using digital holographic imaging

Industry

CPC
G01B9/02047

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02047using digital holographic imaging

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method for examining a coating of a probe surface
- Patent number 11,859,962
- Issue date Jan 2, 2024
- BASF Coatings GmbH
- Rolf Doering
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring interfaces of an optical element
- Patent number 11,808,656
- Issue date Nov 7, 2023
- FOGALE NANOTECH
- Alain Courteville
- G01 - MEASURING TESTING
Information Patent Grant
System for spatial multiplexing
- Patent number 11,768,068
- Issue date Sep 26, 2023
- Ramot at Tel Aviv University Ltd.
- Natan Tzvi Shaked
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and systems of holographic interferometry
- Patent number 11,719,531
- Issue date Aug 8, 2023
- RD Synergy Ltd.
- Dov Furman
- G02 - OPTICS
Information Patent Grant
Interferometry with pulse broadened diode laser
- Patent number 11,680,787
- Issue date Jun 20, 2023
- Carl Zeiss Meditec, Inc.
- Alexandre R. Tumlinson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface shape measurement device and surface shape measurement method
- Patent number 11,635,289
- Issue date Apr 25, 2023
- UNIVERSITY OF HYOGO
- Kunihiro Sato
- G01 - MEASURING TESTING
Information Patent Grant
Method for photocopying a sequence of cut surfaces inside a light-s...
- Patent number 11,482,044
- Issue date Oct 25, 2022
- VISOTEC GMBH
- Helge Sudkamp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microscope with rotating beam system
- Patent number 11,346,649
- Issue date May 31, 2022
- NANOLIVE SA
- Yann Cotte
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry with pulse broadened diode laser
- Patent number 11,320,253
- Issue date May 3, 2022
- Carl Zeiss Meditec, Inc.
- Alexandre R. Tumlinson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple offset interferometer
- Patent number 11,226,588
- Issue date Jan 18, 2022
- Siemens Healthcare GmbH
- Thomas Engel
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measurement device
- Patent number 11,118,895
- Issue date Sep 14, 2021
- CKD Corporation
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Grant
Digital holography range Doppler receiver
- Patent number 11,099,523
- Issue date Aug 24, 2021
- Lockheed Martin Corporation
- Philip Gatt
- G01 - MEASURING TESTING
Information Patent Grant
Digital holographic microscope with electro fluidic system, said el...
- Patent number 11,067,379
- Issue date Jul 20, 2021
- Ovizio Imaging Systems NV/SA
- Philip Mathuis
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry with pulse broadened diode laser
- Patent number 10,809,050
- Issue date Oct 20, 2020
- Carl Zeiss Meditec, Inc.
- Alexandre R. Tumlinson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for exposing at least one sectional face inside a...
- Patent number 10,682,052
- Issue date Jun 16, 2020
- Medizinisches Laserzentrum Luebeck GmbH
- Peter Koch
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Digital holographic microscope
- Patent number 10,520,295
- Issue date Dec 31, 2019
- NANOLIVE SA
- Yann Cotte
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interferometry with pulse broadened diode laser
- Patent number 10,495,439
- Issue date Dec 3, 2019
- Carl Zeiss Meditec, Inc.
- Alexandre R. Tumlinson
- G01 - MEASURING TESTING
Information Patent Grant
Multi wavelength multiplexing for quantitative interferometry
- Patent number 10,488,175
- Issue date Nov 26, 2019
- Ramot at Tel Aviv University Ltd.
- Natan Tzvi Shaked
- G01 - MEASURING TESTING
Information Patent Grant
Single shot full-field reflection phase microscopy
- Patent number 10,451,402
- Issue date Oct 22, 2019
- Massachusetts Institute of Technology
- Zahid Yaqoob
- G01 - MEASURING TESTING
Information Patent Grant
Balanced detection systems
- Patent number 10,436,573
- Issue date Oct 8, 2019
- Carl Zeiss Meditec, Inc.
- Tilman Schmoll
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing an object
- Patent number 10,415,954
- Issue date Sep 17, 2019
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Grant
Device for determining a 3D structure of an object
- Patent number 10,393,501
- Issue date Aug 27, 2019
- VOCO GmbH
- Alexander Knüttel
- G01 - MEASURING TESTING
Information Patent Grant
Optical system phase acquisition method and optical system evaluati...
- Patent number 10,365,164
- Issue date Jul 30, 2019
- Ushio Denki Kabushiki Kaisha
- Masashi Okamoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Calibration method and system for a fast steering mirror
- Patent number 10,330,460
- Issue date Jun 25, 2019
- Raytheon Company
- Kyle Heideman
- G02 - OPTICS
Information Patent Grant
Method and apparatus for digital holographic microtomography
- Patent number 10,234,268
- Issue date Mar 19, 2019
- National Taiwan Normal University
- Chau-Jern Cheng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for analyzing an object using a combination of long and shor...
- Patent number 10,054,419
- Issue date Aug 21, 2018
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for detecting a 3D structure of an object
- Patent number 9,835,435
- Issue date Dec 5, 2017
- VOCO GmbH
- Alexander Knüttel
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
System and a method for quantitative sample imaging using off-axis...
- Patent number 9,816,801
- Issue date Nov 14, 2017
- Ramot at Tel Aviv University Ltd.
- Pinhas Girshovitz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Three-dimensional shape measuring device, method for acquiring holo...
- Patent number 9,494,411
- Issue date Nov 15, 2016
- 3DRAGONS, LLC
- Hideyoshi Horimai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Line-field holoscopy
- Patent number 9,332,902
- Issue date May 10, 2016
- Carl Zeiss Meditec, Inc.
