using an intermediate card or back card with apertures through which the probes pass

Industry

CPC
G01R1/07371

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/07371using an intermediate card or back card with apertures through which the probes pass

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Probe unit
- Patent number 11,994,535
- Issue date May 28, 2024
- NHK Spring Co., Ltd.
- Tsuyoshi Inuma
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for a testing apparatus of electronic devices with enhan...
- Patent number 11,971,449
- Issue date Apr 30, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device having a probe structure with a protrusion portion
- Patent number 11,965,912
- Issue date Apr 23, 2024
- XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,921,133
- Issue date Mar 5, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe head having an improved contact with a device under...
- Patent number 11,867,723
- Issue date Jan 9, 2024
- Technoprobe S.p.A.
- Stefano Felici
- G01 - MEASURING TESTING
Information Patent Grant
Testing head with improved frequency property
- Patent number 11,828,774
- Issue date Nov 28, 2023
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,808,788
- Issue date Nov 7, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,668,732
- Issue date Jun 6, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for testing a pattern formed on a wafer
- Patent number 11,619,655
- Issue date Apr 4, 2023
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Small pitch integrated knife edge temporary bonding microstructures
- Patent number 11,555,830
- Issue date Jan 17, 2023
- HRL Laboratories, LLC
- Erik S. Daniel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe head and probe card having same
- Patent number 11,543,432
- Issue date Jan 3, 2023
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for depopulating pins from contactor test socke...
- Patent number 11,493,535
- Issue date Nov 8, 2022
- Texas Instruments Incorporated
- Kay Chan Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ceramic, probe guiding member, probe card, and socket for package i...
- Patent number 11,485,686
- Issue date Nov 1, 2022
- FERROTEC MATERIAL TECHNOLOGIES CORPORATION
- Wataru Yamagishi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection jig, inspection device, and contact terminal
- Patent number 11,467,186
- Issue date Oct 11, 2022
- Nidec-Read Corporation
- Norihiro Ota
- G01 - MEASURING TESTING
Information Patent Grant
Direct metalized guide plate
- Patent number 11,460,485
- Issue date Oct 4, 2022
- FormFactor, Inc.
- Jason William Cosman
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Contact probe and relative probe head of an apparatus for testing e...
- Patent number 11,442,080
- Issue date Sep 13, 2022
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connection device
- Patent number 11,378,591
- Issue date Jul 5, 2022
- Kabushiki Kaisha Nihon Micronics
- Kenichi Tsuruta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe device and method of adjusting the same
- Patent number 11,340,263
- Issue date May 24, 2022
- Tokyo Electron Limited
- Muneaki Tamura
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe for a testing head for testing high-frequency devices
- Patent number 11,340,262
- Issue date May 24, 2022
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Probe device of floating structure
- Patent number 11,320,460
- Issue date May 3, 2022
- Phoenixon Controls Inc.
- Ki Sool Nah
- G01 - MEASURING TESTING
Information Patent Grant
Fine pitch probe card methods and systems
- Patent number 11,262,384
- Issue date Mar 1, 2022
- Intel Corporation
- Pooya Tadayon
- G01 - MEASURING TESTING
Information Patent Grant
Electronic test device
- Patent number 11,215,642
- Issue date Jan 4, 2022
- Winway Technology Co., Ltd.
- Kuan-Chung Chen
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for a testing apparatus of electronic devices with enhan...
- Patent number 11,163,004
- Issue date Nov 2, 2021
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,035,885
- Issue date Jun 15, 2021
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe testing head with improved frequency properties
- Patent number 11,029,337
- Issue date Jun 8, 2021
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and relative probe head of an apparatus for testing e...
- Patent number 11,016,122
- Issue date May 25, 2021
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Probe card board, probe card, and inspection apparatus
- Patent number 10,996,241
- Issue date May 4, 2021
- Kyocera Corporation
- Tomohiro Imai
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Grant
Vertical probe and jig for vertical probe
- Patent number 10,996,243
- Issue date May 4, 2021
- PROBE INNOVATION, INC.
- Akiko Iwana
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly
- Patent number 10,935,574
- Issue date Mar 2, 2021
- Samsung Electronics Co., Ltd.
- Gyu Yeol Kim
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and method for microcircuit testing with conical...
- Patent number 10,928,423
- Issue date Feb 23, 2021
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
UNIVERSAL PROBE CARD AND TESTING METHOD
- Publication number 20240310412
- Publication date Sep 19, 2024
