using diffraction elements

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G01J3/18

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

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G01J3/18using diffraction elements

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Micro wideband spectroscopic analysis device
- Patent number 12,163,834
- Issue date Dec 10, 2024
- Jed Khoury
- G01 - MEASURING TESTING
Information Patent Grant
Peak determination in two-dimensional optical spectra
- Patent number 12,163,837
- Issue date Dec 10, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hans-Juergen Schlueter
- G01 - MEASURING TESTING
Information Patent Grant
Optical spectrometer and method for spectrally resolved two-dimensi...
- Patent number 12,152,937
- Issue date Nov 26, 2024
- MANTIS PHOTONICS AB
- Diego Guénot
- G01 - MEASURING TESTING
Information Patent Grant
Easily adjustable optical emission spectrometer
- Patent number 12,130,178
- Issue date Oct 29, 2024
- HITACHI HIGH-TECH ANALYTICAL SCIENCE GMBH
- André Peters
- G01 - MEASURING TESTING
Information Patent Grant
Single-photon timing system and method
- Patent number 12,130,176
- Issue date Oct 29, 2024
- The Regents of the University of Colorado, a Body Corporate
- Shu-Wei Huang
- G01 - MEASURING TESTING
Information Patent Grant
Spectral feature control apparatus
- Patent number 12,124,053
- Issue date Oct 22, 2024
- Cymer, LLC
- Eric Anders Mason
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light source apparatus for light measurement
- Patent number 12,117,340
- Issue date Oct 15, 2024
- Ushio Denki Kabushiki Kaisha
- Go Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 12,117,341
- Issue date Oct 15, 2024
- Answeray Inc.
- Seong Ho Cho
- G01 - MEASURING TESTING
Information Patent Grant
Light source modules for noise mitigation
- Patent number 12,111,210
- Issue date Oct 8, 2024
- Apple Inc.
- Mark Alan Arbore
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 12,104,953
- Issue date Oct 1, 2024
- Konica Minolta, Inc.
- Katsutoshi Tsurutani
- G01 - MEASURING TESTING
Information Patent Grant
Emissive display configured with through-display spectrometer
- Patent number 12,098,953
- Issue date Sep 24, 2024
- Google LLC
- Ozan Cakmakci
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Hyperspectral sensor and hyperspectral camera
- Patent number 12,098,951
- Issue date Sep 24, 2024
- FUJIFILM Corporation
- Hiroshi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Absolute linear-in-k spectrometer
- Patent number 12,085,445
- Issue date Sep 10, 2024
- University of Rochester
- Changsik Yoon
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopy system
- Patent number 12,085,447
- Issue date Sep 10, 2024
- Agency for Defense Development
- Jae Hwan Lee
- G01 - MEASURING TESTING
Information Patent Grant
Multi-modal computational imaging via metasurfaces
- Patent number 12,052,518
- Issue date Jul 30, 2024
- University of Utah Research Foundation
- Rajesh Menon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for screening asymptomatic virus emitters
- Patent number 12,029,547
- Issue date Jul 9, 2024
- Hyperspectral Corp.
- David M. Palacios
- G01 - MEASURING TESTING
Information Patent Grant
Material identification through image capture of Raman scattering
- Patent number 12,025,561
- Issue date Jul 2, 2024
- OHIO STATE INNOVATION FOUNDATION
- Heather Allen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for optical applications, spectrometer system and method...
- Patent number 12,018,985
- Issue date Jun 25, 2024
- FiSens GmbH
- Christian Waltermann
- G02 - OPTICS
Information Patent Grant
Identifying objects using near-infrared sensors, cameras or time-of...
- Patent number 11,992,291
- Issue date May 28, 2024
- Omni MedSci, Inc.
- Mohammed N. Islam
- G01 - MEASURING TESTING
Information Patent Grant
Spectrograph recycling
- Patent number 11,976,971
- Issue date May 7, 2024
- MICHIGAN AEROSPACE CORPORATION
- Will Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring Raman spectrum and method thereof
