using electrostatic analysers

Industry

CPC
H01J49/48

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/48using electrostatic analysers

Industries

Patents Grantslast 30 patents

Information Patent Grant
Variable reduction ratio spherical aberration correction electrosta...
- Patent number 11,791,148
- Issue date Oct 17, 2023
- University Corporation National Nara Institute of Science and Technology
- Hiroyuki Matsuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion injection into an electrostatic linear ion trap using Zeno pulsing
- Patent number 11,764,052
- Issue date Sep 19, 2023
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensing data related to charged particles to predict an anomaly in...
- Patent number 11,688,599
- Issue date Jun 27, 2023
- Government of the United States of America as represented by the Secretary of...
- Chadwick Lindstrom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Instrument, including an electrostatic linear ion trap, for separat...
- Patent number 11,646,191
- Issue date May 9, 2023
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting time of flight mass analyser
- Patent number 11,621,156
- Issue date Apr 4, 2023
- Micromass UK Limited
- Boris Kozlov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for simultaneously analyzing multiple ions wit...
- Patent number 11,562,896
- Issue date Jan 24, 2023
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer and method for improving mass and...
- Patent number 11,264,229
- Issue date Mar 1, 2022
- Guennadi Lebedev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution electron energy analyzer
- Patent number 10,964,522
- Issue date Mar 30, 2021
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multimode ion mirror prism and energy filtering apparatus and syste...
- Patent number 10,622,203
- Issue date Apr 14, 2020
- The Board of Trustees of the University of Illinois
- Igor Vladimirovich Veryovkin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic lens, and parallel beam generation device and paralle...
- Patent number 10,614,992
- Issue date Apr 7, 2020
- National University Corporation Nara Institute of Science and Technology
- Fumihiko Matsui
- G01 - MEASURING TESTING
Information Patent Grant
Spiral electrostatic analyzer
- Patent number 10,615,024
- Issue date Apr 7, 2020
- The Government of the United States of America as Represented by the Secretar...
- Patrick Roddy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron spectroscopy system
- Patent number 10,607,807
- Issue date Mar 31, 2020
- Board of Trustees of Michigan State University
- Chong-Yu Ruan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monolithic collimator and energy analyzer for ion spectrometry
- Patent number 10,468,241
- Issue date Nov 5, 2019
- West Virginia University
- Earl Scime
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Accelerator mass spectrometry device for simultaneously measuring i...
- Patent number 10,395,910
- Issue date Aug 27, 2019
- China Institute of Atomic Energy
- Shan Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam combiner
- Patent number 10,361,064
- Issue date Jul 23, 2019
- National Electrostatics Corp.
- Mark L. Sundquist
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Retarding potential type energy analyzer
- Patent number 10,319,578
- Issue date Jun 11, 2019
- Japan Synchrotron Radiation Research Institute
- Takayuki Muro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sorter
- Patent number 10,147,593
- Issue date Dec 4, 2018
- DH Technologies Development Pte. Ltd.
- Takashi Baba
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Analyser arrangement for particle spectrometer
- Patent number 9,978,579
- Issue date May 22, 2018
- SCIENTA OMICRON AB
- Björn Wannberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for measuring energy of electrons excited by sunl...
- Patent number 9,671,356
- Issue date Jun 6, 2017
- National University Corporation Nagoya University
- Toru Ujihara
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method of decoding multiplet containing spectra in open isochronous...
- Patent number 9,673,036
- Issue date Jun 6, 2017
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron spectrometer and measurement method
- Patent number 9,613,790
- Issue date Apr 4, 2017
- Jeol Ltd.
- Yasuhide Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultra-compact plasma spectrometer
- Patent number 9,502,229
- Issue date Nov 22, 2016
- West Virginia University
- Earl Scime
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyser arrangement for particle spectrometer
- Patent number 9,437,408
- Issue date Sep 6, 2016
- SCIENTA OMICRON AB
- Björn Wannberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Open trap mass spectrometer
- Patent number 9,312,119
- Issue date Apr 12, 2016
- Leco Corporation
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Controlling charged particles with inhomogeneous electrostatic fields
- Patent number 9,245,726
- Issue date Jan 26, 2016
- The United States of America as represented by the administrator of the Natio...
- Federico A. Herrero
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of electrical signaling in an ion energy analyzer
- Patent number 9,087,677
- Issue date Jul 21, 2015
- Tokyo Electron Limited
- Merritt Funk
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Parallel radial mirror analyser with an angled zero-volt equipotent...
- Patent number 8,981,292
- Issue date Mar 17, 2015
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle energy analysers and methods of operating charged...
- Patent number 8,866,103
- Issue date Oct 21, 2014
- Shimadzu Corporation
- Dane Cubric
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion energy analyzer
- Patent number 8,847,159
- Issue date Sep 30, 2014
- Tokyo Electron Limited
- Lee Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Ion energy analyzer and methods of manufacturing the same
- Patent number 8,816,281
- Issue date Aug 26, 2014
- Tokyo Electron Limited
