using diffraction elements

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G01J3/18

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

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G01J3/18using diffraction elements

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Apparatuses, systems, and methods for detecting materials based on...
- Patent number 12,281,942
- Issue date Apr 22, 2025
- Wayne State University
- Gregory William Auner
- G01 - MEASURING TESTING
Information Patent Grant
Multipulse-induced spectroscopy method and device based on femtosec...
- Patent number 12,276,613
- Issue date Apr 15, 2025
- CHONGQING INSTITUTE OF EAST CHINA NORMAL UNIVERSITY
- Heping Zeng
- G01 - MEASURING TESTING
Information Patent Grant
Pulsed-light spectroscopic device
- Patent number 12,270,704
- Issue date Apr 8, 2025
- Ushio Denki Kabushiki Kaisha
- Kazuki Shinoyama
- G02 - OPTICS
Information Patent Grant
Wearable device for differential measurement on pulse rate and bloo...
- Patent number 12,268,475
- Issue date Apr 8, 2025
- Omni MedSci, Inc.
- Mohammed N. Islam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight sensors co-registered with camera systems
- Patent number 12,251,194
- Issue date Mar 18, 2025
- Omni MedSci, Inc.
- Mohammed N. Islam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for optical applications
- Patent number 12,247,877
- Issue date Mar 11, 2025
- FiSensGmbh
- Christian Waltermann
- G02 - OPTICS
Information Patent Grant
Image sensor and method of operating
- Patent number 12,247,879
- Issue date Mar 11, 2025
- Samsung Electronics Co., Ltd.
- Radwanul Hasan Siddique
- G01 - MEASURING TESTING
Information Patent Grant
Analyte detection apparatus and method of detecting an analyte
- Patent number 12,241,784
- Issue date Mar 4, 2025
- RSP SYSTEMS A/S
- Stefan Ovesen Banke
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring optical constant
- Patent number 12,241,781
- Issue date Mar 4, 2025
- The University of Tokyo
- Daisuke Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 12,228,452
- Issue date Feb 18, 2025
- Shimadzu Corporation
- Ryoji Hiraoka
- G01 - MEASURING TESTING
Information Patent Grant
Active illumination and time-of-flight camera system to evaluate fa...
- Patent number 12,226,188
- Issue date Feb 18, 2025
- Omni MedSci, Inc.
- Mohammed N. Islam
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Modulator, imaging apparatus, and design method
- Patent number 12,222,243
- Issue date Feb 11, 2025
- Sony Group Corporation
- Tuo Zhuang
- G01 - MEASURING TESTING
Information Patent Grant
Radio frequency tagging optical spectrometer and method for measure...
- Patent number 12,209,910
- Issue date Jan 28, 2025
- Xiamen University
- Quan Liu
- G01 - MEASURING TESTING
Information Patent Grant
Wearable devices comprising semiconductor diode light sources with...
- Patent number 12,193,790
- Issue date Jan 14, 2025
- Omni MedSci, Inc.
- Mohammed N. Islam
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Spectrometer having a support plate and having a housing
- Patent number 12,188,819
- Issue date Jan 7, 2025
- Carl Zeiss Jena GmbH
- Jens Hofmann
- G01 - MEASURING TESTING
Information Patent Grant
Spectral module and method for manufacturing spectral module
- Patent number 12,181,339
- Issue date Dec 31, 2024
- Hamamatsu Photonics K.K.
- Takafumi Yokino
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Systems and methods using multi-wavelength single-pulse Raman spect...
- Patent number 12,181,340
- Issue date Dec 31, 2024
- University of Maryland Baltimore County
- Bradley Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Reducing polarization dependent loss (PDL) in a grating-based optic...
- Patent number 12,174,066
- Issue date Dec 24, 2024
- Viavi Solutions Inc.
- Driss Touahri
- G01 - MEASURING TESTING
Information Patent Grant
Micro wideband spectroscopic analysis device
- Patent number 12,163,834
- Issue date Dec 10, 2024
- Jed Khoury
- G01 - MEASURING TESTING
Information Patent Grant
Peak determination in two-dimensional optical spectra
