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G01N21/67
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N21/00
Investigating or analysing materials by the use of optical means
Current Industry
G01N21/67
using electric arcs or discharges
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Downhole optical emission spectroscopy
Patent number
11,965,418
Issue date
Apr 23, 2024
Halliburton Energy Services, Inc.
Mathew Dennis Rowe
E21 - EARTH DRILLING MINING
Information
Patent Grant
Systems and methods for measuring a temperature of a gas
Patent number
11,946,871
Issue date
Apr 2, 2024
Purdue Research Foundation
Alexey Shashurin
G01 - MEASURING TESTING
Information
Patent Grant
Glow plasma gas measurement signal processing
Patent number
11,948,774
Issue date
Apr 2, 2024
Servomex Group Limited
Bahram Alizadeh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and systems for inclusion analysis
Patent number
11,921,053
Issue date
Mar 5, 2024
FEI Company
Jean-Marc Bohlen
G01 - MEASURING TESTING
Information
Patent Grant
Emission-based detector for capillary gas chromatography
Patent number
11,879,849
Issue date
Jan 23, 2024
Mécanique Analytique Inc.
Yves Gamache
G01 - MEASURING TESTING
Information
Patent Grant
Optical emission spectroscopy control of gas flow in processing cha...
Patent number
11,868,147
Issue date
Jan 9, 2024
Applied Materials, Inc.
Philip DiGiacomo
G01 - MEASURING TESTING
Information
Patent Grant
Measurement deviation correction method and system for spark discha...
Patent number
11,754,503
Issue date
Sep 12, 2023
NCS TESTING TECHNOLOGY CO., LTD
Yunhai Jia
G01 - MEASURING TESTING
Information
Patent Grant
Solution glow discharge plasma chamber with lens
Patent number
11,598,727
Issue date
Mar 7, 2023
2S WATER INCORPORATED
Joseph John Cheramy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for analyzing the elemental composition of a liquid sampl...
Patent number
11,474,042
Issue date
Oct 18, 2022
Agnes Obuchowska
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Plasma-based detector and methods using the same for measuring and...
Patent number
11,474,043
Issue date
Oct 18, 2022
Mécanique Analytique Inc.
Yves Gamache
G01 - MEASURING TESTING
Information
Patent Grant
Multi-electrode/multi-modal atmospheric pressure glow discharge pla...
Patent number
11,366,066
Issue date
Jun 21, 2022
Battelle Memorial Institute
David W. Koppenaal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Emission-based detector for capillary gas chromatography
Patent number
11,340,173
Issue date
May 24, 2022
MECANIQUE ANALYTIQUE INC.
Yves Gamache
G01 - MEASURING TESTING
Information
Patent Grant
Spark emission spectrometer with separable spark chamber
Patent number
11,274,968
Issue date
Mar 15, 2022
ELEMENTAR ANALYSENSYSTEME GMBH
Hans Dominick
G01 - MEASURING TESTING
Information
Patent Grant
Liquid electrode tip
Patent number
11,150,192
Issue date
Oct 19, 2021
2S WATER INCORPORATED
Neil Johnson
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for inclusion analysis
Patent number
11,150,197
Issue date
Oct 19, 2021
FEI Company
Jean-Marc Bohlen
G01 - MEASURING TESTING
Information
Patent Grant
Spark emission spectrometer and method for operating same
Patent number
11,143,596
Issue date
Oct 12, 2021
ELEMENTAR ANALYSENSYSTEME GMBH
Hans Dominick
G01 - MEASURING TESTING
Information
Patent Grant
Plasma spectroscopy analysis method
Patent number
11,143,595
Issue date
Oct 12, 2021
ARKRAY, Inc.
Tsuyoshi Takasu
G01 - MEASURING TESTING
Information
Patent Grant
Atmospheric-pressure ionization and fragmentation of molecules for...
Patent number
11,133,170
Issue date
Sep 28, 2021
Indiana University Research and Technology Corporation
Jacob T. Shelley
G01 - MEASURING TESTING
Information
Patent Grant
Optical emission spectroscopy system, method of calibrating the sam...
Patent number
11,092,495
Issue date
Aug 17, 2021
Samsung Electronics Co., Ltd.
Jeongil Mun
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device for recognizing an arcing fault, and electrical switchgear
Patent number
11,095,109
Issue date
Aug 17, 2021
Siemens Aktiengesellschaft
Stefan Lecheler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Discharge detection system and discharge detection method
Patent number
11,009,466
Issue date
May 18, 2021
SUBARU CORPORATION
Takayuki Nishi
G01 - MEASURING TESTING
Information
Patent Grant
Reduction of molecular background emission and sample matrix manage...
