using cyclotron resonance

Industry

CPC
G01R33/64

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R33/00Arrangements or instruments for measuring magnetic variables

Current Industry

G01R33/64using cyclotron resonance

Industries

Patents Grantslast 30 patents

Information Patent Grant
Precision magnetic field monitoring in high radiation environments
- Patent number 10,598,754
- Issue date Mar 24, 2020
- Board of Trustees of Michigan State University
- Georg Bollen
- G01 - MEASURING TESTING
Information Patent Grant
Temperature gradient in microfabricated sensor cavity
- Patent number 10,409,227
- Issue date Sep 10, 2019
- Texas Instruments Incorporated
- Roozbeh Parsa
- G04 - HOROLOGY
Information Patent Grant
Micro-vacancy center device
- Patent number 10,168,393
- Issue date Jan 1, 2019
- Lockheed Martin Corporation
- John B. Stetson
- G01 - MEASURING TESTING
Information Patent Grant
Gas nuclear magnetic resonance apparatus
- Patent number 7,855,557
- Issue date Dec 21, 2010
- National University Corporation Kobe University
- Kiyokazu Fuke
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for analysis of mixed gas components
- Patent number 6,107,627
- Issue date Aug 22, 2000
- Nikkiso Company Limited
- Kazuo Nakagawa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for analysis of mixed gas components
- Patent number 5,777,205
- Issue date Jul 7, 1998
- Nikkiso Company Limited
- Kazuo Nakagawa
- G01 - MEASURING TESTING
Information Patent Grant
Fourier transform molecular spectrometer
- Patent number 5,233,190
- Issue date Aug 3, 1993
- Leybold Inficon Inc.
- Fritz H. Schlereth
- G01 - MEASURING TESTING
Information Patent Grant
Linear prediction ion cyclotron resonance spectrometry apparatus an...
- Patent number 5,047,636
- Issue date Sep 10, 1991
- Wisconsin Alumni Research Foundation
- Thomas C. Farrar
- G01 - MEASURING TESTING
Information Patent Grant
Ion cyclotron resonance spectrometer
- Patent number 5,019,706
- Issue date May 28, 1991
- Spectrospin AG
- Martin Allemann
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for highly sensitive spectroscopy of trapped ions
- Patent number 4,982,088
- Issue date Jan 1, 1991
- California Institute of Technology
- Daniel P. Weitekamp
- G01 - MEASURING TESTING
Information Patent Grant
PC-based FT/ICR system
- Patent number 4,956,788
- Issue date Sep 11, 1990
- University of the Pacific
- Shenheng Guan
- G01 - MEASURING TESTING
Information Patent Grant
Method for eliminating undesirable charged particles from the measu...
- Patent number 4,818,864
- Issue date Apr 4, 1989
- Spectrospin AG
- Martin Allemann
- G01 - MEASURING TESTING
Information Patent Grant
Ion cyclotron resonance spectrometer
- Patent number 4,746,802
- Issue date May 24, 1988
- Spectrospin AG
- Hanspeter Kellerhals
- G01 - MEASURING TESTING
Information Patent Grant
Procedure for recording ion-cyclotron-resonance spectra and apparat...
- Patent number 4,563,579
- Issue date Jan 7, 1986
- Spectrospin AG
- Hanspeter Kellerhals
- G01 - MEASURING TESTING
Information Patent Grant
Method for ion cyclotron resonance spectroscopy
- Patent number 4,464,570
- Issue date Aug 7, 1984
- Martin Allemann
- G01 - MEASURING TESTING
Information Patent Grant
Fourier transform ion cyclotron resonance spectroscopy method and a...
- Patent number 3,937,955
- Issue date Feb 10, 1976
- Nicolet Technology Corporation
- Melvin Barnet Comisarow
- G01 - MEASURING TESTING
Information Patent Grant
3742212
- Patent number 3,742,212
- Issue date Jun 26, 1973
- G01 - MEASURING TESTING
Information Patent Grant
3677642
- Patent number 3,677,642
- Issue date Jul 18, 1972
- G01 - MEASURING TESTING
Information Patent Grant
3535512
- Patent number 3,535,512
- Issue date Oct 20, 1970
- G01 - MEASURING TESTING
Information Patent Grant
3511986
- Patent number 3,511,986
- Issue date May 12, 1970
- G01 - MEASURING TESTING
Information Patent Grant
3505517
- Patent number 3,505,517
- Issue date Apr 7, 1970
- G01 - MEASURING TESTING
Information Patent Grant
3505516
- Patent number 3,505,516
- Issue date Apr 7, 1970
- G01 - MEASURING TESTING
Information Patent Grant
3502867
- Patent number 3,502,867
- Issue date Mar 24, 1970
- G01 - MEASURING TESTING
Information Patent Grant
3475605
- Patent number 3,475,605
- Issue date Oct 28, 1969
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PRECISION MAGNETIC FIELD MONITORING IN HIGH RADIATION ENVIRONMENTS
- Publication number 20170276757
- Publication date Sep 28, 2017
- Board of Trustees of Michigan State University
- Georg Bollen
- G01 - MEASURING TESTING
Information Patent Application
GAS NUCLEAR MAGNETIC RESONANCE APPARATUS
- Publication number 20100156410
- Publication date Jun 24, 2010
- National University Corporation KOBE University
- Kiyokazu Fuke
- G01 - MEASURING TESTING

using cyclotron resonance

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Precision magnetic field monitoring in high radiation environments

Temperature gradient in microfabricated sensor cavity

Micro-vacancy center device

Gas nuclear magnetic resonance apparatus

Apparatus for analysis of mixed gas components

Apparatus for analysis of mixed gas components

Fourier transform molecular spectrometer

Linear prediction ion cyclotron resonance spectrometry apparatus an...

Ion cyclotron resonance spectrometer

Method and apparatus for highly sensitive spectroscopy of trapped ions

PC-based FT/ICR system

Method for eliminating undesirable charged particles from the measu...

Ion cyclotron resonance spectrometer

Procedure for recording ion-cyclotron-resonance spectra and apparat...

Method for ion cyclotron resonance spectroscopy

Fourier transform ion cyclotron resonance spectroscopy method and a...

3742212

3677642

3535512

3511986

3505517

3505516

3502867

3475605

Patents Applicationslast 30 patents

PRECISION MAGNETIC FIELD MONITORING IN HIGH RADIATION ENVIRONMENTS

GAS NUCLEAR MAGNETIC RESONANCE APPARATUS