- Patent number 12,163,837
- Issue date Dec 10, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hans-Juergen Schlueter
- G01 - MEASURING TESTING
Information Patent Grant
Optical spectrometer and method for spectrally resolved two-dimensi...
- Patent number 12,152,937
- Issue date Nov 26, 2024
- MANTIS PHOTONICS AB
- Diego Guénot
- G01 - MEASURING TESTING
Information Patent Grant
Easily adjustable optical emission spectrometer
- Patent number 12,130,178
- Issue date Oct 29, 2024
- HITACHI HIGH-TECH ANALYTICAL SCIENCE GMBH
- André Peters
- G01 - MEASURING TESTING
Information Patent Grant
Single-photon timing system and method
- Patent number 12,130,176
- Issue date Oct 29, 2024
- The Regents of the University of Colorado, a Body Corporate
- Shu-Wei Huang
- G01 - MEASURING TESTING
Information Patent Grant
Spectral feature control apparatus
- Patent number 12,124,053
- Issue date Oct 22, 2024
- Cymer, LLC
- Eric Anders Mason
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light source apparatus for light measurement
- Patent number 12,117,340
- Issue date Oct 15, 2024
- Ushio Denki Kabushiki Kaisha
- Go Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 12,117,341
- Issue date Oct 15, 2024
- Answeray Inc.
- Seong Ho Cho
- G01 - MEASURING TESTING
Information Patent Grant
Light source modules for noise mitigation
- Patent number 12,111,210
- Issue date Oct 8, 2024
- Apple Inc.
- Mark Alan Arbore
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 12,104,953
- Issue date Oct 1, 2024
- Konica Minolta, Inc.
- Katsutoshi Tsurutani
- G01 - MEASURING TESTING
Information Patent Grant
Emissive display configured with through-display spectrometer
- Patent number 12,098,953
- Issue date Sep 24, 2024
- Google LLC
- Ozan Cakmakci
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Hyperspectral sensor and hyperspectral camera
- Patent number 12,098,951
- Issue date Sep 24, 2024
- FUJIFILM Corporation
- Hiroshi Sato
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECTROSCOPIC SYSTEM
- Publication number 20250123145
- Publication date Apr 17, 2025
- FUJIFILM CORPORATION
- Yukito SAITOH
- G01 - MEASURING TESTING
Information Patent Application
HOLOGRAPHIC GRATING EXPOSURE SYSTEM AND HOLOGRAPHIC GRATING IMAGING...
- Publication number 20250123146
- Publication date Apr 17, 2025
- TSINGHUA UNIVERSITY
- JUN ZHU
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC DEVICE, SPECTROSCOPIC METHOD, RAMAN SCATTERING ANALYS...
- Publication number 20250116553
- Publication date Apr 10, 2025
- TOHOKU UNIVERSITY
- Shinichiro IWAI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT SYSTEMS WITH MULTI-WAVELENGTH EMISSION
- Publication number 20250109989
- Publication date Apr 3, 2025
- Apple Inc.
- Mark A. Arbore
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC ANALYZER
- Publication number 20250102358
- Publication date Mar 27, 2025
- HAMAMATSU PHOTONICS K. K.
- Tatsuo DOUGAKIUCHI
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH CALIBRATION METHOD FOR GRATING SPECTROMETERS
- Publication number 20250085164
- Publication date Mar 13, 2025
- Zolix Instruments Co., Ltd.
- Zemin Lei
- G01 - MEASURING TESTING
Information Patent Application
HYPERSPECTRAL COMPRESSIVE IMAGING WITH INTEGRATED PHOTONICS
- Publication number 20250076573
- Publication date Mar 6, 2025
- The Regents of the University of California
- Sung-Joo Ben Yoo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PROCESSES AND SYSTEMS FOR MONITORING ONE OR MORE GASES DISSOLVED IN...
- Publication number 20250076274
- Publication date Mar 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Richa Sharma
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM MEASUREMENT DEVICE
- Publication number 20250076115
- Publication date Mar 6, 2025
- HTC CORPORATION
- Bo-Wen Xiao
- G01 - MEASURING TESTING
Information Patent Application
WEARABLE DEVICE FOR DIFFERENTIAL MEASUREMENT ON PULSE RATE AND BLOO...
- Publication number 20250049326
- Publication date Feb 13, 2025
- Omni MedSci, Inc.
- Mohammed N. ISLAM
