LTD
- Jun Soo CHO
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES
- Publication number 20220099703
- Publication date Mar 31, 2022
- Technoprobe S.p.A.
- Riccardo LIBERINI
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND FAN-OUT PROBE THEREOF
- Publication number 20220011346
- Publication date Jan 13, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING METHOD OF INTEGRATED SUBSTRATE
- Publication number 20210382088
- Publication date Dec 9, 2021
- Dyi-Chung HU
- G01 - MEASURING TESTING
Information Patent Application
THIN-FILM PROBE CARD AND TEST MODULE THEREOF
- Publication number 20210349129
- Publication date Nov 11, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING
Information Patent Application
SPLIT THIN-FILM PROBE CARD AND ELASTIC MODULE THEREOF
- Publication number 20210325430
- Publication date Oct 21, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- WEN-TSUNG LEE
- G01 - MEASURING TESTING

using an intermediate adapter

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Probe head and probe card comprising same

Probe head and probe card comprising same

Maintaining the shape of a circuit board

Probe card and wafer testing assembly thereof

Probe head for electronic devices and corresponding probe card

Manufacturing method of integrated substrate

Inspection jig and board inspection apparatus including the same

Probe head for reduced-pitch applications

Portable probe card assembly

Testing head having improved frequency properties

Probe card structure

Vertical probe arrays and improved methods for making using tempora...

Testing head having improved frequency properties

Relay pogo charged device model tester using electrostatic discharg...

Probe card for a testing apparatus of electronic devices

Probe card device and testing equipment thereof

Anodic aluminum oxide structure, probe head having same, and probe...

Interposer test structures and methods

Testing head having improved frequency properties

Probe card for testing wafer

Probe head and die set having horizontally fine adjustable die and...

Test probing structure

Board-like connector, dual-ring bridge of board-like connector, and...

Contact probe and corresponding testing head of an apparatus for te...

Probe card device and spring-like probe

Contact probe and relative probe head of an apparatus for testing e...

Probe head for high frequency signal test and medium or low frequen...

Cantilever contact probe and corresponding probe head

Split thin-film probe card

High density and fine pitch interconnect structures in an electric...

Patents Applicationslast 30 patents

PORTABLE PROBE CARD ASSEMBLY

TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES

CRYOGENIC PROBE CARD

VERTICAL PROBE ARRAYS AND IMPROVED METHODS FOR MAKING USING TEMPORA...

PACKAGE STRUCTURE AND MANUFACTURING METHOD THEREOF

PROBE HEAD AND VERTICAL PROBE CARD COMPRISING THE SAME

Abbreviated Loopback Attenuation

APPARATUS AND METHOD FOR PROTECTING PROBE CARD AND PROBES USING THE...

TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES

PROBE CARD AND MANUFACTURING METHOD THEREOF

PROBE CARD AND SEMICONDUCTOR TEST METHOD USING THE SAME

PROBE CARD

PROBE HEAD AND PROBE CARD COMPRISING SAME

PROBE CARD DEVICE AND TESTING EQUIPMENT THEREOF

INSPECTION JIG AND BOARD INSPECTION APPARATUS INCLUDING THE SAME

PROBE CARD AND WAFER TESTING ASSEMBLY THEREOF

PROBE CARD STRUCTURE

PROBE HEAD FOR REDUCED-PITCH APPLICATIONS

PROBE CARD DEVICE AND SPRING-LIKE PROBE

INTERPOSER AND MANUFACTURING METHOD THEREOF

PROBE HEAD AND DIE SET HAVING HORIZONTALLY FINE ADJUSTABLE DIE AND...

PORTABLE PROBE CARD ASSEMBLY

Probe head for electronic devices and corresponding probe card

BOARD-LIKE CONNECTOR, DUAL-RING BRIDGE OF BOARD-LIKE CONNECTOR, AND...

PROBE CARD FOR TESTING WAFER

PROBE CARD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES

PROBE CARD DEVICE AND FAN-OUT PROBE THEREOF

MANUFACTURING METHOD OF INTEGRATED SUBSTRATE

THIN-FILM PROBE CARD AND TEST MODULE THEREOF

SPLIT THIN-FILM PROBE CARD AND ELASTIC MODULE THEREOF