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PHYSICS
G01
Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N21/00
Investigating or analysing materials by the use of optical means
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G01N21/67
using electric arcs or discharges
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Patents Grants
last 30 patents
Information
Patent Grant
Spark spectrometry for inclusions content distribution on the surfa...
Patent number
12,203,864
Issue date
Jan 21, 2025
NCS TESTING TECHNOLOGY CO., LTD
Yunhai Jia
G01 - MEASURING TESTING
Information
Patent Grant
Vacuum feedthrough, electrode assembly, and device for generating a...
Patent number
12,096,545
Issue date
Sep 17, 2024
INFICON AG
Bernhard Andreaus
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Solution glow discharge plasma chamber with ventilation
Patent number
12,050,180
Issue date
Jul 30, 2024
2S WATER INCORPORATED
Joseph John Cheramy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for preparing glow discharge sputtering sample...
Patent number
12,019,025
Issue date
Jun 25, 2024
NCS TESTING TECHNOLOGY CO., LTD
Xing Yu
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Generator for spectrometry
Patent number
12,022,603
Issue date
Jun 25, 2024
Analytik Jena GmbH+Co. KG
Frank Claus
G01 - MEASURING TESTING
Information
Patent Grant
Downhole optical emission spectroscopy
Patent number
11,965,418
Issue date
Apr 23, 2024
Halliburton Energy Services, Inc.
Mathew Dennis Rowe
E21 - EARTH DRILLING MINING
Information
Patent Grant
Systems and methods for measuring a temperature of a gas
Patent number
11,946,871
Issue date
Apr 2, 2024
Purdue Research Foundation
Alexey Shashurin
G01 - MEASURING TESTING
Information
Patent Grant
Glow plasma gas measurement signal processing
Patent number
11,948,774
Issue date
Apr 2, 2024
Servomex Group Limited
Bahram Alizadeh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and systems for inclusion analysis
Patent number
11,921,053
Issue date
Mar 5, 2024
FEI Company
Jean-Marc Bohlen
G01 - MEASURING TESTING
Information
Patent Grant
Emission-based detector for capillary gas chromatography
Patent number
11,879,849
Issue date
Jan 23, 2024
Mécanique Analytique Inc.
Yves Gamache
G01 - MEASURING TESTING
Information
Patent Grant
Optical emission spectroscopy control of gas flow in processing cha...
Patent number
11,868,147
Issue date
Jan 9, 2024
Applied Materials, Inc.
Philip DiGiacomo
G01 - MEASURING TESTING
Information
Patent Grant
Measurement deviation correction method and system for spark discha...
Patent number
11,754,503
Issue date
Sep 12, 2023
NCS TESTING TECHNOLOGY CO., LTD
Yunhai Jia
G01 - MEASURING TESTING
Information
Patent Grant
Solution glow discharge plasma chamber with lens
Patent number
11,598,727
Issue date
Mar 7, 2023
2S WATER INCORPORATED
Joseph John Cheramy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for analyzing the elemental composition of a liquid sampl...
Patent number
11,474,042
Issue date
Oct 18, 2022
Agnes Obuchowska
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Plasma-based detector and methods using the same for measuring and...
Patent number
11,474,043
Issue date
Oct 18, 2022
Mécanique Analytique Inc.
Yves Gamache
G01 - MEASURING TESTING
Information
Patent Grant
Multi-electrode/multi-modal atmospheric pressure glow discharge pla...
Patent number
11,366,066
Issue date
Jun 21, 2022
Battelle Memorial Institute
David W. Koppenaal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Emission-based detector for capillary gas chromatography
Patent number
11,340,173
Issue date
May 24, 2022
MECANIQUE ANALYTIQUE INC.
Yves Gamache
G01 - MEASURING TESTING
Information
Patent Grant
Spark emission spectrometer with separable spark chamber
Patent number
11,274,968
Issue date
Mar 15, 2022
ELEMENTAR ANALYSENSYSTEME GMBH
Hans Dominick
G01 - MEASURING TESTING
Information
Patent Grant
Liquid electrode tip
Patent number
11,150,192
Issue date
Oct 19, 2021
2S WATER INCORPORATED
Neil Johnson
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for inclusion analysis
Patent number
11,150,197
Issue date
Oct 19, 2021
FEI Company
Jean-Marc Bohlen
G01 - MEASURING TESTING
Information
Patent Grant
Spark emission spectrometer and method for operating same
Patent number
11,143,596
Issue date
Oct 12, 2021
ELEMENTAR ANALYSENSYSTEME GMBH
Hans Dominick
G01 - MEASURING TESTING
Information
Patent Grant
Plasma spectroscopy analysis method
Patent number
11,143,595
Issue date
Oct 12, 2021
ARKRAY, Inc.