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SPECTROSCOPIC DEVICE
- Publication number 20250052611
- Publication date Feb 13, 2025
- Hamamatsu Photonics K.K.
- Makoto NOZAKI
- G01 - MEASURING TESTING
Information Patent Application
MULTI-DIMENSIONAL SPECTROMETER CALIBRATION
- Publication number 20250035486
- Publication date Jan 30, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Antonella Guzzonato
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE MODULES FOR NOISE MITIGATION
- Publication number 20250027813
- Publication date Jan 23, 2025
- Apple Inc.
- Mark Alan Arbore
- G01 - MEASURING TESTING
Information Patent Application
AUTO-FOCUS SPECTROMETER
- Publication number 20250027812
- Publication date Jan 23, 2025
- Zolix Instruments Co., Ltd.
- Fei Tong
- G01 - MEASURING TESTING
Information Patent Application
WEARABLE DEVICE FOR DIFFERENTIAL MEASUREMENT ON PULSE RATE AND BLOO...
- Publication number 20250017473
- Publication date Jan 16, 2025
- Omni MedSci, Inc.
- Mohammed N. ISLAM
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENTS USING CAMERA SENSOR COUPLED TO A CHEMICAL DETECTION SY...
- Publication number 20250017472
- Publication date Jan 16, 2025
- Omni MedSci, Inc.
- Mohammed N. ISLAM
- G01 - MEASURING TESTING
Information Patent Application
TIME-OF-FLIGHT MEASUREMENT ON USER WITH CAMERAS AND POSITION SENSOR
- Publication number 20250009232
- Publication date Jan 9, 2025
- Omni MedSci, Inc.
- Mohammed N. ISLAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECTRAL FEATURE CONTROL APPARATUS
- Publication number 20250013066
- Publication date Jan 9, 2025
- CYMER, LLC
- Eric Anders Mason
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
REMOTE SENSING SYSTEM WITH TIME-OF-FLIGHT SENSOR, ACTIVE ILLUMINATO...
- Publication number 20250009233
- Publication date Jan 9, 2025
- Omni MedSci, Inc.
- Mohammed N. ISLAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELIMINATION OF OPTICAL GHOSTS IN OPTICAL SPECTRAL ANALYZERS THROUGH...
- Publication number 20250003798
- Publication date Jan 2, 2025
- VIAVI SOLUTIONS INC.
- Driss TOUAHRI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SCREENING ASYMPTOMATIC VIRUS EMITTERS
- Publication number 20240407667
- Publication date Dec 12, 2024
- Hyperspectral Corp.
- David M. Palacios
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENTS USING CAMERA IMAGING TISSUE COMPRISING SKIN OR THE HAND
- Publication number 20240398237
- Publication date Dec 5, 2024
- Mohammed N. ISLAM
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
ACTIVE REMOTE SENSING OF ATMOSPHERIC GASES OR SMOKE USING A TIME-OF...
- Publication number 20240389858
- Publication date Nov 28, 2024
- Mohammed N. ISLAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND PROGRAM
- Publication number 20240385041
- Publication date Nov 21, 2024
- YOKOGAWA ELECTRIC CORPORATION
- Gentaro Ishihara
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED BOUND-MODE SPECTRAL/ANGULAR SENSORS
- Publication number 20240377246
- Publication date Nov 14, 2024
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPIC RAMAN SPECTROSCOPY DEVICE
- Publication number 20240344990
- Publication date Oct 17, 2024
- SHIMADZU CORPORATION
- Tomoki SASAYAMA
- G02 - OPTICS
Information Patent Application
OPTICAL SPECTRUM ANALYZER
- Publication number 20240344885
- Publication date Oct 17, 2024
- Anritsu Corporation
- Maki UENO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS TO ACQUIRE THREE DIMENSIONAL IMAGES USING SPECT...
- Publication number 20240288307
- Publication date Aug 29, 2024
- Yissum Research Development Company of the Hebrew University of Jerusalem Ltd.
- Uriel LEVY
- G01 - MEASURING TESTING
Information Patent Application
TIME-OF-FLIGHT SENSORS CO-REGISTERED WITH CAMERA SYSTEMS
- Publication number 20240268680
- Publication date Aug 15, 2024
- Mohammed N. ISLAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECTROSCOPIC ANALYSIS DEVICE AND INTERFERING LIGHT FORMATION MECHA...
- Publication number 20240271999
- Publication date Aug 15, 2024
- Tsubasa SAITO
- G01 - MEASURING TESTING

