TREA

using electrostatic analysers

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Industry

  • CPC
  • H01J49/282
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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/282using electrostatic analysers
Industries

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    Monitoring Radical Particle Concentration Using Mass Spectrometry
    • Publication number 20240264116
    • Publication date Aug 8, 2024
    • MKS Instruments, Inc.
    • Chenglong Yang
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SYSTEMS AND TECHNIQUES FOR IN-SOURCE ION SEPARATION
    • Publication number 20240222105
    • Publication date Jul 4, 2024
    • Thermo Finnigan LLC
    • Mikhail V. UGAROV
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SPACE WEATHER FORECASTING
    • Publication number 20220381949
    • Publication date Dec 1, 2022
    • UNIVERSITETET I OSLO
    • Anna Fæhn FOLLESTAD
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD AND DEVICE FOR CROSSTALK COMPENSATION
    • Publication number 20220301841
    • Publication date Sep 22, 2022
    • Thermo Fisher Scientific (Bremen) GmbH
    • Alexander KHOLOMEEV
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Monitoring Radical Particle Concentration Using Mass Spectrometry
    • Publication number 20220196597
    • Publication date Jun 23, 2022
    • MKS Instruments, Inc.
    • Chenglong Yang
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ANALYSIS DEVICE
    • Publication number 20210335590
    • Publication date Oct 28, 2021
    • Sharp Kabushiki Kaisha
    • Masamitsu MORITANI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Method and Device for Crosstalk Compensation
    • Publication number 20210142994
    • Publication date May 13, 2021
    • Thermo Fisher Scientific (Bremen) GmbH
    • Alexander KHOLOMEEV
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    METHOD AND SYSTEM FOR MEASURING INERT GAS BY ION PROBE
    • Publication number 20210057204
    • Publication date Feb 25, 2021
    • Institute of Geology and Geophysics, Chinese Academy of Sciences
    • Yu LIU
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    DEVICE AND SYSTEM FOR SELECTIVE IONIZATION AND ANALYTE DETECTION AN...
    • Publication number 20200258734
    • Publication date Aug 13, 2020
    • Battelle Memorial Institute
    • Elizabeth Denis
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ION GUIDE WITHIN PULSED CONVERTERS
    • Publication number 20200168447
    • Publication date May 28, 2020
    • Anatoly Verenchikov
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass Analyzer Dynamic Tuning for Plural Optimization Criteria
    • Publication number 20190371588
    • Publication date Dec 5, 2019
    • Thermo Finnigan LLC
    • Jesse D. CANTERBURY
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    METHOD AND SYSTEM OF ATMOSPHERIC PRESSURE MEGAVOLT ELECTROSTATIC FI...
    • Publication number 20190318921
    • Publication date Oct 17, 2019
    • The University of Hong Kong
    • Kwan Ming Ng
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Ion Trap Mass Spectrometer
    • Publication number 20190295835
    • Publication date Sep 26, 2019
    • LECO CORPORATION
    • Anatoly N. Verenchikov
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Method and Device for Crosstalk Compensation
    • Publication number 20190198303
    • Publication date Jun 27, 2019
    • Thermo Fisher Scientific (Bremen) GmbH
    • Alexander KHOLOMEEV
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Electrostatic Trap
    • Publication number 20190164740
    • Publication date May 30, 2019
    • Thermo Fisher Scientific (Bremen) GmbH
    • Alexander A. MAKAROV
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Ion Trap Mass Spectrometer
    • Publication number 20190157062
    • Publication date May 23, 2019
    • Leco Corporation
    • Anatoly N. Verenchikov
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ANALYTICAL DEVICE
    • Publication number 20190051505
    • Publication date Feb 14, 2019
    • Shimadzu Corporation
    • Kosuke HOSOI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Method and Apparatus for Isotope Ratio Mass Spectrometry
    • Publication number 20180226238
    • Publication date Aug 9, 2018
    • Thermo Fisher Scientific (Bremen) GmbH
    • Jens GRIEP-RAMING
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Ion Trap Mass Spectrometer
    • Publication number 20170372883
    • Publication date Dec 28, 2017
    • Leco Corporation
    • Anatoly N. Verenchikov
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Ion Trap Mass Spectrometer
    • Publication number 20170365456
    • Publication date Dec 21, 2017
    • Leco Corporation
    • Anatoly N. Verenchikov
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Ion Trap Mass Spectrometer
    • Publication number 20170365457
    • Publication date Dec 21, 2017
    • Leco Corporation
    • Anatoly N. Verenchikov
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Electrostatic Trap
    • Publication number 20170117130
    • Publication date Apr 27, 2017
    • Thermo Fisher Scientific (Bremen) GmbH
    • Alexander A. MAKAROV
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS ANALYSER
    • Publication number 20170084445
    • Publication date Mar 23, 2017
    • Shimadzu Corporation
    • Li DING
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    METHOD AND SYSTEM OF ATMOSPHERIC PRESSURE MEGAVOLT ELECTROSTATIC FI...
    • Publication number 20170084442
    • Publication date Mar 23, 2017
    • The University of Hong Kong
    • Kwan Ming Ng
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ION DETECTION
    • Publication number 20170040152
    • Publication date Feb 9, 2017
    • Thermo Fisher Scientific (Bremen) GmbH
    • Alexander Alekseevich Makarov
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Ion Trap Mass Spectrometer
    • Publication number 20160013040
    • Publication date Jan 14, 2016
    • Leco Corporation
    • Anatoly N. Verenchikov
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Ion Trap Mass Spectrometer
    • Publication number 20160005584
    • Publication date Jan 7, 2016
    • Anatoly N. Verenchikov
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Ion Trap Mass Spectrometer
    • Publication number 20150380233
    • Publication date Dec 31, 2015
    • Leco Corporation
    • Anatoly N. Verenchikov
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ION INJECTION FROM A QUADRUPOLE ION TRAP
    • Publication number 20150340220
    • Publication date Nov 26, 2015
    • Thermo Fisher Scientific (Bremen) GmbH
    • Christian Albrecht HOCK
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Electrostatic Ion Mirrors
    • Publication number 20140312221
    • Publication date Oct 23, 2014
    • Anatoly N. Verenchikov
    • H01 - BASIC ELECTRIC ELEMENTS