- Alexandre R. Tumlinson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL DIFFRACTION TOMOGRAPHY MICROSCOPE
- Publication number 20240053135
- Publication date Feb 15, 2024
- NANOLIVE SA
- Sebastien EQUIS
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DIFFRACTION TOMOGRAPHY MICROSCOPE
- Publication number 20240044636
- Publication date Feb 8, 2024
- NANOLIVE SA
- Sebastien EQUIS
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Reconstruction of Digital Holograms
- Publication number 20230259070
- Publication date Aug 17, 2023
- ORBOTECH LTD.
- Yigal KATZIR
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DEVICE AND METHOD FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT
- Publication number 20220357236
- Publication date Nov 10, 2022
- FOGALE NANOTECH
- Alain COURTEVILLE
- G01 - MEASURING TESTING
Information Patent Application
Surface Shape Measurement Device and Surface Shape Measurement Method
- Publication number 20220349699
- Publication date Nov 3, 2022
- UNIVERSITY OF HYOGO
- Kunihiro Sato
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR SPATIAL MULTIPLEXING
- Publication number 20220307815
- Publication date Sep 29, 2022
- Ramot at Tel Aviv University Ltd.
- Natan Tzvi SHAKED
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY WITH PULSE BROADENED DIODE LASER
- Publication number 20220268565
- Publication date Aug 25, 2022
- Carl Zeiss Meditec, Inc.
- Alexandre R. TUMLINSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR EXAMINING A COATING OF A PROBE SURFACE
- Publication number 20220196389
- Publication date Jun 23, 2022
- BASF COATINGS GMBH
- Rolf Doering
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PHOTOCOPYING A SEQUENCE OF CUT SURFACES INSIDE A LIGHT-S...
- Publication number 20210034863
- Publication date Feb 4, 2021
- Visotec GmbH
- Helge Sudkamp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERFEROMETRY WITH PULSE BROADENED DIODE LASER
- Publication number 20210018311
- Publication date Jan 21, 2021
- Carl Zeiss Meditec, Inc.
- Alexandre R. TUMLINSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIGITAL HOLOGRAPHIC MICROSCOPE
- Publication number 20200348122
- Publication date Nov 5, 2020
- NANOLIVE SA
- Yann COTTE
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY WITH PULSE BROADENED DIODE LASER
- Publication number 20200064117
- Publication date Feb 27, 2020
- Carl Zeiss Meditec, Inc.
- Alexandre R. TUMLINSON
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MONITORING A BUILDING STRUCTURE
- Publication number 20190310085
- Publication date Oct 10, 2019
- Consiglio Nazionale delle Ricerche - CNR
- Massimiliano LOCATELLI
- G01 - MEASURING TESTING
Information Patent Application
MULTI WAVELENGTH MULTIPLEXING FOR QUANTITATIVE INTERFEROMETRY
- Publication number 20190162520
- Publication date May 30, 2019
- Ramot at Tel Aviv University Ltd.
- Natan Tzvi SHAKED
- G01 - MEASURING TESTING
Information Patent Application
Method for Analyzing an Object
- Publication number 20190017804
- Publication date Jan 17, 2019
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
BALANCED DETECTION SYSTEMS
- Publication number 20180364025
- Publication date Dec 20, 2018
- Tilman SCHMOLL
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION METHOD AND SYSTEM FOR A FAST STEERING MIRROR
- Publication number 20180356204
- Publication date Dec 13, 2018
- Raytheon Company
- Kyle Heideman
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY WITH PULSE BROADENED DIODE LASER
- Publication number 20180259316
- Publication date Sep 13, 2018
- Carl Zeiss Meditec, Inc.
- Alexandre R. TUMLINSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR MONITORING A BUILDING STRUCTURE
- Publication number 20180003499
- Publication date Jan 4, 2018
- Consiglio Nazionale delle Ricerche - CNR
- Massimiliano LOCATELLI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR DETERMINING A 3D STRUCTURE OF AN OBJECT
- Publication number 20170322015
- Publication date Nov 9, 2017
- VOCO GmbH
- Alexander Knüttel
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPE
- Publication number 20170299371
- Publication date Oct 19, 2017
- NANOLIVE SA
- Yann COTTE
- G02 - OPTICS
Information Patent Application
DIGITAL HOLOGRAPHIC MICROSCOPE WITH ELECTRO-FLUIDIC SYSTEM, SAID EL...
- Publication number 20170205222
- Publication date Jul 20, 2017
- OVIZIO IMAGING SYSTEMS NV/SA
- Philip Mathuis
- G01 - MEASURING TESTING
Information Patent Application
LENS-FREE TOMOGRAPHIC IMAGING DEVICES AND METHODS
- Publication number 20170153106
- Publication date Jun 1, 2017
- The Regents of the University of California
- Aydogan Ozcan
- G02 - OPTICS
Information Patent Application
Method for Analyzing an Object Using a Combination of Long and Shor...
- Publication number 20170038191
- Publication date Feb 9, 2017
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER
- Publication number 20160334205
- Publication date Nov 17, 2016
- Applejack 199 L.P.
- ARUN ANANTH AIYER
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL HOLOGRAPHY THREE-DIMENSIONAL IMAGING APPARATUS AND DIGITAL...
- Publication number 20150176966
- Publication date Jun 25, 2015
- Canon Kabushiki Kaisha
- Akira Eguchi
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR DETECTING A 3D STRUCTURE OF AN OBJECT
- Publication number 20140320865
- Publication date Oct 30, 2014
- Alexander Knüttel
- G02 - OPTICS
Information Patent Application
LINE-FIELD HOLOSCOPY
- Publication number 20140028974
- Publication date Jan 30, 2014
- Carl Zeiss Meditec, Inc.
- Alexandre R. Tumlinson
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY-BASED STRESS ANALYSIS
- Publication number 20130003152
- Publication date Jan 3, 2013
- United Technologies Corporation
- Igor V. Belousov
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-SHOT FULL-FIELD REFLECTION PHASE MICROSCOPY
- Publication number 20120307035
- Publication date Dec 6, 2012
- Zahid Yaqoob
- G02 - OPTICS