- PANJIT INTERNATIONAL INC.
- CHUNG-HSIUNG HO
- G01 - MEASURING TESTING
Information Patent Application
Probe head for wafer-level burn-in test (WLBI) and probe card compr...
- Publication number 20240183882
- Publication date Jun 6, 2024
- Microsoft S.p.A
- Giuseppe AMELIO
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
- Publication number 20240151744
- Publication date May 9, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
GUIDE PLATE AND TEST DEVICE INCLUDING SAME
- Publication number 20240118337
- Publication date Apr 11, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...
- Publication number 20240027495
- Publication date Jan 25, 2024
- TECHNOPROBE S.P.A.
- Riccardo VETTORI
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD SUBSTRATE, SUBSTRATE STRUCTURE AND METHOD OF FABRICATING...
- Publication number 20230358786
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Yu Chen
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
- Publication number 20230333142
- Publication date Oct 19, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD WITH IMPROVED FREQUENCY PROPERTY
- Publication number 20230324438
- Publication date Oct 12, 2023
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Application
Probes with Planar Unbiased Spring Elements for Electronic Componen...
- Publication number 20230314482
- Publication date Oct 5, 2023
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Application
CERAMIC, PROBE GUIDING MEMBER, PROBE CARD AND SOCKET FOR PACKAGE IN...
- Publication number 20230312423
- Publication date Oct 5, 2023
- FERROTEC MATERIAL TECHNOLOGIES CORPORATION
- Wataru YAMAGISHI
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Application
PROBE CARD
- Publication number 20230266365
- Publication date Aug 24, 2023
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Chikaomi MORI
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD AND PROBE CARD HAVING SAME
- Publication number 20230143340
- Publication date May 11, 2023
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
PROBE STRUCTURE AND PROBE CARD DEVICE
- Publication number 20220341969
- Publication date Oct 27, 2022
- teCat Technologies (Suzhou) Limited
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
TEST PROBE MODULE
- Publication number 20220221490
- Publication date Jul 14, 2022
- teCat Technologies (Suzhou) Limited
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE
- Publication number 20220221491
- Publication date Jul 14, 2022
- teCat Technologies (Suzhou) Limited
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
Vertical Probe Head
- Publication number 20220155349
- Publication date May 19, 2022
- Technoprobe, S.p.A.
- Flavio MAGGIONI
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES WITH ENHAN...
- Publication number 20220034966
- Publication date Feb 3, 2022
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
PROBE UNIT
- Publication number 20220018877
- Publication date Jan 20, 2022
- NHK Spring Co., Ltd.
- Tsuyoshi Inuma
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION JIG, INSPECTION DEVICE, AND CONTACT TERMINAL
- Publication number 20210364553
- Publication date Nov 25, 2021
- NIDEC-READ CORPORATION
- Norihiro OTA
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE HEAD HAVING AN IMPROVED CONTACT WITH A DEVICE UNDER...
- Publication number 20210318355
- Publication date Oct 14, 2021
- Technoprobe S.p.A.
- Stefano FELICI
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD AND PROBE CARD HAVING SAME
- Publication number 20210302471
- Publication date Sep 30, 2021
- Point Engineering Co., Ltd.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC TEST DEVICE
- Publication number 20210278440
- Publication date Sep 9, 2021
- WINWAY TECHNOLOGY CO., LTD.
- Kuan-Chung CHEN
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
- Publication number 20210270869
- Publication date Sep 2, 2021
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND RELATIVE PROBE HEAD OF AN APPARATUS FOR TESTING E...
- Publication number 20210247422
- Publication date Aug 12, 2021
- Technoprobe S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
CERAMIC, PROBE GUIDING MEMBER, PROBE CARD, AND SOCKET FOR PACKAGE I...
- Publication number 20210188714
- Publication date Jun 24, 2021
- FERROTEC MATERIAL TECHNOLOGIES CORPORATION
- Wataru YAMAGISHI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTION DEVICE
- Publication number 20210140999
- Publication date May 13, 2021
- Kabushiki Kaisha Nihon Micronics
- Kenichi TSURUTA
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20210102975
- Publication date Apr 8, 2021
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
SMALL PITCH INTEGRATED KNIFE EDGE TEMPORARY BONDING MICROSTRUCTURES
- Publication number 20210063439
- Publication date Mar 4, 2021
- HRL LABORATORIES, LLC
- Erik S. DANIEL
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ELECTRICALLY CONNECTING A TEST PIECE TO AN ELECTRICAL TE...
- Publication number 20210025920
- Publication date Jan 28, 2021
- Feinmetall GmbH
- Gunther Bohm
- G01 - MEASURING TESTING
Information Patent Application
REUSABLE PROBE CARD WITH REMOVABLE PROBE INSERT
- Publication number 20200386787
- Publication date Dec 10, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Yazdi Dinshaw Contractor
- G01 - MEASURING TESTING

