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using change of resonant frequency of a crystal
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G01K7/32
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PHYSICS
G01
Measuring instruments
G01K
MEASURING TEMPERATURE MEASURING QUANTITY OF HEAT THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
G01K7/00
Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat; Power supply
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G01K7/32
using change of resonant frequency of a crystal
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last 30 patents
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Circuit and method for determining the ratio between two frequencies
Patent number
11,846,661
Issue date
Dec 19, 2023
SEMIBLOCKS B.V.
Michiel Van Elzakker
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Micro-electro-mechanical system (MEMS) thermal sensor
Patent number
11,796,396
Issue date
Oct 24, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Tsai-Hao Hung
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Patent Grant
Sensors incorporated into tire plies to detect reversible deformati...
Patent number
11,719,582
Issue date
Aug 8, 2023
LytEn, Inc.
Michael W. Stowell
B60 - VEHICLES IN GENERAL
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Patent Grant
Electronic circuit
Patent number
11,698,400
Issue date
Jul 11, 2023
Kabushiki Kaisha Toshiba
Shusuke Kawai
H03 - BASIC ELECTRONIC CIRCUITRY
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Devices, systems, and methods for sensing temperature in induction...
Patent number
11,700,674
Issue date
Jul 11, 2023
PHILIP MORRIS PRODUCTS, S.A.
Andrew L. Bleloch
A24 - TOBACCO CIGARS CIGARETTES SMOKERS' REQUISITES
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Patent Grant
Torsional mode quartz crystal device
Patent number
11,658,637
Issue date
May 23, 2023
Statek Corporation
Yue Fang
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Grant
Sensors incorporated into tire plies to detect reversible deformati...
Patent number
11,555,748
Issue date
Jan 17, 2023
LytEn, Inc.
Michael W. Stowell
B60 - VEHICLES IN GENERAL
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Patent Grant
Temperature detection circuit, temperature sensor device and displa...
Patent number
11,519,786
Issue date
Dec 6, 2022
BEIJING BOE TECHNOLOGY DEVELOPMENT CO., LTD.
Pengpeng Wang
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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Patent Grant
Temperature monitoring
Patent number
11,513,010
Issue date
Nov 29, 2022
Cirrus Logic, Inc.
John Paul Lesso
G01 - MEASURING TESTING
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Patent Grant
Temperature detection device and temperature detection method
Patent number
11,435,238
Issue date
Sep 6, 2022
Mitsubishi Electric Cornoration
Kenzo Makino
G01 - MEASURING TESTING
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Patent Grant
Microcontroller comprising oscillators that are configured to recei...
Patent number
11,296,653
Issue date
Apr 5, 2022
STMicroelectronics (Rousset) SAS
Arnaud Gamet
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Grant
Temperature sensor
Patent number
11,274,976
Issue date
Mar 15, 2022
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Franck Badets
G01 - MEASURING TESTING
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Patent Grant
Vibration element and oscillator
Patent number
11,264,950
Issue date
Mar 1, 2022
Seiko Epson Corporation
Ryuta Nishizawa
G01 - MEASURING TESTING
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System and method for measuring changes in dielectric properties in...
Patent number
11,193,964
Issue date
Dec 7, 2021
Purdue Research Foundation
Abhijeet Dhiman
G01 - MEASURING TESTING
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Rotating electric machine device and rotating electric machine devi...
Patent number
11,114,968
Issue date
Sep 7, 2021
Mitsubishi Electric Corporation
Yoshihiro Miyama
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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Patent Grant
Apparatuses and methods for sensing temperature along a wellbore us...
Patent number
11,092,000
Issue date
Aug 17, 2021
Metrol Technology Limited
Leslie David Jarvis
E21 - EARTH DRILLING MINING
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Patent Grant
Torsional mode quartz crystal device
Patent number
11,070,192
Issue date
Jul 20, 2021
Statek Corporation
Yue Fang
G01 - MEASURING TESTING
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Patent Grant
Real-time temperature measurement for electrical conductors
Patent number
11,067,455
Issue date
Jul 20, 2021
3M Innovative Properties Company
Sihua Yuan
H01 - BASIC ELECTRIC ELEMENTS
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Temperature sensor with reduced power supply voltage sensitivity
Patent number
11,018,654
Issue date
May 25, 2021
Marvell Asia Pte, Ltd.
Lei Luo
G01 - MEASURING TESTING
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Distributed sensor arrays for measuring one or more of pressure and...
Patent number
11,015,435
Issue date
May 25, 2021
Quartzdyne, Inc.
Matthew Palmer
E21 - EARTH DRILLING MINING
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Ring oscillator temperature sensor
Patent number
10,998,889
Issue date
May 4, 2021
Birad—Research & Development Company Ltd.