using digital holographic imaging

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for examining a coating of a probe surface

Device and method for measuring interfaces of an optical element

System for spatial multiplexing

Methods and systems of holographic interferometry

Interferometry with pulse broadened diode laser

Surface shape measurement device and surface shape measurement method

Method for photocopying a sequence of cut surfaces inside a light-s...

Microscope with rotating beam system

Interferometry with pulse broadened diode laser

Multiple offset interferometer

Three-dimensional measurement device

Digital holography range Doppler receiver

Digital holographic microscope with electro fluidic system, said el...

Interferometry with pulse broadened diode laser

Method and device for exposing at least one sectional face inside a...

Digital holographic microscope

Interferometry with pulse broadened diode laser

Multi wavelength multiplexing for quantitative interferometry

Single shot full-field reflection phase microscopy

Balanced detection systems

Method for analyzing an object

Device for determining a 3D structure of an object

Optical system phase acquisition method and optical system evaluati...

Calibration method and system for a fast steering mirror

Method and apparatus for digital holographic microtomography

Method for analyzing an object using a combination of long and shor...

Apparatus for detecting a 3D structure of an object

System and a method for quantitative sample imaging using off-axis...

Three-dimensional shape measuring device, method for acquiring holo...

Line-field holoscopy

Patents Applicationslast 30 patents

OPTICAL DIFFRACTION TOMOGRAPHY MICROSCOPE

OPTICAL DIFFRACTION TOMOGRAPHY MICROSCOPE

Systems and Methods for Reconstruction of Digital Holograms

DEVICE AND METHOD FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT

Surface Shape Measurement Device and Surface Shape Measurement Method

SYSTEM FOR SPATIAL MULTIPLEXING

INTERFEROMETRY WITH PULSE BROADENED DIODE LASER

METHOD FOR EXAMINING A COATING OF A PROBE SURFACE

METHOD FOR PHOTOCOPYING A SEQUENCE OF CUT SURFACES INSIDE A LIGHT-S...

INTERFEROMETRY WITH PULSE BROADENED DIODE LASER

DIGITAL HOLOGRAPHIC MICROSCOPE

INTERFEROMETRY WITH PULSE BROADENED DIODE LASER

METHOD AND SYSTEM FOR MONITORING A BUILDING STRUCTURE

MULTI WAVELENGTH MULTIPLEXING FOR QUANTITATIVE INTERFEROMETRY

Method for Analyzing an Object

BALANCED DETECTION SYSTEMS

CALIBRATION METHOD AND SYSTEM FOR A FAST STEERING MIRROR

INTERFEROMETRY WITH PULSE BROADENED DIODE LASER

METHOD AND SYSTEM FOR MONITORING A BUILDING STRUCTURE

DEVICE FOR DETERMINING A 3D STRUCTURE OF AN OBJECT

MICROSCOPE

DIGITAL HOLOGRAPHIC MICROSCOPE WITH ELECTRO-FLUIDIC SYSTEM, SAID EL...

LENS-FREE TOMOGRAPHIC IMAGING DEVICES AND METHODS

Method for Analyzing an Object Using a Combination of Long and Shor...

INTERFEROMETER

DIGITAL HOLOGRAPHY THREE-DIMENSIONAL IMAGING APPARATUS AND DIGITAL...

APPARATUS FOR DETECTING A 3D STRUCTURE OF AN OBJECT

LINE-FIELD HOLOSCOPY

INTERFEROMETRY-BASED STRESS ANALYSIS

SINGLE-SHOT FULL-FIELD REFLECTION PHASE MICROSCOPY