using an intermediate card or back card with apertures through which the probes pass

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Probe unit

Probe head for a testing apparatus of electronic devices with enhan...

Probe card device having a probe structure with a protrusion portion

Testing head having improved frequency properties

Vertical probe head having an improved contact with a device under...

Testing head with improved frequency property

Testing head having improved frequency properties

Testing head having improved frequency properties

Probe card for testing a pattern formed on a wafer

Small pitch integrated knife edge temporary bonding microstructures

Probe head and probe card having same

Systems and methods for depopulating pins from contactor test socke...

Ceramic, probe guiding member, probe card, and socket for package i...

Inspection jig, inspection device, and contact terminal

Direct metalized guide plate

Contact probe and relative probe head of an apparatus for testing e...

Electrical connection device

Probe device and method of adjusting the same

Contact probe for a testing head for testing high-frequency devices

Probe device of floating structure

Fine pitch probe card methods and systems

Electronic test device

Probe head for a testing apparatus of electronic devices with enhan...

Testing head having improved frequency properties

Vertical probe testing head with improved frequency properties

Contact probe and relative probe head of an apparatus for testing e...

Probe card board, probe card, and inspection apparatus

Vertical probe and jig for vertical probe

Probe card assembly

Testing apparatus and method for microcircuit testing with conical...

Patents Applicationslast 30 patents

UNIVERSAL PROBE CARD AND TESTING METHOD

Probe head for wafer-level burn-in test (WLBI) and probe card compr...

TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES

GUIDE PLATE AND TEST DEVICE INCLUDING SAME

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...

PROBE CARD SUBSTRATE, SUBSTRATE STRUCTURE AND METHOD OF FABRICATING...

TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES

TESTING HEAD WITH IMPROVED FREQUENCY PROPERTY

Probes with Planar Unbiased Spring Elements for Electronic Componen...

CERAMIC, PROBE GUIDING MEMBER, PROBE CARD AND SOCKET FOR PACKAGE IN...

PROBE CARD

PROBE HEAD AND PROBE CARD HAVING SAME

PROBE STRUCTURE AND PROBE CARD DEVICE

TEST PROBE MODULE

PROBE CARD DEVICE

Vertical Probe Head

PROBE HEAD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES WITH ENHAN...

PROBE UNIT

INSPECTION JIG, INSPECTION DEVICE, AND CONTACT TERMINAL

VERTICAL PROBE HEAD HAVING AN IMPROVED CONTACT WITH A DEVICE UNDER...

PROBE HEAD AND PROBE CARD HAVING SAME

ELECTRONIC TEST DEVICE

TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES

CONTACT PROBE AND RELATIVE PROBE HEAD OF AN APPARATUS FOR TESTING E...

CERAMIC, PROBE GUIDING MEMBER, PROBE CARD, AND SOCKET FOR PACKAGE I...

ELECTRICAL CONNECTION DEVICE

PROBE CARD

SMALL PITCH INTEGRATED KNIFE EDGE TEMPORARY BONDING MICROSTRUCTURES

METHOD FOR ELECTRICALLY CONNECTING A TEST PIECE TO AN ELECTRICAL TE...

REUSABLE PROBE CARD WITH REMOVABLE PROBE INSERT