Tsuyoshi Takasu
G01 - MEASURING TESTING
Information
Patent Grant
Atmospheric-pressure ionization and fragmentation of molecules for...
Patent number
11,133,170
Issue date
Sep 28, 2021
Indiana University Research and Technology Corporation
Jacob T. Shelley
G01 - MEASURING TESTING
Information
Patent Grant
Optical emission spectroscopy system, method of calibrating the sam...
Patent number
11,092,495
Issue date
Aug 17, 2021
Samsung Electronics Co., Ltd.
Jeongil Mun
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device for recognizing an arcing fault, and electrical switchgear
Patent number
11,095,109
Issue date
Aug 17, 2021
Siemens Aktiengesellschaft
Stefan Lecheler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Discharge detection system and discharge detection method
Patent number
11,009,466
Issue date
May 18, 2021
SUBARU CORPORATION
Takayuki Nishi
G01 - MEASURING TESTING
Information
Patent Grant
Reduction of molecular background emission and sample matrix manage...
Patent number
10,962,483
Issue date
Mar 30, 2021
InnoTech Alberta Inc.
Stuart Garth Schroeder
G01 - MEASURING TESTING
Information
Patent Grant
Method and tool for producing sample containing object, method for...
Patent number
10,859,502
Issue date
Dec 8, 2020
Horiba, Ltd.
Akira Fujimoto
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for spectral analysis of a chemical composition o...
Patent number
10,830,705
Issue date
Nov 10, 2020
Aleksandr Nikolaevich Zabrodin
G01 - MEASURING TESTING
Information
Patent Grant
Optical detection of tracer gases in a gas discharge cell having un...
Patent number
10,782,237
Issue date
Sep 22, 2020
INFICON Holding AG
Vladimir Schwartz
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CIRCUIT ADAPTIVE ZERO-VOLTAGE SWITCHING CONTROL METHOD BASED ON SWI...
Publication number
20250044233
Publication date
Feb 6, 2025
NANJING EFFICIENT POWER FOR INTELLIGENT COMPUTING TECHNOLOGIES CO. LTD.
Borong HU
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC CONFINEMENT OF ARC DISCHARGE MIGRATION IN SPARK OES SYSTEMS
Publication number
20240344994
Publication date
Oct 17, 2024
Thermo Electron Scientific Instruments LLC
Patrick Lancuba
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
A DEVICE FOR DETECTING HEALTH DISORDERS FROM BIOLOGICAL SAMPLES AND...
Publication number
20240264146
Publication date
Aug 8, 2024
Ricardo Daniel DE SIMONE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ULTRA-HIGH-SPEED FULLY AUTOMATIC PRECISION SPECTRAL ANALYSIS SYSTEM...
Publication number
20240210433
Publication date
Jun 27, 2024
NCS TESTING TECHNOLOGY CO., LTD
Yunhai Jia
G01 - MEASURING TESTING
Information
Patent Application
VACUUM FEEDTHROUGH, ELECTRODE ASSEMBLY, AND DEVICE FOR GENERATING A...
Publication number
20240196508
Publication date
Jun 13, 2024
INFICON AG
Bernhard ANDREAUS
G01 - MEASURING TESTING
Information
Patent Application
SPARK SPECTROMETRY FOR INCLUSIONS CONTENT DISTRIBUTION ON THE SURFA...
Publication number
20240159680
Publication date
May 16, 2024
NCS Testing Technology CO.,LTD
Yunhai Jia
G01 - MEASURING TESTING
Information
Patent Application
SPARK STAND ASSEMBLY FOR AN OPTICAL EMISSION SPECTROSCOPY INSTRUMENT
Publication number
20240003817
Publication date
Jan 4, 2024
Hitachi High-Tech Analytical Science GmbH
André PETERS
G01 - MEASURING TESTING
Information
Patent Application
HIGH SPECTRAL AND TEMPORAL RESOLUTION GLOW DISCHARGE SPECTROMETRY D...
Publication number
20230349832
Publication date
Nov 2, 2023
HORIBA FRANCE SAS
Patrick CHAPON
G01 - MEASURING TESTING
Information
Patent Application
GAS ANALYZER
Publication number
20230280277
Publication date
Sep 7, 2023
Marunaka Co.,Ltd.