Patent number
10,962,483
Issue date
Mar 30, 2021
InnoTech Alberta Inc.
Stuart Garth Schroeder
G01 - MEASURING TESTING
Information
Patent Grant
Method and tool for producing sample containing object, method for...
Patent number
10,859,502
Issue date
Dec 8, 2020
Horiba, Ltd.
Akira Fujimoto
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for spectral analysis of a chemical composition o...
Patent number
10,830,705
Issue date
Nov 10, 2020
Aleksandr Nikolaevich Zabrodin
G01 - MEASURING TESTING
Information
Patent Grant
Optical detection of tracer gases in a gas discharge cell having un...
Patent number
10,782,237
Issue date
Sep 22, 2020
INFICON Holding AG
Vladimir Schwartz
G01 - MEASURING TESTING
Information
Patent Grant
Solution cathode glow discharge plasma-atomic emission spectrum app...
Patent number
10,705,023
Issue date
Jul 7, 2020
Shanghai Institute of Ceramics, Chinese Academy of Sciences
Zheng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Device for positioning and isolating a sample in a sealed environment
Patent number
10,677,733
Issue date
Jun 9, 2020
Thermo Scientific Portable Analytical Instruments Inc.
Andrew T. Leoni
G01 - MEASURING TESTING
Information
Patent Grant
Method for analyzing nitrogen in metal sample, apparatus for analyz...
Patent number
10,641,711
Issue date
May 5, 2020
JFE Steel Corporation
Satoshi Kinoshiro
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Optical emission spectroscopic techniques for monitoring etching
Patent number
10,541,184
Issue date
Jan 21, 2020
Applied Materials, Inc.
Soonwook Jung
G01 - MEASURING TESTING
Information
Patent Grant
Metal-antibody tagging and plasma-based detection
Patent number
10,451,556
Issue date
Oct 22, 2019
Purdue Research Foundation
Joseph Paul Robinson
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SPARK STAND ASSEMBLY FOR AN OPTICAL EMISSION SPECTROSCOPY INSTRUMENT
Publication number
20240003817
Publication date
Jan 4, 2024
Hitachi High-Tech Analytical Science GmbH
André PETERS
G01 - MEASURING TESTING
Information
Patent Application
HIGH SPECTRAL AND TEMPORAL RESOLUTION GLOW DISCHARGE SPECTROMETRY D...
Publication number
20230349832
Publication date
Nov 2, 2023
HORIBA FRANCE SAS
Patrick CHAPON
G01 - MEASURING TESTING
Information
Patent Application
GAS ANALYZER
Publication number
20230280277
Publication date
Sep 7, 2023
Marunaka Co.,Ltd.
Mitsugu NAKAGAWA
G01 - MEASURING TESTING
Information
Patent Application
COMPOSITE OPTICAL FIBRE BASED PLASMA GENERATION DEVICE
Publication number
20230101792
Publication date
Mar 30, 2023
UNIVERSITE DE BORDEAUX
Sylvain DANTO
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Solution Glow Discharge Plasma Chamber with Ventilation
Publication number
20230059048
Publication date
Feb 23, 2023
2S WATER INCORPORATED
Joseph John Cheramy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Solution Glow Discharge Plasma Chamber with Lens
Publication number
20230059823
Publication date
Feb 23, 2023
2 S Water Incorporated
Joseph John Cheramy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
A SPARK STAND AND METHOD OF MAINTENANCE
Publication number
20220333990
Publication date
Oct 20, 2022
Thermo Fisher Scientific (Ecublens)
Fabio Demarco
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
OPTICAL EMISSION SPECTROSCOPY CONTROL OF GAS FLOW IN PROCESSING CHA...
Publication number
20220291702
Publication date
Sep 15, 2022
Applied Materials, Inc.
Philip DiGiacomo
G01 - MEASURING TESTING
Information
Patent Application
EMISSION-BASED DETECTOR FOR CAPILLARY GAS CHROMATOGRAPHY
Publication number
20220252517
Publication date
Aug 11, 2022
Mecanique Analytique Inc.
Yves GAMACHE
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR PREPARING GLOW DISCHARGE SPUTTERING SAMPLE...