- Merritt Funk
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
ELECTROSTATIC DEFLECTION CONVERGENCE-TYPE ENERGY ANALYZER, IMAGING-...
- Publication number 20240047190
- Publication date Feb 8, 2024
- INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION NATIONAL INSTITUTE OF NATURAL...
- Hiroyuki MATSUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSTRUMENT, INCLUDING AN ELECTROSTATIC LINEAR ION TRAP, FOR ANALYZI...
- Publication number 20230245879
- Publication date Aug 3, 2023
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSTRUMENT FOR SEPARATING IONS INCLUDING AN ELECTROSTATIC LINEAR IO...
- Publication number 20230154741
- Publication date May 18, 2023
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VARIABLE REDUCTION RATIO SPHERICAL ABERRATION CORRECTION ELECTROSTA...
- Publication number 20210193448
- Publication date Jun 24, 2021
- National University Corporation Nara Institute of Science and Technology
- Hiroyuki MATSUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High Resolution Electron Energy Analyzer
- Publication number 20190378705
- Publication date Dec 12, 2019
- KLA-Tencor Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SPECTROSCOPY SYSTEM
- Publication number 20190096627
- Publication date Mar 28, 2019
- Board of Trustees of Michigan State University
- Chong-Yu RUAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multimode Ion Mirror Prism and Energy Filtering Apparatus and Syste...
- Publication number 20180323053
- Publication date Nov 8, 2018
- THE BOARD OF TRUSTEES OF UNIVERSITY OF ILLINOIS
- Igor Vladimirovich Veryovkin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER
- Publication number 20180269054
- Publication date Sep 20, 2018
- SCIENTA OMICRON AB
- Björn WANNBERG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACCELERATOR MASS SPECTROMETRY DEVICE FOR SIMULTANEOUSLY MEASURING I...
- Publication number 20180082828
- Publication date Mar 22, 2018
- CHINA INSTITUTE OF ATOMIC ENERGY
- Shan JIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RETARDING POTENTIAL TYPE ENERGY ANALYZER
- Publication number 20180082829
- Publication date Mar 22, 2018
- JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE
- Takayuki MURO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MONOLITHIC COLLIMATOR AND ENERGY ANALYZER FOR ION SPECTROMETRY
- Publication number 20170287693
- Publication date Oct 5, 2017
- West Virginia University
- Earl Scime
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER
- Publication number 20160336166
- Publication date Nov 17, 2016
- SCIENTA OMICRON AB
- Björn WANNBERG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Spectrometer and Measurement Method
- Publication number 20160268119
- Publication date Sep 15, 2016
- JEOL Ltd.
- Yasuhide Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER
- Publication number 20140361161
- Publication date Dec 11, 2014
- VG SCIENTA AB
- Björn Wannberg
- G01 - MEASURING TESTING
Information Patent Application
PARALLEL RADIAL MIRROR ANALYSER FOR SCANNING MICROSCOPES
- Publication number 20140042317
- Publication date Feb 13, 2014
- National University of Singapore
- Anjam KHURSHEED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEQUENTIAL RADIAL MIRROR ANALYSER
- Publication number 20130126730
- Publication date May 23, 2013
- National University of Singapore
- Anjam KHURSHEED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HOLLOW CYLINDRICAL ANALYZER
- Publication number 20130112870
- Publication date May 9, 2013
- Victor Gorelik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE ENERGY ANALYSERS AND METHODS OF OPERATING CHARGED...
- Publication number 20130105687
- Publication date May 2, 2013
- Shimadzu Corporation
- Dane Cubric
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Open Trap Mass Spectrometer
- Publication number 20130056627
- Publication date Mar 7, 2013
- Leco Corporation
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION ENERGY ANALYZER
- Publication number 20120248310
- Publication date Oct 4, 2012
- TOKYO ELECTRON LIMITED
- Lee Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHODS OF ELECTRICAL SIGNALING IN AN ION ENERGY ANALYZER
- Publication number 20120248322
- Publication date Oct 4, 2012
- TOKYO ELECTRON LIMITED
- Merritt Funk
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
ION ENERGY ANALYZER AND METHODS OF MANUFACTURING THE SAME
- Publication number 20120248311
- Publication date Oct 4, 2012
- TOKYO ELECTRON LIMITED
- Merritt Funk
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Devices, Systems, and Methods for Dispersive Energy Imaging
- Publication number 20110278448
- Publication date Nov 17, 2011
- UTAH STATE UNIVERSITY RESEARCH FOUNDATION
- Erik Syrstad
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIND AND TEMPERATURE SPECTROMETER WITH CROSSED SMALL-DEFLECTION ENE...
- Publication number 20110180700
- Publication date Jul 28, 2011
- NASA HQ's.
- FEDERICO A. HERRERO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE ANALYZER
- Publication number 20110174968
- Publication date Jul 21, 2011
- SHIMADZU CORPORATION
- Masaru Nishiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE ENERGY ANALYZER
- Publication number 20110168886
- Publication date Jul 14, 2011
- KLA-Tencor Corporation
- Khashayar Shadman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE ENERGY ANALYSERS
- Publication number 20110147585
- Publication date Jun 23, 2011
- Nikolay Alekseevich Kholine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electromagnetic Imaging Analyser
- Publication number 20110069862
- Publication date Mar 24, 2011
- VACUUM SYSTEMS LTD
- Jiri Krizek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER APPARATUS TO REDUCE ENERGY OF ELECTRONS IN AN ANALYZE...
- Publication number 20100237240
- Publication date Sep 23, 2010
- Physical Electronics USA, Inc.
- David G. Watson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE ANALYSER AND METHOD
- Publication number 20100163725
- Publication date Jul 1, 2010
- Ian Richard Barkshire
- H01 - BASIC ELECTRIC ELEMENTS