- Patent number 11,965,779
- Issue date Apr 23, 2024
- TimeGate Instruments Oy
- Lauri Kurki
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for screening asymptomatic virus emitters
- Patent number 11,937,912
- Issue date Mar 26, 2024
- Hyperspectral Corp.
- David M. Palacios
- G01 - MEASURING TESTING
Information Patent Grant
Optical detection device, optical detection method, method for desi...
- Patent number 11,933,735
- Issue date Mar 19, 2024
- Osaka University
- Tsuyoshi Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for screening asymptomatic virus emitters
- Patent number 11,925,456
- Issue date Mar 12, 2024
- Hyperspectral Corp.
- David M. Palacios
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Image sensor and method of operating
- Patent number 11,920,982
- Issue date Mar 5, 2024
- Samsung Electronics Co., Ltd.
- Radwanul Hasan Siddique
- G01 - MEASURING TESTING
Information Patent Grant
Optical module and mobile device having same
- Patent number 11,913,837
- Issue date Feb 27, 2024
- TRIPLE WIN TECHNOLOGY(SHENZHEN) CO. LTD.
- Hsin-Yen Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Optic for multi-pass optical channel monitor
- Patent number 11,909,437
- Issue date Feb 20, 2024
- Lumentum Operations LLC
- Paul Colbourne
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Freeform offner spectrometer
- Patent number 11,898,907
- Issue date Feb 13, 2024
- Raytheon Company
- Benjamin James Lewis
- G01 - MEASURING TESTING
Information Patent Grant
Processing chamber with optical fiber with bragg grating sensors
- Patent number 11,901,165
- Issue date Feb 13, 2024
- William J. O'Banion
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Short-wave infrared sensor for identifying based on water content
- Patent number 11,896,346
- Issue date Feb 13, 2024
- OMNI MEDSCI, LLC
- Mohammed N. Islam
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR SCREENING ASYMPTOMATIC VIRUS EMITTERS
- Publication number 20240407667
- Publication date Dec 12, 2024
- Hyperspectral Corp.
- David M. Palacios
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENTS USING CAMERA IMAGING TISSUE COMPRISING SKIN OR THE HAND
- Publication number 20240398237
- Publication date Dec 5, 2024
- Mohammed N. ISLAM
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
ACTIVE REMOTE SENSING OF ATMOSPHERIC GASES OR SMOKE USING A TIME-OF...
- Publication number 20240389858
- Publication date Nov 28, 2024
- Mohammed N. ISLAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND PROGRAM
- Publication number 20240385041
- Publication date Nov 21, 2024
- YOKOGAWA ELECTRIC CORPORATION
- Gentaro Ishihara
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED BOUND-MODE SPECTRAL/ANGULAR SENSORS
- Publication number 20240377246
- Publication date Nov 14, 2024
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPIC RAMAN SPECTROSCOPY DEVICE
- Publication number 20240344990
- Publication date Oct 17, 2024
- SHIMADZU CORPORATION
- Tomoki SASAYAMA
- G02 - OPTICS
Information Patent Application
OPTICAL SPECTRUM ANALYZER
- Publication number 20240344885
- Publication date Oct 17, 2024
- Anritsu Corporation
- Maki UENO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS TO ACQUIRE THREE DIMENSIONAL IMAGES USING SPECT...
- Publication number 20240288307
- Publication date Aug 29, 2024
- Yissum Research Development Company of the Hebrew University of Jerusalem Ltd.
- Uriel LEVY
- G01 - MEASURING TESTING
Information Patent Application
TIME-OF-FLIGHT SENSORS CO-REGISTERED WITH CAMERA SYSTEMS
- Publication number 20240268680
- Publication date Aug 15, 2024
- Mohammed N. ISLAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECTROSCOPIC ANALYSIS DEVICE AND INTERFERING LIGHT FORMATION MECHA...
- Publication number 20240271999
- Publication date Aug 15, 2024
- Tsubasa SAITO
- G01 - MEASURING TESTING
Information Patent Application
Serpentine Integrated Grating and Associated Devices
- Publication number 20240264460
- Publication date Aug 8, 2024
- The Regents of the University of Colorado, a Body Corporate
- Kelvin Wagner
- G01 - MEASURING TESTING