Joseph Shor
H03 - BASIC ELECTRONIC CIRCUITRY
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Oscillator, electronic apparatus, and vehicle
Patent number
10,992,300
Issue date
Apr 27, 2021
Seiko Epson Corporation
Kentaro Seo
G01 - MEASURING TESTING
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Patent Grant
Wireless temperature sensors and methods
Patent number
10,969,282
Issue date
Apr 6, 2021
Florida State University Research Foundation, Inc.
Chengying (Cheryl) Xu
G01 - MEASURING TESTING
Information
Patent Grant
Micro-electro-mechanical system (MEMS) thermal sensor
Patent number
10,962,424
Issue date
Mar 30, 2021
Taiwan Semiconductor Manufacturing Co., Ltd.
Tsai-Hao Hung
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Temperature sensor and method of sensing temperature
Patent number
10,935,438
Issue date
Mar 2, 2021
Samsung Electronics Co., Ltd.
JongPal Kim
G01 - MEASURING TESTING
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Patent Grant
Temperature monitoring
Patent number
10,935,439
Issue date
Mar 2, 2021
Cirrus Logic, Inc.
John Paul Lesso
G01 - MEASURING TESTING
Information
Patent Grant
System and method for modeling and correcting frequency of quartz c...
Patent number
10,914,643
Issue date
Feb 9, 2021
Samsung Electronics Co., Ltd.
Daniel Babitch
G01 - MEASURING TESTING
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Patent Grant
Temperature and pressure sensors and methods
Patent number
10,845,211
Issue date
Nov 24, 2020
Florida State University Research Foundation, Inc.
Chengying Xu
G01 - MEASURING TESTING
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Patent Grant
Temperature measurement in switchgear stations
Patent number
10,823,622
Issue date
Nov 3, 2020
General Electric Technology GmbH
Eros Stella
G01 - MEASURING TESTING
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Patent Grant
System and method for modeling and correcting frequency of quartz c...
Patent number
10,823,623
Issue date
Nov 3, 2020
Samsung Electronics Co., Ltd.
Daniel Babitch
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
TORSIONAL MODE QUARTZ CRYSTAL DEVICE
Publication number
20240137006
Publication date
Apr 25, 2024
STATEK CORPORATION
Yue Fang
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Micro-Electro-Mechanical System (Mems) Thermal Sensor
Publication number
20230375416
Publication date
Nov 23, 2023
Taiwan Semiconductor Manufacturing Co., Ltd.
Tsai-Hao HUNG
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
PREDICTIVE ELECTRONIC THERMOMETER CIRCUIT STRUCTURE CAPABLE OF TEMP...
Publication number
20230332959
Publication date
Oct 19, 2023
CRM ICBG (WUXI) CO., LTD.
FANG LI
G01 - MEASURING TESTING
Information
Patent Application
SENSORS INCORPORATED INTO TIRE PLIES TO DETECT REVERSIBLE DEFORMATI...
Publication number
20230332958
Publication date
Oct 19, 2023
Lyten, Inc.
Michael W. STOWELL
B60 - VEHICLES IN GENERAL
Information
Patent Application
DEVICES, SYSTEMS, AND METHODS FOR SENSING TEMPERATURE IN INDUCTION...
Publication number
20230199918
Publication date
Jun 22, 2023
Philip Morris Products S.A.
Andrew L. BLELOCH
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
SENSORS INCORPORATED INTO TIRE PLIES TO DETECT REVERSIBLE DEFORMATI...
Publication number
20230066778
Publication date
Mar 2, 2023
Lyten, Inc.
Michael W. STOWELL
B60 - VEHICLES IN GENERAL
Information
Patent Application
THIN FILM TRANSISTOR BASED TEMPERATURE SENSOR
Publication number
20230061108
Publication date
Mar 2, 2023
Taiwan Semiconductor Manufacturing Co., Ltd.
Shih-Lien Linus LU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETECTING COMPONENT TEMPERATURE IN A SYSTEM
Publication number
20230065309
Publication date
Mar 2, 2023
Edwards Vacuum LLC
Budd Edward Faulkner
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
ODMR TEMPERATURE MEASUREMENT METHOD
Publication number
20220357217
Publication date
Nov 10, 2022
National University Corporation Okayama University
Masazumi FUJIWARA
G01 - MEASURING TESTING
Information
Patent Application
ON-DIE THERMAL SENSING NETWORK FOR INTEGRATED CIRCUITS
Publication number
20220268644
Publication date
Aug 25, 2022
PROTEANTECS LTD.