Mitsugu NAKAGAWA
G01 - MEASURING TESTING
Information
Patent Application
COMPOSITE OPTICAL FIBRE BASED PLASMA GENERATION DEVICE
Publication number
20230101792
Publication date
Mar 30, 2023
UNIVERSITE DE BORDEAUX
Sylvain DANTO
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Solution Glow Discharge Plasma Chamber with Ventilation
Publication number
20230059048
Publication date
Feb 23, 2023
2S WATER INCORPORATED
Joseph John Cheramy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Solution Glow Discharge Plasma Chamber with Lens
Publication number
20230059823
Publication date
Feb 23, 2023
2 S Water Incorporated
Joseph John Cheramy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
A SPARK STAND AND METHOD OF MAINTENANCE
Publication number
20220333990
Publication date
Oct 20, 2022
Thermo Fisher Scientific (Ecublens)
Fabio Demarco
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
OPTICAL EMISSION SPECTROSCOPY CONTROL OF GAS FLOW IN PROCESSING CHA...
Publication number
20220291702
Publication date
Sep 15, 2022
Applied Materials, Inc.
Philip DiGiacomo
G01 - MEASURING TESTING
Information
Patent Application
EMISSION-BASED DETECTOR FOR CAPILLARY GAS CHROMATOGRAPHY
Publication number
20220252517
Publication date
Aug 11, 2022
Mecanique Analytique Inc.
Yves GAMACHE
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR PREPARING GLOW DISCHARGE SPUTTERING SAMPLE...
Publication number
20220205922
Publication date
Jun 30, 2022
NCS Testing Technology CO.,LTD
Xing YU
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Improved Spark Stand for Optical Emission Spectrometry
Publication number
20220155217
Publication date
May 19, 2022
THERMO FISHER SCIENTIFIC (ECUBLENS) SARL
Patrick Lancuba
G01 - MEASURING TESTING
Information
Patent Application
PATHOGEN SCREENING USING OPTICAL EMISSION SPECTROSCOPY (OES)
Publication number
20220026367
Publication date
Jan 27, 2022
Jyotirmoy Mazumder
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR INCLUSION ANALYSIS
Publication number
20220026373
Publication date
Jan 27, 2022
FEI Company
Jean-Marc Bohlen
G01 - MEASURING TESTING
Information
Patent Application
GENERATOR FOR SPECTROMETRY
Publication number
20220007490
Publication date
Jan 6, 2022
Analytik Jena GmbH
Frank Claus
G01 - MEASURING TESTING
Information
Patent Application
GLOW PLASMA GAS MEASUREMENT SIGNAL PROCESSING
Publication number
20210310956
Publication date
Oct 7, 2021
Servomex Group Limited
Bahram Alizadeh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SPARK EMISSION SPECTROMETER WITH SEPARABLE SPARK CHAMBER
Publication number
20210285820
Publication date
Sep 16, 2021
Elementar Analysensysteme GmbH
Hans DOMINICK
G01 - MEASURING TESTING
Information
Patent Application
LIQUID ELECTRODE TIP
Publication number
20210223182
Publication date
Jul 22, 2021
2S WATER INCORPORATED
Neil JOHNSON
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR MEASURING A TEMPERATURE OF A GAS
Publication number
20210199590
Publication date
Jul 1, 2021
Purdue Research Foundation
Alexey Shashurin
G01 - MEASURING TESTING
Information
Patent Application
PLASMA-BASED DETECTOR AND METHODS USING THE SAME FOR MEASURING AND...
Publication number
20210156805
Publication date
May 27, 2021
MECANIQUE ANALYTIQUE INC.
Yves Gamache
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR ANALYZING THE ELEMENTAL COMPOSITION OF A LIQUID SAMPL...
Publication number
20210131971
Publication date
May 6, 2021
Agnes OBUCHOWSKA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI-ELECTRODE/MULTI-MODAL ATMOSPHERIC PRESSURE GLOW DISCHARGE PLA...
Publication number
20210109026
Publication date
Apr 15, 2021
Battelle Memorial Institute
David W. Koppenaal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PARTICLE DETECTION DEVICE
Publication number
20200348220
Publication date
Nov 5, 2020
NGK Insulators, Ltd.
Keiichi KANNO
G01 - MEASURING TESTING
Information
Patent Application
GAS ANALYZER
Publication number
20200348237
Publication date
Nov 5, 2020
Marunaka Co., Ltd.
Mitsugu NAKAGAWA
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR INCLUSION ANALYSIS
Publication number
20200309715
Publication date
Oct 1, 2020
FEI Company
Jean-Marc Bohlen
G01 - MEASURING TESTING