using diffraction elements

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatuses, systems, and methods for detecting materials based on...

Multipulse-induced spectroscopy method and device based on femtosec...

Pulsed-light spectroscopic device

Wearable device for differential measurement on pulse rate and bloo...

Time-of-flight sensors co-registered with camera systems

Device for optical applications

Image sensor and method of operating

Analyte detection apparatus and method of detecting an analyte

Device and method for measuring optical constant

Spectrometer

Active illumination and time-of-flight camera system to evaluate fa...

Modulator, imaging apparatus, and design method

Radio frequency tagging optical spectrometer and method for measure...

Wearable devices comprising semiconductor diode light sources with...

Spectrometer having a support plate and having a housing

Spectral module and method for manufacturing spectral module

Systems and methods using multi-wavelength single-pulse Raman spect...

Reducing polarization dependent loss (PDL) in a grating-based optic...

Micro wideband spectroscopic analysis device

Peak determination in two-dimensional optical spectra

Optical spectrometer and method for spectrally resolved two-dimensi...

Easily adjustable optical emission spectrometer

Single-photon timing system and method

Spectral feature control apparatus

Light source apparatus for light measurement

Spectrometer

Light source modules for noise mitigation

Spectrometer

Emissive display configured with through-display spectrometer

Hyperspectral sensor and hyperspectral camera

Patents Applicationslast 30 patents

SPECTROSCOPIC SYSTEM

HOLOGRAPHIC GRATING EXPOSURE SYSTEM AND HOLOGRAPHIC GRATING IMAGING...

SPECTROSCOPIC DEVICE, SPECTROSCOPIC METHOD, RAMAN SCATTERING ANALYS...

OPTICAL MEASUREMENT SYSTEMS WITH MULTI-WAVELENGTH EMISSION

SPECTROSCOPIC ANALYZER

WAVELENGTH CALIBRATION METHOD FOR GRATING SPECTROMETERS

HYPERSPECTRAL COMPRESSIVE IMAGING WITH INTEGRATED PHOTONICS

PROCESSES AND SYSTEMS FOR MONITORING ONE OR MORE GASES DISSOLVED IN...

SPECTRUM MEASUREMENT DEVICE

WEARABLE DEVICE FOR DIFFERENTIAL MEASUREMENT ON PULSE RATE AND BLOO...

SPECTROSCOPIC DEVICE

MULTI-DIMENSIONAL SPECTROMETER CALIBRATION

LIGHT SOURCE MODULES FOR NOISE MITIGATION

AUTO-FOCUS SPECTROMETER

WEARABLE DEVICE FOR DIFFERENTIAL MEASUREMENT ON PULSE RATE AND BLOO...

MEASUREMENTS USING CAMERA SENSOR COUPLED TO A CHEMICAL DETECTION SY...

TIME-OF-FLIGHT MEASUREMENT ON USER WITH CAMERAS AND POSITION SENSOR

SPECTRAL FEATURE CONTROL APPARATUS

REMOTE SENSING SYSTEM WITH TIME-OF-FLIGHT SENSOR, ACTIVE ILLUMINATO...

ELIMINATION OF OPTICAL GHOSTS IN OPTICAL SPECTRAL ANALYZERS THROUGH...

SYSTEMS AND METHODS FOR SCREENING ASYMPTOMATIC VIRUS EMITTERS

MEASUREMENTS USING CAMERA IMAGING TISSUE COMPRISING SKIN OR THE HAND

ACTIVE REMOTE SENSING OF ATMOSPHERIC GASES OR SMOKE USING A TIME-OF...

MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND PROGRAM

INTEGRATED BOUND-MODE SPECTRAL/ANGULAR SENSORS

MICROSCOPIC RAMAN SPECTROSCOPY DEVICE

OPTICAL SPECTRUM ANALYZER

SYSTEMS AND METHODS TO ACQUIRE THREE DIMENSIONAL IMAGES USING SPECT...

TIME-OF-FLIGHT SENSORS CO-REGISTERED WITH CAMERA SYSTEMS

SPECTROSCOPIC ANALYSIS DEVICE AND INTERFERING LIGHT FORMATION MECHA...