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G01N2021/216
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PHYSICS
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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N2021/216
using circular polarised light
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last 30 patents
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Patent Grant
Metasurface device for detecting optical chirality
Patent number
12,146,826
Issue date
Nov 19, 2024
The Board of Trustees of the Leland Stanford Junior University
Jennifer A. Dionne
G01 - MEASURING TESTING
Information
Patent Grant
Snapshot polarization imaging with a micro-camera array microscope
Patent number
12,035,057
Issue date
Jul 9, 2024
Ramona Optics Inc.
Jaehee Park
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Trace microanalysis microscope systems and methods
Patent number
12,025,498
Issue date
Jul 2, 2024
SPECTRICON IKE
Konstantinos Balas
G01 - MEASURING TESTING
Information
Patent Grant
Circular dichroism measurement device and circular dichroism measur...
Patent number
11,879,833
Issue date
Jan 23, 2024
Jasco Corporation
Yuichi Miyoshi
G01 - MEASURING TESTING
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Patent Grant
Cholesteric liquid crystal layer, laminate, optically anisotropic b...
Patent number
11,732,194
Issue date
Aug 22, 2023
FUJIFILM Corporation
Keisuke Kodama
C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information
Patent Grant
Spectroscopic ellipsometry system for thin film imaging
Patent number
11,668,645
Issue date
Jun 6, 2023
Bruker Nano, Inc.
Emad Zawaideh
G02 - OPTICS
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Patent Grant
Compositions and methods for controllably merging emulsion droplets...
Patent number
11,474,109
Issue date
Oct 18, 2022
Scintimetrics, Inc.
Christopher Gordon Atwood
G01 - MEASURING TESTING
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Patent Grant
Polarization enhanced interferometric imaging
Patent number
11,428,626
Issue date
Aug 30, 2022
Trustees of Boston University
M. Selim Ünlü
G01 - MEASURING TESTING
Information
Patent Grant
Polarization and phase microscope
Patent number
11,366,302
Issue date
Jun 21, 2022
Arizona Board of Regents on behalf of the University of Arizona
Stanley Pau
G01 - MEASURING TESTING
Information
Patent Grant
Polarization property image measurement device, and polarization pr...
Patent number
11,268,900
Issue date
Mar 8, 2022
Nikon Corporation
Takanori Kojima
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method and apparatus for analysing a component
Patent number
11,125,679
Issue date
Sep 21, 2021
Rolls-Royce PLC
James R. Fortune
F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information
Patent Grant
Configurable retro-reflective sensor system for the improved charac...
Patent number
10,928,307
Issue date
Feb 23, 2021
Fraunhofer-Geseilschaft zurförderung der angewandten Forschung e.V.
Matthias Hartrumpf
G01 - MEASURING TESTING
Information
Patent Grant
Device for evaluating crystallinity and method of evaluating crysta...
Patent number
10,801,970
Issue date
Oct 13, 2020
Samsung Display Co., Ltd.
Jin Seo
G01 - MEASURING TESTING
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Patent Grant
Imaging apparatus for obtaining image of polarizing film, inspectio...
Patent number
10,746,664
Issue date
Aug 18, 2020
Nitto Denko Corporation
Shunsuke Sasaki
G01 - MEASURING TESTING
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Patent Grant
Method for imaging biological tissue using polarized Majorana photons
Patent number
10,733,729
Issue date
Aug 4, 2020
Robert R. Alfano
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Circular dichroism measuring method and circular dichroism measurin...
Patent number
10,663,391
Issue date
May 26, 2020
Hamamatsu Photonics K.K.
Hiroshi Satozono
G01 - MEASURING TESTING
Information
Patent Grant
Optical interrogator for measuring polarization properties
Patent number
10,627,341
Issue date
Apr 21, 2020
United States of America as represented by Secretary of the Navy
David Thomas Wayne
G01 - MEASURING TESTING
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Patent Grant
Polarization property image measurement device, and polarization pr...
Patent number
10,620,116
Issue date
Apr 14, 2020
Nikon Corporation
Takanori Kojima
G01 - MEASURING TESTING
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Patent Grant
Optical device
Patent number
10,598,587
Issue date
Mar 24, 2020
EVERREADY PRECISION IND. CORP.
Jyh-Long Chern
G01 - MEASURING TESTING
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Patent Grant
Sensing method and sensing system
Patent number
10,598,588
Issue date
Mar 24, 2020
FUJIFILM Corporation
Wataru Majima
G02 - OPTICS
Information
Patent Grant
Polarization enhanced interferometric imaging
Patent number
10,488,328
Issue date
Nov 26, 2019
Trustees of Boston University
M. Selim Ünlü
G01 - MEASURING TESTING
Information
Patent Grant
Mitigating meniscus effects in vertically oriented circular dichroi...