using electrostatic analysers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Variable reduction ratio spherical aberration correction electrosta...

Ion injection into an electrostatic linear ion trap using Zeno pulsing

Sensing data related to charged particles to predict an anomaly in...

Instrument, including an electrostatic linear ion trap, for separat...

Multi-reflecting time of flight mass analyser

Apparatus and method for simultaneously analyzing multiple ions wit...

Time-of-flight mass spectrometer and method for improving mass and...

High resolution electron energy analyzer

Multimode ion mirror prism and energy filtering apparatus and syste...

Electrostatic lens, and parallel beam generation device and paralle...

Spiral electrostatic analyzer

Electron spectroscopy system

Monolithic collimator and energy analyzer for ion spectrometry

Accelerator mass spectrometry device for simultaneously measuring i...

Beam combiner

Retarding potential type energy analyzer

Ion sorter

Analyser arrangement for particle spectrometer

Method and device for measuring energy of electrons excited by sunl...

Method of decoding multiplet containing spectra in open isochronous...

Electron spectrometer and measurement method

Ultra-compact plasma spectrometer

Analyser arrangement for particle spectrometer

Open trap mass spectrometer

Controlling charged particles with inhomogeneous electrostatic fields

Methods of electrical signaling in an ion energy analyzer

Parallel radial mirror analyser with an angled zero-volt equipotent...

Charged particle energy analysers and methods of operating charged...

Ion energy analyzer

Ion energy analyzer and methods of manufacturing the same

Patents Applicationslast 30 patents

ELECTROSTATIC DEFLECTION CONVERGENCE-TYPE ENERGY ANALYZER, IMAGING-...

INSTRUMENT, INCLUDING AN ELECTROSTATIC LINEAR ION TRAP, FOR ANALYZI...

INSTRUMENT FOR SEPARATING IONS INCLUDING AN ELECTROSTATIC LINEAR IO...

VARIABLE REDUCTION RATIO SPHERICAL ABERRATION CORRECTION ELECTROSTA...

High Resolution Electron Energy Analyzer

ELECTRON SPECTROSCOPY SYSTEM

Multimode Ion Mirror Prism and Energy Filtering Apparatus and Syste...

ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER

ACCELERATOR MASS SPECTROMETRY DEVICE FOR SIMULTANEOUSLY MEASURING I...

RETARDING POTENTIAL TYPE ENERGY ANALYZER

MONOLITHIC COLLIMATOR AND ENERGY ANALYZER FOR ION SPECTROMETRY

ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER

Electron Spectrometer and Measurement Method

ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER

PARALLEL RADIAL MIRROR ANALYSER FOR SCANNING MICROSCOPES

SEQUENTIAL RADIAL MIRROR ANALYSER

HOLLOW CYLINDRICAL ANALYZER

CHARGED PARTICLE ENERGY ANALYSERS AND METHODS OF OPERATING CHARGED...

Open Trap Mass Spectrometer

ION ENERGY ANALYZER

METHODS OF ELECTRICAL SIGNALING IN AN ION ENERGY ANALYZER

ION ENERGY ANALYZER AND METHODS OF MANUFACTURING THE SAME

Devices, Systems, and Methods for Dispersive Energy Imaging

WIND AND TEMPERATURE SPECTROMETER WITH CROSSED SMALL-DEFLECTION ENE...

CHARGED PARTICLE ANALYZER

CHARGED-PARTICLE ENERGY ANALYZER

CHARGED PARTICLE ENERGY ANALYSERS

Electromagnetic Imaging Analyser

SAMPLE HOLDER APPARATUS TO REDUCE ENERGY OF ELECTRONS IN AN ANALYZE...

CHARGED PARTICLE ANALYSER AND METHOD