Publication number
20220205922
Publication date
Jun 30, 2022
NCS Testing Technology CO.,LTD
Xing YU
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Improved Spark Stand for Optical Emission Spectrometry
Publication number
20220155217
Publication date
May 19, 2022
THERMO FISHER SCIENTIFIC (ECUBLENS) SARL
Patrick Lancuba
G01 - MEASURING TESTING
Information
Patent Application
PATHOGEN SCREENING USING OPTICAL EMISSION SPECTROSCOPY (OES)
Publication number
20220026367
Publication date
Jan 27, 2022
Jyotirmoy Mazumder
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR INCLUSION ANALYSIS
Publication number
20220026373
Publication date
Jan 27, 2022
FEI Company
Jean-Marc Bohlen
G01 - MEASURING TESTING
Information
Patent Application
GENERATOR FOR SPECTROMETRY
Publication number
20220007490
Publication date
Jan 6, 2022
Analytik Jena GmbH
Frank Claus
G01 - MEASURING TESTING
Information
Patent Application
GLOW PLASMA GAS MEASUREMENT SIGNAL PROCESSING
Publication number
20210310956
Publication date
Oct 7, 2021
Servomex Group Limited
Bahram Alizadeh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SPARK EMISSION SPECTROMETER WITH SEPARABLE SPARK CHAMBER
Publication number
20210285820
Publication date
Sep 16, 2021
Elementar Analysensysteme GmbH
Hans DOMINICK
G01 - MEASURING TESTING
Information
Patent Application
LIQUID ELECTRODE TIP
Publication number
20210223182
Publication date
Jul 22, 2021
2S WATER INCORPORATED
Neil JOHNSON
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR MEASURING A TEMPERATURE OF A GAS
Publication number
20210199590
Publication date
Jul 1, 2021
Purdue Research Foundation
Alexey Shashurin
G01 - MEASURING TESTING
Information
Patent Application
PLASMA-BASED DETECTOR AND METHODS USING THE SAME FOR MEASURING AND...
Publication number
20210156805
Publication date
May 27, 2021
MECANIQUE ANALYTIQUE INC.
Yves Gamache
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR ANALYZING THE ELEMENTAL COMPOSITION OF A LIQUID SAMPL...
Publication number
20210131971
Publication date
May 6, 2021
Agnes OBUCHOWSKA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI-ELECTRODE/MULTI-MODAL ATMOSPHERIC PRESSURE GLOW DISCHARGE PLA...
Publication number
20210109026
Publication date
Apr 15, 2021
Battelle Memorial Institute
David W. Koppenaal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PARTICLE DETECTION DEVICE
Publication number
20200348220
Publication date
Nov 5, 2020
NGK Insulators, Ltd.
Keiichi KANNO
G01 - MEASURING TESTING
Information
Patent Application
GAS ANALYZER
Publication number
20200348237
Publication date
Nov 5, 2020
Marunaka Co., Ltd.
Mitsugu NAKAGAWA
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR INCLUSION ANALYSIS
Publication number
20200309715
Publication date
Oct 1, 2020
FEI Company
Jean-Marc Bohlen
G01 - MEASURING TESTING
Information
Patent Application
SPARK EMISSION SPECTOMETER AND METHOD FOR OPERATING SAME
Publication number
20200300769
Publication date
Sep 24, 2020
Elementar Analysensysteme GmbH
Hans DOMINICK
G01 - MEASURING TESTING
Information
Patent Application
DISCHARGE DETECTION SYSTEM AND DISCHARGE DETECTION METHOD
Publication number
20200141872
Publication date
May 7, 2020
SUBARU CORPORATION
Takayuki NISHI
G01 - MEASURING TESTING
Information
Patent Application
METAL-ANTIBODY TAGGING AND PLASMA-BASED DETECTION
Publication number
20200141873
Publication date
May 7, 2020
Purdue Research Foundation
Joseph Paul Robinson
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR RAPID ELEMENTAL ANALYSIS OF AIRBORNE PARTIC...
Publication number
20200132606
Publication date
Apr 30, 2020
The USA, as represented by the Secretary, Department of Health and Human Serv...
Pramod P. Kulkarni
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR SPECTRAL ANALYSIS OF A CHEMICAL COMPOSITION O...
Publication number
20200116642
Publication date
Apr 16, 2020
Aleksandr Nikolaevich ZABRODIN
G01 - MEASURING TESTING
Information
Patent Application
METAL-ANTIBODY TAGGING AND PLASMA-BASED DETECTION
Publication number
20200049629
Publication date
Feb 13, 2020
Purdue Research Foundation
Joseph Paul Robinson
G01 - MEASURING TESTING