Information Patent Application
WIDE-FIELD SPECTRAL IMAGING SYSTEM
- Publication number 20240230406
- Publication date Jul 11, 2024
- National Central University
- Fan-Ching Chien
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR DETECTING MATERIALS BASED ON...
- Publication number 20240230407
- Publication date Jul 11, 2024
- Wayne State University
- Gregory William Auner
- G01 - MEASURING TESTING
Information Patent Application
WIDE WAVELENGTH OPTICAL DETECTION SYSTEM
- Publication number 20240219234
- Publication date Jul 4, 2024
- Attollo Engineering, LLC
- Jonathan Geske
- G01 - MEASURING TESTING
Information Patent Application
WAVEGUIDE AND ELECTROMAGNETIC SPECTROMETER
- Publication number 20240219231
- Publication date Jul 4, 2024
- Endress+Hauser Optical Analysis, Inc.
- Marc Winter
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-PHOTON TIMING SYSTEM AND METHOD
- Publication number 20240183709
- Publication date Jun 6, 2024
- The Regents of the University of Colorado, a Body Corporate
- Shu-Wei HUANG
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING CHAMBER WITH OPTICAL FIBER WITH BRAGG GRATING SENSORS
- Publication number 20240186124
- Publication date Jun 6, 2024
- iSenseCloud, Inc.
- William J. O'Banion
- G01 - MEASURING TESTING
Information Patent Application
WEARABLE DEVICES COMPRISING SEMICONDUCTOR DIODE LIGHT SOURCES WITH...
- Publication number 20240180428
- Publication date Jun 6, 2024
- Omni MedSci, Inc.
- Mohammed N. ISLAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSOR AND METHOD OF OPERATING
- Publication number 20240175750
- Publication date May 30, 2024
- Samsung Electronics Co., LTD
- Radwanul Hasan SIDDIQUE
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPE
- Publication number 20240159589
- Publication date May 16, 2024
- FUJIFILM CORPORATION
- Yukito SAITOH
- G01 - MEASURING TESTING
Information Patent Application
HYPERSPECTRAL SENSOR WITH PIXEL HAVING LIGHT FOCUSING TRANSPARENT D...
- Publication number 20240151583
- Publication date May 9, 2024
- Sony Semiconductor Solutions Corporation
- Victor A. Lenchenkov
- G01 - MEASURING TESTING
Information Patent Application
SOLAR REFLECTION FULL-BAND HYPERSPECTRAL IMAGING DETECTION SYSTEM
- Publication number 20240142305
- Publication date May 2, 2024
- SHANGHAI INSTITUTE OF TECHNICAL PHYSICS, CHINESE ACADEMY OF SCIENCES
- Yinnian LIU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR DETECTING MATERIALS BASED ON...
- Publication number 20240133739
- Publication date Apr 25, 2024
- Wayne State University
- Gregory William Auner
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR MAKING A TIME-SYNCHRONISED PHASOR MEASURE...
- Publication number 20240125827
- Publication date Apr 18, 2024
- Synaptec Limited
- Philip Orr
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
ULTRATHIN MICRO-SPECTROMETER AND METHOD OF MANUFACTURING THE SAME
- Publication number 20240102859
- Publication date Mar 28, 2024
- Korea Advanced Institute of Science and Technology
- Ki Hun Jeong
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CHARACTERISTIC MEASURING APPARATUS, WAVELENGTH SHIFT CORREC...
- Publication number 20240068870
- Publication date Feb 29, 2024
- Konica Minolta, Inc.
- Takashi KAWASAKI
- G01 - MEASURING TESTING
Information Patent Application
POLARIMETRIC IMAGE SENSOR
- Publication number 20240053202
- Publication date Feb 15, 2024
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Jerome VAILLANT
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SPECTROMETER SYSTEM
- Publication number 20240044705
- Publication date Feb 8, 2024
- Bar Ilan University
- Moti FRIDMAN
- G01 - MEASURING TESTING
Information Patent Application
DETERIORATION EVALUATION METHOD OF LINE SENSOR, SPECTRUM MEASUREMEN...
- Publication number 20240044710
- Publication date Feb 8, 2024
- Gigaphoton Inc.
- Natsuhiko KOUNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SPECTROMETER
- Publication number 20240044707
- Publication date Feb 8, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Lutz Frommberger
- G01 - MEASURING TESTING