Patent number
10,436,644
Issue date
Oct 8, 2019
Baoliang Wang
G01 - MEASURING TESTING
Information
Patent Grant
Crystalline particle detection
Patent number
10,408,733
Issue date
Sep 10, 2019
TROLEX LIMITED
Paul Henry Kaye
G01 - MEASURING TESTING
Information
Patent Grant
Identification of a reflective surface as being associated with a t...
Patent number
10,371,625
Issue date
Aug 6, 2019
Lockheed Martin Corporation
David R. Twede
G01 - MEASURING TESTING
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Patent Grant
Circular dichroism measuring method and circular dichroism measurin...
Patent number
10,330,590
Issue date
Jun 25, 2019
Hamamatsu Photonics K.K.
Hiroshi Satozono
G01 - MEASURING TESTING
Information
Patent Grant
Optically detecting cloud metrics using sampled analog measurements...
Patent number
10,207,810
Issue date
Feb 19, 2019
Rosemount Aerospace Inc.
Kaare Josef Anderson
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Grant
Device for evaluating crystallinity and method of evaluating crysta...
Patent number
10,184,903
Issue date
Jan 22, 2019
Samsung Display Co., Ltd.
Jin Seo
G01 - MEASURING TESTING
Information
Patent Grant
Sensing system and sensing method
Patent number
10,036,701
Issue date
Jul 31, 2018
FUJIFILM Corporation
Mitsuyoshi Ichihashi
G02 - OPTICS
Information
Patent Grant
Circular polarization filter and application therefor
Patent number
9,759,600
Issue date
Sep 12, 2017
FUJIFILM Corporation
Mitsuyoshi Ichihashi
G02 - OPTICS
Information
Patent Grant
Configurational chirality based separation
Patent number
9,726,596
Issue date
Aug 8, 2017
University of Calcutta
Anjan Kr. Dasgupta
C07 - ORGANIC CHEMISTRY
Patents Applications
last 30 patents
Information
Patent Application
DEVICES AND METHODS FOR DETERMINING CHIRAL OPTICAL PROPERTIES FROM...
Publication number
20240418632
Publication date
Dec 19, 2024
The Regents of the University of Michigan
Nicholas A. KOTOV
G01 - MEASURING TESTING
Information
Patent Application
DETERMINING AND RECONSTRUCTING A SHAPE AND A MATERIAL PROPERTY OF A...
Publication number
20240369352
Publication date
Nov 7, 2024
Meta Platforms Technologies, LLC
Salim BOUTAMI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
METHODS AND SYSTEMS FOR MEASURING OPTICAL CHARACTERISTICS OF OBJECTS
Publication number
20240361233
Publication date
Oct 31, 2024
UNIVERSITY OF THE WITWATERSRAND, JOHANNESBURG
Tavares Wagner Buono
G01 - MEASURING TESTING
Information
Patent Application
AIR QUALITY MEASURING DEVICE
Publication number
20240302268
Publication date
Sep 12, 2024
Samsung Electronics Co., Ltd.
Junghui CHOI
G01 - MEASURING TESTING
Information
Patent Application
CIRCULARLY POLARIZED LIGHT ILLUMINATOR, ANALYSIS DEVICE, AND MICROS...
Publication number
20240142370
Publication date
May 2, 2024
INTER-UNIVERSITY RESEARCH INSTITUTE COPORATION NATIONAL INSTITUTES OF NATURAL...
Hiromi OKAMOTO
G01 - MEASURING TESTING
Information
Patent Application
CHIRAL MOLECULE DETECTOR AND METHOD FOR DETECTING CHIRAL MOLECULE
Publication number
20240077409
Publication date
Mar 7, 2024
GUANGZHOU LUXVISIONS INNOVATION TECHNOLOGY LIMITED
Tzu-Yao Lin
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION DEVICE
Publication number
20230288327
Publication date
Sep 14, 2023
Mitsubishi Heavy Industries, Ltd.
Syusaku Yamamoto
G01 - MEASURING TESTING
Information
Patent Application
Spectroscopic ellipsometry system for thin film imaging
Publication number
20230010806
Publication date
Jan 12, 2023
Scientific Computing International
Emad Zawaideh
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR CARRYING OUT POLARIZATION RESOLVED RAMAN SPECTROSCOPY
Publication number
20230003576
Publication date
Jan 5, 2023
Danmarks Tekniske Universitet
Oleksii ILCHENKO
G01 - MEASURING TESTING
Information
Patent Application
TRACE MICROANALYSIS MICROSCOPE SYSTEMS AND METHODS
Publication number
20220412802
Publication date
Dec 29, 2022
SPECTRICON IKE
KONSTANTINOS BALAS
G01 - MEASURING TESTING
Information
Patent Application
Metasurface device for detecting optical chirality
Publication number
20220364982
Publication date
Nov 17, 2022
Jennifer A. Dionne
G01 - MEASURING TESTING
Information
Patent Application
CIRCULAR DICHROISM MEASUREMENT DEVICE AND CIRCULAR DICHROISM MEASUR...