Eyal FAYNEH
G01 - MEASURING TESTING
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Patent Application
CIRCUIT AND METHOD FOR DETERMINING THE RATIO BETWEEN TWO FREQUENCIES
Publication number
20220170968
Publication date
Jun 2, 2022
SEMIBLOCKS B.V.
Michiel VAN ELZAKKER
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
TORSIONAL MODE QUARTZ CRYSTAL DEVICE
Publication number
20220109425
Publication date
Apr 7, 2022
STATEK CORPORATION
Yue Fang
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Vibration Device And Oscillator
Publication number
20210367583
Publication date
Nov 25, 2021
SEIKO EPSON CORPORATION
Ryuta NISHIZAWA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SENSORS INCORPORATED INTO TIRE PLIES TO DETECT REVERSIBLE DEFORMATI...
Publication number
20210293630
Publication date
Sep 23, 2021
Lyten, Inc.
Michael W. STOWELL
B60 - VEHICLES IN GENERAL
Information
Patent Application
MICRO-ELECTRO-MECHANICAL SYTEM (MEMS) THERMAL SENSOR
Publication number
20210215550
Publication date
Jul 15, 2021
Taiwan Semiconductor Manufacturing Co., Ltd.
Tsai-Hao HUNG
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Devices, Systems, and Methods for Sensing Temperature in Induction...
Publication number
20210145067
Publication date
May 20, 2021
Loto Labs, Inc.
Andrew L. Bleloch
A24 - TOBACCO CIGARS CIGARETTES SMOKERS' REQUISITES
Information
Patent Application
TEMPERATURE MONITORING
Publication number
20210131878
Publication date
May 6, 2021
Cirrus Logic International Semiconductor Ltd.
John Paul LESSO
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC CIRCUIT
Publication number
20210072297
Publication date
Mar 11, 2021
KABUSHIKI KAISHA TOSHIBA
Shusuke KAWAI
G01 - MEASURING TESTING
Information
Patent Application
TORSIONAL MODE QUARTZ CRYSTAL DEVICE
Publication number
20210058064
Publication date
Feb 25, 2021
STATEK CORPORATION
Yue Fang
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
TEMPERATURE AND PRESSURE SENSORS AND METHODS
Publication number
20200363234
Publication date
Nov 19, 2020
The Florida State University Research Foundation, Inc.
Chengying Xu
G01 - MEASURING TESTING
Information
Patent Application
APPARATUSES AND METHODS FOR SENSING TEMPERATURE ALONG A WELLBORE US...
Publication number
20200318473
Publication date
Oct 8, 2020
Metrol Technology Limited
Leslie David JARVIS
E21 - EARTH DRILLING MINING
Information
Patent Application
OSCILLATOR, ELECTRONIC APPARATUS, AND VEHICLE
Publication number
20200313677
Publication date
Oct 1, 2020
SEIKO EPSON CORPORATION
Kentaro SEO
G01 - MEASURING TESTING
Information
Patent Application
ROTATING ELECTRIC MACHINE DEVICE AND ROTATING ELECTRIC MACHINE DEVI...
Publication number
20200295694
Publication date
Sep 17, 2020
Mitsubishi Electric Corporation
Yoshihiro MIYAMA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR MODELING AND CORRECTING FREQUENCY OF QUARTZ C...
Publication number
20200292395
Publication date
Sep 17, 2020
Samsung Electronics Co., Ltd.
Daniel BABITCH
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE DETECTION DEVICE AND TEMPERATURE DETECTION METHOD
Publication number
20200284664
Publication date
Sep 10, 2020
Mitsubishi Electric Corporation
Kenzo MAKINO
G01 - MEASURING TESTING
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Patent Application
TEMPERATURE DETECTOR
Publication number
20200264054
Publication date
Aug 20, 2020
NIHON DEMPA KOGYO CO., LTD.
Hiroyuki KUKITA
G01 - MEASURING TESTING
Information
Patent Application
MICRO-ELECTRO-MECHANICAL SYSTEM (MEMS) THERMAL SENSOR
Publication number
20200103290
Publication date
Apr 2, 2020
Taiwan Semiconductor Manufacturing Co., Ltd.
Tsai-Hao HUNG
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
THERMAL DETECTION SYSTEM AND METHOD
Publication number
20200056946
Publication date
Feb 20, 2020
SIGNIFY HOLDING B.V.
Hong CHEN
G01 - MEASURING TESTING
Information
Patent Application
Wireless Temperature Sensors and Methods
Publication number
20200011744
Publication date
Jan 9, 2020
Florida State University Research Foundation, Inc.
Chengying (Cheryl) Xu
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE LIMIT VALUE SENSOR
Publication number
20190353529
Publication date
Nov 21, 2019
Endress + Hauser Wetzer GmbH + Co. KG
Marc Schalles
G01 - MEASURING TESTING