using diffraction elements

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Micro wideband spectroscopic analysis device

Peak determination in two-dimensional optical spectra

Optical spectrometer and method for spectrally resolved two-dimensi...

Easily adjustable optical emission spectrometer

Single-photon timing system and method

Spectral feature control apparatus

Light source apparatus for light measurement

Spectrometer

Light source modules for noise mitigation

Spectrometer

Emissive display configured with through-display spectrometer

Hyperspectral sensor and hyperspectral camera

Absolute linear-in-k spectrometer

Spectroscopy system

Multi-modal computational imaging via metasurfaces

Systems and methods for screening asymptomatic virus emitters

Material identification through image capture of Raman scattering

Apparatus for optical applications, spectrometer system and method...

Identifying objects using near-infrared sensors, cameras or time-of...

Spectrograph recycling

Apparatus for measuring Raman spectrum and method thereof

Systems and methods for screening asymptomatic virus emitters

Optical detection device, optical detection method, method for desi...

Systems and methods for screening asymptomatic virus emitters

Image sensor and method of operating

Optical module and mobile device having same

Optic for multi-pass optical channel monitor

Freeform offner spectrometer

Processing chamber with optical fiber with bragg grating sensors

Short-wave infrared sensor for identifying based on water content

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR SCREENING ASYMPTOMATIC VIRUS EMITTERS

MEASUREMENTS USING CAMERA IMAGING TISSUE COMPRISING SKIN OR THE HAND

ACTIVE REMOTE SENSING OF ATMOSPHERIC GASES OR SMOKE USING A TIME-OF...

MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND PROGRAM

INTEGRATED BOUND-MODE SPECTRAL/ANGULAR SENSORS

MICROSCOPIC RAMAN SPECTROSCOPY DEVICE

OPTICAL SPECTRUM ANALYZER

SYSTEMS AND METHODS TO ACQUIRE THREE DIMENSIONAL IMAGES USING SPECT...

TIME-OF-FLIGHT SENSORS CO-REGISTERED WITH CAMERA SYSTEMS

SPECTROSCOPIC ANALYSIS DEVICE AND INTERFERING LIGHT FORMATION MECHA...

Serpentine Integrated Grating and Associated Devices

WIDE-FIELD SPECTRAL IMAGING SYSTEM

APPARATUSES, SYSTEMS, AND METHODS FOR DETECTING MATERIALS BASED ON...

WIDE WAVELENGTH OPTICAL DETECTION SYSTEM

WAVEGUIDE AND ELECTROMAGNETIC SPECTROMETER

SINGLE-PHOTON TIMING SYSTEM AND METHOD

PROCESSING CHAMBER WITH OPTICAL FIBER WITH BRAGG GRATING SENSORS

WEARABLE DEVICES COMPRISING SEMICONDUCTOR DIODE LIGHT SOURCES WITH...

IMAGE SENSOR AND METHOD OF OPERATING

SPECTROSCOPE

HYPERSPECTRAL SENSOR WITH PIXEL HAVING LIGHT FOCUSING TRANSPARENT D...

SOLAR REFLECTION FULL-BAND HYPERSPECTRAL IMAGING DETECTION SYSTEM

APPARATUSES, SYSTEMS, AND METHODS FOR DETECTING MATERIALS BASED ON...

METHODS AND APPARATUS FOR MAKING A TIME-SYNCHRONISED PHASOR MEASURE...

ULTRATHIN MICRO-SPECTROMETER AND METHOD OF MANUFACTURING THE SAME

OPTICAL CHARACTERISTIC MEASURING APPARATUS, WAVELENGTH SHIFT CORREC...

POLARIMETRIC IMAGE SENSOR

OPTICAL SPECTROMETER SYSTEM

DETERIORATION EVALUATION METHOD OF LINE SENSOR, SPECTRUM MEASUREMEN...

OPTICAL SPECTROMETER