Publication number
20220155218
Publication date
May 19, 2022
JASCO CORPORATION
Yuichi MIYOSHI
G01 - MEASURING TESTING
Information
Patent Application
CHOLESTERIC LIQUID CRYSTAL LAYER, LAMINATE, OPTICALLY ANISOTROPIC B...
Publication number
20210116615
Publication date
Apr 22, 2021
FUJIFILM CORPORATION
Keisuke KODAMA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR ANALYSING A COMPONENT
Publication number
20210048384
Publication date
Feb 18, 2021
Rolls-Royce plc
James R. FORTUNE
G01 - MEASURING TESTING
Information
Patent Application
POLARIZATION AND PHASE MICROSCOPE
Publication number
20200209602
Publication date
Jul 2, 2020
Arizona Board of Regents on behalf of The University of Arizona
Stanley Pau
G02 - OPTICS
Information
Patent Application
OPTICAL DEVICE
Publication number
20200173912
Publication date
Jun 4, 2020
EVERREADY PRECISION IND. CORP.
JYH-LONG CHERN
G01 - MEASURING TESTING
Information
Patent Application
COMPOSITIONS AND METHODS FOR CONTROLLABLY MERGING EMULSION DROPLETS...
Publication number
20200158736
Publication date
May 21, 2020
Christopher Gordon ATWOOD
G01 - MEASURING TESTING
Information
Patent Application
POLARIZATION ENHANCED INTERFEROMETRIC IMAGING
Publication number
20200150028
Publication date
May 14, 2020
Trustees of Boston University
M. Selim ÜNLÜ
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DEVICES FOR CALIBRATING, AND FOR ANALYZING THE QUALITY OF A...
Publication number
20200088651
Publication date
Mar 19, 2020
SAINT-GOBAIN GLASS FRANCE
Romain DECOURCELLE
C03 - GLASS MINERAL OR SLAG WOOL
Information
Patent Application
CIRCULAR DICHROISM MEASURING METHOD AND CIRCULAR DICHROISM MEASURIN...
Publication number
20190271639
Publication date
Sep 5, 2019
HAMAMATSU PHOTONICS K. K.
Hiroshi SATOZONO
G01 - MEASURING TESTING
Information
Patent Application
CONFIGURABLE RETRO-REFLECTIVE SENSOR SYSTEM FOR THE IMPROVED CHARAC...
Publication number
20190170636
Publication date
Jun 6, 2019
Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
Matthias HARTRUMPF
G02 - OPTICS
Information
Patent Application
SYSTEM AND METHOD FOR DETECTION OF MATERIALS USING ORBITAL ANGULAR...
Publication number
20170115220
Publication date
Apr 27, 2017
NXGEN PARTNERS IP, LLC
SOLYMAN ASHRAFI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL PARTICLE ANALYSIS
Publication number
20150268151
Publication date
Sep 24, 2015
Faris Modawar
G01 - MEASURING TESTING
Information
Patent Application
IMAGE PROCESSING APPARATUS
Publication number
20150219552
Publication date
Aug 6, 2015
Panasonic Intellectual Property Management Co., Ltd.
KATSUHIRO KANAMORI
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR MEASURING PHASE RETARDATION DISTRIBUTION AND...
Publication number
20140347665
Publication date
Nov 27, 2014
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
Aijun ZENG
G01 - MEASURING TESTING
Information
Patent Application
HAIR DETECTOR WITH MULTIPLE FOCAL POINTS
Publication number
20140296837
Publication date
Oct 2, 2014
Koninklijke Philips N.V.
Babu Varghese
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR HYPERSPECTRAL IMAGING
Publication number
20120307056
Publication date
Dec 6, 2012
Karel J. Zuzak
G02 - OPTICS
Information
Patent Application
OPTICAL INGREDIENT-MEASURING APPARATUS
Publication number
20120218555
Publication date
Aug 30, 2012
Hitachi Cable, Ltd.
Tatsuya KUMAGAI
G01 - MEASURING TESTING
Information
Patent Application
POLARIZATION SWITCHING LIDAR DEVICE AND METHOD
Publication number
20120026497
Publication date
Feb 2, 2012
SIGMA SPACE CORPORATION
Savyasachee Liptarag Mathur
G01 - MEASURING TESTING
Information
Patent Application
Chiral Plasmonic Structures For Mediating Chemical Transformation A...
Publication number
20110235032
Publication date
Sep 29, 2011
SOUTHWEST RESEARCH INSTITUTE
Michael A. MILLER
G01 - MEASURING TESTING